ISO/IEC TR 29123:2007
(Main)Identification Cards — Proximity Cards — Requirements for the enhancement of interoperability
Identification Cards — Proximity Cards — Requirements for the enhancement of interoperability
ISO/IEC TR 29123:2007 defines a series of requirement and tests used to enhance the interoperability of proximity cards (PICC) and proximity coupling devices (PCD) defined in the ISO/IEC 14443 series and tested in accordance with ISO/IEC 10373-6. Conformance to ISO/IEC TR 29123:2007 should increase the chance that the PICCs and PCDs designed to the ISO/IEC 14443 series of standards will be interoperable.
Cartes d'identification — Cartes de proximité — Exigences pour l'amélioration de l'interopérabilité
General Information
Standards Content (Sample)
TECHNICAL ISO/TR
REPORT 29123
First edition
2007-12-15
Identification Cards — Proximity Cards —
Requirements for the enhancement of
interoperability
Cartes d'identification — Cartes de proximité — Exigences pour
l'amélioration de l'interopérabilité
Reference number
ISO/IEC TR 29123:2007(E)
©
ISO 2007
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ISO/IEC TR 29123:2007(E)
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ii © ISO/IEC 2007 – All rights reserved
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ISO/IEC TR 29123:2007(E)
Contents Page
Foreword. vi
Introduction . vii
1 Scope. 1
2 Normative references. 1
3 Terms and definitions. 1
4 Symbols (and abbreviated terms) . 2
5 General Test Requirements and Conditions.2
5.1 Test Environment. 2
5.1.1 Test setup. 2
5.1.2 PICC test apparatus. 2
5.1.3 PCD test apparatus. 3
5.2 Nominal Environment. 3
5.3 Definition of PCD Measurement reference point.3
6 PCD Power Transfer. 3
6.1 PCD Operating Field Strength. 3
6.1.1 Test Description. 3
6.1.2 Conditions . 4
6.1.3 Test report. 4
6.2 Resonant Frequency of PICC (informal only) . 4
7 PCD Communication Signal Interface . 4
7.1 Purpose. 4
7.2 RF Noise and Signal Distortion (informal only). 5
7.3 Load modulation reception test (Type A and B). 5
7.3.1 Test Description. 5
7.3.2 Conditions . 5
7.3.3 Parameters. 5
7.3.4 Pass Criteria. 6
7.4 Modulation Index and Waveform Test (Types A and B) . 6
7.4.1 Test Description. 6
7.4.2 Conditions . 6
7.4.3 Parameters. 6
7.4.4 Pass Criteria. 6
8 PCD Framing and timing tests . 7
8.1 Type A Frame Delay Time – PICC to PCD . 7
8.1.1 Test Description. 7
8.1.2 Conditions . 7
8.1.3 Parameters. 7
8.1.4 Pass Criteria. 7
8.1.5 Remarks. 7
8.2 Type A Frame Delay Time – PCD to PICC . 7
8.2.1 Test Description. 7
8.2.2 Conditions . 7
8.2.3 Parameters. 7
8.2.4 Pass Criteria. 7
8.3 Type B PCD Bit Boundaries. 8
8.3.1 Test Description. 8
8.3.2 Conditions . 8
8.3.3 Parameters. 8
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ISO/IEC TR 29123:2007(E)
8.3.4 Pass Criteria. 8
8.4 Type B PCD Start-of-Frame & End-of-Frame-Timing (SOF & EOF) (Type B only). 8
8.4.1 Test Description. 8
8.4.2 Conditions. 8
8.4.3 Parameters. 8
8.4.4 Pass Criteria. 8
8.5 Type B Extra Guard Time (EGT) PCD to PICC. 8
8.5.1 Test Description. 8
8.5.2 Conditions. 8
8.5.3 Parameters. 9
8.5.4 Pass Criteria. 9
8.6 Type B Extra Guard Time (EGT) PICC to PCD. 9
8.6.1 Test Description. 9
8.6.2 Conditions. 9
8.6.3 Parameters. 9
8.6.4 Pass Criteria. 9
8.7 Timing before PICC Type B Start-of-Frame (TR0 & TR1) . 9
8.7.1 Test Description. 9
8.7.2 Conditions. 9
8.7.3 Parameters. 9
8.7.4 Pass Criteria. 10
8.8 Timing before PCD Type B Start-of-Frame (TR2). 10
8.8.1 Test Description. 10
8.8.2 Conditions. 10
8.8.3 Parameters. 10
8.8.4 Pass Criteria. 10
9 Protocol Activation . 10
9.1 Purpose. 10
9.2 Type A Activation - Handling of Collisions . 10
9.2.1 Test Description. 10
9.2.2 Pass Criteria. 10
9.3 Type A Activation - Handling of RATS (including frame size selection). 11
9.3.1 Test Description. 11
9.3.2 Pass Criteria. 11
9.4 Type A Activation - Handling of PPS . 11
9.4.1 Test Description. 11
9.4.2 Pass Criteria. 11
9.5 Type A Activation - Handling of CID during Activation. 11
9.5.1 Test Description. 11
9.5.2 Pass Criteria. 11
9.6 Type B Activation - Frame Size Selection . 11
9.6.1 Test Description. 11
9.6.2 Pass Criteria. 11
9.7 Type B Activation - Bit Rate Selection. 12
9.7.1 Test Description. 12
9.7.2 Pass Criteria. 12
9.8 Type B Activation - Handling of CID during Activation. 12
9.8.1 Test Description. 12
9.8.2 Pass Criteria. 12
9.9 Handling of the Polling Loop (Type A and B). 12
9.9.1 Test Description. 12
9.9.2 Pass Criteria. 12
9.10 Data Exchange Protocol Tests - Error Detection and Recovery. 12
9.10.1 Test Description. 13
9.10.2 Pass Criteria. 13
9.11 Data Exchange Protocol Tests - Request for Waiting Time Extension . 13
9.11.1 Test Description. 13
9.11.2 Pass Criteria. 13
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ISO/IEC TR 29123:2007(E)
Annex A (informative) Definition of the Test Apparatus . 14
A.1 Definition of the Reference PCD . 14
A.2 Definition of the Reference PICC for load modulation reception test. 14
A.2.1 General. 14
Annex B (informative) Test Tables . 16
B.1 PICC. 16
B.1.1 Type A and B. 16
B.1.2 Type A. 17
B.1.3 Type B. 18
B.2 PCD. 20
B.2.1 Type A and B. 20
B.2.2 Type A. 22
B.2.3 Type B. 24
Bibliography . 26
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ISO/IEC TR 29123:2007(E)
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are members of
ISO or IEC participate in the development of International Standards through technical committees
established by the respective organization to deal with particular fields of technical activity. ISO and IEC
technical committees collaborate in fields of mutual interest. Other international organizations, governmental
and non-governmental, in liaison with ISO and IEC, also take part in the work. In the field of information
technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of the joint technical committee is to prepare International Standards. Draft International
Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication as
an International Standard requires approval by at least 75 % of the national bodies casting a vote.
In exceptional circumstances, the joint technical committee may propose the publication of a Technical Report
of one of the following types:
— type 1, when the required support cannot be obtained for the publication of an International Standard,
despite repeated efforts;
— type 2, when the subject is still under technical development or where for any other reason there is the
future but not immediate possibility of an agreement on an International Standard;
— type 3, when the joint technical committee has collected data of a different kind from that which is
normally published as an International Standard (“state of the art”, for example).
Technical Reports of types 1 and 2 are subject to review within three years of publication, to decide whether
they can be transformed into International Standards. Technical Reports of type 3 do not necessarily have to
be reviewed until the data they provide are considered to be no longer valid or useful.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights.
ISO/IEC TR 29123, which is a Technical Report of type 2, was prepared by Joint Technical Committee
ISO/IEC JTC 1, Information technology, Subcommittee SC 17, Cards and personal identification.
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ISO/IEC TR 29123:2007(E)
Introduction
This Technical Report describes requirements for improving the interoperability of proximity cards systems
compliant with ISO/IEC 14443. It consists of test functionality based on the ISO/IEC 14443 series and the
ISO/IEC 10373-6 test methods standards that may optionally be included in proximity devices in order to
improve testability as defined in Annex B. A number of practical tests are then defined.
The contents of this Technical Report may be incorporated into the Revision of ISO/IEC 10373-6, and
subsequently may be withdrawn after the publication of ISO/IEC 10373-6 (Revision), expected in 2009.
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TECHNICAL REPORT ISO/IEC TR 29123:2007(E)
Identification Cards — Proximity Cards — Requirements for the
enhancement of interoperability
1 Scope
This Technical Report defines a series of requirement and tests used to enhance the interoperability of
Proximity cards (PICC) and Proximity coupling devices (PCD) defined in the ISO/IEC 14443 series and tested
in accordance with ISO/IEC 10373-6.
Conformance to this Technical Report should increase the chance that the PICCs and PCDs designed to the
ISO/IEC 14443 series of standards will be interoperable.
2 Normative references
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
ISO/IEC 10373-6:2001, Identification cards — Test methods — Part 6: Proximity cards
ISO/IEC 14443-1:2000, Identification cards — Contactless integrated circuit(s) cards — Proximity cards —
Part 1: Physical characteristics
ISO/IEC 14443-2:2001, Identification cards — Contactless integrated circuit(s) cards — Proximity cards —
Part 2: Radio frequency power and signal interface
ISO/IEC 14443-3:2001, Identification cards — Contactless integrated circuit(s) cards —Proximity cards —
Part 3: Initialization and anticollision
ISO/IEC 14443-4:2001, Identification cards — Contactless integrated circuit(s) cards — Proximity cards —
Part 4: Transmission protocol
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1
base standard
ISO/IEC 14443, the standard to which the tests refer
3.2
test method
method for testing the characteristics of PICCs and PCDs for the purpose of assessing their conformance with
International Standards
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ISO/IEC TR 29123:2007(E)
4 Symbols (and abbreviated terms)
For the purposes of this document, the following abbreviations apply:
ATS Answer to select
DUT Device under test
EGT Extra guard time
EOF End of frame
etu Elementary time unit
fc Carrier frequency (13,56MHz)
FDT Frame delay time
fs Sub-carrier frequency
H Maximum field strength of the PCD antenna field
max
H
min Minimum field strength of the PCD antenna field
PCD Proximity coupling device
PICC Proximity integrated circuit card
PPS Protocol and parameter selection
RATS Request for answer to select
SOF Start of frame
5 General Test Requirements and Conditions
Tests described in this technical report may be performed in any sequence.
5.1 Test Environment
A proximity card system consists of a PCD and a minimum of one PICC. In order to test either a PCD or PICC,
test apparatus is required in order to fulfill the functionality of the other component.
Annex A defines reference test apparatus in order to undertake testing of a proximity device. A reference PCD
is required in order to test a PICC, A reference PICC is required to test a PCD. These reference devices have
been standardized such that all facilities undertaking the testing defined in this standard can do so in a
consistent manner.
Unless otherwise specified, the tests in this technical report shall be applied to PICCs and PCDs defined in
ISO/IEC 14443.
5.1.1 Test setup
All cables used to connect apparatus in the test setup should be kept as short as possible, for certain critical
cables see the appropriate clause. No metallic objects (or electronic equipment) may be placed within a 30 cm
radius of the test setup wherever fields might be affected. Other electromagnetic sources including PCDs, that
could influence the test results, shall not be present.
5.1.2 PICC test apparatus
The PICC test apparatus shall be as defined in ISO/IEC 10373-6 with additional functionality as required by
further clauses of this document.
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ISO/IEC TR 29123:2007(E)
5.1.3 PCD test apparatus
The PCD test apparatus shall be as defined in ISO/IEC 10373-6 with additional functionality as required by
further clauses of this document.
5.2 Nominal Environment
Unless otherwise specified, to ensure consistent conditions, tests shall be performed within the following
nominal environment:
Table 1 — Nominal Environment
Parameter Value
Temperature Nominal Temperature of
23 °C ± 3 °C (73 °F ± 5 °F)
Relative humidity 40 % to 60 %
5.3 Definition of PCD Measurement reference point
All tests shall be done over a certain set of points within the manufacturer's defined conformity volume.
The PCD manufacturer shall define a Reference Point as the (0,0,0) point for the X,Y,Z axis and plane where
the optimal position on the surface of the PCD for contactless operation is located. When performing tests, all
position references given shall be relative to the Reference Point.
X and Y locations shall be in the same plane as the face of the PCD on which the optimal position is located.
Height Z shall be calculated perpendicular to the face of the PCD on which the optimal position is located such
that:
For height Z = 0 mm: The DUT antenna shall be placed in contact with the Reference Point.
For height Z = n mm: The DUT antenna shall be placed exactly n mm along the main axis.
6 PCD Power Transfer
6.1 PCD Operating Field Strength
The purpose of this test is to check if the PCD meets the field strength requirements, within its defined
conformity volume.
6.1.1 Test Description
The field strength measured under loaded conditions, with the reference PICC, shall be between H and
min, PCD
H recorded for all measurement positions defined within the defined conformity volume.
max, PCD
The measurement device used for this test shall be the Reference PICC for field and power measurements
defin
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