ISO/IEC 16963:2015

Information technology — Digitally recorded media for information interchange and storage — Test method for the estimation of lifetime of optical disks for long-term data storage

ISO/IEC 16963:2015 specifies an accelerated aging test method for estimating the lifetime of the retrievability of information stored on recordable or rewritable optical disks. The method is based on the theoretical assumption that the lifetime of data recorded on an optical disk has a lognormal distribution. Detailed testing is specified for the following formats: DVD-R/RW/RAM disks, +R/+RW disks, CD-R/RW disks and BD recordable / rewritable disks. The testing can be applied to additional optical-disk formats with substitution of the appropriate specifications and can also be updated by committee in the future as required. ISO/IEC 16963:2015 includes: stress conditions (Basic and Rigorous stress-conditions for testing and subsequent analysis using both the Eyring and Arrhenius methods); ambient storage conditions in which the lifetime of data stored on optical disk is estimated (a Controlled storage-condition, 25 °C and 50 % RH, representing full-time air conditioning - the Eyring method is used to estimate the lifetime under this storage condition; and a Harsh storage-condition, 30 °C and 80 % RH, representing the most severe conditions in which users handle and store optical disks - the Arrhenius method is used to estimate the lifetime under this storage condition); a description of the evaluation system; procedures for specimen preparation and data acquisition; definitions and methods used in testing specific disk types; analysis of test results to determine the lifetime of stored data; and a format for reporting the estimated lifetime of stored data. The methodology includes only the effects of temperature and relative humidity. It does not attempt to model degradation due to complex failure mechanism kinetics, nor does it test for exposure to light, corrosive gases, contaminants, handling, or variations in playback subsystems. Disks exposed to these additional sources of stress or higher levels of temperature and relative humidity are expected to experience shorter usable lifetimes.

Technologies de l'information — Supports pour l'échange d'informations et le stockage enregistrés numériquement — Méthode d'essai pour l'estimation de la durée de vie de disques optiques pour le stockage à long terme

General Information

• Status: Withdrawn
• Publication Date: 16-Mar-2015
• Withdrawal Date: 16-Mar-2015
• ICS: 35.220.30 - Optical storage devices
• Technical Committee: ISO/IEC JTC 1/SC 23 - Digitally recorded media for information interchange and storage
• Drafting Committee: ISO/IEC JTC 1/SC 23 - Digitally recorded media for information interchange and storage
• Parallel Committee: ISO/TC 42 - Photography
• Current Stage: 9599 - Withdrawal of International Standard
• Completion Date: 25-Jul-2017

Relations

• Revised: ISO/IEC 16963:2017 - Information technology — Digitally recorded media for information interchange and storage — Test method for the estimation of lifetime of optical disks for long-term data storage
• Effective Date: 23-Apr-2016
• Revises: ISO/IEC 16963:2011 - Information technology — Digitally recorded media for information interchange and storage — Test method for the estimation of lifetime of optical media for long-term data storage
• Effective Date: 22-Sep-2012

Standards Content (Sample)

INTERNATIONAL ISO/IEC
STANDARD 16963
Second edition
2015-03-15
Information technology — Digitally
recorded media for information
interchange and storage — Test
method for the estimation of lifetime
of optical disks for long-term data
storage
Technologies de l’information — Supports pour l’échange
d’informations et le stockage enregistrés numériquement — Méthode
d’essai pour l’estimation de la durée de vie de disques optiques pour le
stockage à long terme
Reference number
ISO/IEC 16963:2015(E)
©
ISO/IEC 2015

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ISO/IEC 16963:2015(E)

COPYRIGHT PROTECTED DOCUMENT
© ISO/IEC 2015
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form
or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior
written permission. Permission can be requested from either ISO at the address below or ISO’s member body in the country of
the requester.
ISO copyright office
Case postale 56 • CH-1211 Geneva 20
Tel. + 41 22 749 01 11
Fax + 41 22 749 09 47
E-mail [e-mail]
Web www.iso.org
Published in Switzerland
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ISO/IEC 16963:2015(E)

Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Conformance . 1
3 Normative references . 2
4 Terms and definitions . 3
5 Conventions and notations . 4
5.1 Representation of numbers . 4
5.2 Variables . 4
5.3 Names . 4
6 List of acronyms . 4
7 Measurements . 5
7.1 Summary . 5
7.2 Test specimen . 7
7.3 Recording conditions . 8
7.4 Playback conditions . 8
7.5 Disk testing locations . 9
8 Accelerated stress test . 9
8.1 General . 9
8.2 Stress conditions . 9
8.3 Measuring-time intervals .12
8.4 Design of stress conditions .12
8.5 Disk orientation .13
9 Lifetime estimation.13
9.1 Time-to-failure .13
9.2 Accelerated-aging test methods .14
9.3 Data analysis and judgment of effectiveness .14
9.4 Result of estimated disk life .15
Annex A (normative) Outline of Disk-life estimation method and data-analysis steps .16
Annex B (normative) Disk-life estimation for Controlled storage-condition (Eyring method) .24
Annex C (normative) Disk-life estimation for Harsh storage-condition (Arrhenius method) .39
Annex D (normative) Alternative non destructive stress condition .44
Annex E (informative) Interval estimation for B Life using maximum likelihood .46
5
Annex F (informative) RSER measurement of BD disks.52
Bibliography .53
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ISO/IEC 16963:2015(E)

Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are
members of ISO or IEC participate in the development of International Standards through technical
committees established by the respective organization to deal with particular fields of technical
activity. ISO and IEC technical committees collaborate in fields of mutual interest. Other international
organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in the
work. In the field of information technology, ISO and IEC have established a joint technical committee,
ISO/IEC JTC 1.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for
the different types of document should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject
of patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights.
Details of any patent rights identified during the development of the document will be in the Introduction
and/or on the ISO list of patent declarations received (see www.iso.org/patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation on the meaning of ISO specific terms and expressions related to conformity
assessment, as well as information about ISO’s adherence to the WTO principles in the Technical Barriers
to Trade (TBT) see the following URL: Foreword - Supplementary information
The committee responsible for this document is ISO/IEC JTC 1, Information technology, SC 23, Digitally
recorded media for information interchange and storage.
This second edition cancels and replaces the first edition (ISO/IEC 16963:2011), which has been
technically revised.
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ISO/IEC 16963:2015(E)

Introduction
Markets and industry have developed a common understanding that the property referred to as the
lifetime of data recorded to optical disks plays an increasingly important role in many applications.
Disparate standardized test methodologies exist for Magneto-Optical disks vs recordable compact disks
and DVD systems. The first edition of this International Standard provided a common methodology
applicable for various purposes that included lifetime testing of then available writable CD and DVD
optical disks.
ISO/IEC JTC 1/SC 23/JWG 1, which is a Joint working group comprising ISO/TC 42, ISO/TC 171/SC 1 and
ISO/IEC JTC 1/SC 23, initiated work on this subject and developed initial drafts with assistance from
Ecma International TC 31.
After the issuance of the first edition of this International Standard, ISO/IEC standards for the physical
formats of BD Recordable and Rewritable disks were published. Accordingly, ISO/IEC JTC 1/SC 23/JWG 1
started work again to include testing of writable BD optical disks in this second edition of the International
Standard. Additional details for lifetime estimation are also incorporated.
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INTERNATIONAL STANDARD ISO/IEC 16963:2015(E)
Information technology — Digitally recorded media for
information interchange and storage — Test method for
the estimation of lifetime of optical disks for long-term
data storage
1 Scope
This International Standard specifies an accelerated aging test method for estimating the lifetime of the
retrievability of information stored on recordable or rewritable optical disks.
The method is based on the theoretical assumption that the lifetime of data recorded on an optical disk
has a lognormal distribution.
Detailed testing is specified for the following formats: DVD-R/RW/RAM disks, +R/+RW disks, CD-R/RW
disks and BD recordable / rewritable disks. The testing can be applied to additional optical-disk formats
with substitution of the appropriate specifications and can also be updated by committee in the future
as required.
This International Standard includes:
— stress conditions
— Basic and Rigorous stress-conditions for testing and subsequent analysis using both the Eyring
and Arrhenius methods;
— ambient storage conditions in which the lifetime of data stored on optical disk is estimated
— a Controlled storage-condition, 25 °C and 50 % RH, representing full-time air conditioning. The
Eyring method is used to estimate the lifetime under this storage condition;
— a Harsh storage-condition, 30 °C and 80 % RH, representing the most severe conditions in which
users handle and store optical disks. The Arrhenius method is used to estimate the lifetime
under this storage condition;
— a description of the evaluation system;
— procedures for specimen preparation and data acquisition;
— definitions and methods used in testing specific disk types;
— analysis of test results to determine the lifetime of stored data;
— a format for reporting the estimated lifetime of stored data.
The methodology includes only the effects of temperature and relative humidity. It does not attempt
to model degradation due to complex failure mechanism kinetics, nor does it test for exposure to light,
corrosive gases, contaminants, handling, or variations in playback subsystems. Disks exposed to these
additional sources of stress or higher levels of temperature and relative humidity are expected to
experience shorter usable lifetimes.
2 Conformance
A disk tested by this methodology shall conform to all normative references specific to that disk format.
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ISO/IEC 16963:2015(E)

3 Normative references
The following referenced documents in whole or in part, are normatively referenced in this document
and are indispensable for the application of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including any
amendments) applies.
ISO/IEC 10149, Information technology — Data interchange on read-only 120 mm optical data disks (CD-
ROM)
ISO/IEC 16448, Information technology — 120 mm DVD — Read-only disk
ISO/IEC 16449, Information technology — 80 mm DVD — Read-only disk
ISO/IEC 17592, Information technology — 120 mm (4,7 Gbytes per side) and 80 mm (1,46 Gbytes per side)
DVD rewritable disk (DVD-RAM)
ISO/IEC 17342, Information technology — 80 mm (1,46 Gbytes per side) and 120 mm (4,70 Gbytes per side)
DVD re-recordable disk (DVD-RW)
ISO/IEC 23912, Information technology — 80 mm (1,46 Gbytes per side) and 120 mm (4,70 Gbytes per side)
DVD Recordable Disk (DVD-R)
ISO/IEC 12862, Information technology — 120 mm (8,54 Gbytes per side) and 80 mm (2,66 Gbytes per side)
DVD recordable disk for dual layer (DVD-R for DL)
ISO/IEC 13170, Information technology — 120 mm (8,54 Gbytes per side) and 80 mm (2,66 Gbytes per side)
DVD re-recordable disk for dual layer (DVD-RW for DL)
ISO/IEC 25434, Information technology — Data interchange on 120 mm and 80 mm optical disk using +R
DL format — Capacity: 8,55 Gbytes and 2,66 Gbytes per side (recording speed up to 16X)
ISO/IEC 17344, Information technology — Data interchange on 120 mm and 80 mm optical disk using +R
format — Capacity: 4,7 Gbytes and 1,46 Gbytes per side (recording speed up to 16X)
ISO/IEC 17341, Information technology — Data interchange on 120 mm and 80 mm optical disk using +RW
format — Capacity: 4,7 Gbytes and 1,46 Gbytes per side (recording speed up to 4X)
ISO/IEC 26925, Information technology — Data interchange on 120 mm and 80 mm optical disk using +RW
HS format — Capacity: 4,7 Gbytes and 1,46 Gbytes per side (recording speed 8X)
ISO/IEC 29642, Information technology — Data interchange on 120 mm and 80 mm optical disk using +RW
DL format — Capacity: 8,55 Gbytes and 2,66 Gbytes per side (recording speed 2,4X)
ISO/IEC 30190, Information technology — Digitally recorded media for information interchange and
storage — 120 mm Single Layer (25,0 Gbytes per disk) and Dual Layer (50,0 Gbytes per disk) BD Recordable
disk
ISO/IEC 30191, Information technology — Digitally recorded media for information interchange and
storage — 120 mm Triple Layer (100,0 Gbytes per disk) and Quadruple Layer (128,0 Gbytes per disk) BD
Recordable disk
ISO/IEC 30192, Information technology — Digitally recorded media for information interchange and
storage — 120 mm Single Layer (25,0 Gbytes per disk) and Dual Layer (50,0 Gbytes per disk) BD Rewritable
disk
ISO/IEC 30193, Information technology — Digitally recorded media for information interchange and
storage — 120 mm Triple Layer (100,0 Gbytes per disk) BD Rewritable disk
ECMA-394, Recordable Compact Disc Systems CD-R Multi-Speed
ECMA-395, Recordable Compact Disc Systems CD-RW Ultra-Speed
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ISO/IEC 16963:2015(E)

4 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
4.1
Arrhenius method
accelerated aging model based on the effects of temperature only
4.2
baseline
analysis of an initial test (e.g. initial data errors) after recording and before exposure to any stress
condition, i.e. measurement at stress time t = 0 hours
4.3
Basic stress-condition
accelerated-aging conditions for estimating the lifetime of data stored on optical disks with a reasonable
amount of time and labour
4.4
B Life
5
5 percentile of the lifetime distribution (i.e. 5 % failure time) or 95 % survival lifetime
4.5
(B Life)
5 L
95 % lower confidence bound of B Life
5
4.6
B Life
50
50 percentile of the lifetime distribution (i.e. 50 % failure time) or 50 % survival lifetime
4.7
Controlled storage-condition
well-controlled storage conditions with full-time air conditioning (25 °C and 50 % RH) which can extend
the lifetime of data stored on optical disks
4.8
Eyring method
accelerated-aging model based on the combined effects of temperature and relative humidity
4.9
data error
measured error on a sample disk before error correction is applied
4.10
Harsh storage-condition
most-severe conditions in which users handle and store the optical disks (30 °C and 80 % RH) under
which the lifetime of data stored on optical disks may be reduced
4.11
incubation
process of enclosing and maintaining controlled test-sample environments
4.12
LDC Block
ECC Block of BDs using Long-Distance Code
[SOURCE: ISO/IEC 30190:2013, 13.6]
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4.13
Maximum Data Error
measured data error anywhere in one of the relevant areas on the disk
Note 1 to entry: For BD Recordable SL/DL disks, BD Recordable TL/QL disks, BD Rewritable SL/DL disks, and BD
Rewritable TL disks, this is the Maximum RSER; for DVD-R/RW disks and +R/+RW disks, this is the Maximum
PI Sum 8; for DVD-RAM disks, this is the Maximum BER and for CD-R/RW disks, this is the Maximum C1 Ave 10.
4.14
retrievability
ability to recover physically-recorded information as recorded
4.15
Rigorous stress-condition
accelerated-aging conditions for estimating the lifetime of data stored on optical disks with higher
confidence
4.16
shelf life
maximum time an unrecorded disk can be stored under specific conditions and still meet the performance
requirements specified
4.17
shelf time
time spent on the shelf
4.18
stress
temperature and relative humidity variables to which the sample is exposed during the incubation (4.11)
sub-intervals
4.19
system
combination of hardware, software, storage medium, and documentation used to record, retrieve, and
reproduce information
5 Conventions and notations
5.1 Representation of numbers
A measured value is rounded off to the least significant digit of the corresponding specified value.
For instance, it follows that a specified value of 1,26 with a positive tolerance of + 0,01 and a negative
tolerance of - 0,02 allows a range of measured values from 1,235 to 1,275.
5.2 Variables
A variable with “^” above the character denotes that its value is obtained by estimation.
5.3 Names
The names of entities having explicitly-defined meanings for the purpose of this document are capitalized.
6 List of acronyms
BER Byte Error Rate
BLER BLock Error Rate
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DL Dual Layer
ECC Error-Correction Code
LDC Long-Distance Code
PI Parity (of the) Inner (code)
QL Quadruple Layer
RH Relative Humidity
NOTE The same meaning as “relative humidity” and used for the unit with %.
RSER Random Symbol Error Rate
SER Symbol Error Rate
SL Single Layer
TL Triple Layer
7 Measurements
7.1 Summary
7.1.1 Stress incubation and measuring
A group of disks shall be measured at four stress conditions for Basic stress-condition testing, or five
stress conditions for Rigorous stress-condition testing, for analysis by the Eyring method. For analysis
by the Arrhenius method, three stress conditions shall be used for Basic stress-condition testing and
four stress conditions shall be used for the Rigorous stress-condition testing.
Each total incubation time is divided into several incubation sub-interval time periods. The purpose of
the sub-intervals is to provide sufficient data points to enable proper fitting of the data to an exponential
curve during analysis. Each disk in each group of disks has its initial data errors measured before
exposure to a stress condition. After each incubation sub-interval, each disk shall be measured for its
data errors again.
A control disk used for monitoring the measurement equipment may also be measured after each
incubation sub-interval.
7.1.2 Assumptions
This International Standard is based on the following assumptions for applicability to the optical disks
to be tested:
— the life-distribution of the disks is appropriately modeled by a statistical distribution,
— the Eyring method can be used to model aging with both stresses involved (temperature and relative
humidity),
— the dominant failure mechanism acting when disks are in use under normal conditions will be the
same as that acting under the stress conditions,
— compatibility of a disk and drive combination can assure the initial recording quality, and will not
otherwise affect the resulting lifetime estimation,
— a hardware and software system needed to read the disk will be available at the time retrieval of the
information is attempted,
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ISO/IEC 16963:2015(E)

— the recorded format will be recognizable and interpretable by the reading software.
7.1.3 Data error
7.1.3.1 General
Data errors shall be measured at disk locations defined in 7.5. For each format, the Maximum Data Error
used to estimate the time-to-failure shall be determined as follows:
BD Recordable SL/DL disks, BD Recordable TL/QL disks, BD Rewritable SL/DL disks and BD Rewritable
TL disks defined in ISO/IEC 30190, ISO/IEC 30191, ISO/IEC 30192 and ISO/IEC 30193, respectively :
Maximum Random SER (Max RSER)
DVD-R disks defined in ISO/IEC 23912 and ISO/IEC 12862, DVD-RW disks defined in ISO/IEC 17342 and
ISO/IEC 13170, +R disks defined in ISO/IEC 25434 and ISO/IEC 17344, and +RW disks defined in
ISO/IEC 17341, ISO/IEC 26925 and ISO/IEC 29642: Maximum PI Sum 8 (Max PI Sum 8),
DVD-RAM disks defined in ISO/IEC 17592: Maximum Byte Error Rate (Max BER),
CD-R/RW disks defined in ECMA-394 and ECMA-395 respectively:
Maximum C1 Ave 10 (Max C1 Ave 10)
7.1.3.2 RSER
Per ISO/IEC 30190, ISO/IEC 30191, ISO/IEC 30192 and ISO/IEC 30193, a Random Symbol Error Rate
(RSER) is defined as the SER where all erroneous bytes contained in burst errors of length ≥ 40 bytes
are not counted, neither in the numerator nor in the denominator of the SER calculation:
N
EE−
()
∑ ab
ii
i=1

N
NE×−75392
∑ b
i
i=1
where
number of all erroneous bytes in LDC Block i;
E
a
i
E number of all erroneous bytes ≥ 40 bytes in LDC Block i;
b
i
N number of LDC Blocks.
RSER shall be averaged over any 10 000 consecutive LDC Blocks with the condition that all Blocks are
recorded either in a continuously-written sequence, or in a discontinuously-written sequence excluding
disk defects.
A burst error is defined as a sequence of bytes where there are not more than two correct bytes between
any two erroneous bytes.
For determining burst errors, the bytes shall be ordered in the same sequence as they were recorded
on the disk. The length of a burst error is defined as the total number of bytes counting from the first
erroneous byte that is preceded by at least three correct bytes to the last erroneous byte that is followed
by at least three correct bytes.
The number of erroneous bytes in a burst is defined as the actual number of bytes in that burst that are
not correct (see example in Figure 1).
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The maximum value of the RSER measured over the area specified in 7.5 (Max RSER) shall not exceed
-3
10 .
xcxc cccc xx xcxc cc xcxc xx xx xcxc cccc .c.c xx
   bursburst t lelengngthth = = 9 9 bybytetes s
nunumbmber er ofof e errorroneouneous s bybytetes s inin bursburst = t = 66
c c = = cocorrrrecect t bybytete, ,  x x = = erroerroneouneous s bybytete
Figure 1 — Example of burst error
7.1.3.3 PI Sum 8
Per ISO/IEC 16448 or ISO/IEC 16449, a row in an ECC block that has at least 1 byte in error constitutes
a PI error. PI Sum 8 is measured over any 8 consecutive ECC blocks. The maximum number of PI errors,
also called Max PI Sum 8, before error correction, measured over the area specified in 7.5 shall not
exceed 280.
7.1.3.4 BER
The number of erroneous symbols shall be measured in any consecutive 32 ECC blocks in the first pass
of the decoder before correction. The BER is the number of erroneous symbols divided by the total
number of symbols included in the 32 consecutive ECC blocks. The maximum value of the BER measured
-3
over the area specified in 7.5 (Max BER) shall not exceed 10 .
7.1.3.5 C1 Ave 10
-2
ISO/IEC 10149 specifies that the BLER averaged over any 10 seconds shall be less than 3×10 . At the
standard (1X) data transfer rate, the total number of blocks per second entering the C1-decoder is 7 350.
Thus, the number of C1 errors per second before error correction which is averaged over any 10 seconds
is called C1 Ave 10. The maximum value measured over the area specified in 7.5 (Max C1 Ave 10) shall
not exceed 220.
7.1.4 Data quality
Data quality is checked by plotting the median rank of the estimated time to failure values with a best-fit
line for each stress condition. The lines are then checked for reasonable parallelism.
7.1.5 Regression
The log predicted time-to-failure values shall be calculated using linear regression.
Multiple linear-regression is used for the Eyring method and linear regression is used for the Arrhenius
method.
7.2 Test specimen
The sample disks shall represent the construction, materials, manufacturing process, quality and
variation of the final process output.
Consideration shall be made for shelf life. Longer shelf time of optical disks before recording and testing
may impact test results. Shelf time shall be representative of normal usage.
NOTE In case the support of disk manufacturer is available, it is recommended to use the disks gathered from
as many production lots as possible.
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7.3 Recording conditions
7.3.1 General
Before disks are entered into accelerated-aging tests, they shall be recorded as optimally as is practicable
according to the descriptions given in the related standard. OPC (Optimum Power Control) during the
writing process shall serve as the method to achieve minimum data errors. It is generally assumed
that optimally-recorded disks will yield the longest estimated-lifetime. Disks are deemed acceptable for
entry into the aging tests when their data errors and all other disk parameters are found to be within
their respective standard’s specification limits.
The choice of recording hardware is at the discretion of the recording party. It may be based either on a
commercial drive or a specialty recording tester. It shall be capable of producing recordings that meet
all specifications.
The recording speed used for testing shall be reported.
NOTE It is expected that the lifetime of data on a disk may be affected by recording conditions including
recording speed.
7.3.2 Recording test environment
When performing recordings, the air immediately surrounding the disk shall have the following
properties:
temperature: 23 °C to 35 °C
relative humidity: 45 % to 55 %
atmospheric pressure: 60 kPa to 106 kPa
No condensation on the disk shall occur. Before testing, the disk shall be conditioned in this environment
for 48 hrs minimum. It is recommended that, before testing, the entrance surface be cleaned according
to the instructions of the manufacturer of the disk.
7.4 Playback conditions
7.4.1 Playback tester
Specimen disks shall be read as described i
...