ETSI ES 203 119-6 V1.1.1 (2018-06)
Methods for Testing and Specification (MTS); The Test Description Language (TDL); Part 6: Mapping to TTCN-3
Methods for Testing and Specification (MTS); The Test Description Language (TDL); Part 6: Mapping to TTCN-3
DES/MTS-203119-6
Metode za preskušanje in specificiranje (MTS) - Jezik za opis preskusa (TDL) - 6. del: Preslikava v TTCN-3
V tem dokumentu je opisano, kako naj bodo elementi jezika za opis preskusa (TDL) preslikani v zapis preskušanja in nadzora preskusov različice 3 (TTCN-3) [2]. Ta dokument se predvidoma uporablja kot osnova za razvoj orodij TDL. Metamodel jezika TDL in pomeni metarazredov so opisani v standardu ETSI ES 203 119-1 [1].
General Information
Buy Standard
Standards Content (Sample)
ETSI ES 203 119-6 V1.1.1 (2018-06)
ETSI STANDARD
Methods for Testing and Specification (MTS);
The Test Description Language (TDL);
Part 6: Mapping to TTCN-3
---------------------- Page: 1 ----------------------
2 ETSI ES 203 119-6 V1.1.1 (2018-06)
Reference
DES/MTS-203119-6
Keywords
methodology, model, testing, TTCN-3
ETSI
650 Route des Lucioles
F-06921 Sophia Antipolis Cedex - FRANCE
Tel.: +33 4 92 94 42 00 Fax: +33 4 93 65 47 16
Siret N° 348 623 562 00017 - NAF 742 C
Association à but non lucratif enregistrée à la
Sous-Préfecture de Grasse (06) N° 7803/88
Important notice
The present document can be downloaded from:
http://www.etsi.org/standards-search
The present document may be made available in electronic versions and/or in print. The content of any electronic and/or
print versions of the present document shall not be modified without the prior written authorization of ETSI. In case of any
existing or perceived difference in contents between such versions and/or in print, the only prevailing document is the
print of the Portable Document Format (PDF) version kept on a specific network drive within ETSI Secretariat.
Users of the present document should be aware that the document may be subject to revision or change of status.
Information on the current status of this and other ETSI documents is available at
https://portal.etsi.org/TB/ETSIDeliverableStatus.aspx
If you find errors in the present document, please send your comment to one of the following services:
https://portal.etsi.org/People/CommiteeSupportStaff.aspx
Copyright Notification
No part may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying
and microfilm except as authorized by written permission of ETSI.
The content of the PDF version shall not be modified without the written authorization of ETSI.
The copyright and the foregoing restriction extend to reproduction in all media.
© ETSI 2018.
All rights reserved.
TM TM TM
DECT , PLUGTESTS , UMTS and the ETSI logo are trademarks of ETSI registered for the benefit of its Members.
TM TM
3GPP and LTE are trademarks of ETSI registered for the benefit of its Members and
of the 3GPP Organizational Partners.
oneM2M logo is protected for the benefit of its Members.
®
GSM and the GSM logo are trademarks registered and owned by the GSM Association.
ETSI
---------------------- Page: 2 ----------------------
3 ETSI ES 203 119-6 V1.1.1 (2018-06)
Contents
Intellectual Property Rights . 7
Foreword . 7
Modal verbs terminology . 7
1 Scope . 8
2 References . 8
2.1 Normative references . 8
2.2 Informative references . 8
3 Definitions and abbreviations . 9
3.1 Definitions . 9
3.2 Abbreviations . 9
4 Basic Principles . 9
4.1 Introduction . 9
4.2 Document Structure . 9
4.3 Notational Conventions . 10
4.3.0 General . 10
4.3.1 Functions used in production rules . 11
4.3.2 Predefined Annotations . 11
4.4 Conformance . 11
5 Foundation . 11
5.1 Overview . 11
5.2 Mapping of Foundation Elements . 11
5.2.1 Element . 11
5.2.2 NamedElement . 12
5.2.3 PackageableElement . 12
5.2.4 Package . 12
5.2.5 ElementImport . 12
5.2.6 Comment . 12
5.2.7 Annotation . 13
5.2.8 AnnotationType . 13
5.2.9 TestObjective . 13
6 Data . 13
6.1 Overview . 13
6.2 Mapping of Data Definition Ele me nts . 14
6.2.1 DataResourceMapping . 14
6.2.2 MappableDataElement . 14
6.2.3 DataElementMapping . 14
6.2.4 ParameterMapping . 14
6.2.5 DataType . 14
6.2.6 DataInstance . 14
6.2.7 SimpleDataType . 14
6.2.8 SimpleDataInstance . 14
6.2.9 StructuredDataType . 15
6.2.10 Member . 15
6.2.11 StructuredDataInstance . 15
6.2.12 MemberAssignment . 15
6.2.13 CollectionDataType . 16
6.2.14 CollectionDataInstance . 16
6.2.15 ProcedureSignature . 16
6.2.16 ProcedureParameter . 16
6.2.17 ParameterKind . 16
6.2.18 Parameter . 16
6.2.19 FormalParameter . 16
6.2.20 Variable . 16
ETSI
---------------------- Page: 3 ----------------------
4 ETSI ES 203 119-6 V1.1.1 (2018-06)
6.2.21 Action . 17
6.2.22 Function . 17
6.2.23 UnassignedMemberTreatment . 17
6.2.24 PredefinedFunction . 18
6.3 Mapping of Data Use Elements . 18
6.3.1 DataUse . 18
6.3.2 ParameterBinding . 18
6.3.3 StaticDataUse . 18
6.3.4 DataInstanceUse . 18
6.3.5 SpecialValueUse . 20
6.3.6 AnyValue . 20
6.3.7 AnyValueOrOmit . 20
6.3.8 OmitValue. 20
6.3.9 DynamicDataUse . 20
6.3.10 FunctionCall . 20
6.3.11 FormalParameterUse . 22
6.3.12 VariableUse . 23
6.3.13 PredefinedFunctionCall . 25
7 Time . 25
7.1 Overview . 25
7.2 Mapping of Time Elements . 25
7.2.1 Time . 25
7.2.2 TimeLabel . 25
7.2.3 TimeLabelUse . 26
7.2.4 TimeLabelUseKind . 26
7.2.5 TimeConstraint . 26
7.2.6 TimeOperation . 28
7.2.7 Wait . 28
7.2.8 Quiescence . 28
7.2.9 Timer . 28
7.2.10 TimerOperation . 29
7.2.11 TimerStart . 29
7.2.12 TimerStop . 29
7.2.13 TimeOut . 29
8 Test Configuration . 29
8.1 Overview . 29
8.2 Mapping of TestConfiguration Elements in Non-special Cases . 29
8.2.1 Introduction. 29
8.2.2 GateType . 30
8.2.3 GateTypeKind . 30
8.2.4 GateInstance . 30
8.2.5 ComponentType . 31
8.2.6 ComponentInstance . 31
8.2.7 ComponentInstanceRole . 31
8.2.8 GateReference . 31
8.2.9 Connection . 32
8.2.10 TestConfiguration . 32
8.2.11 Definition of the component type of MTC . 32
8.2.12 Definition of the component type of system . 33
8.3 Mapping of TestConfiguration Elements in Special Cases . 33
8.3.1 Introduction. 33
8.3.2 Connectable and mappable GateType. 33
8.3.3 A gate connected to a Tester and an SUT . 33
8.3.4 More than one SUT. 34
8.3.5 A gate of a Tester is connected to more SUTs . 35
8.3.6 A gate is connected to more gates of the same component . 35
9 Test Behaviour . 36
9.1 Overview . 36
9.2 Mapping of Test Description Elements . 37
9.2.1 TestDescription . 37
ETSI
---------------------- Page: 4 ----------------------
5 ETSI ES 203 119-6 V1.1.1 (2018-06)
9.2.2 BehaviourDescription . 39
9.3 Mapping of Combined Behaviour elements . 39
9.3.1 Behaviour . 39
9.3.2 Block . 39
9.3.3 LocalExpression . 39
9.3.4 CombinedBehaviour . 39
9.3.5 SingleCombinedBehaviour . 39
9.3.6 CompoundBehaviour . 39
9.3.7 BoundedLoopBehaviour . 40
9.3.8 UnboundedLoopBehaviour . 40
9.3.9 OptionalBehaviour . 40
9.3.10 MultipleCombinedBehaviour . 42
9.3.11 AlternativeBehaviour . 43
9.3.12 ConditionalBehaviour . 43
9.3.13 ParallelBehaviour . 43
9.3.14 ExceptionalBehaviour . 44
9.3.15 DefaultBehaviour . 46
9.3.16 InterruptBehaviour . 46
9.3.17 PeriodicBehaviour . 46
9.4 Mapping of Atomic Behaviour Elements . 46
9.4.1 AtomicBehaviour . 46
9.4.2 Break . 46
9.4.3 Stop . 47
9.4.4 VerdictAssignment . 47
9.4.5 Assertion . 47
9.4.6 Interaction . 47
9.4.7 Message . 47
9.4.8 ProcedureCall . 48
9.4.9 Target . 50
9.4.10 ValueAssignment . 50
9.4.11 TestDescriptionReference . 50
9.4.12 ComponentInstanceBinding . 50
9.4.13 ActionBehaviour . 51
9.4.14 ActionReference . 51
9.4.15 InlineAction . 51
9.4.16 Assignment . 51
10 Predefined TDL Model Instances . 51
10.1 Overview . 51
10.2 Mapping of Predefined Instances of the 'SimpleDataType' Element . 51
10.2.1 Boolean . 51
10.2.2 Integer . 51
10.2.3 String . 52
10.2.4 Verdict . 52
10.3 Mapping of Predefined Instances of 'SimpleDataInstance' Element . 52
10.3.1 true . 52
10.3.2 false . 52
10.3.3 pass . 52
10.3.4 fail . 52
10.3.5 inconclusive . 52
10.4 Mapping of Predefined Instances of 'Time' Element . 52
10.4.1 Second . 52
10.5 Mapping of Predefined Instances of the 'Function' Element . 52
10.5.1 Overview . 52
10.5.2 Functions of Return Type 'Boolean' .
...
Final draft ETSI ES 203 119-6 V1.1.1 (2018-04)
ETSI STANDARD
Methods for Testing and Specification (MTS);
The Test Description Language (TDL);
Part 6: Mapping to TTCN-3
---------------------- Page: 1 ----------------------
2 Final draft ETSI ES 203 119-6 V1.1.1 (2018-04)
Reference
DES/MTS-203119-6
Keywords
methodology, model, testing, TTCN-3
ETSI
650 Route des Lucioles
F-06921 Sophia Antipolis Cedex - FRANCE
Tel.: +33 4 92 94 42 00 Fax: +33 4 93 65 47 16
Siret N° 348 623 562 00017 - NAF 742 C
Association à but non lucratif enregistrée à la
Sous-Préfecture de Grasse (06) N° 7803/88
Important notice
The present document can be downloaded from:
http://www.etsi.org/standards-search
The present document may be made available in electronic versions and/or in print. The content of any electronic and/or
print versions of the present document shall not be modified without the prior written authorization of ETSI. In case of any
existing or perceived difference in contents between such versions and/or in print, the only prevailing document is the
print of the Portable Document Format (PDF) version kept on a specific network drive within ETSI Secretariat.
Users of the present document should be aware that the document may be subject to revision or change of status.
Information on the current status of this and other ETSI documents is available at
https://portal.etsi.org/TB/ETSIDeliverableStatus.aspx
If you find errors in the present document, please send your comment to one of the following services:
https://portal.etsi.org/People/CommiteeSupportStaff.aspx
Copyright Notification
No part may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying
and microfilm except as authorized by written permission of ETSI.
The content of the PDF version shall not be modified without the written authorization of ETSI.
The copyright and the foregoing restriction extend to reproduction in all media.
© ETSI 2018.
All rights reserved.
TM TM TM
DECT , PLUGTESTS , UMTS and the ETSI logo are trademarks of ETSI registered for the benefit of its Members.
TM TM
3GPP and LTE are trademarks of ETSI registered for the benefit of its Members and
of the 3GPP Organizational Partners.
oneM2M logo is protected for the benefit of its Members.
®
GSM and the GSM logo are trademarks registered and owned by the GSM Association.
ETSI
---------------------- Page: 2 ----------------------
3 Final draft ETSI ES 203 119-6 V1.1.1 (2018-04)
Contents
Intellectual Property Rights . 7
Foreword . 7
Modal verbs terminology . 7
1 Scope . 8
2 References . 8
2.1 Normative references . 8
2.2 Informative references . 8
3 Definitions and abbreviations . 9
3.1 Definitions . 9
3.2 Abbreviations . 9
4 Basic Principles . 9
4.1 Introduction . 9
4.2 Document Structure . 9
4.3 Notational Conventions . 10
4.3.0 General . 10
4.3.1 Functions used in production rules . 11
4.3.2 Predefined Annotations . 11
4.4 Conformance . 11
5 Foundation . 11
5.1 Overview . 11
5.2 Mapping of Foundation Elements . 11
5.2.1 Element . 11
5.2.2 NamedElement . 12
5.2.3 PackageableElement . 12
5.2.4 Package . 12
5.2.5 ElementImport . 12
5.2.6 Comment . 13
5.2.7 Annotation . 13
5.2.8 AnnotationType . 13
5.2.9 TestObjective . 13
6 Data . 13
6.1 Overview . 13
6.2 Mapping of Data Definition Ele me nts . 14
6.2.1 DataResourceMapping . 14
6.2.2 MappableDataElement . 14
6.2.3 DataElementMapping . 14
6.2.4 ParameterMapping . 14
6.2.5 DataType . 14
6.2.6 DataInstance . 14
6.2.7 SimpleDataType . 14
6.2.8 SimpleDataInstance . 14
6.2.9 StructuredDataType . 15
6.2.10 Member . 15
6.2.11 StructuredDataInstance . 15
6.2.12 MemberAssignment . 16
6.2.13 CollectionDataType . 16
6.2.14 CollectionDataInstance . 16
6.2.15 ProcedureSignature . 16
6.2.16 ProcedureParameter . 16
6.2.17 ParameterKind . 16
6.2.18 Parameter . 16
6.2.19 FormalParameter . 16
6.2.20 Variable . 16
ETSI
---------------------- Page: 3 ----------------------
4 Final draft ETSI ES 203 119-6 V1.1.1 (2018-04)
6.2.21 Action . 17
6.2.22 Function . 17
6.2.23 UnassignedMemberTreatment . 17
6.2.24 PredefinedFunction . 18
6.3 Mapping of Data Use Elements . 18
6.3.1 DataUse . 18
6.3.2 ParameterBinding . 18
6.3.3 StaticDataUse . 18
6.3.4 DataInstanceUse . 18
6.3.5 SpecialValueUse . 20
6.3.6 AnyValue . 20
6.3.7 AnyValueOrOmit . 20
6.3.8 OmitValue. 20
6.3.9 DynamicDataUse . 20
6.3.10 FunctionCall . 20
6.3.11 FormalParameterUse . 22
6.3.12 VariableUse . 23
6.3.13 PredefinedFunctionCall . 25
7 Time . 25
7.1 Overview . 25
7.2 Mapping of Time Elements . 25
7.2.1 Time . 25
7.2.2 TimeLabel . 25
7.2.3 TimeLabelUse . 26
7.2.4 TimeLabelUseKind . 26
7.2.5 TimeConstraint . 26
7.2.6 TimeOperation . 28
7.2.7 Wait . 28
7.2.8 Quiescence . 28
7.2.9 Timer . 28
7.2.10 TimerOperation . 29
7.2.11 TimerStart . 29
7.2.12 TimerStop . 29
7.2.13 TimeOut . 29
8 Test Configuration . 29
8.1 Overview . 29
8.2 Mapping of TestConfiguration Elements in Non-special Cases . 29
8.2.1 Introduction. 29
8.2.2 GateType . 30
8.2.3 GateTypeKind . 30
8.2.4 GateInstance . 30
8.2.5 ComponentType . 31
8.2.6 ComponentInstance . 31
8.2.7 ComponentInstanceRole . 31
8.2.8 GateReference . 31
8.2.9 Connection . 32
8.2.10 TestConfiguration . 32
8.2.11 Definition of the component type of MTC . 32
8.2.12 Definition of the component type of system . 33
8.3 Mapping of TestConfiguration Elements in Special Cases . 33
8.3.1 Introduction. 33
8.3.2 Connectable and mappable GateType. 33
8.3.3 A gate connected to a Tester and an SUT . 33
8.3.4 More than one SUT. 34
8.3.5 A gate of a Tester is connected to more SUTs . 35
8.3.6 A gate is connected to more gates of the same component . 35
9 Test Behaviour . 36
9.1 Overview . 36
9.2 Mapping of Test Description Elements . 37
9.2.1 TestDescription . 37
ETSI
---------------------- Page: 4 ----------------------
5 Final draft ETSI ES 203 119-6 V1.1.1 (2018-04)
9.2.2 BehaviourDescription . 39
9.3 Mapping of Combined Behaviour elements . 39
9.3.1 Behaviour . 39
9.3.2 Block . 39
9.3.3 LocalExpression . 39
9.3.4 CombinedBehaviour . 39
9.3.5 SingleCombinedBehaviour . 39
9.3.6 CompoundBehaviour . 39
9.3.7 BoundedLoopBehaviour . 40
9.3.8 UnboundedLoopBehaviour . 40
9.3.9 OptionalBehaviour . 40
9.3.10 MultipleCombinedBehaviour . 42
9.3.11 AlternativeBehaviour . 43
9.3.12 ConditionalBehaviour . 43
9.3.13 ParallelBehaviour . 43
9.3.14 ExceptionalBehaviour . 44
9.3.15 DefaultBehaviour . 46
9.3.16 InterruptBehaviour . 46
9.3.17 PeriodicBehaviour . 46
9.4 Mapping of Atomic Behaviour Elements . 46
9.4.1 AtomicBehaviour . 46
9.4.2 Break . 46
9.4.3 Stop . 47
9.4.4 VerdictAssignment . 47
9.4.5 Assertion . 47
9.4.6 Interaction . 47
9.4.7 Message . 47
9.4.8 ProcedureCall . 48
9.4.9 Target . 50
9.4.10 ValueAssignment . 50
9.4.11 TestDescriptionReference . 50
9.4.12 ComponentInstanceBinding . 50
9.4.13 ActionBehaviour . 51
9.4.14 ActionReference . 51
9.4.15 InlineAction . 51
9.4.16 Assignment . 51
10 Predefined TDL Model Instances . 51
10.1 Overview . 51
10.2 Mapping of Predefined Instances of the 'SimpleDataType' Element . 51
10.2.1 Boolean . 51
10.2.2 Integer . 51
10.2.3 String . 52
10.2.4 Verdict . 52
10.3 Mapping of Predefined Instances of 'SimpleDataInstance' Element . 52
10.3.1 true . 52
10.3.2 false . 52
10.3.3 pass . 52
10.3.4 fail . 52
10.3.5 inconclusive . 52
10.4 Mapping of Predefined Instances of 'Time' Element . 52
10.4.1 Second . 52
10.5 Mapping of Predefined Instances of the 'Function' Element . 52
10.5.1 Overview . 52
10.5.2 Functions of Return Type 'Boolean' .
...
SLOVENSKI STANDARD
SIST ES 203 119-6 V1.1.1:2018
01-december-2018
Metode za preskušanje in specificiranje (MTS) - Jezik za opis preskusa (TDL) - 6.
del: Preslikava v TTCN-3
Methods for Testing and Specification (MTS) - The Test Description Language (TDL) -
Part 6: Mapping to TTCN-3
Ta slovenski standard je istoveten z: ETSI ES 203 119-6 V1.1.1 (2018-06)
ICS:
35.060 Jeziki, ki se uporabljajo v Languages used in
informacijski tehniki in information technology
tehnologiji
SIST ES 203 119-6 V1.1.1:2018 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
---------------------- Page: 1 ----------------------
SIST ES 203 119-6 V1.1.1:2018
---------------------- Page: 2 ----------------------
SIST ES 203 119-6 V1.1.1:2018
ETSI ES 203 119-6 V1.1.1 (2018-06)
ETSI STANDARD
Methods for Testing and Specification (MTS);
The Test Description Language (TDL);
Part 6: Mapping to TTCN-3
---------------------- Page: 3 ----------------------
SIST ES 203 119-6 V1.1.1:2018
2 ETSI ES 203 119-6 V1.1.1 (2018-06)
Reference
DES/MTS-203119-6
Keywords
methodology, model, testing, TTCN-3
ETSI
650 Route des Lucioles
F-06921 Sophia Antipolis Cedex - FRANCE
Tel.: +33 4 92 94 42 00 Fax: +33 4 93 65 47 16
Siret N° 348 623 562 00017 - NAF 742 C
Association à but non lucratif enregistrée à la
Sous-Préfecture de Grasse (06) N° 7803/88
Important notice
The present document can be downloaded from:
http://www.etsi.org/standards-search
The present document may be made available in electronic versions and/or in print. The content of any electronic and/or
print versions of the present document shall not be modified without the prior written authorization of ETSI. In case of any
existing or perceived difference in contents between such versions and/or in print, the only prevailing document is the
print of the Portable Document Format (PDF) version kept on a specific network drive within ETSI Secretariat.
Users of the present document should be aware that the document may be subject to revision or change of status.
Information on the current status of this and other ETSI documents is available at
https://portal.etsi.org/TB/ETSIDeliverableStatus.aspx
If you find errors in the present document, please send your comment to one of the following services:
https://portal.etsi.org/People/CommiteeSupportStaff.aspx
Copyright Notification
No part may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying
and microfilm except as authorized by written permission of ETSI.
The content of the PDF version shall not be modified without the written authorization of ETSI.
The copyright and the foregoing restriction extend to reproduction in all media.
© ETSI 2018.
All rights reserved.
TM TM TM
DECT , PLUGTESTS , UMTS and the ETSI logo are trademarks of ETSI registered for the benefit of its Members.
TM TM
3GPP and LTE are trademarks of ETSI registered for the benefit of its Members and
of the 3GPP Organizational Partners.
oneM2M logo is protected for the benefit of its Members.
®
GSM and the GSM logo are trademarks registered and owned by the GSM Association.
ETSI
---------------------- Page: 4 ----------------------
SIST ES 203 119-6 V1.1.1:2018
3 ETSI ES 203 119-6 V1.1.1 (2018-06)
Contents
Intellectual Property Rights . 7
Foreword . 7
Modal verbs terminology . 7
1 Scope . 8
2 References . 8
2.1 Normative references . 8
2.2 Informative references . 8
3 Definitions and abbreviations . 9
3.1 Definitions . 9
3.2 Abbreviations . 9
4 Basic Principles . 9
4.1 Introduction . 9
4.2 Document Structure . 9
4.3 Notational Conventions . 10
4.3.0 General . 10
4.3.1 Functions used in production rules . 11
4.3.2 Predefined Annotations . 11
4.4 Conformance . 11
5 Foundation . 11
5.1 Overview . 11
5.2 Mapping of Foundation Elements . 11
5.2.1 Element . 11
5.2.2 NamedElement . 12
5.2.3 PackageableElement . 12
5.2.4 Package . 12
5.2.5 ElementImport . 12
5.2.6 Comment . 12
5.2.7 Annotation . 13
5.2.8 AnnotationType . 13
5.2.9 TestObjective . 13
6 Data . 13
6.1 Overview . 13
6.2 Mapping of Data Definition Ele me nts . 14
6.2.1 DataResourceMapping . 14
6.2.2 MappableDataElement . 14
6.2.3 DataElementMapping . 14
6.2.4 ParameterMapping . 14
6.2.5 DataType . 14
6.2.6 DataInstance . 14
6.2.7 SimpleDataType . 14
6.2.8 SimpleDataInstance . 14
6.2.9 StructuredDataType . 15
6.2.10 Member . 15
6.2.11 StructuredDataInstance . 15
6.2.12 MemberAssignment . 15
6.2.13 CollectionDataType . 16
6.2.14 CollectionDataInstance . 16
6.2.15 ProcedureSignature . 16
6.2.16 ProcedureParameter . 16
6.2.17 ParameterKind . 16
6.2.18 Parameter . 16
6.2.19 FormalParameter . 16
6.2.20 Variable . 16
ETSI
---------------------- Page: 5 ----------------------
SIST ES 203 119-6 V1.1.1:2018
4 ETSI ES 203 119-6 V1.1.1 (2018-06)
6.2.21 Action . 17
6.2.22 Function . 17
6.2.23 UnassignedMemberTreatment . 17
6.2.24 PredefinedFunction . 18
6.3 Mapping of Data Use Elements . 18
6.3.1 DataUse . 18
6.3.2 ParameterBinding . 18
6.3.3 StaticDataUse . 18
6.3.4 DataInstanceUse . 18
6.3.5 SpecialValueUse . 20
6.3.6 AnyValue . 20
6.3.7 AnyValueOrOmit . 20
6.3.8 OmitValue. 20
6.3.9 DynamicDataUse . 20
6.3.10 FunctionCall . 20
6.3.11 FormalParameterUse . 22
6.3.12 VariableUse . 23
6.3.13 PredefinedFunctionCall . 25
7 Time . 25
7.1 Overview . 25
7.2 Mapping of Time Elements . 25
7.2.1 Time . 25
7.2.2 TimeLabel . 25
7.2.3 TimeLabelUse . 26
7.2.4 TimeLabelUseKind . 26
7.2.5 TimeConstraint . 26
7.2.6 TimeOperation . 28
7.2.7 Wait . 28
7.2.8 Quiescence . 28
7.2.9 Timer . 28
7.2.10 TimerOperation . 29
7.2.11 TimerStart . 29
7.2.12 TimerStop . 29
7.2.13 TimeOut . 29
8 Test Configuration . 29
8.1 Overview . 29
8.2 Mapping of TestConfiguration Elements in Non-special Cases . 29
8.2.1 Introduction. 29
8.2.2 GateType . 30
8.2.3 GateTypeKind . 30
8.2.4 GateInstance . 30
8.2.5 ComponentType . 31
8.2.6 ComponentInstance . 31
8.2.7 ComponentInstanceRole . 31
8.2.8 GateReference . 31
8.2.9 Connection . 32
8.2.10 TestConfiguration . 32
8.2.11 Definition of the component type of MTC . 32
8.2.12 Definition of the component type of system . 33
8.3 Mapping of TestConfiguration Elements in Special Cases . 33
8.3.1 Introduction. 33
8.3.2 Connectable and mappable GateType. 33
8.3.3 A gate connected to a Tester and an SUT . 33
8.3.4 More than one SUT. 34
8.3.5 A gate of a Tester is connected to more SUTs . 35
8.3.6 A gate is connected to more gates of the same component . 35
9 Test Behaviour . 36
9.1 Overview . 36
9.2 Mapping of Test Description Elements . 37
9.2.1 TestDescription . 37
ETSI
---------------------- Page: 6 ----------------------
SIST ES 203 119-6 V1.1.1:2018
5 ETSI ES 203 119-6 V1.1.1 (2018-06)
9.2.2 BehaviourDescription . 39
9.3 Mapping of Combined Behaviour elements . 39
9.3.1 Behaviour . 39
9.3.2 Block . 39
9.3.3 LocalExpression . 39
9.3.4 CombinedBehaviour . 39
9.3.5 SingleCombinedBehaviour . 39
9.3.6 CompoundBehaviour . 39
9.3.7 BoundedLoopBehaviour . 40
9.3.8 UnboundedLoopBehaviour . 40
9.3.9 OptionalBehaviour . 40
9.3.10 MultipleCombinedBehaviour . 42
9.3.11 AlternativeBehaviour . 43
9.3.12 ConditionalBehaviour . 43
9.3.13 ParallelBehaviour . 43
9.3.14 ExceptionalBehaviour . 44
9.3.15 DefaultBehaviour . 46
9.3.16 InterruptBehaviour . 46
9.3.17 PeriodicBehaviour . 46
9.4 Mapping of Atomic Behaviour Elements . 46
9.4.1 AtomicBehaviour . 46
9.4.2 Break . 46
9.4.3 Stop . 47
9.4.4 VerdictAssignment . 47
9.4.5 Assertion . 47
9.4.6 Interaction . 47
9.4.7 Message . 47
9.4.8 ProcedureCall . 48
9.4.9 Target . 50
9.4.10 ValueAssignment . 50
9.4.11 TestDescriptionReference . 50
9.4.12 ComponentInstanceBinding . 50
9.4.13 ActionBehaviour . 51
9.4.14 ActionReference . 51
9.4.15 InlineAction . 51
9.4.16 Assignment . 51
10 Predefined TDL Model Instances . 51
10.1 Overview . 51
10.2 Mapping of Predefined Instances of the 'SimpleDataType' Element . 51
10.2.1 Boolean . 51
10.2.2 Integer . 51
10.2.3 String . 52
10.2.4 Verdict . 52
10.3 Mapping of Predefined Instances of 'SimpleDataInstance' Element . 52
10.3.1 true . 52
10.3.2 false . 52
10.3.3 pass . 52
10.3.4 fail .
...
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