IEC PAS 60603-7-3:2004

Connectors for electronic equipment - Part 7-3: Detail specification for 8-way, shielded, free and fixed connectors, for data transmissions with frequencies up to 100 MHz

Covers connectors to be used up to 100 MHz when used with appropriate cables, as specified in IEC 61156 and used in cabling systems laid down in ISO/IEC 11801. These connectors are intermateable, interoperable, and backward compatible with other IEC 60603-7 series connectors.

General Information

• Status: Replaced
• Publication Date: 03-Nov-2004
• ICS: 31.220.10 - Plug-and-socket devices. Connectors
• Technical Committee: SC 48B - Electrical connectors
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 30-Jan-2008

Relations

• Replaced By: IEC 60603-7-3:2008 - Connectors for electronic equipment - Part 7-3: Detail specification for 8-way, shielded, free and fixed connectors, for data transmissions with frequencies up to 100 MHz
• Effective Date: 05-Sep-2023

Standards Content (Sample)

PUBLICLY
IEC
AVAILABLE
PAS 60603-7-3
SPECIFICATION
First edition
Pre-Standard
2004-11
Connectors for electronic equipment –

Part 7-3:
Detail specification for 8-way, shielded,
free and fixed connectors, for data transmissions
with frequencies up to 100 MHz

Reference number
IEC/PAS 60603-7-3:2004(E)
Publication numbering
As from 1 January 1997 all IEC publications are issued with a designation in the
60000 series. For example, IEC 34-1 is now referred to as IEC 60034-1.

Consolidated editions
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edition numbers 1.0, 1.1 and 1.2 refer, respectively, to the base publication, the
base publication incorporating amendment 1 and the base publication incorporating
amendments 1 and 2.
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PUBLICLY
IEC
AVAILABLE
PAS 60603-7-3
SPECIFICATION
First edition
Pre-Standard
2004-11
Connectors for electronic equipment –

Part 7-3:
Detail specification for 8-way, shielded,
free and fixed connectors, for data transmissions
with frequencies up to 100 MHz

© IEC 2004 ⎯ Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: [phone] Telefax: [phone] E-mail: [e-mail] Web: www.iec.ch
PRICE CODE
Commission Electrotechnique Internationale
XC
International Electrotechnical Commission
Международная Электротехническая Комиссия
For price, see current catalogue

– 2 – PAS 60603-7-3 © IEC:2004 (E)

CONTENTS
Page
FOREWORD.6

Clause
1 General .7

1.1 Scope.7

1.2 Normative references .7

2 Technical information .9
2.1 Terminology .9
2.2 Interchangeability levels .9
2.2.1 General .9
2.2.2 Intermateability .9
2.2.3 Backward Compatibility .9
2.2.4 Interoperability.9
2.3 IEC type designation.10
3 Common features and isometric view .11
3.1 Isometric view .11
3.2 Mating information for connectors with cables attached .11
3.2.1 General .11
3.2.2 Contacts .12
3.2.3 Fixed connector .14
3.2.4 Free connector (contacts not shown) .17
4 Cable terminations and internal connections – Fixed and free connectors .19
4.1 General .19
4.2 Termination Types .19
4.2.1 Solder terminations .19
4.2.2 Insulation displacement terminations .19
4.2.3 Crimp terminations.19
4.2.4 Insulation piercing terminations .19
4.2.5 Press-in connections (compliant pin (UC)) .19
4.2.6 Spring-clamp terminations.19
4.2.7 Other types.19
5 Gauges .20

5.1 Fixed connectors .20
5.2 Free connectors .22
6 Characteristics .25
6.1 General .25
6.2 Pin and pair grouping assignment. .25
6.3 Classification into climatic category.25
6.4 Electrical .26
6.4.1 Creepage and clearance distances.26
6.4.2 Voltage proof .26
6.4.3 Current-carrying capacity .26
6.4.4 Mating cycles with power applied .27
6.4.5 Initial contact resistance between separable fixed and free
connectors.27

PAS 60603-7-3 © IEC:2004 (E) – 3 –

6.4.6 Input to output d.c. resistance .27

6.4.7 Input to output d.c. resistance unbalance.28

6.4.8 Insulation resistance .28

6.4.9 Transfer impedance .28

6.5 Transmission characteristics.28

6.5.1 General .28

6.5.2 Insertion loss .28

6.5.3 Return loss .29

6.5.4 Propagation delay .29

6.5.5 Delay skew .29

6.5.6 NEXT loss .29
6.5.7 Power sum NEXT loss (for information only) .29
6.5.8 FEXT Loss.29
6.5.9 Power sum FEXT loss (for information only) .30
6.5.10 Transverse conversion loss .30
6.5.11 Coupling attenuation .30
6.6 Mechanical.30
6.6.1 Mechanical operation .30
6.6.2 Effectiveness of connector coupling devices .30
6.6.3 Insertion and withdrawal forces .30
7 Tests and test schedule .31
7.1 General .31
7.2 Arrangement for contact resistance test: .32
7.3 Arrangement for vibration test (test phase CP1) .33
7.4 Test procedures and measuring methods .33
7.5 Preconditioning.34
7.6 Wiring and mounting of specimens.34
7.6.1 Wiring.34
7.6.2 Mounting.34
7.7 Test schedules .34
7.7.1 Basic (minimum) test schedule .34
7.7.2 Full test schedule.34
Annex A (normative) Gauging continuity procedure.41
A.1 Object .41
A.2 Preparation of the specimens.41

A.3 Test method .41
A.4 Final measurements .41
A.5 Description of continuity gauge .42
Annex B (normative) Locking device mechanical operation .44
B.1 Object .44
B.2 Preparation of the specimens.44
B.3 Test method .44
B.4 Final measurements .44
Annex C (normative) Test Plug Requirements .45
C.1 General .45
C.2 De-embedding reference NEXT plug construction.45
C.3 Set-up and calibration.46
C.3.1 Port extension .46

– 4 – PAS 60603-7-3 © IEC:2004 (E)

C.4 De-embedding reference plug NEXT measurement.48

C.5 De-embedding reference NEXT jack construction .48

C.5.1 De-embedding reference NEXT jack selection.48

C.6 De-embedding reference jack NEXT measurement .49

C.7 Test plug construction.49

C.8 Test plug NEXT measurement .49

C.9 Test plug NEXT requirements .51

C.10 Connector NEXT testing .
...