Fixed resistors for use in electronic equipment - Part 1: Generic specification

This part of EN 60115 is a generic specification and is applicable to fixed resistors for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.

Festwiderstände zur Verwendung in Geräten der Elektronik - Teil 1: Fachgrundspezifikation

Résistances fixes utilisées dans les équipements électroniques - Partie 1: Spécification générique

L'IEC 60115-1:2020 est une spécification générique et s'applique aux résistances fixes utilisées dans les équipements électroniques. Elle définit les termes normalisés, les procédures d'examen et les méthodes d'essai utilisés dans les spécifications intermédiaires et particulières des composants électroniques dans le cadre de l'assurance qualité, ainsi qu'à d'autres fins. Cette édition contient les modifications techniques majeures suivantes par rapport à l'édition précédente:  cette 5e édition s'appuie sur une nouvelle structure de document, dans laquelle les essais du précédent Article 4 sont désormais présentés de l'Article 6 à l'Article 12, avec une Annexe X informative donnant des références croisées vers la version précédente de la présente norme; les termes et définitions ont été révisés et amendés, complétés par une nouvelle section relative aux technologies en matière de résistance et une nouvelle section relative aux niveaux de classification des produits; un nouveau Paragraphe 4.7 relatif aux recommandations en matière de remplacements admis a été ajouté; les dispositions en matière d'emballage, de stockage et de transport de 4.8, 4.9 et 4.10 ont été intégralement révisées; un nouveau Paragraphe 5.3 relatif aux tolérances par défaut pour la plupart des paramètres d'essai habituels a été ajouté; la méthode générique de résistance de mesure (5.6 désormais) a été séparée de l'essai pour des raisons de conformité avec une valeur de résistance spécifiée en 6.1, en révision du précédent 4.5; l'essai de coefficient de température de résistance de 6.2 est une révision du précédent essai de 4.8 (Variation de la résistance avec la température), des concessions particulières sur les résistances inférieures à 10 Ω ayant été consenties; les méthodes d'essai d'endurance de 7.1 à 7.3 (précédemment 4.25.1 à 4.25.3) ont été intégralement révisées; l'essai de surcharge haute tension à une seule impulsion de 8.2 (précédemment 4.27) a été intégralement révisé. Il propose désormais des sévérités pour la forme d'onde des impulsions 1,2/50 et la forme d'onde des impulsions 10/700 au profit de spécifications particulières avec signification améliorée; l'essai de surcharge haute tension à impulsions périodiques de 8.3 (précédemment 4.28) a été révisé et un tableau corrigé des sévérités est fourni; l'essai de surcharge à impulsions périodiques de 8.4 (précédemment 4.39) a été déconseillé et simplifié pour ne présenter que la sévérité historiquement appliquée dans les spécifications subordonnées; le Paragraphe 9.1 relatif à l'examen visuel, le Paragraphe 9.2 relatif au calibrage des dimensions et le Paragraphe 9.3 relatif à l'évaluation des dimensions détaillées (toutes les parties de l'ancien 4.4) ont été intégralement révisés; les essais de robustesse des sorties (précédemment 4.16) ont été révisés et divisés en essais de robustesse des bornes soudables (9.5) et essais de robustesse des bornes à tiges filetées ou à vis (9.6); l'essai de secousses de 9.9 (précédemment 4.20) et l'essai de choc de 9.10 (précédemment 4.21) ont été révisés pour refléter la norme d'essai pertinente fusionnée IEC 60068-2-29; l'essai de chaleur sèche et à froid de la séquence climatiqu

Fiksni upori za elektronsko opremo - 1. del: Splošna specifikacija

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SLOVENSKI STANDARD
oSIST prEN 60115-1:2021
01-januar-2021
Fiksni upori za elektronsko opremo - 1. del: Splošna specifikacija
Fixed resistors for use in electronic equipment - Part 1: Generic specification
Festwiderstände zur Verwendung in Geräten der Elektronik - Teil 1:
Fachgrundspezifikation

Résistances fixes utilisées dans les équipements électroniques - Partie 1: Spécification

générique
Ta slovenski standard je istoveten z: prEN 60115-1
ICS:
31.040.10 Fiksni upor Fixed resistors
oSIST prEN 60115-1:2021 en,fr,de

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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oSIST prEN 60115-1:2021
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oSIST prEN 60115-1:2021
EUROPEAN STANDARD DRAFT
prEN 60115-1
NORME EUROPÉENNE
EUROPÄISCHE NORM
November 2020
ICS 31.040.10 Will supersede EN 60115-1:2011 and all of its
amendments and corrigenda (if any)
English Version
Fixed resistors for use in electronic equipment - Part 1: Generic
specification
(IEC 60115-1:2020 , modified)

Résistances fixes utilisées dans les équipements Festwiderstände zur Verwendung in Geräten der Elektronik

électroniques - Partie 1: Spécification générique - Teil 1: Fachgrundspezifikation

(IEC 60115-1:2020 , modifiée) (IEC 60115-1:2020 , modifiziert)
This draft European Standard is submitted to CENELEC members for enquiry.
Deadline for CENELEC: 2021-02-12.

The text of this draft consists of the text of IEC 60115-1:2020 (40/2662(F)/CDV).

If this draft becomes a European Standard, CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which

stipulate the conditions for giving this European Standard the status of a national standard without any alteration.

This draft European Standard was established by CENELEC in three official versions (English, French, German).

A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to

the CEN-CENELEC Management Centre has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,

Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the

Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,

Turkey and the United Kingdom.

Recipients of this draft are invited to submit, with their comments, notification of any relevant patent rights of which they are aware and to

provide supporting documentation.

Warning : This document is not a European Standard. It is distributed for review and comments. It is subject to change without notice and

shall not be referred to as a European Standard.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels

© 2020 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.

Project: 69910 Ref. No. prEN 60115-1 E
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oSIST prEN 60115-1:2021
prEN 60115-1:2020 (E)
Contents

European foreword ............................................................................................................. 3

1 Modification to the Introduction ................................................................................. 5

2 Modification to Clause 1 .............................................................................................. 5

3 Modification to Clause 2 .............................................................................................. 5

4 Modification to Annex B .............................................................................................. 5

5 Modification of Annex C .............................................................................................. 7

6 Modification of Annex Q .............................................................................................10

7 Modification of Annex R .............................................................................................10

8 Modification of Annex X .............................................................................................10

9 Addition of a new Annex ZA ......................................................................................11

10 Addition of a new Annex ZX ......................................................................................14

11 Modification of the Bibliography ...............................................................................19

Bibliography .......................................................................................................................20

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oSIST prEN 60115-1:2021
prEN 60115-1:2020 (E)
European foreword

This document (prEN 60115-1:2020) consists of the text of IEC 60115-1:2020 prepared by IEC/TC 40,

“Capacitors and resistors for electronic equipment”, together with the common modifications prepared

by the CLC TC/40XB, “Resistors”.
This document is currently submitted to the enquiry.
The following dates are proposed:
• latest date by which the existence of this document (doa) dor + 6 months
has to be announced at national level
• latest date by which this document has to be (dop) dor + 12 months
implemented at national level by publication of an
identical national standard or by endorsement
• latest date by which the national standards (dow) dor + 36 months
conflicting with this document have to be withdrawn (to be confirmed or
modified when voting)
This document will supersede EN 60115-1:2011 + A11:2015.

Clauses, subclauses, annexes, notes, tables and figures which are additional to those in

IEC 60115-1:2020 are prefixed “Z”.

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent

rights.
Preceding documents on the subject covered by this specification have been:
— EN 60115-1:2001 + A1:2001 + A11:2007
— EN 140000:1993-12
— CECC 40 000:1973-00, 1979-00.

This edition contains the following significant technical changes with respect to the previous edition:

a) this edition employs a new document structure, where the tests of prior Clause 4 are given in

Clauses 6 to 12 now, with an informative Annex ZX providing cross-references for references

to the prior revision of this standard;

b) the terms and definitions have been revised and amended, supplemented by a new section on

resistor technologies and a new section on product classification levels;

c) a new Subclause 4.7 on recommendations for permissible substitutions has been added;

d) the provisions for packaging, storage and transportation in Subclauses 4.8, 4.9 and 4.10 have

been completely revised;

e) a new Subclause 5.3 on default tolerances for the most common test parameters has been

added;

f) the generic method of measuring resistance, now Sublause 5.6, has been separated from the

test for compliance with a prescribed resistance value in 6.1, as a revision of the prior 4.5;

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g) the test for the temperature coefficient of resistance of Subclause 6.2 is a revision of the prior

test 4.8, variation of resistance with temperature, where the special concessions for resistors

below 10 Ω have been waived;

h) the single-pulse high-voltage overload test of Subclause 8.2 (prior 4.27) has been completely

revised;

i) the periodic-pulse high-voltage overload test of Subclause 8.3 (prior 4.28) has been revised and

a corrected table of severities provided;

j) the period-pulse overload test of Subclause 8.4 (prior 4.39) has been deprecated and

streamlined to only offer the severity historically applied in subordinate specifications;

k) the Subclauses 9.1 on visual inspection, 9.2 on the gauging of dimensions, and 9.3 on the

assessment of detail dimensions (all parts of prior 4.4) have been completely revised;

l) the tests for robustness of terminations (prior 4.16) have been revised and separated into tests

for the robustness of solderable terminations, Subclause 9.5, and tests for the robustness of

threaded stud or screw terminations, Subclause 9.6;

m) the bump test of Subclause 9.9 (prior 4.20) and the shock test of Subclause 9.10 (prior 4.21)

have been revised to reflect the merged relevant test standard EN 60068-2-29;

n) the accelerated damp heat, steady-state test of Subclause 10.5 (prior 4.37) has been amended

with an option for a reduced number of bias voltages;

o) the corrosion test of Subclause 10.6 has been completely revised in order to employ the better

suitable test method of EN 60068-2-52 instead of the prior used EN 60068-2-11;

p) the whisker growth test of 10.7 has been revised to reflect the changes of the new revision of

the test methods of EN IEC 60068-2-82;

q) the test methods for solderability of Subclause 11.1 (prior 4.17) and for resistance to soldering

heat of Subclause 11.2 (prior 4.18) have been completely revised to incorporate the necessary

option for the variety of lead-bearing and lead-free solder alloys and respective process

conditions;

r) the solvent resistance test of 11.3 combines the prior tests 4.29, component solvent resistance,

and 4.30, solvent resistance of marking, in one test;

s) the accidental overload test of Subclause 12.3 (prior 4.26) has been completely revised.

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oSIST prEN 60115-1:2021
prEN 60115-1:2020 (E)
1 Modification to the Introduction

The introduction shall be amended with the insertion of a new paragraph after the existing first

paragraph:

The explanation given in this introduction uses IEC documents as examples. Anyhow, the same

principles apply in unison to respective documents with EN or EN IEC prefix.
2 Modification to Clause 1
The first paragraph of the scope shall be modified to read:

This part of EN 60115 is a generic specification and is applicable to fixed resistors for use in electronic

equipment.
3 Modification to Clause 2

In the clause on normative references, insert the following new paragraph after the existing first

paragraph:

The readers of this European Standard are advised of the corresponding European documents listed in

the normative Annex ZA, which take precedence over the International Standards listed in this Clause.

This precedence also applies to all informative and normative references made within this document.

4 Modification to Annex B

The rules for the preparation of detail specifications for resistors and capacitors for electronic equipment

for use within the IECQ system, provided in Annex B, shall be modified as presented on the next page:

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prEN 60115-1:2020 (E)
Annex B
(normative)
Rules for the preparation of detail specifications for resistors
and capacitors for electronic equipment for use within the IECQ system

B.1 The drafting of a complete detail specification, in line with the ruling of the CEN/CENELEC Internal

Regulations, shall begin only when all the following conditions have been met:
a) the generic specification has been approved;

b) the sectional specification, if appropriate, has been circulated for approval according to the relevant

system rules (e.g. FDIS, or unanimously approved CDV, at IEC);

c) the associated blank detail specification has been circulated for approval according to the relevant

system rules (e.g. FDIS, or unanimously approved CDV, at IEC);

B.2 Detail specifications shall use the standard or preferred values, ratings and characteristics, and

severities for environmental tests, etc. which are given in the appropriate generic or sectional

specifications.

An exception to this rule may only be granted for a specified detail specification, if agreed by the

technical committee.

B.3 The detail specification should not be circulated for approval according to the relevant system

rules (e.g. FDIS, or unanimously approved CDV, at IEC) until the sectional and blank detail

specifications have been approved for publication.
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5 Modification of Annex C

The example of a test record provided in Annex C shall be modified as presented on the following pages:

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oSIST prEN 60115-1:2021
prEN 60115-1:2020 (E)
Annex C
(informative)
Example of a certified test record
Component manufacturer Veriohm Ltd.
Place of manufacture Amper Lane 8, Voltville
Detail specification and issue EN 140401-808:2021
Description of component Fixed low power film surface mount (SMD) resistors,
Rectangular
Current three months period 2021–01–01 – 2021–03–31

This Certified Test Record is a completed and accurate record of the tests carried out in accordance

with the specified procedures.
Manufacturer
Designated Management Representative (T. Rustworthy)
IECQ Certification Body
Supervising Inspector (S. Crutiny)
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oSIST prEN 60115-1:2021
prEN 60115-1:2020 (E)
6 Modification of Annex Q
The header of this annex shall be changed from informative to normative:
Annex Q
(normative)
Quality assessment procedures
7 Modification of Annex R
The header of this annex shall be changed from informative to normative:
Annex R
(normative)
Failure rate level evaluation, determination and qualification
8 Modification of Annex X
The contents of this annex shall be replaced by the following information:

This annex, providing cross references for references to IEC 60115-1:2008, has been deleted from this

document. In lieu thereof, see Annex ZX, which is providing cross references for references to

EN 60115-1:2011 and A11:2015.
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prEN 60115-1:2020 (E)
9 Addition of a new Annex ZA

A new Annex ZA shall be inserted to provide normative information on European publications

corresponding to IEC publications referenced in the text of this specification.
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following documents are referred to in the text in such a way that some or all of their content

constitutes requirements of this document. For dated references, only the edition cited applies. For

undated references, the latest edition of the referenced document (including any amendments)

applies.

NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant

EN/HD applies.

NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:

www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60027 series Letters symbols to be used in electrical - series
technology - Part 1: General
IEC 60050 series International electrotechnical vocabulary – - series
Chapter 00: General index
IEC 60062 - Marking codes for resistors and capacitors EN 60062 -
IEC 60063 - Preferred number series for resistors and EN 60063 -
capacitors
IEC 60068-1 2013 Environmental testing - Part 1: General and EN 60068-1 2014
guidance
IEC 60068-2-1 - Environmental testing - Part 2–1: Tests - EN 60068-2-1 -
Test A: Cold
IEC 60068-2-2 - Environmental testing - Part 2–2: Tests - EN 60068-2-2 -
Test B: Dry heat
IEC 60068-2-6 - Environmental testing - Part 2–6: Tests - EN 60068-2-6 -
Test Fc: Vibration (sinusoidal)
IEC 60068-2-13 - Environmental testing - Part 2–13: Tests - EN 60068-2-13 -
Test M: Low air pressure
IEC 60068-2-14 - Environmental testing - Part 2–14: Tests - EN 60068-2-14 -
Test N: Change of temperature

IEC 60068-2-20 2008 Environmental testing - Part 2–20: Tests - EN 60068-2-20 2008

Test T: Test methods for solderability and
resistance to soldering heat of devices with
leads

IEC 60068-2-21 2006 Environmental testing - Part 2–21: Tests - EN 60068-2-21 2006

Test U: Robustness of terminations and
integral mounting devices

IEC 60068-2-27 2008 Environmental testing - Part 2–27: Tests - EN 60068-2-27 2009

Test Ea and guidance: Shock
IEC 60068-2-30 - Environmental testing - Part 2–30: Tests - EN 60068-2-30 -
Test Db: Damp heat, cyclic (12 h + 12 h
cycle)
IEC 60068-2-45 1980 Basic environmental testing procedures - EN 60068-2-45 1992
AMD 1 1993 Part 2–45: Tests - Test XA and guidance: A1 1993
Immersion in cleaning solvents
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oSIST prEN 60115-1:2021
prEN 60115-1:2020 (E)
IEC 60068-2-47 - Environmental testing - Part 2–47: Test - EN 60068-2-47 -
Mounting of specimens for vibration, impact
and similar dynamic tests
IEC 60068-2-52 - Environmental testing - Part 2–52: Test – EN -
Test Kb: Salt mist, cyclic (sodium chloride IEC 60068-2-52
solution)
IEC 60068-2-58 - Environmental testing - Part 2–58: Tests - EN 60068-2-58 -
Test Td: Test methods for solderability,
resistance to dissolution of metallization
and to soldering heat of surface mounting
devices (SMD)
IEC 60068-2-67 - Environmental testing - Part 2–67: Tests - EN 60068-2-67 -
Test Cy: Damp heat, steady-state,
accelerated test primarily intended for
components
IEC 60068-2-78 - Environmental testing - Part 2–78: Tests - EN 60068-2-78 -
Test Cab: Damp heat, steady-state
IEC 60068-2-82 2019 Environmental testing - Part 2–82: Tests - EN 2019
Test Xw1: Whisker test methods for IEC 60068-2-82
components and parts used in electronic
assemblies
IEC 60195 2016 Method of measurement of current noise EN 60195 2016
generated in fixed resistors
IEC 60286 series Packaging of components for automatic EN 60286 series
handling - Part 1: Tape packaging of
components with axial leads on continuous
tapes
IEC 60294 - Measurement of the dimensions of a EN 60294 -
cylindrical component with axial
terminations
IEC 60440 2012 Method of measurement of nonlinearity in EN 60440 2012
resistors
IEC 60617-DB - Graphical symbols for diagrams - -
IEC 60695-11-5 - Fire hazard testing - Part 11–5: Test flames EN 60695-11-5 -
- Needle-flame test method - Apparatus,
confirmatory test arrangement and
guidance
IEC 61191 series Printed board assemblies - Part 1: Generic EN IEC 61191 series
specification - Requirements for soldered
electrical and electronic assemblies using
surface mount and related assembly
technologies
IEC 61193-2 - Quality assessment systems - Part 2: EN 61193-2 -
Selection and use of sampling plans for
inspection of electronic components and
packages
IEC 61340-3-1 - Electrostatics - Part 3–1: Methods for EN 61340-3-1 -
simulation of electrostatic effects - Human
body model (HBM) electrostatic discharge
test waveforms
IEC 61760-1 - Surface mounting technology - Part 1: EN IEC 61760-1 -
Standard method for the specification of
surface mounting components (SMDs)
IEC 61760-2 - Surface mounting technology - Part 2: EN 61760-2 -
Transportation and storage conditions of
surface mounting devices (SMD) -
Application guide
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IEC 62090 - Product package labels for electronic - -
components using bar code and two-
dimensional symbologies
IEC 62812 2019 Low resistance measurements - Methods EN IEC 62812 2019
and guidance
IEC 80000 series Quantities and units - Part 13: Information EN 80000 series
science and technology
ISO 80000 series Quantities and units – Part 1: General EN ISO 80000 series
IECQ 03-1 2018 IEC Quality Assessment System for - -
Electronic Components (IECQ System) –
Rules of procedure – Part 1: General
Requirements for all IECQ Schemes
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10 Addition of a new Annex ZX

A new Annex ZX shall be inserted to provide informative cross references for references to clauses,

figures or tables of the prior revision of this specification, EN 60115-1:2011 and A11:2015, as presented

on the following pages.
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Annex ZX
(informative)
Cross-references for references to the prior revision of this document

The revision of this generic specification has resulted in changes of the clause and annex numbering,

the figure numbering and the table numbering. The following Table ZX.1 provides cross-references for

all references to specific clauses or annexes of the prior revision of this generic specification.

Table ZX.1 – Cross-references for references to clauses
EN 60115-1:2011 EN 60115-1:2021
+A11:2015 Notes
(IEC 60115-1:2008, mod.) (IEC 60115-1:2020, mod.)
1 — The former Clause 1 is split into Clauses 1 and 2:
1.1 1 — Scope
1.2 2 — Normative references
2 — The former Clause 2 is split into Clauses 3 and 4.
2.1 4.1
2.2 3.1
2.3 4.2
4.4
2.4
4.5
2.5 4.3
2.6 4.8
2.7 4.9
2.8 4.10
Annex Q
4 — The former Clause 4 is split into Clauses 5 to 12.
4.1 5.1
4.2 5.2
4.3 5.4
4.4 — The former Clause 4.4 is split into 9.1 to 9.3:
4.4.1 9.1 — Visual examination;
4.4.2 9.2 — Dimensions (Gauging);
4.4.3 9.3 — Dimensions (Detail)
4.5 — The former Clause 4.5 is split into 5.6 and 6.1:
4.5.1 5.6 — general method of resistance measurement;
4.5.2 6.1 — test for resistance and tolerance.
4.6 12.1
4.7 12.2
The title is changed to: Temperature coefficient of
4.8 6.2
resistance
4.9 6.3 The title is changed to: Inductance
4.10 6.5
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4.11 6.4
4.12 6.6
4.13 8.1 The title is changed to: Short-term overload
4.14 6.7
4.15 9.4
4.16 — The former Clause 4.16 is split into 9.5 and 9.6 for:
4.16.2 9.5.4.2 — tensile test, e.g. for wire terminations;
4.16.3 9.5.4.3 — bending test, e.g. for wire terminations;
4.16.4 9.5.4.4 — torsion test, e.g. for wire terminations;
4.16.5 9.6.4 — resistors with threaded stud or screw terminations.
4.17 11.1 Solderability test for:
4.17.2 a) 11.1.4.4 — resistors for through-hole assembly;
4.17.2 b) 11.1.4.5 — resistors not for assembly on circuit boards;
4.17.2 c) 11.1.4.3 — SMD resistors.
4.18 11.2 Resistance to soldering heat test for:
4.18.2 a) 11.2.4.4 — resistors for through-hole assembly;
4.18.2 b) 11.2.4.5 — resistors not for assembly on circuit boards;
4.18.2 c) 11.2.4.3 — SMD resistors.
4.19 10.1
4.20 9.9
4.21 9.10
4.22 9.11
4.23 10.3
4.24 10.4
4.25 — Endurance tests are given in Clause 7:
4.25.1 7.1 — Endurance at the rated temperature 70 °C;
4.25.2 7.2 — Endurance at room temperature;
4.25.3 7.3 — Endurance at a maximum temperature (e.g. UCT).
4.26 12.3
4.27 8.2
4.28 8.3
4.29
11.3 The solvent resistance tests are merged into 11.3.
4.30
4.31 5.5.2
4.32 9.7
4.33 9.8
4.34 10.6 The corrosion test employs a different test method.
4.35 12.4
4.36 10.2
4.37 10.5
4.38 8.5
This legacy test is presented only with a traditionally
4.39 8.4
applied severity.
4.40 10.7
4.41 10.8
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— — EN 60115-1:2011 does not contain Annexes A, D, E
Annex B Annex B
Annex C — The content of this Annex is merged into 8.3.
Annex F Annex A
Annex G — The overview on tests is given in the table of contents.
Annex Q Annex Q
Annex ZA Annex C
Annex ZR Annex R
Annex ZX Annex ZX

Table ZX.2 provides cross-references for all references to specific figures of the prior revision of this

generic specification.
Table ZX.2 – Cross-references for references to figures
EN 60115-1:2011 EN 60115-1:2020
+A11:2015 Notes
(IEC 60115-1:2008, mod.) (IEC 60115-1:2020, mod.)
Figure 1 Figure 25 The designation is changed to: Parallel clamp fixture
Figure 2 Figure 26 The designation is changed to: V-clamp fixture
Figure 3 Figure 9
Figure 4 Figure 10
Figure 5 Figure 19
Figure 6 Figure 12
Figure 7 Figure 13
Figure 8 Figure 14
Figure 9 Figure 15
Figure 10 Figure 27
Figure 11 Figure 17
Figure 12 Figure 18
Figure C.1
— The subject is covered in 8.3.4.1.
Figure C.2
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oSIST prEN 60115-1:2021
prEN 60115-1:2020 (E)

Table ZX.3 provides cross-references for all references to specific tables of the prior revision of this

generic specification.
Table ZX.3 – Cross reference for references to tables
EN 60115-1:2011 EN 60115-1:2020
+A11:2015 Notes
(IEC 60115-1:2008, mod.) (IEC 60115-1:2020, mod.)
Table 1 Table 2
Table 2 Table 9
Table 3
— The subject is covered in 6.2.5.
Table 4
Table 5 Table 13
Table 6 Table 14
Table 7 Table 20
Table 8 Table 11
Table 9 Table 12
Table 10 — The subject is covered in 8.4.4.
Table ZR.1 Table R.1
Table ZR.2 Table R.2
Table ZR.3 Table R.3
Table ZR.4 Table R.4
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oSIST prEN 60115-1:2021
prEN 60115-1:2020 (E)
11 Modification of the Bibliography

The Bibliography shall be modified for presentation of European Standards, where applicable, as

presented on the following pages.
---------------------- Page: 21 ----------------------
oSIST prEN 60115-1:2021
prEN 60115-1:2020 (E)
Bibliography

EN 60060-1, High-voltage test techniques - Part 1: General definitions and test requirements

EN 60068-2-11, Environmental testing - Part 2: Tests - Test Ka: Salt mist
EN 60068-2-29, Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
1)
(IEC 60068-2-29)

EN 60068-2-69, Environmental testing - Part 2-69: Tests - Test Te/Tc: Solderability testing of

electronic components and printed boards by the wetting balance (force measurement) method

EN IEC 60068-3-5, Environmental testing - Part 3-5: Supporting documentation and guidance -

Confirmation of the performance of temperature chambers

EN 60068-3-13, Environmental testing - Part 3-13: Supporting documentation and guidance on Test T

- Soldering

EN IEC 60721-3-1, Classification of environmental conditions - Part 3-1: Classification of groups of

environmental parameters and their severities - Storage

EN IEC 60721-3-2, Classification of environmental conditions - Part 3-2: Classification of groups of

environmental parameters and their severities - Transportation and Handling

EN IEC 60749-26, Semiconductor devices - Mechanical and climatic test methods - Part 26:

Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

EN 61000-4-5:2014, Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement

techniques - Surge immunity test

EN IEC 61190-1-3, Attachment materials for electronic assembly - Part 1-3: Requirements for

electronic grade solder alloys and fluxed and non-fluxed solid solder for electronic soldering

applications

EN 61249-2-22, Materials for printed boards and other interconnecting structures - Part 2-22:

Reinforced base materials, clad and unclad - Modified non-halogenated epoxide woven E-glass

laminated sheets of defined flammability (vertical burning test), copper-clad

EN 61249-2-35, Materials for printed boards and other interconnecting structures - Part 2-35:

Reinforced base materials, clad and unclad - Modified epoxide woven E-glass laminate sheets of

defined flammability (vertical burning test), copper-clad for lead-free assembly

IEC/TR 60068-3-12, Environmental testing - Part 3-12: Supporting documentation and guidance -

Method to evaluate a possible lead-free solder reflow temperature profile
IEC 60410, Sampling plans and procedures for inspection by attributes
IEC CA 01, IEC Conformity Assessment Systems – Basic Rules

EN 60068-2-29:1993 has been withdrawn as its contents has been merged into EN 60068-2-27:2009

IEC 60410:1973 has been withdrawn in 2015.
---------------------- Page: 22 ----------------------
oSIST prEN 60115-1:2021
prEN 60115-1:2020 (E)

IEC QC 001002-3, IEC Quality Assessment System for Electronic Components (IECQ) - Rules of

Procedure - Part 3: Approval procedures
, 4)

IECQ 01 IEC Quality Assessment System for Electronic Components (IECQ System) – Basic Rules

IECQ 01-S, IEC Quality Assessment System for Electronic Components (IECQ System) – IECQ

Supplement to Harmonized Basic Rules IEC CA 01

IECQ 03-3, IEC Quality Assessment System for Electronic Components (IECQ System) – Rules of

Procedure – Part 3: IECQ Approved Component Products, Related Materials & Assemblies Scheme

IECQ 03-3-1, IEC Quality Assessment System for Electronic Components (IECQ System) – Rules of

Procedure – Part 3-1: IECQ Approved Component Products, Related Materials & Assemblies

Scheme, IECQ Approved Component – Technology Certification (IECQ AC-TC)
EN ISO 9001, Quality management systems - Requirements (ISO 9001:2015)
ISO 3, Preferred numbers — Series of preferred numbers
ISO 17, Guide to the use of preferred numbers and of series of preferred numbers
ISO 497,
...

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