ISO/IEC 10373-6:2025

Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects

This document defines test methods which are specific to proximity cards and objects, proximity coupling devices and proximity extended devices, defined in ISO/IEC 14443-1, ISO/IEC 14443-2, ISO/IEC 14443-3 and ISO/IEC 14443-4. NOTE Test methods defined in this document are intended to be performed separately. A given proximity card or object, proximity coupling device or proximity extended device, is not required to pass through all the tests sequentially. The conformance test plan defined in Annex O specifies the list of tests required for each part of the ISO/IEC 14443 series.

Cartes et dispositifs de sécurité pour l'identification personnelle — Méthodes d'essai — Partie 6: Objets sans contact de proximité

General Information

• Status: Published
• Publication Date: 12-Feb-2025
• ICS: 35.240.15 - Identification cards. Chip cards. Biometrics
• Technical Committee: ISO/IEC JTC 1/SC 17 - Cards and security devices for personal identification
• Drafting Committee: ISO/IEC JTC 1/SC 17 - Cards and security devices for personal identification
• Current Stage: 6060 - International Standard published
• Start Date: 13-Feb-2025
• Due Date: 13-Feb-2025
• Completion Date: 13-Feb-2025

Relations

• Revises: ISO/IEC 10373-6:2020/Amd 1:2021 - Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects — Amendment 1: Dynamic power level management
• Effective Date: 06-Jun-2022
• Revises: ISO/IEC 10373-6:2020/Amd 2:2020 - Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects — Amendment 2: Enhancements for harmonization
• Effective Date: 06-Jun-2022
• Revises: ISO/IEC 10373-6:2020 - Cards and security devices for personal identification — Test methods — Part 6: Contactless proximity objects
• Effective Date: 06-Jun-2022

Standards Content (Sample)

International
Standard
ISO/IEC 10373-6
Fifth edition
Cards and security devices for
2025-02
personal identification — Test
methods —
Part 6:
Contactless proximity objects
Cartes et dispositifs de sécurité pour l'identification
personnelle — Méthodes d'essai —
Partie 6: Objets sans contact de proximité
Reference number
© ISO/IEC 2025
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
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or ISO’s member body in the country of the requester.
ISO copyright office
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Phone: [phone]
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Website: www.iso.org
Published in Switzerland
© ISO/IEC 2025 – All rights reserved
ii
Contents Page
Foreword .v
1 Scope . 1
2 Normative references . 1
3 Terms, definitions, symbols and abbreviated terms . 1
3.1 Terms and definitions .1
3.2 Symbols and abbreviated terms .2
4 Default items applicable to the test methods . 5
4.1 Test environment .5
4.2 Pre-conditioning .5
4.3 Setup tolerances .5
4.4 Spurious inductance .6
4.5 Measurement uncertainty .6
4.6 DUT position .6
4.7 Test conditions for PCD .6
4.8 Test conditions for PICC .7
5 Apparatus and circuits for test of ISO/IEC 14443-1 and ISO/IEC 14443-2 parameters .10
5.1 Overview .10
5.2 Minimum requirements for measurement instruments — Oscilloscope .10
5.3 Calibration coils .11
5.3.1 General .11
5.3.2 Size of the calibration coil card .11
5.3.3 Thickness and material of the calibration coil card .11
5.3.4 Coil characteristics .11
5.4 Test PCD assemblies . . . 12
5.4.1 General . 12
5.4.2 Test PCD antennas. 13
5.4.3 Sense coils . 13
5.4.4 Mechanical construction of the Test PCD assemblies .14
5.5 Reference PICC and Active Reference PICC . 15
5.5.1 General . 15
5.5.2 Reference PICC. 15
5.5.3 Active Reference PICC .18
5.6 PICC transmission test setup . 20
5.6.1 General description . 20
5.6.2 Phase stability precondition test . 20
5.7 EMD test setup .21
5.7.1 General description .21
5.7.2 Computation of power versus time .21
5.7.3 Noise floor precondition test . . 22
6 Test of ISO/IEC 14443-1 parameters . .22
6.1 PCD test for alternating magnetic fields . 22
6.1.1 Purpose . 22
6.1.2 Procedure . 23
6.1.3 Test report . 23
6.2 PICC test for alternating magnetic fields. 23
6.2.1 Purpose . 23
6.2.2 Apparatus . 23
6.2.3 Procedure .24
6.2.4 Test report .24
6.3 PXD tests .24
7 Test of ISO/IEC 14443-2 parameters .24
7.1 PCD tests .24
7.1.1 PCD field strength . 25

© ISO/IEC 2025 – All rights reserved
iii
7.1.2 Modulation index m and waveform . 26
7.1.3 Phase stability test .27
7.1.4 Load modulation reception for PICC to PCD bit rates of f /128, f /64, f /32 and
c c c
f /16 .27
c
7.1.5 Load modulation reception for PICC to PCD bit rates of f /8, f /4 and f /2 . 34
c c c
7.1.6 PCD EMD immunity test . 35
7.2 PICC tests . 36
7.2.1 PICC transmission . 36
7.2.2 PICC EMD level and low EMD time test . 38
7.2.3 PICC reception . 39
7.2.4 PICC resonance frequency .43
7.2.5 PICC maximum loading effect .43
7.2.6 PICC operating field strength test .45
7.3 Test methods for bit rates of 3f /4, f , 3f /2 and 2f from PCD to PICC .45
c c c c
7.4 PXD tests .45
8 Test of ISO/IEC 14443-3 and ISO/IEC 14443-4 parameters .46
8.1 PCD tests . 46
8.1.1 PCD EMD recovery test .
...