IEC 62271-101:2006/AMD1:2010

Amendment 1 - High-voltage switchgear and controlgear - Part 101: Synthetic testing

Amendement 1 - Appareillage à haute tension - Partie 101: Essais synthétiques

General Information

• Status: Published
• Publication Date: 10-May-2010
• ICS: 29.130.10 - High voltage switchgear and controlgear
• Technical Committee: SC 17A - Switching devices
• Drafting Committee: MT 28 - TC 17/SC 17A/MT 28
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 12-Oct-2012

Relations

• Amends: IEC 62271-101:2006 - High-voltage switchgear and controlgear - Part 101: Synthetic testing
• Effective Date: 05-Sep-2023
• Revised: IEC 62271-101:2012 - High-voltage switchgear and controlgear - Part 101: Synthetic testing
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 62271-101 ®
Edition 1.0 2010-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 1
AMENDEMENT 1
High-voltage switchgear and controlgear –
Part 101: Synthetic testing
Appareillage à haute tension –
Partie 101: Essais synthétiques

IEC 62271-101:2006/A1:2010
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IEC 62271-101 ®
Edition 1.0 2010-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 1
AMENDEMENT 1
High-voltage switchgear and controlgear –
Part 101: Synthetic testing
Appareillage à haute tension –
Partie 101: Essais synthétiques

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
P
CODE PRIX
ICS 29.130.10 ISBN 978-2-88910-928-9
– 2 – 62271-101 Amend. 1 © IEC:2010

FOREWORD
This amendment has been prepared by subcommittee 17A: High-voltage switchgear and

controlgear, of IEC technical committee 17: Switchgear and controlgear.

The text of this amendment is based on the following documents:

FDIS Report on voting
17A/907/FDIS 17A/919/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
INTRODUCTION
This amendment cancels and replaces IEC 61633.
The original edition of IEC 62271-101 (2006) makes extensive reference to
IEC 62271-100:2001. Since then, a new edition of IEC 62271-100 has been published (2008).
Within this amendment, references are made to IEC 62271-100:2008. Unless they are
explicitly mentioned in this amendment, all of the references in the original edition of
IEC 62271-101 (2006) still make reference to IEC 62271-100:2001. A second amendment to
IEC 62271-101, which will update all cross-references to the new IEC 62271-100:2008, is
under consideration.
Change "Tables I.1a through I.2d" to "Tables 15 through 22 of IEC 62271-100:2008" in the
whole document.
62271-101 Amend. 1 © IEC:2010 – 3 –

2 Normative references
Delete reference to IEC 61633.

Add the following new reference (and footnote) to the existing list:

IEC 62271-100:2008, High-voltage switchgear and controlgear – Part 100: Alternating-current

circuit-breakers
4.2.4 Other synthetic test methods
In the second paragraph, replace “IEC 61633” by “Annex O of IEC 62271-100:2008”.

6 Specific requirements for synthetic tests for making and breaking
performance related to the requirements of 6.102 through 6.111 of
IEC 62271-100
Add the following text at the end on the first paragraph:
Annex O of IEC 62271-100:2008 gives guidelines for the testing of metal-enclosed and dead
tank circuit breakers.
Add the following subclause:
6.102.4.2 Unit testing
For the application of the synthetic test methods to one or more units of a circuit breaker, the
requirements of 6.102.4.2 of IEC 62271-100:2008 are applicable. In the case of metal-
enclosed or dead tank circuit-breakers, Annex N gives details of some typical test circuits and
Annex O of IEC 62271-100:2008 outlines appropriate testing guidelines.

6.111 Capacitive current switching tests
Add the following text:
For metal-enclosed and dead tank circuit-breakers, typical test circuits are given in Annex N
and additional guidelines are given in Annex O of IEC 62271-100:2008.

___________
Unless explicitly otherwise mentioned, all of the references to IEC 62271-100 make reference to IEC 62271-100:2001. A
second amendment to IEC 62271-101, which will update all cross-references to the new IEC 62271-100:2008, is under
consideration.
– 4 – 62271-101 Amend. 1 © IEC:2010

Figure 5
Replace the existing Figure 5 by the following new Figure 5:

IEC  961/10 IEC  962/10
Figure 5a – Synthetic make circuit for terminal fault
IEC  963/10
Figure 5b – Synthetic make circuit for out-of-phase (ac + dc method)

62271-101 Amend. 1 © IEC:2010 – 5 –

L TR S L
1 t h
u i
t t
R
h
CH L U
u S pf h
cs a
C
h
L1
IEC  964/10
Figure 5c – Synthetic make circuit for out-of-phase (ac + ac method)
Key
S auxiliary circuit-breaker i current through S

a t t
S circuit-breaker under test L inductance of the current circuit

t 1
u voltage of the current circuit L
inductance of the voltage circuit
cs h
i current of the current circuit R C components of the ITMC circuit
cs h h
i injected current L parallel inductance of the voltage circuit

h pf
U applied voltage t time delay of making device
h m
CH making device (triggered spark gap)
Figure 5 – Typical synthetic make circuits for single-phase tests

G.1 Introduction
Add the following new text below the note:
For applicability of the mentioned methods in case of metal-enclosed or dead tank circuit-
breakers, see Annex N and Annex O of IEC 62271-100:2008.

G.1.2 Recovery voltage
In the second paragraph, replace “4.3 of IEC 61633” by “O.4.3 of IEC 62271-100:2008”.

Annex I
Replace the existing text of Annex I by the following new text:
For the last current loop parameters, refer to Tables 15 through 22 of IEC 62271-100:2008.
Tables I.1a and I.1b cover the last loop di/dt reduction for 50 Hz and 60 Hz, respectively,
under three-phase conditions with the first pole-to-clear in phase A and the required
asymmetry in phase C.
– 6 – 62271-101 Amend. 1 © IEC:2010

Tables I.2a and I.2b cover the corrected values for k = 1,3 and f = 50 Hz; k = 1,3 and
pp r pp
f = 60 Hz and k = 1,5 and f = 50 Hz, respectively.
r pp r
Delete the existing Tables I.1a through I.2d, and renumber Tables I.3 to I.1 and Tables I.4 to

I.2.
62271-101 Amend. 1 © IEC:2010 – 7 –

Add the following new Annex N:

Annex N
(informative)
Typical test circuits for metal-enclosed and dead tank circuit breakers

This annex outlines some typical synthetic test circuits for type testing relevant to short-circuit

making, breaking and switching performance of metal enclosed and dead tank circuit-

breakers. Other methods are not excluded provided that they supply the correct stresses to
the pole terminals, between the phases and between the terminals and the enclosure of the
circuit-breaker.
Many circuits are possible with different features. Some examples are given in Figures N.1
through N.9 as follows:
– terminal fault tests on one or more units of metal-enclosed or dead tank circuit-breakers
(Figures N.1 to N.4);
– capacitive current switching tests (Figures N.5 to N.7);
– out-of-phase switching tests (Figure N.8);
– full pole terminal fault tests with voltage applied to both terminals and the metal enclosure
(Figure N.9).
L
u
A
S
a
L
h
i
h
u
cs
S
t
u u Z U
G E t h h
i i
cs t
IEC  965/10
Figure N.1a – Typical injection circuit with voltage circuit
in parallel with the unit(s) under test

– 8 – 62271-101 Amend. 1 © IEC:2010

IEC  966/10
Figure N.1b – Typical injection circuit with voltage circuit in parallel
with the unit(s) used as auxiliary circuit-breaker
Key
S unit(s) of the circuit-breaker used as auxiliary circuit-breaker

a
S unit(s) of the circuit-breaker used as test circuit-breaker

t
G source supply of u , applied to the enclosure
E
u
voltage of the current circuit
cs
i current of the current circuit
cs
i injected current
h
i current through S
t t
L inductance of the current circuit
L
inductance of the voltage circuit
h
Z equivalent surge impedance of the voltage circuit

h
C capacitance of the voltage circuit which, together with L , controls the major part of the TRV

h h
Figure N.1 – Test circuit for unit testing
(circuit-breaker with interaction due to gas circulation)

62271-101 Amend. 1 © IEC:2010 – 9 –

Voltage
u + u
c cs
u
E
u
c
u = u - u
A E cs
u
t
u
cs
t
1 t Time
See details
u
E
u
A
Voltage
Voltage
u
E
u
A
u
t
u
t
u u
cs cs
i
h Time Time
i
t
i
cs
i
cs
t = instant of injection
i
t
h
of the voltage u
B
Current
Current
IEC  967/10
Typical voltage waveshapes in a current Typical voltage waveshapes in a voltage
injection circuit, in accordance with injection circuit, in accordance with
Figure N.1a, with the voltage circuit in Figure N.1b, with the voltage circuit in
parallel with the unit(s) as test circuit- parallel with the unit(s) as auxiliary circuit-
breaker breaker
Key
u voltage applied to the insulated enclosure

E
u voltage applied to the contact gap of the unit(s) under test (resulting voltage between the
B
terminal not earthed of the unit under test and the enclosure; a linear distribution of the voltage
between the units is assumed)
u voltage of the current circuit
cs
u resulting voltage between one terminal and the enclosure
A
u peak of the TRV
C
Figure N.2 – Half-pole testing of a circuit-breaker in test circuit given by Figure N.1 –
Example of the required TRVs to be applied between the terminals of the unit(s) under
test and between the live parts and the insulated enclosure

– 10 – 62271-101 Amend. 1 © IEC:2010

IEC  968/10
Figure N.3a – Typical injection circuit with voltage circuit
in parallel with the unit(s) under test
L
S
a U
C h
h
L
h
u
A
u St
cs
u u
G E t
i
cs i
t
IEC  969/10
Figure N.3b – Typical injection circuit with voltage circuit
in parallel with the auxiliary circuit-breaker
Key
S unit(s) o
...