ISO/IEC 24789-2:2024

Identification cards — Card service life — Part 2: Methods of evaluation

This document provides methods of evaluation for ID-1 identification card service life for the applications provided in ISO/IEC 24789-1. The listed evaluation methods represent available tests, not mandatory tests. The selection of mandatory tests is listed in ISO/IEC 24789-1.

Cartes d'identification — Durée de vie des cartes — Partie 2: Méthodes d'évaluation

General Information

• Status: Published
• Publication Date: 07-Jan-2024
• ICS: 35.240.15 - Identification cards. Chip cards. Biometrics
• Technical Committee: ISO/IEC JTC 1/SC 17 - Cards and security devices for personal identification
• Drafting Committee: ISO/IEC JTC 1/SC 17 - Cards and security devices for personal identification
• Current Stage: 6060 - International Standard published
• Start Date: 08-Jan-2024
• Due Date: 16-Oct-2023
• Completion Date: 08-Jan-2024

Relations

• Revises: ISO/IEC 24789-2:2011 - Identification cards — Card service life — Part 2: Methods of evaluation
• Effective Date: 06-Jun-2022

Standards Content (Sample)

FINAL
INTERNATIONAL ISO/IEC
DRAFT
STANDARD FDIS
24789-2
ISO/IEC JTC 1/SC 17
Identification cards — Card service
Secretariat: BSI
life —
Voting begins on:
2023-08-17
Part 2:
Voting terminates on:
Methods of evaluation
2023-10-12
Cartes d'identification — Durée de vie des cartes —
Partie 2: Méthodes d'évaluation
RECIPIENTS OF THIS DRAFT ARE INVITED TO
SUBMIT, WITH THEIR COMMENTS, NOTIFICATION
OF ANY RELEVANT PATENT RIGHTS OF WHICH
THEY ARE AWARE AND TO PROVIDE SUPPOR TING
DOCUMENTATION.
IN ADDITION TO THEIR EVALUATION AS
Reference number
BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO-
ISO/IEC FDIS 24789-2:2023(E)
LOGICAL, COMMERCIAL AND USER PURPOSES,
DRAFT INTERNATIONAL STANDARDS MAY ON
OCCASION HAVE TO BE CONSIDERED IN THE
LIGHT OF THEIR POTENTIAL TO BECOME STAN-
DARDS TO WHICH REFERENCE MAY BE MADE IN
NATIONAL REGULATIONS. © ISO/IEC 2023

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ISO/IEC FDIS 24789-2:2023(E)
FINAL
INTERNATIONAL ISO/IEC
DRAFT
STANDARD FDIS
24789-2
ISO/IEC JTC 1/SC 17
Identification cards — Card service
Secretariat: BSI
life —
Voting begins on:
Part 2:
Voting terminates on:
Methods of evaluation
Cartes d'identification — Durée de vie des cartes —
Partie 2: Méthodes d'évaluation
COPYRIGHT PROTECTED DOCUMENT
© ISO/IEC 2023
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
or ISO’s member body in the country of the requester.
RECIPIENTS OF THIS DRAFT ARE INVITED TO
ISO copyright office
SUBMIT, WITH THEIR COMMENTS, NOTIFICATION
OF ANY RELEVANT PATENT RIGHTS OF WHICH
CP 401 • Ch. de Blandonnet 8
THEY ARE AWARE AND TO PROVIDE SUPPOR TING
CH-1214 Vernier, Geneva
DOCUMENTATION.
Phone: [phone]
IN ADDITION TO THEIR EVALUATION AS
Reference number
Email: [e-mail]
BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO­
ISO/IEC FDIS 24789­2:2023(E)
Website: www.iso.org
LOGICAL, COMMERCIAL AND USER PURPOSES,
DRAFT INTERNATIONAL STANDARDS MAY ON
Published in Switzerland
OCCASION HAVE TO BE CONSIDERED IN THE
LIGHT OF THEIR POTENTIAL TO BECOME STAN­
DARDS TO WHICH REFERENCE MAY BE MADE IN
ii
  © ISO/IEC 2023 – All rights reserved
NATIONAL REGULATIONS. © ISO/IEC 2023

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ISO/IEC FDIS 24789-2:2023(E)
Contents Page
Foreword .v
Introduction .vii
1 Scope .1
2 Normative references .1
3 Terms and definitions .2
3.1 Terms and definitions . 2
3.2 Abbreviated terms . 2
4 Default items applicable to the evaluation methods .2
4.1 Test environment . 2
4.2 Pre­conditioning . 2
4.3 Default tolerance . 3
4.4 Total measurement uncertainty .
...

ISO/IEC FDIS 24789-2:2023(E)
ISO / /IEC JTC 1/SC 17/WG 1
Date: 2023-06
Secretariat: BSI
Date: 2023-08-02
Identification cards — Card service life — —
Part 2:
Methods of evaluation
Cartes d'identification — Durée de vie des cartes — —
Partie 2: Méthodes d'évaluation
FDIS stage

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ISO/IEC DISFDIS 24789-2:2023(E)
© ISO 2022/IEC 2023
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this
publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical,
including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can
be requested from either ISO at the address below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: + 41 22 749 01 11
Fax: [phone]
EmailE-mail: [e-mail]
Website: www.iso.orgwww.iso.org
Published in Switzerland

ii © ISO/IEC 2023 – All rights reserved
ii © ISO/IEC 2023 – All rights reserved

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ISO/IEC DISFDIS 24789-2:2023(E)
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are
members of ISO or IEC participate in the development of International Standards through technical
committees established by the respective organization to deal with particular fields of technical activity.
ISO and IEC technical committees collaborate in fields of mutual interest. Other international
organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in the
work.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of document should be noted. This document was drafted in accordance with the editorial
rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directiveswww.iso.org/directives or
www.iec.ch/members_experts/refdocs).
Field Code Changed
Attention is drawnISO and IEC draw attention to the possibility that some of the elementsimplementation
of this document may beinvolve the subjectuse of (a) patent(s). ISO and IEC take no position concerning
the evidence, validity or applicability of any claimed patent rights. in respect thereof. As of the date of
publication of this document, ISO and IEC had not received notice of (a) patent(s) which may be required
to implement this document. However, implementers are cautioned that this may not represent the latest
information, which may be obtained from the patent database available at www.iso.org/patents and
https://patents.iec.ch. ISO and IEC shall not be held responsible for identifying any or all such patent
rights. Details of any patent rights identified during the development of the document will be in the
Introduction and/or on the ISO list of patent declarations received (see www.iso.org/patents) or the IEC
list of patent declarations received (see https://patents.iec.ch).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO's adherence to the World
Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT) see
www.iso.org/iso/foreword.htmlwww.iso.org/iso/foreword.html. In the IEC, see
www.iec.ch/understanding-standardswww.iec.ch/understanding-standards.
This document was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology,
Subcommittee SC 17, Cards and security devices for personal identification.
This second edition cancels and replaces the first edition (ISO/IEC 24789-2:2011), which has been
technically revised.
The main changes are as follows:
— — all methods have been revised to bring them to the latest technical status;
— — additional details are defined in the method ICM adhesion;
— — plasticizer changed from DOP to DOTP;
— — temperature humidity cycling method is replaced by temperature and exposure with humidity
variation;
© ISO/IEC 2023 – All rights reserved iii
© ISO/IEC 2023 – All rights reserved iii

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ISO/IEC DISFDIS 24789-2:2023(E)
— — temperature and humidity aging followed by peel strength is deleted;
— — ID-card static stress method is added;
— — temperature and humidity induced dye migration method is added;
— — mechanical life cycle sequence for contactless cards is added into the informative
Annex A.Annex A.
A list of all pa
...