SIST EN 62586-2:2017/kprA1:2021
(Amendment)Power quality measurement in power supply systems - Part 2: Functional tests and uncertainty requirements
Power quality measurement in power supply systems - Part 2: Functional tests and uncertainty requirements
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Messung der Spannungsqualität in Energieversorgungssystemen - Teil 2: Funktionsprüfungen und Anforderungen an die Messunsicherheit
Mesure de la qualité de l'alimention dans les réseaux d'alimentation - Partie 2: Essais fonctionnels et exigences d'incertitude
Merjenje kakovosti električne energije v napajalnih sistemih - 2. del: Zahteve za funkcionalne preskuse in negotovost
General Information
RELATIONS
Standards Content (sample)
SLOVENSKI STANDARD
SIST EN 62586-2:2017/kprA1:2020
01-julij-2020
Merjenje kakovosti električne energije v napajalnih sistemih - 2. del: Zahteve za
funkcionalne preskuse in negotovostPower quality measurement in power supply systems - Part 2: Functional tests and
uncertainty requirements
Messung der Spannungsqualität in Energieversorgungssystemen - Teil 2:
Funktionsprüfungen und Anforderungen an die Messunsicherheit
Mesure de la qualité de l'alimention dans les réseaux d'alimentation - Partie 2: Essais
fonctionnels et exigences d'incertitudeTa slovenski standard je istoveten z: EN 62586-2:2017/prA1:2020
ICS:
17.220.20 Merjenje električnih in Measurement of electrical
magnetnih veličin and magnetic quantities
SIST EN 62586-2:2017/kprA1:2020 en,fr,de
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN 62586-2:2017/kprA1:2020
85/721/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 62586-2/AMD1 ED2
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2020-05-29 2020-08-21
SUPERSEDES DOCUMENTS:
85/700/CD, 85/711A/CC
IEC TC 85 : MEASURING EQUIPMENT FOR ELECTRICAL AND ELECTROMAGNETIC QUANTITIES
SECRETARIAT: SECRETARY:
China Ms Guiju HAN
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:
SC 77A
Other TC/SCs are requested to indicate their interest, if any,
in this CDV to the secretary.
FUNCTIONS CONCERNED:
EMC ENVIRONMENT QUALITY ASSURANCE SAFETY
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel votingThe attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft for
Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.
This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of which they
are aware and to provide supporting documentation.TITLE:
Power quality measurement in power supply systems - Part 2: Functional tests and uncertainty
requirementsPROPOSED STABILITY DATE: 2025
NOTE FROM TC/SC OFFICERS:
Copyright © 2020 International Electrotechnical Commission, IEC. All rights reserved. It is permitted to download this
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
permission in writing from IEC.---------------------- Page: 3 ----------------------
SIST EN 62586-2:2017/kprA1:2020
IEC CDV 62586-2 © IEC 2020 - 2 - 85/721/CDV
1 CONTENTS
2 CONTENTS........................................................................................................................ - 2 -
3 FOREWORD ...................................................................................................................... - 3 -
4 5.1.4 Single "power-system influence quantities" ................................................. - 5 -
5 6.4.1 General ....................................................................................................... - 5 -
6 6.13 Rapid voltage changes (RVC) .......................................................................... - 10 -
7 6.13.1 RVC parameters and evaluation ................................................................ - 10 -
8 6.13.2 General ..................................................................................................... - 10 -
9 6.13.3 “No RVC” tests .......................................................................................... - 12 -
10 6.13.4 “RVC threshold and setup”test ................................................................... - 16 -
11 6.13.5 “RVC parameters” test .............................................................................. - 18 -
12 6.13.6 “RVC polyphase” tests .............................................................................. - 20 -
13 6.13.7 “Voltage is in steady-state condition” tests ................................................ - 22 -
14 Annex G (informative) Gapless measurements of voltage amplitude and harmonics ........ - 25 -
16 Figure 2 – Detail 1 of waveform for test of dips according to test A4.1.1 ............................. - 6 -
17 Figure 3 – Detail 2 of waveform for tests of dips according to A4.1.1 .................................. - 6 -
18 Figure 4 – Detail 3 of waveform for tests of dips according to test A4.1.1 ........................... - 7 -
19 Figure 18 – RVC event (new figure) ................................................................................. - 10 -
20 Figure 19 – Test A13.1.1 waveform .................................................................................. - 12 -
21 Figure 20 – Test A13.1.1 waveform with RVC limits and arithmetic mean ......................... - 13 -
22 Figure 21 – Test A13.1.2 waveform .................................................................................. - 14 -
23 Figure 22 – Test A13.1.2 waveform with RVC limits and arithmetic mean ......................... - 14 -
24 Figure 23 – Test A13.1.3 waveform .................................................................................. - 15 -
25 Figure 24 – Test A13.1.3 waveform with RVC limits and arithmetic mean ......................... - 16 -
26 Figure 25 – Test A13.2.1 waveform .................................................................................. - 17 -
27 Figure 26 – Test A13.2.1 waveform with RVC limits and arithmetic mean ......................... - 17 -
28 Figure 27 – Test A13.3.1 waveform .................................................................................. - 19 -
29 Figure 28 – Test A13.3.1 waveform with RVC limits and arithmetic mean ......................... - 19 -
30 Figure 29 – Test A13.4.1 waveform .................................................................................. - 21 -
31 Figure 47 – Test A13.4.1 waveform with RVC limits and VSS ........................................... - 21 -
32 Figure 30 – Test A13.5.1 waveform .................................................................................. - 22 -
33 Figure 32 – Test A13.5.2 waveform .................................................................................. - 24 -
34 Figure 33 – Test A13.5.2 waveform with RVC limits and arithmetic mean ......................... - 24 -
35 Figure G.4 – Spectral leakage effects for a missing sample.............................................. - 25 -
37 Table 8 – Specification of test A13.1.1 ............................................................................. - 12 -
38 Table 9 – Specification of test A13.1.2 ............................................................................. - 13 -
39 Table 10 – Specification of test A13.1.3 ........................................................................... - 15 -
40 Table 11 – Specification of test A13.2.1 ........................................................................... - 16 -
41 Table 12 – Specification of test A13.3.1 ........................................................................... - 18 -
42 Table 13 – Specification of test A13.4.1 ........................................................................... - 20 -
43 Table 14 – Specification of test A13.5.1 ........................................................................... - 22 -
44 Table 15 – Specification of test A13.5.2 ........................................................................... - 23 -
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IEC CDV 62586-2 © IEC 2020 - 3 - 85/721/CDV
46 INTERNATIONAL ELECTROTECHNICAL COMMISSION
47 ____________
49 POWER QUALITY MEASUREMENT IN POWER SUPPLY SYSTEMS –
51 Part 2: Functional tests and uncertainty requirements
53 FOREWORD
54 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all
55 national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-
56 operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to
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60 International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation.
61 IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions
62 determined by agreement between the two organizations.63 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
64 consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC
65 National Committees.66 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees
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68 IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user.
69 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently
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71 and the corresponding national or regional publication shall be clearly indicated in the latter.
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74 independent certification bodies.75 6) All users should ensure that they have the latest edition of this publication.
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79 publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.
80 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
81 indispensable for the correct application of this publication.82 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights.
83 IEC shall not be held responsible for identifying any or all such patent rights.
84 International Standard IEC 62586-2 has been prepared by IEC technical committee 85: Measuring
85 equipment for electrical and electromagnetic quantities.86 This second edition cancels and replaces the first edition published in 2013. This edition constitutes a
87 technical revision.88 This edition includes the following significant technical changes with respect to the previous edition:
89 a) test procedures for RVC and current have been added;90 b) mistakes have been fixed.
91 This bilingual version (2017-11) corresponds to the monolingual English version, published in 2017-03.
92 The text of this standard is based on the following documents:CDV Report on voting
85/525/CDV 85/571/RVC
94 Full information on the voting for the approval of this standard can be found in the report on voting
95 indicated in the above table.96 The French version of this standard has not been voted upon.
97 This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
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IEC CDV 62586-2 © IEC 2020 - 4 - 85/721/CDV
98 A list of all parts of the IEC 62586 series, published under the general title Power quality
99 measurement in power supply systems, can be found on the IEC website.100 The committee has decided that the contents of this publication will remain unchanged until the
101 stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to the
102 specific publication. At this date, the publication will be103 • reconfirmed,
104 • withdrawn,
105 • replaced by a revised edition, or
106 • amended.
107
108 The contents of the corrigendum of June 2018 have been included in this copy.
109IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correctunderstanding of its contents. Users should therefore print this document using a
colour printer.110
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SIST EN 62586-2:2017/kprA1:2020
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111
112 5.1.4 Single "power-system influence quantities"
c d
113 Replace in Table 4 the footnotes and by the following:
114 This signal represents a crest factor of 2 and applies to voltage signals.
115 This signal represents a crest factor of 3 and applies to current signals.
116
117 6.2.2.2 Variations due to single influence quantities
118 Replace the complete clause by the following:
119 Each test shall last at least 1 s.
No. Target of the test Testing points Complementary test Test criterion (if
according Table 3 conditions according test is applicable)
to Table 4
A2.3.1 Measure influence of P3 for voltage S1 for frequency TC10/12(unc)
frequency on measurement magnitude
uncertainty (for further
calculations as required in
S3 for frequency
Clause8).
A2.3.2 Measure influence of P3 for voltage S1 for harmonics TC10/12(unc) on
harmonics on measurement magnitude ch1 compared to a
uncertainty (for further reference voltage
calculations as requiredin
Clause8).
120
121 6.4.1 General
122 Replace Figure 1 by the following:
% Udin Test signal phase 1
150
100
-50
-100
-150
0 5 10 15 20 25 30
Number of cycles
Zero crossing at T1
% Udin
Test signal phase 2
150
100
-50
-100
-150
0 5 10 15 20 25 30
Number of cycles
Zero crossing at T1 + 10 cycles
% Udin
Test signal phase 3
150
100
-50
-100
-150
0 5 10 15 20 25 30
Number of cycles
Zero crossing at T1 + 20 cycles
123
124 Figure 1 – Overview of test for dips according to test A4.1.1
125
126
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127 Replace Figure 2 by the following:
% Udin
1/2 cycle RMS phase 1
100
0 05,1 100,2 10,53 200,4 205,5 300,6
Number of cycles
% Udin
1/2 cycle RMS phase 2
100
5 10 15 20 25 30
Number of cycles
% Udin
1/2 cycle RMS phase 3
100
5 10 15 20 25 30
Number of cycles
IEC
128 Figure 2 – Detail 1 of waveform for test of dips according to test A4.1.1
129 Replace Figure 3 by the following:
din
90 % U
din
2 % U hysteresis
din
0 % U
din
Vdip duration
Vdip start Vdip end
IEC
130 Figure 3 – Detail 2 of waveform for tests of dips according to A4.1.1
131 Replace Figure 4 by the following:
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SIST EN 62586-2:2017/kprA1:2020
IEC CDV 62586-2 © IEC 2020 - 7 - 85/721/CDV
U U U U U U U U
rms(½) rms(½) rms(½) rms(½) rms(½) rms(½) rms(½) rms(½)
N + 1 N + 2 N + 3 N + 4 N + 5 N + 6 N + 7
100 % U 70,7% U 0 % U 0 % U 0 % U 63,6% U 90 % U 90 % U
din din din din din din din din
U U U U U U U U
rms(½) rms(½) rms(½) rms(½) rms(½) rms(½) rms(½) rms(½)
N + 8 N + 9 N + 10 N + 11 N + 12 N + 13 N + 14 N + 15
90 % U 92 % U 94 % U 94 % U 94 % U 94 % U 94 % U 94 % U
din din din din din din din din
IEC
132 Figure 4 – Detail 3 of waveform for tests of dips according to test A4.1.1
133
134 Replace Figure 5 by the following:
135
136 Figure 5 – Detail 1 of waveform for test of dips according to test A4.1.2
137 Replace Figure 6 by the following:
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138
139 Figure 6 – Detail 2 of waveform for tests of dips according to test A4.1.2
140
141 Replace Figure 7 by the following:
Test signal: swell 200 %, 2,5 cycles
% Udin
300
200
100
–100
–200
–300
0 1 2 3 4 5 6 Cycles
IEC
142
143 Figure 7 – Detail 1 of waveform for test of swells according to test A4.1.2
144
145
146
147
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148 Replace Figure 8 by the following:
149
1/2 cycle RMS
% Udin
200
180
160
140
120
100
0 1 2 3 4 5 6 Cycles
IEC
150
151 Figure 8 – Detail 2 of waveform for tests of swells according to test A4.1.2
152
153 Replace Figure 9 by the following:
% U
din
100
Time
IEC
154 Figure 9 – Sliding reference voltage test
155
156
157
158
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IEC CDV 62586-2 © IEC 2020 - 10 - 85/721/CDV
159 6.13 Rapid voltage changes (RVC)
160 Replace the entire clause by the following:
161 6.13.1 RVC parameters and evaluation
162 An RVC event is characterized by four parameters:
163 • start time,
164 • duration,
165 ∆U
• max
...
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