prEN IEC 62024-1:2023
(Main)High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
Induktive Hochfrequenz-Bauelemente - Elektrische Eigenschaften und Messmethoden - Teil 1: Chipinduktivitäten im Nanohenry-Bereich
Composants inductifs à haute fréquence - Caractéristiques électriques et méthodes de mesure - Partie 1: Bobine d'inductance pastille de l'ordre du nanohenry
Visokofrekvenčne induktivne komponente - Električne karakteristike in merilne metode - 1. del: Čipni induktor v območju nanohenrijev
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
oSIST prEN IEC 62024-1:2023
01-september-2023
Visokofrekvenčne induktivne komponente - Električne karakteristike in merilne
metode - 1. del: Čipni induktor v območju nanohenrijev
High frequency inductive components - Electrical characteristics and measuring methods
- Part 1: Nanohenry range chip inductor
Induktive Hochfrequenz-Bauelemente - Elektrische Eigenschaften und Messmethoden -
Teil 1: Chipinduktivitäten im Nanohenry-Bereich
Composants inductifs à haute fréquence - Caractéristiques électriques et méthodes de
mesure - Partie 1: Inductance à puce de l'ordre du nanohenry
Ta slovenski standard je istoveten z: prEN IEC 62024-1:2023
ICS:
29.100.10 Magnetne komponente Magnetic components
oSIST prEN IEC 62024-1:2023 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
---------------------- Page: 1 ----------------------
oSIST prEN IEC 62024-1:2023
---------------------- Page: 2 ----------------------
oSIST prEN IEC 62024-1:2023
51/1441/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 62024-1 ED4
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2023-07-07 2023-09-29
SUPERSEDES DOCUMENTS:
51/1415/CD, 51/1424/CC
IEC TC 51 : MAGNETIC COMPONENTS, FERRITE AND MAGNETIC POWDER MATERIALS
SECRETARIAT: SECRETARY:
Japan Mr Takeshi Abe
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:
Other TC/SCs are requested to indicate their interest, if any,
in this CDV to the secretary.
FUNCTIONS CONCERNED:
EMC ENVIRONMENT QUALITY ASSURANCE SAFETY
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft for
Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.
This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of which they
are aware and to provide supporting documentation.
Recipients of this document are invited to submit, with their comments, notification of any relevant “In Some Countries”
clauses to be included should this proposal proceed. Recipients are reminded that the CDV stage is the final stage for
submitting ISC clauses. (SEE AC/22/2007 OR NEW GUIDANCE DOC).
TITLE:
High frequency inductive components - Electrical characteristics and measuring methods - Part 1:
Nanohenry range chip inductor
PROPOSED STABILITY DATE: 2028
Copyright © 2023 International Electrotechnical Commission, IEC. All rights reserved. It is permitted to download this
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
permission in writing from IEC.
---------------------- Page: 3 ----------------------
oSIST prEN IEC 62024-1:2023
IEC CDV 62024-1 © IEC 2023 2 51/1441/CDV
NOTE FROM TC/SC OFFICERS:
---------------------- Page: 4 ----------------------
oSIST prEN IEC 62024-1:2023
51/1441/CDV 3 IEC CDV 62024-1 © IEC 2023
1 CONTENTS
2
3 FOREWORD . 5
4 1 Scope . 7
5 2 Normative references . 7
6 3 Terms and definitions . 7
7 4 Inductance, Q-factor and impedance . 7
8 4.1 Inductance . 7
9 4.1.1 Measuring method . 7
10 4.1.2 Measuring circuit . 8
11 4.1.3 Mounting the inductor for the test . 9
12 4.1.4 Measuring method and calculation formula . 11
13 4.1.5 Notes on measurement . 12
14 4.2 Quality factor . 13
15 4.2.1 Measuring method .
...
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.