Smart Cards; Test specification for the Single Wire Protocol (SWP) interface; Part 2: UICC features (Release 11)

RTS/SCP-00SWPUvb01

General Information

Status
Published
Publication Date
17-Sep-2019
Technical Committee
Current Stage
12 - Completion
Due Date
04-Oct-2019
Completion Date
18-Sep-2019
Ref Project

Buy Standard

Standard
ETSI TS 102 694-2 V11.0.1 (2019-09) - Smart Cards; Test specification for the Single Wire Protocol (SWP) interface; Part 2: UICC features (Release 11)
English language
131 pages
sale 15% off
Preview
sale 15% off
Preview

Standards Content (Sample)

ETSI TS 102 694-2 V11.0.1 (2019-09)






TECHNICAL SPECIFICATION
Smart Cards;
Test specification for the
Single Wire Protocol (SWP) interface;
Part 2: UICC features
(Release 11)

---------------------- Page: 1 ----------------------
Release 11 2 ETSI TS 102 694-2 V11.0.1 (2019-09)



Reference
RTS/SCP-00SWPUvb01
Keywords
smart card, terminal
ETSI
650 Route des Lucioles
F-06921 Sophia Antipolis Cedex - FRANCE

Tel.: +33 4 92 94 42 00  Fax: +33 4 93 65 47 16

Siret N° 348 623 562 00017 - NAF 742 C
Association à but non lucratif enregistrée à la
Sous-Préfecture de Grasse (06) N° 7803/88

Important notice
The present document can be downloaded from:
http://www.etsi.org/standards-search
The present document may be made available in electronic versions and/or in print. The content of any electronic and/or
print versions of the present document shall not be modified without the prior written authorization of ETSI. In case of any
existing or perceived difference in contents between such versions and/or in print, the prevailing version of an ETSI
deliverable is the one made publicly available in PDF format at www.etsi.org/deliver.
Users of the present document should be aware that the document may be subject to revision or change of status.
Information on the current status of this and other ETSI documents is available at
https://portal.etsi.org/TB/ETSIDeliverableStatus.aspx
If you find errors in the present document, please send your comment to one of the following services:
https://portal.etsi.org/People/CommiteeSupportStaff.aspx
Copyright Notification
No part may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying
and microfilm except as authorized by written permission of ETSI.
The content of the PDF version shall not be modified without the written authorization of ETSI.
The copyright and the foregoing restriction extend to reproduction in all media.

© ETSI 2019.
All rights reserved.

DECT™, PLUGTESTS™, UMTS™ and the ETSI logo are trademarks of ETSI registered for the benefit of its Members.

3GPP™ and LTE™ are trademarks of ETSI registered for the benefit of its Members and
of the 3GPP Organizational Partners.
oneM2M™ logo is a trademark of ETSI registered for the benefit of its Members and
of the oneM2M Partners.
®
GSM and the GSM logo are trademarks registered and owned by the GSM Association.
ETSI

---------------------- Page: 2 ----------------------
Release 11 3 ETSI TS 102 694-2 V11.0.1 (2019-09)
Contents
Intellectual Property Rights . 11
Foreword . 11
Modal verbs terminology . 12
Introduction . 12
1 Scope . 13
2 References . 13
2.1 Normative references . 13
2.2 Informative references . 14
3 Definition of terms, symbols, abbreviations and formats . 14
3.1 Terms . 14
3.2 Symbols . 15
3.3 Abbreviations . 15
3.4 Formats . 16
3.4.1 Format of the table of optional features . 16
3.4.2 Format of the applicability table . 16
3.4.3 Status and Notations . 16
4 Test environment . 17
4.1 Table of optional features . 17
4.2 Applicability table . 18
4.3 Information to be provided by the DUT supplier . 23
4.4 Test equipment . 23
4.4.0 General requirements . 23
4.4.1 Measurement/setting uncertainties . 23
4.4.2 Default conditions for DUT operation . 24
4.4.2.0 General . 24
4.4.2.1 Temperature . 24
4.4.2.2 ETSI TS 102 221 interface contacts (CLK, RST, I/O) and contact Vcc . 25
4.4.2.3 ETSI TS 102 600 interface contacts (IC_DP, IC_DM) . 25
4.4.2.4 ETSI TS 102 613 interface contact (SWIO). 25
4.4.2.5 Status of UICC interfaces . 26
4.4.2.6 Characteristics of LLCs . 26
4.4.2.6.1 ACT LLC . 26
4.4.2.6.2 SHDLC LLC . 26
4.4.2.6.3 CLT LLC . 27
4.4.3 Minimum/maximum conditions for DUT operation . 27
4.4.3.0 General . 27
4.4.3.1 Temperature . 27
4.4.3.2 Contact Vcc . 27
4.5 Test execution . 28
4.5.1 Parameter variations . 28
4.5.2 Execution requirements . 28
4.6 Pass criterion . 29
5 Test cases . 29
5.1 Principle of the Single Wire Protocol . 29
5.2 System architecture . 29
5.2.1 General overview . 29
5.2.2 ETSI TS 102 221 support . 29
5.2.2.1 Conformance requirements . 29
5.2.3 Configurations . 29
5.2.3.1 Conformance requirements . 29
5.2.3.2 Test case 1: Global Interface bytes of the ATR . 30
5.2.3.2.1 Test execution . 30
5.2.3.2.2 Initial conditions . 30
ETSI

---------------------- Page: 3 ----------------------
Release 11 4 ETSI TS 102 694-2 V11.0.1 (2019-09)
5.2.3.2.3 Test procedure . 30
5.2.3.3 Test case 2: interaction with ETSI TS 102 221 interface - SWP activation while the UICC

receives data . 30
5.2.3.3.1 Test execution . 30
5.2.3.3.2 Initial conditions . 30
5.2.3.3.3 Test procedure . 30
5.2.3.4 Test case 3: interaction with ETSI TS 102 221 interface - SWP activation while the UICC sends
data . 31
5.2.3.4.1 Test execution . 31
5.2.3.4.2 Initial conditions . 31
5.2.3.4.3 Test procedure . 31
5.2.4 Interaction with other interfaces . 31
5.2.4.1 Conformance requirements . 31
5.2.4.2 Test case 1: interaction with ETSI TS 102 221 interface - ETSI TS 102 221 clock stop . 32
5.2.4.2.1 Test execution . 32
5.2.4.2.2 Initial conditions . 32
5.2.4.2.3 Test procedure . 32
5.2.4.3 Test case 2: interaction with ETSI TS 102 221 interface - ETSI TS 102 221 reset . 32
5.2.4.3.1 Test execution . 32
5.2.4.3.2 Initial conditions . 32
5.2.4.3.3 Test procedure . 32
5.2.4.4 Test case 3: interaction with ETSI TS 102 221 interface - SWP deactivation while the UICC
receives data . 33
5.2.4.4.1 Test execution . 33
5.2.4.4.2 Initial conditions . 33
5.2.4.4.3 Test procedure . 33
5.2.4.5 Test case 4: interaction with ETSI TS 102 221 interface - SWP deactivation while the UICC
sends data . 33
5.2.4.5.1 Test execution . 33
5.2.4.5.2 Initial conditions . 33
5.2.4.5.3 Test procedure . 34
5.2.4.6 Test case 5: interaction with ETSI TS 102 221 interface - reset SWP while the UICC receives

data . 34
5.2.4.6.1 Test execution . 34
5.2.4.6.2 Initial conditions . 34
5.2.4.6.3 Test procedure . 34
5.2.4.7 Test case 6: interaction with ETSI TS 102 221 interface - reset SWP while the UICC sends data . 35
5.2.4.7.1 Test execution . 35
5.2.4.7.2 Initial conditions . 35
5.2.4.7.3 Test procedure . 35
5.2.4.8 Test case 7: interaction with ETSI TS 102 221 interface - activate SWP in ETSI TS 102 221
clock stop . 35
5.2.4.8.1 Test execution . 35
5.2.4.8.2 Initial conditions . 35
5.2.4.8.3 Test procedure . 36
5.3 Physical characteristic s . 36
5.3.1 Temperature range for card operations . 36
5.3.1.1 Conformance requirements . 36
5.3.2 Contacts . 36
5.3.2.1 Provision of contacts . 36
5.3.2.1.1 Conformance requirements . 36
5.3.2.2 Contact activation and deactivation . 36
5.3.2.2.1 Conformance requirements . 36
5.3.2.3 Interface activation . 37
5.3.2.3.1 Conformance requirements . 37
5.3.2.3.2 Test case 1: initial activation in low power mode . 38
5.3.2.3.3 Test case 2: initial activation in low power mode with corrupted frames . 38
5.3.2.3.4 Test case 3: no activation. 39
5.3.2.3.5 Void . 39
5.3.2.3.6 Test case 5: full power mode activation . 39
5.3.2.3.7 Test case 6: low power mode activation with re-transmission of ACT_SYNC. 40
5.3.2.3.8 Test case 7: full power mode activation with re-transmission of ACT_SYNC . 40
ETSI

---------------------- Page: 4 ----------------------
Release 11 5 ETSI TS 102 694-2 V11.0.1 (2019-09)
5.3.2.3.9 Void . 41
5.3.2.3.10 Test case 9: low power mode activation with multiple re-transmission of ACT_SYNC . 41
5.3.2.3.11 Test case 10: full power mode activation with re-transmission of ACT_READY . 41
5.3.2.3.12 Test case 11: full power mode activation with multiple re-transmission of ACT_SYNC . 42
5.3.2.3.13 Test case 12: subsequent activation in low power mode . 43
5.3.2.3.14 Test case 13: subsequent activation in full power mode . 43
5.3.2.3.15 Void . 44
5.3.2.4 Behaviour of a UICC in a terminal not supporting SWP . 44
5.3.2.4.1 Conformance requirements . 44
5.3.2.4.2 Void . 44
5.3.2.4.3 Void . 44
5.3.2.5 Behaviour of a terminal connected to a UICC not supporting SWP . 44
5.3.2.6 Inactive contacts . 44
5.4 Electrical characteristics . 44
5.4.1 Operating conditions . 44
5.4.1.1 Operating conditions . 44
5.4.1.2 Supply voltage classes. 45
5.4.1.2.1 Conformance requirements . 45
5.4.1.2.2 Test case 1: ETSI TS 102 221 voltage classes B and C support . 45
5.4.1.3 Vcc (C1) low power mode definition . 45
5.4.1.3.1 Conformance requirements . 45
5.4.1.3.2 Test case 1: operation in low power mode . 45
5.4.1.4 Signal S1 . 46
5.4.1.4.1 Conformance requirements . 46
5.4.1.4.2 Test case 1: S1 communication in voltage class B . 46
5.4.1.4.3 Test case 2: S1 communication in voltage class C, full power mode . 47
5.4.1.4.4 Test case 3: S1 communication in low power mode. 48
5.4.1.5 Signal S2 . 49
5.4.1.5.1 Signal S2. 49
5.4.1.5.2 Operating current for S2 . 49
5.5 Physical transmission layer . 53
5.5.1 S1 Bit coding and sampling time . 53
5.5.1.1 Conformance requirements . 53
5.5.1.2 Test case 1: communication with timing variation, default bit duration . 53
5.5.1.2.1 Test execution . 53
5.5.1.2.2 Initial conditions . 53
5.5.1.2.3 Test procedure . 54
5.5.1.3 Test case 2: communication with timing variation, extended bit duration . 54
5.5.1.3.1 Test execution . 54
5.5.1.3.2 Initial conditions . 54
5.5.1.3.3 Test procedure . 55
5.5.1.4 Test case 3: S1 rise and fall time . 55
5.5.1.4.1 Test execution . 55
5.5.1.4.2 Initial conditions . 55
5.5.1.4.3 Test procedure . 56
5.5.1.5 Test case 4: measurement of C6 input capacitance . 56
5.5.1.5.1 Test execution . 56
5.5.1.5.2 Initial conditions . 56
5.5.1.5.3 Test procedure . 56
5.5.1.5.4 Example for C6 input capacitance test implementation (informative) . 56
5.5.1.6 Test case 5: communication with variation in bit duration . 57
5.5.1.6.1 Test execution . 57
5.5.1.6.2 Initial conditions . 57
5.5.1.6.3 Test procedure . 57
5.5.2 S2 switching management . 57
5.5.2.1 Conformance requirements . 57
5.5.2.2 Test case 1: S2 switching management . 57
5.5.2.2.1 Test execution . 57
5.5.2.2.2 Initial conditions . 57
5.5.2.2.3 Test procedure . 57
5.5.2.3 Test case 2: S2 switching management (variation in bit duration) . 58
5.5.2.3.1 Test execution . 58
ETSI

---------------------- Page: 5 ----------------------
Release 11 6 ETSI TS 102 694-2 V11.0.1 (2019-09)
5.5.2.3.2 Initial conditions .
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.