IEC PAS 60512-27-200:2018

Connectors for electrical and electronic equipment - Tests and measurements - Part 27-200: Additional specifications for signal integrity tests up to 2 000 MHz on IEC 60603-7 series connectors - Tests 27a to 27g

IEC/PAS 60512-27-200:2018 covers additional, supplemental specifications for signal integrity and transmission performance test methods of IEC 60512-27-100, for connectors using de-embedded crosstalk measurements, which are specified in respective parts of IEC 60603-7 standards for connecting hardware applications up to 2 000 MHz.
These additional specifications are also applicable for testing the related lower frequency connectors. However, the test methodology specified in the detail specification for any given connector remains the reference conformance test for that connector.
Test procedures of IEC 60512-27-100 affected by these supplemental methods and procedures are:
• insertion loss, test 27a;
• return loss, test 27b;
• near-end crosstalk (NEXT) test 27c;
• far-end crosstalk (FEXT), test 27d;
• transverse conversion loss (TCL), test 27f;
• transverse conversion transfer loss (TCTL), test 27g.
Other test procedures referenced here are:
• transfer impedance (ZT), see test procedures in IEC 62153-4-6 or IEC 62153-4-7.
• for coupling attenuation (aC), see test procedures in IEC 62153-4-7 or IEC 62153-4-12.
Keywords: Connector, Signal Integrity

General Information

• Status: Replaced
• Publication Date: 18-Oct-2018
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 31.220.10 - Plug-and-socket devices. Connectors
• Technical Committee: SC 48B - Electrical connectors
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 15-Sep-2022

Relations

• Replaced By: IEC 60512-27-200:2022 - Connectors for electrical and electronic equipment - Tests and measurements - Part 27-200: Additional specifications for signal integrity tests up to 2 000 MHz on IEC 60603-7 series connectors - Tests 27a to 27g
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC PAS 60512-27-200 ®
Edition 1.0 2018-10
PUBLICLY AVAILABLE
SPECIFICATION
PRE-STANDARD
colour
inside
Connectors for electrical and electronic equipment – Tests and measurements –
Part 27-200: Additional specifications for signal integrity tests up to 2 000 MHz on
IEC 60603-7 series connectors – Tests 27a to 27g

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IEC PAS 60512-27-200 ®
Edition 1.0 2018-10
PUBLICLY AVAILABLE
SPECIFICATION
PRE-STANDARD
colour
inside
Connectors for electrical and electronic equipment – Tests and measurements –

Part 27-200: Additional specifications for signal integrity tests up to 2 000 MHz on

IEC 60603-7 series connectors – Tests 27a to 27g

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.220.10 ISBN 978-2-8322-6093-7

– 2 – IEC PAS 60512-27-200:2018 © IEC 2018
CONTENTS
FOREWORD . 8
1 Scope . 10
2 Normative references . 10
3 Terms and definitions . 12
4 Overall test arrangement . 12
4.1 General . 12
4.2 Indirect-reference test fixtures . 12
Annex A (normative) Indirect-reference test fixtures . 13
A.1 General . 13
A.2 Requirements . 13
Annex B (normative) Measurement requirements (general) . 14
B.1 General test configuration . 14
B.2 Termination of a cable DUT to test system . 14
B.2.1 General . 14
B.2.2 Interconnections between the device under test (DUT) and the
calibration plane . 15
B.2.3 Test lead return loss requirements . 15
B.2.4 Ground plane requirements . 18
B.2.5 Network analyzer requirements . 18
B.3 Measurement points and spacing . 18
B.4 Impedance matching terminations . 19
B.4.1 General . 19
B.4.2 Resistor terminations . 19
B.4.3 Termination return loss performance at the calibration plane . 20
B.4.4 Termination TCL performance at the calibration plane . 20
B.4.5 Calibration methods . 20
B.4.6 Two-port calibration of the test system . 21
B.4.7 One-port calibration of the test system . 21
B.5 General calibration plane . 21
B.5.1 General . 21
B.5.2 Calibration references . 22
B.5.3 50 Ω and 100 Ω calibration reference load requirements . 22
B.5.4 Calibration reference load return loss requirement . 23
B.5.5 Typical test equipment performance parameters . 23
Annex C (normative) Cabling and component test procedures using baluns . 24
C.1 Measurement test setup and apparatus. 24
C.1.1 General . 24
C.1.2 Balun terminations . 24
C.1.3 Balun requirements. 24
C.2 Testing of cabling . 26
C.2.1 Cabling DC resistance . 26
C.2.2 Return loss testing of cables and channels . 27
C.2.3 Insertion loss of cables and channels . 29
C.2.4 NEXT loss of cables and channels . 30
C.2.5 FEXT loss of cables and channels . 32
C.2.6 Cable and channel propagation delay . 34

C.2.7 TCL of cables and channels . 34
C.2.8 TCTL of cables and channels . 38
C.2.9 Cable and channel measurement precautions . 40
C.2.10 Screened or shielded cable and channel measurement configurations . 40
C.3 Permanent link test procedures . 40
C.3.1 General . 40
C.3.2 Permanent link measurement configurations . 40
C.3.3 Calibration of permanent link test configurations. . 41
C.3.4 Return loss of permanent links . 41
C.3.5 Insertion loss of permanent link . 42
C.3.6 NEXT loss of permanent link . 42
C.3.7 FEXT loss of permanent link . 43
C.3.8 TCL of permanent link . 44
C.3.9 TCTL of permanent link . 45
C.3.10 Propagation delay of permanent link . 46
C.4 Direct attach measurement procedures . 47
C.4.1 Direct attach test configurations. 47
C.5 Modular cord test procedures . 50
C.5.1 Network analyzer test configuration . 50
C.5.2 Test fixturing for modular cords . 52
C.5.3 Modular cord measurements. . 52
C.6 Connecting hardware testing . 52
C.6.1 General . 52
C.6.2 Connecting hardware measurement configurations . 52
C.6.3 Return loss measurements . 53
C.6.4 Insertion loss measurements . 53
C.6.5 NEXT loss measurements . 54
C.6.6 Test plug characterization . 56
C.6.7 Category 6A measurement reproducibility . 72
C.7 Modular cord test head requirements . 74
C.7.1 General . 74
C.7.2 Modular cord test head NEXT loss . 74
C.7.3 Modular cord test head FEXT loss . 74
C.7.4 Modular cord test head return loss . 75
C.8 Alien crosstalk measurements . 75
C.8.1 Cabling ANEXT loss and AFEXT loss laboratory measurement
procedures . 75
C.8.2 ANEXT loss and AFEXT loss of cable . 77
C.8.3 Connecting Hardware ANEXT loss and AFEXT loss measurements . 79
Annex D (normative) Cabling and component balunless test procedures . 83
D.1 Balunless measurement requirements . 83
D.2 Resistor terminations used with balunless measurement systems . 83
D.3 Calibration methods . 84
D.4 Testing of cables and cabling . 84
D.4.1 Cabling and cable measurement procedures . 84
D.4.2 Cabling and cable DC resistance . 85
D.4.3 Cabling and cable return loss . 85
D.4.4 Insertion loss of cables and channels . 86
D.4.5 NEXT loss of cables and channels . 87

– 4 – IEC PAS 60512-27-200:2018 © IEC 2018
D.4.6 FEXT loss of cables and channels . 87
D.4.7
...