IEC 62024-1:2017

High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor

IEC 62024-1:2017 specifies electrical characteristics and measuring methods for the nanohenry range chip inductor that is normally used in high frequency (over 100 kHz) range.
This third edition cancels and replaces the second edition published in 2008. This edition constitutes a technical revision.This edition includes the following significant technical changes with respect to the previous edition:
a) addition of voltage-drop method of DC resistance measuring;
b) unification of technical terms.

Composants inductifs à haute fréquence - Caractéristiques électriques et méthodes de mesure - Partie 1 : Inductance pastille de l'ordre du nanohenry

L'IEC 62024-1:2017 spécifie les caractéristiques électriques et les méthodes de mesure pour l'inductance pastille de l'ordre du nanohenry qui est normalement utilisée dans la plage des hautes fréquences (supérieures à 100 kHz).
Cette troisième édition annule et remplace la deuxième édition parue en 2008. Cette édition constitue une révision technique.
Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente:  
ajout de la méthode de chute de tension pour le mesurage de la résistance en courant continu;
harmonisation des termes techniques.

General Information

• Status: Published
• Publication Date: 12-Dec-2017
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 29.100.10 - Magnetic components
• Technical Committee: TC 51 - Magnetic components, ferrite and magnetic powder materials
• Drafting Committee: WG 9 - TC 51/WG 9
• Current Stage: PPUB - Publication issued
• Start Date: 05-Jan-2018
• Completion Date: 13-Dec-2017

Relations

• Revised: IEC 62024-1:2024 - High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
• Effective Date: 05-Sep-2023
• Revises: IEC 62024-1:2008/COR1:2008 - Corrigendum 1 - High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
• Effective Date: 05-Sep-2023
• Revises: IEC 62024-1:2008 - High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 62024-1 ®
Edition 3.0 2017-12
INTERNATIONAL
STANDARD
High frequency inductive components – Electrical characteristics and measuring
methods –
Part 1: Nanohenry range chip inductor

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
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IEC 62024-1 ®
Edition 3.0 2017-12
INTERNATIONAL
STANDARD
High frequency inductive components – Electrical characteristics and measuring

methods –
Part 1: Nanohenry range chip inductor

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 29.100.10 ISBN 978-2-8322-5167-6

– 2 – IEC 62024-1:2017 © IEC 2017
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Inductance, Q-factor and impedance . 6
4.1 Inductance . 6
4.1.1 Measuring method . 6
4.1.2 Measuring circuit . 6
4.1.3 Mounting the inductor for the test . 7
4.1.4 Measuring method and calculation formula . 8
4.1.5 Notes on measurement . 9
4.2 Quality factor . 10
4.2.1 Measuring method . 10
4.2.2 Measuring circuit . 10
4.2.3 Mounting the inductor for test . 10
4.2.4 Measuring methods and calculation formula . 10
4.2.5 Notes on measurement . 11
4.3 Impedance . 11
4.3.1 Measuring method . 11
4.3.2 Measuring circuit . 11
4.3.3 Mounting the inductor for test . 11
4.3.4 Measuring method and calculation . 11
4.3.5 Notes on measurement . 11
5 Resonance frequency . 12
5.1 Self-resonance frequency . 12
5.2 Minimum output method . 12
5.2.1 General . 12
5.2.2 Measuring circuit . 12
5.2.3 Mounting the inductor for test . 12
5.2.4 Measuring method and calculation formula . 13
5.2.5 Note on measurement . 13
5.3 Reflection method . 13
5.3.1 General . 13
5.3.2 Measuring circuit . 14
5.3.3 Mounting the inductor for test . 14
5.3.4 Measuring method . 15
5.3.5 Notes on measurement . 15
5.4 Measurement by analyser . 16
5.4.1 Measurement by impedance analyser . 16
5.4.2 Measurement by network analyser . 16
6 DC resistance . 16
6.1 Voltage-drop method. 16
6.1.1 Measuring circuit . 16
6.1.2 Measuring method and calculation formula . 17
6.2 Bridge method . 17
6.2.1 Measuring circuit . 17

6.2.2 Measuring method and calculation formula . 17
6.3 Notes on measurement . 18
6.4 Measuring temperature . 18
Annex A (normative) Mounting method for a surface mounting coil . 19
A.1 Overview. 19
A.2 Mounting printed-circuit board and mounting land . 19
A.3 Solder . 19
A.4 Preparation . 19
A.5 Pre-heating . 19
A.6 Soldering . 19
A.7 Cleaning . 19

Figure 1 – Example of circuit for vector voltage/current method . 7
Figure 2 – Fixture A . 7
Figure 3 – Fixture B . 8
Figure 4 – Short device shape . 10
Figure 5 – Example of test circuit for the minimum output method . 12
Figure 6 – Self-resonance frequency test board (minimum output method) . 13
Figure 7 – Example of test circuit for the reflection method . 14
Figure 8 – Self-resonance frequency test board (reflection method) . 15
Figure 9 – Suitable test fixture for measuring self-resonance frequency . 16
Figure 10 – Example of test circuit for voltage-drop method . 17
Figure 11 – Example of test circuit for bridge method . 18

Table 1 – Dimensions of l and d . 8
Table 2 – Short device dimensions and inductances . 10

– 4 – IEC 62024-1:2017 © IEC 2017
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
HIGH FREQUENCY INDUCTIVE COMPONENTS –
ELECTRICAL CHARACTERISTICS AND MEASURING METHODS –

Part 1: Nanohenry range chip inductor

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IEC 62024-1 ®
Edition 3.0 2017-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
High frequency inductive components – Electrical characteristics and measuring
methods –
Part 1: Nanohenry range chip inductor

Composants inductifs à haute fréquence – Caractéristiques électriques et
méthodes de mesure –
Partie 1: Inductance pastille de l'ordre du nanohenry

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
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IEC 62024-1 ®
Edition 3.0 2017-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
High frequency inductive components – Electrical characteristics and measuring

methods –
Part 1: Nanohenry range chip inductor

Composants inductifs à haute fréquence – Caractéristiques électriques et

méthodes de mesure –
Partie 1: Inductance pastille de l'ordre du nanohenry

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 29.100.10 ISBN 978-2-8322-1088-0

– 2 – IEC 62024-1:2017 © IEC 2017
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Inductance, Q-factor and impedance . 6
4.1 Inductance . 6
4.1.1 Measuring method . 6
4.1.2 Measuring circuit . 6
4.1.3 Mounting the inductor for the test . 7
4.1.4 Measuring method and calculation formula . 8
4.1.5 Notes on measurement . 9
4.2 Quality factor . 10
4.2.1 Measuring method . 10
4.2.2 Measuring circuit . 10
4.2.3 Mounting the inductor for test . 10
4.2.4 Measuring methods and calculation formula . 10
4.2.5 Notes on measurement . 11
4.3 Impedance . 11
4.3.1 Measuring method . 11
4.3.2 Measuring circuit . 11
4.3.3 Mounting the inductor for test . 11
4.3.4 Measuring method and calculation . 11
4.3.5 Notes on measurement . 11
5 Resonance frequency . 12
5.1 Self-resonance frequency . 12
5.2 Minimum output method . 12
5.2.1 General . 12
5.2.2 Measuring circuit . 12
5.2.3 Mounting the inductor for test . 12
5.2.4 Measuring method and calculation formula . 13
5.2.5 Note on measurement . 13
5.3 Reflection method . 13
5.3.1 General . 13
5.3.2 Measuring circuit . 14
5.3.3 Mounting the inductor for test . 14
5.3.4 Measuring method . 15
5.3.5 Notes on measurement . 15
5.4 Measurement by analyser . 16
5.4.1 Measurement by impedance analyser . 16
5.4.2 Measurement by network analyser . 16
6 DC resistance . 16
6.1 Voltage-drop method. 16
6.1.1 Measuring circuit . 16
6.1.2 Measuring method and calculation formula . 17
6.2 Bridge method . 17
6.2.1 Measuring circuit . 17

6.2.2 Measuring method and calculation formula . 17
6.3 Notes on measurement . 18
6.4 Measuring temperature . 18
Annex A (normative) Mounting method for a surface mounting coil . 19
A.1 Overview. 19
A.2 Mounting printed-circuit board and mounting land . 19
A.3 Solder . 19
A.4 Preparation . 19
A.5 Pre-heating . 19
A.6 Soldering . 19
A.7 Cleaning . 19

Figure 1 – Example of circuit for vector voltage/current method . 7
Figure 2 – Fixture A . 7
Figure 3 – Fixture B . 8
Figure 4 – Short device shape . 10
Figure 5 – Example of test circuit for the minimum output method . 12
Figure 6 – Self-resonance frequency test board (minimum output method) . 13
Figure 7 – Example of test circuit for the reflection method . 14
Figure 8 – Self-resonance frequency test board (reflection method) . 15
Figure 9 – Suitable test fixture for measuring self-resonance frequency . 16
Figure 10 – Example of test circuit for voltage-drop method . 17
Figure 11 – Example of test circuit for bridge method . 18

Table 1 – Dimensions of l and d . 8
Table 2 – Short device dimensions and inductances . 10

– 4 – IEC 62024-1:2017 © IEC 2017
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
HIGH FREQUENCY INDUCTIVE COMPONENTS –
ELECTRICAL CHARACTERISTICS AND MEASURING METHODS –

Part 1: Nanohenry range chip inductor
...