ISO/IEC 14443-4:2008/Amd 1:2012

Identification cards — Contactless integrated circuit cards — Proximity cards — Part 4: Transmission protocol — Amendment 1: Exchange of additional parameters

Cartes d'identification — Cartes à circuit(s) intégré(s) sans contact — Cartes de proximité — Partie 4: Protocole de transmission — Amendement 1: Échange de paramètres additionnels

General Information

• Status: Withdrawn
• Publication Date: 01-Mar-2012
• Withdrawal Date: 01-Mar-2012
• ICS: 35.240.15 - Identification cards. Chip cards. Biometrics
• Technical Committee: ISO/IEC JTC 1/SC 17 - Cards and security devices for personal identification
• Drafting Committee: ISO/IEC JTC 1/SC 17/WG 8 - Integrated circuit cards without contacts
• Current Stage: 9599 - Withdrawal of International Standard
• Completion Date: 27-May-2016

Relations

• Revised: ISO/IEC 14443-4:2016 - Identification cards — Contactless integrated circuit cards — Proximity cards — Part 4: Transmission protocol
• Effective Date: 21-Nov-2015
• Amends: ISO/IEC 14443-4:2008 - Identification cards — Contactless integrated circuit cards — Proximity cards — Part 4: Transmission protocol
• Effective Date: 14-Aug-2021

Standards Content (Sample)

INTERNATIONAL ISO/IEC
STANDARD 14443-4
Second edition
2008-07-15
AMENDMENT 1
2012-03-01


Identification cards — Contactless
integrated circuit cards — Proximity
cards —
Part 4:
Transmission protocol
AMENDMENT 1: Exchange of additional
parameters
Cartes d'identification — Cartes à circuit(s) intégré(s) sans contact —
Cartes de proximité —
Partie 4: Protocole de transmission
AMENDEMENT 1: Échange de paramètres additionnels





Reference number
ISO/IEC 14443-4:2008/Amd.1:2012(E)
©
ISO/IEC 2012

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ISO/IEC 14443-4:2008/Amd.1:2012(E)

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ii © ISO/IEC 2012 – All rights reserved

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ISO/IEC 14443-4:2008/Amd.1:2012(E)
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are members of
ISO or IEC participate in the development of International Standards through technical committees
established by the respective organization to deal with particular fields of technical activity. ISO and IEC
technical committees collaborate in fields of mutual interest. Other international organizations, governmental
and non-governmental, in liaison with ISO and IEC, also take part in the work. In the field of information
technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of the joint technical committee is to prepare International Standards. Draft International
Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication as
an International Standard requires approval by at least 75 % of the national bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights.
Amendment 1 to ISO/IEC 14443-4:2008 was prepared by Joint Technical Committee ISO/IEC JTC 1,
Information technology, Subcommittee SC 17, Cards and personal identification.

© ISO/IEC 2012 – All rights reserved iii

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ISO/IEC 14443-4:2008/Amd.1:2012(E)

Identification cards — Contactless integrated circuit cards —
Proximity cards —
Part 4:
Transmission protocol
AMENDMENT 1: Exchange of additional parameters
Page 14, Clause 7
Following the first list, add the following new paragraph:
“A mechanism is provided in order to introduce additional protocol functions that may be defined from time to
time in this standard or in other standards that use this standard as their foundation.”
Page 15, 7.1.1.1
Replace the third dash with the following:
“
 S-block used to exchange control information between the PCD and the PICC. The support of the
S(PARAMETERS) block is optional for PCDs and PICCs. Three different types of S-blocks are defined:
1) "Waiting time extension" containing a 1 byte long INF field,
2) "DESELECT" containing no INF field,
3) "PARAMETERS" containing a n-byte long INF field with n ≥ 0.
NOTE FSD and FSC should be large enough to contain the expected S(PARAMETERS) blocks.
”
Replace the last paragraph with the following:
“A PICC or PCD setting b6 <> (0)b of an I-block is n
...