IEC 61058-1:2000/COR1:2009

Corrigendum 1 - Switches for appliances - Part 1: General requirements

Corrigendum 1 - Interrupteurs pour appareils - Partie 1: Règles générales

General Information

• Status: Published
• Publication Date: 27-Jan-2009
• ICS: 29.120.40 - Switches
• Technical Committee: SC 23J - Switches for appliances
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 20-Jul-2016

Relations

• Corrects: IEC 61058-1:2000 - Switches for appliances - Part 1: General requirements
• Effective Date: 05-Sep-2023
• Revised: IEC 61058-1:2016 - Switches for appliances - Part 1: General requirements
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 61058-1
(Third edition – 2000)
Switches for appliances –
Part 1: General requirements
CORRIGENDUM 1
Corrections to IEC 61058-1:2000:

Table 15 – Electrical endurance tests for the different types of electronic switches with
or without electrical contact(s)
Replace Table 15 by the following new table:
January 2009
Table 15 – Electrical endurance tests for the different types of electronic switches with or without electrical contact(s)
Test conditions
Functional test (7.1.17.1) Simulated test (7.1.17.2) Specific test condition of
3)
Type of electronic switch
(Tables 17, 18) end application (7.1.17.3)
Complete Contacts only Complete Contacts only Complete Contacts only
switch switch switch
1)
SSD
TL1 TL3 TL4
without
TC5, TC6, TC8 --- TC5, TC6, TC8 --- TC5, TC6, TC8 ---
electrical
contact(s) TE1, TE3 TE1, TE3 TE1, TE3

a)   Serial contact:
a)   TL1
TL3, TC1, TC4
TC5, TC6, TC8
Serial contact: TE1 to TE3 Serial contact:
TL1 TE1, TE3 TL4
SSD with
2)
TC1, TC4 with TL2 (SSD short-circuited) TC7 with TL4
serial
TC5, TC6, TC8 TC5, TC8
TE1 to TE3 TE1 to TE3
b)   Serial contact:
contact(s)
TE1, TE3 TE1, TE3
b)   TL3
2) 2)
(SSD short-circuited) (SSD short-circuited)
TL3, TC1, TC7
TC5, TC6, TC8
TE1 to TE3
TE1, TE3
2)
(SSD short-circuited)
SSD with
Parallel contact: Parallel contact: Parallel contact:
parallel
TL1 TL3 TL4
TC1, TC4 with TL2 TL3, TC1, TC4 TC7 with TL4
contact(s)
TC5, TC6, TC8 TC5, TC6, TC8 TC5, TC8
TE1 to TE3 TE1 to TE3 TE1 to TE3

TE1, TE3 TE1, TE3 TE1, TE3
(SSD disconnected) (SSD disconnected) (SSD disconnected)

a)   TL1 a)   Serial contact:
TC5, TC6, TC8 TL3, TC1, TC4
Serial contact: TE1, TE3 TE1 to TE3 Serial contact:
2)
TC1, TC4 with TL2 (SSD short-circuited) TC7 with TL4
TE1 to TE3 TE1 to TE3
b)   Serial contact:
b)   TL3
SSD with 2) 2)
(SSD short-circuited) (SSD short-circuited)
TL1 TL4
TL3, TC1, TC7
serial and
TC5, TC6, TC8
TC5, TC6, TC8 TC5, TC8
TE1 to TE3
parallel
TE1, TE3
2)
TE1, TE3 TE1, TE3
contact(s) (SSD short-circuited)
a) and b) Parallel
Parallel contact: Parallel contact:
contact:
TC1, TC4 with TL2 TC7 with TL4
TL3, TC1, TC7
TE1 to TE3 TE1 to TE3
TE1 to TE3
(SSD disconnected) (SSD disconnected)
(SSD disconnected)
January 2009
Table 15 (continued)
TL = type of test load:
TL1 = thermal current or maximum rated resistive current, if no thermal current is declared
TL2 = maximum rated resistive current
TL3 = rated load (7.1.2)
TL4 = declared specific load (7.1.2.5)
TC = type of test condition:
TC1 = increased-voltage test at accelerated speed (17.2.4.1)
TC2 = test at slow speed (17.2.4.2)
TC3 = test at high speed (17.2.4.3)
TC4 = test at accelerated speed (17.2.4.4)
TC5 = manual functional test: 20 times at maximum manual operating speed to perform the full function of the electronic switch (17.2.4.5)
TC6 = test at minimum load (17.2.4.6)
TC7 = test condition according to TC4, number of operating cycles: 1 000 or the declared number of cycles whichever is the lowest (17.2.4.7)
TC8 = full number of operating cycles at accelerated speed (17.2.4.8)
TE = type of evaluation test:
TE1 = functional compliance (17.2.5.1)
TE2 = thermal compliance (17.2.5.2)
TE3 = insulating compliance (17.2.5.3)
1)
SSD = semiconductor switching device.
2)
The short circuit shall be performed in a way to allow the terminals and contacts and other parts designed for the maximum rated current to be loaded with the maximum rated
current.
3)
For combinations of SSD and mechanical contacts, where the function of the SSD and the mechanical contacts are independent of each other, the requirements of this part of
IEC 61058 apply for the mechanical contacts.
a/b) Testing shall be completed using either method “a” or method “b”. The same method shall be used for both complete switch and the contacts only testing.
Testing with series and parallel contacts, the parallel contact test is added to either method “a” or “b”. Testing to both method “a” and method “b” is not required.

January 2009
17.2.4.8 Endurance test (TC8)
Replace the text of this subclause by the following:
Full number of operating cycles, the electrical conditions are those specified in table 15, at
accelerated speed.
Corrections to IEC 61058-1 Amendment 2:2007:
16 Heating
Replace the text
“Replace Subclause 16.2.2 by the following:”
by the following new text:
“Replace items a) to i)in Subclause 16.2.2 by the following:”

23 Abnormal operation and fault conditions for electronic switches
Add the following new text to the end of 23.1.1.2:
23.1.1.2.1 Switches for continuous duty, duty type S1, are loaded for 1 h with the conventional fusing
current for the fuse which in the installation will protect the switch.
For switches for short-time duty, duty type S2, the temperature is measured 2 min after the operation
of the switch.
For switches for intermittent periodic duty, duty type S3, the temperature is measured after steady
state has been reached, or after 4 h, whichever is the shorter time.
The conventional fusing currents to be used for these tests are specified in table 26:
Table 26 – Conventional fusing current versus rated current
Device Rated current Conventional
1)
fusing current
A A
Cord switches Up to and including 16 26
Independently mounted Up to and including 16 26
switches
Over 16 up to and including 32 51
Over 32 up to and including 63 101
1)
The values specified originate from IEC 60269-1.
23.1.1.2.2 Switches for continuous duty, duty type S1, are loaded in such a way that the current
through the switch measures 0,95 times the current with which the protecting device releases after
1 h
January 2009
For switches for short-time duty, duty type S2, the temperature is measured 2 min after the operation
of the switch.
For switches for intermittent periodic duty, duty type S3, the temperature is measured after steady
state has been reached, or after 4 h, whichever is the shorter time.
23.1.1.2.3 The fuses are replaced by links of negligible impedance and shall be loaded in such a
manner that the current through the links shall be 2,1 times the rated current of the fuse.
For switches for continuous duty, duty type S1, the temperature is measured after steady state has
been reached or after 30 min, whichever is the shorter time.
For switches for short-time duty, duty type S2, the temperature is measured 2 min after the operation
of the switch.
For switches for intermittent periodic duty, duty type S3, the temperature is measured after steady
state has been reached, or after 4 h, whichever is the shorter time.
23.1.1.2.4 The electronic cord switches and electronic independently mounted switches are loaded
either as described in 23.1.1.2.3 with incorporated fuse or as described in 23.1.1.2.2 with another
automatic protective device, choosing the test requiring the lowest load.

January 2009
IEC 61058-1
(Troisième édition – 2000)
Interrupteurs pour appareils –
Partie 1: Règles générales
CORRIGENDUM 1
Corrections à la CEI 61058-1:2000:

Tableau 15 – Essais d’endurance électrique pour les différents types d’interrupteurs
électroniques avec ou sans contacts électriques combinés
Remplacer le Tableau 15 par le nouveau tableau suivant :
Janvier 2009
...