ISO/IEC 15416

Automatic identification and data capture techniques — Bar code print quality test specification — Linear symbols

ISO/IEC 15416:2016: - specifies the methodology for the measurement of specific attributes of bar code symbols; - defines a method for evaluating these measurements and deriving an overall assessment of symbol quality; and - provides information on possible causes of deviation from optimum grades to assist users in taking appropriate corrective action. ISO/IEC 15416:2016 applies to those symbologies for which a reference decode algorithm has been defined, and which are intended to be read using linear scanning methods, but its methodology can be applied partially or wholly to other symbologies.

Techniques automatiques d'identification et de capture des données — Spécifications pour essai de qualité d'impression des codes à barres — Symboles linéaires

General Information

• Status: Not Published
• ICS: 01.080.50 - Graphical symbols for use on information technology and telecommunications technical drawings and in relevant technical product documentation
• ICS: 35.040.50 - Automatic identification and data capture techniques
• Technical Committee: ISO/IEC JTC 1/SC 31 - Automatic identification and data capture techniques
• Drafting Committee: ISO/IEC JTC 1/SC 31 - Automatic identification and data capture techniques
• Current Stage: 6000 - International Standard under publication
• Due Date: 04-Dec-2024
• Completion Date: 04-Dec-2024

Relations

• Revises: ISO/IEC 15416:2016 - Automatic identification and data capture techniques — Bar code print quality test specification — Linear symbols
• Effective Date: 06-Jun-2022

Standards Content (Sample)

International
Standard
Third edition
Automatic identification and data
capture techniques — Bar code
print quality test specification —
Linear symbols
Techniques automatiques d'identification et de capture des
données — Spécifications pour essai de qualité d'impression des
codes à barres — Symboles linéaires
PROOF/ÉPREUVE
Reference number
© ISO/IEC 2024
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: [phone]
Email: [e-mail]
Website: www.iso.org
Published in Switzerland
PROOF/ÉPREUVE
© ISO/IEC 2024 – All rights reserved
ii
Contents Page
Foreword .v
Introduction .vi
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Symbols and abbreviated terms. 3
4.1 Symbols .3
4.2 Abbreviated terms .4
5 Measurement methodology . 4
5.1 General requirements .4
5.2 Reference reflectivity measurements .5
5.2.1 General .5
5.2.2 Measurement light source .5
5.2.3 Measuring aperture .5
5.2.4 Optical geometry . .6
5.2.5 Inspection band .7
5.2.6 Number of scans .8
5.3 Scan reflectance profile .8
5.4 Scan reflectance profile assessment parameters .9
5.4.1 General .9
5.4.2 Element determination .10
5.4.3 Edge determination .10
5.4.4 Decode .10
5.4.5 Symbol contrast .10
5.4.6 Edge contrast .10
5.4.7 Modulation .11
5.4.8 Defects .11
5.4.9 Decodability . . 13
5.4.10 Quiet zone check .14
6 Symbol grading . 14
6.1 General .14
6.2 Scan reflectance profile grading . 15
6.2.1 General . 15
6.2.2 Decode . 15
6.2.3 Reflectance parameter grading . 15
6.2.4 Decodability . .16
6.3 Expression of symbol grade . .16
Annex A (normative) Decodability . 17
Annex B (normative) Threshold calculation algorithm — Algorithm description .18
Annex C (informative) Example of symbol quality grading . 19
Annex D (informative) Substrate characteristics .21
Annex E (informative) Interpretation of the scan reflectance profile and profile grades .24
Annex F (informative) Guidance on selection of light wavelength .27
Annex G (informative) Guidance on number of scans per symbol .28
Annex H (informative) Example of verification report .29
Annex I (informative) Comparison with traditional methodologies .30
Annex J (informative) Process control requirements .33
PROOF/ÉPREUVE
© ISO/IEC 2024 – All rights reserved
iii
Annex K (informative) Description of significant changes in this edition of this document .37
Bibliography .38
PROOF/ÉPREUVE
© ISO/IEC 2024 – All rights reserved
iv
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are
members of ISO or IEC participate in the development of International Standards through technical
committees established by the respective organization to deal with particular fields of technical activity.
ISO and IEC technical committees collaborate in fields of mutual interest. Other international organizations,
governmental and non-governmental, in liaison with ISO and IEC, also take part in the work.
The procedures used to develop this document and those intended for its further maintenance are described
in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the different types
of document should be noted. This document was drafted in accordance with the editorial rules of the ISO/
IEC Directives, Part 2 (see www.iso.org/directives or www.iec.ch/members_experts/refdocs).
ISO and IEC draw attention to the possibility that the implementation of this document may involve the
use of (a) patent(s). ISO and IEC take no position concerning the evidence, validity or applicability of any
claimed patent rights in respect thereof. As of the date of publication of this document, ISO and IEC had not
received notice of (a) patent(s) which may be required to implement this document. However, implementers
are cautioned that this may not represent the latest information, which may be obtained from the patent
database available at www.iso.org/patents and https://patents.iec.ch. ISO and IEC shall not be held
responsible for identifying any or all such patent rights.
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and expressions
related to conformity assessment, as well as information about ISO's adherence to the World Trade
Organization (WTO) principles in the Technical Barriers to Trade (TBT) see www.iso.org/iso/foreword.html.
In the IEC, see www.iec.ch/understanding-standards.
This document was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology,
Subcommittee SC 31, Automatic identification and data capture techniques.
This third edition cancels and replaces the second edition (ISO/IEC 15416:2016), which has been technically
revised.
The main changes are as follows:
— Modified calculation of threshold to find edges within a scan reflectance profile;
— Modified calculation of R and R ;
max min
— Clarified calculation of continuous grades.
Any feedback or questions on this document should be directed to the user’s national standards
body. A complete listing of these bodies can be found at www.iso.org/members.html and
www.iec.ch/national-committees.
PROOF/ÉPREUVE
© ISO/IEC 2024 – All rights reserved
v
Introduction
The technology of bar coding is based on the recognition of patterns encoded in bars and spaces of defined
dimensions according to rules defining the translation of characters into such patterns, known as the
symbology specification.
The bar code symbol is produced in such a way as to be reliably decoded at the point of use, if it is to fulfil its
basic objective as a machine-readable data carrier.
Manufacturers of bar code equipment and the producers and users of bar code symbols therefore require
publicly available standard test specifications for the objective assessment of the quality of bar code symbols,
to which they can refer to when developing eq
...

Formatted
ISO/IEC DIS 15416:2024(Een)
ISO/IEC JTC 1/SC 31
Formatted: French (Switzerland)
Secretariat: ANSI
Automatic identification and data capture techniques — Bar code print quality test
specification — Linear symbols
Formatted: Don't adjust space between Latin and Asian text,
Third edition
Don't adjust space between Asian text and numbers
Date: 2024-03-1811-06 Formatted: Font: Bold, French (Switzerland)

ISO/IEC DIS 15416:2023(E)
© ISO/IEC 2024 Formatted: Font: 10 pt, Font color: Black, French
(Switzerland)
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this
Formatted: Default Paragraph Font, Font: 10 pt, Font color:
Black, French (Switzerland)
publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical,
including photocopying, or posting on the internet or an intranet, without prior written permission. Permission
Formatted: Font: 10 pt, Font color: Black, French
can be requested from either ISO at the address below or ISO's member body in the country of the requester. (Switzerland)
Formatted: Default Paragraph Font, Font: 10 pt, Font color:
ISO Copyright Office
Black, French (Switzerland)
CP 401 • CH-1214 Vernier, Geneva
Formatted: French (Switzerland)
Phone: + 41 22 749 01 11
Formatted: Font: 10 pt, Font color: Black, English (United
Email: [e-mail]
States)
Website: www.iso.org
Formatted: Font: 10 pt, Font color: Black, English (United
Published in Switzerland.
States)
Formatted: Space After: 0 pt, Adjust space between Latin
and Asian text, Adjust space between Asian text and numbers
Formatted: Font: 10 pt, Font color: Black, English (United
States)
Formatted: Font: 10 pt, Font color: Black, English (United
States)
Formatted: Font: 10 pt, Font color: Black, English (United
States)
Formatted: Font: 10 pt, English (United States)
Formatted: Font: 10 pt, Font color: Black
Formatted: Font: 10 pt, English (United States)
Formatted: Font: 10 pt, Font color: Black
Formatted: Font: 10 pt, Font color: Black, English (United
States)
Formatted: Adjust space between Latin and Asian text,
Adjust space between Asian text and numbers
ii © ISO/IEC 2023 – All rights reserved

ISO/IEC DIS 15416:2023(E2024(en)
Formatted: Centered
Contents
Foreword . v
Introduction . vii
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Symbols and abbreviated terms . 3
4.1 Symbols . 3
4.2 Abbreviated terms . 4
5 Measurement methodology . 5
5.1 General requirements. 5
5.2 Reference reflectivity measurements . 5
5.2.1 General . 5
5.2.2 Measurement light source . 6
5.2.3 Measuring aperture . 6
5.2.4 Optical geometry . 6
5.2.5 Inspection band . 8
5.2.6 Number of scans . 10
5.3 Scan reflectance profile . 10
5.4 Scan reflectance profile assessment parameters . 11
5.4.1 General . 11
5.4.2 Element determination . 11
5.4.3 Edge determination . 12
5.4.4 Decode . 12
5.4.5 Symbol contrast . 12
5.4.6 Edge contrast . 12
5.4.7 Modulation . 12
5.4.8 Defects . 13
5.4.9 Decodability . 15
5.4.10 Quiet zone check . 17
6 Symbol grading . 17
6.1 General . 17
6.2 Scan reflectance profile grading . 18
6.2.1 General . 18
6.2.2 Decode . 18
6.2.3 Reflectance parameter grading . 18
Formatted: Font: 9 pt
6.2.4 Decodability . 19
Formatted: Centered, Space After: 24 pt, Line spacing: At
6.3 Expression of symbol grade . 19
least 12 pt
© ISO/IEC 2024 – All rights reserved
iii
© ISO/IEC 2023 – All rights reserved iii

ISO/IEC DIS 15416:2023(E)
Annex A (normative) Decodability . 21
Annex B (normative) Threshold calculation algorithm — Algorithm description . 23
Annex C (informative) Example of symbol quality grading . 24
Annex D (informative) Substrate characteristics . 26
Annex E (informative) Interpretation of the scan reflectance profile and profile grades . 30
Annex F (informative) Guidance on selection of light wavelength . 33
Annex G (informative) Guidance on number of scans per symbol . 34
Annex H (informative) Example of verification report . 35
Annex I (informative) Comparison with traditional methodologies . 36
Annex J (informative) Process control requirements . 39
Annex K (informative) Description of significant changes in this revision . 44
Bibliography . 45
iv © ISO/IEC 2023 – All rights reserved

ISO/IEC DIS 15416:2023(E2024(en)
Formatted: Centered
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical Formatted: Don't adjust space between Latin and Asian text,
Don't adjust space between Asian text and numbers
Commission) form the specialized system for worldwide standardization. National bodies that are members
of ISO or IEC participate in the development of International Standards through technical committees
established by the respective organization to deal with particular fields of technical activity. ISO and IEC
technical committees collaborate in fields of mutual interest. Other international organizations,
governmental and non-governmental, in liaison with ISO and IEC, also take part in the work.
The procedures used to develop this document and those intended for its further maintenance are described
in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the different types
of document should be noted. This document was drafted in accordance with the editorial rules of the
ISO/IEC Directives, Part 2 (see www.iso.org/directives or www.iec.ch/members_experts/refdocs).
ISO and IEC draw attention to the possibility that the implementation of this document may involve the use
of (a) patent(s). ISO and IEC take no position concerning the evidence, validity or applicability of any claimed
patent rights in respect thereof. As of the date of publication of this document, ISO and IEC had not received
notice of (a) patent(s) which may be required to implement this document. However, implementers are
cautioned that this may not represent the latest information, which may be obtained from the patent
database available at www.iso.org/patents and https://patents.iec.ch. ISO and IEC shall not be held
responsible for identifying any or all such patent rights.
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and expressions
related to conformity assessment, as well as information about ISO's adherence to the World Trade
Organization (WTO) principles in the Technical Barriers to Trade (TBT) see
www.iso.org/iso/foreword.html. In the IEC, see www.iec.ch/understanding-standards.
This document was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology,
Subcommittee SC 31, Automatic identification and data capture techniques.
This third edition cancels and replaces the second edition (ISO/IEC 15416:2016), which has been technically
Formatted: Don't adjust space between Latin and Asian text,
revised.
Don't adjust space between Asian text and numbers
Formatted: Font: Cambria
The main changes are as follows:
Formatted: Don't adjust space between Latin and Asian text,
Don't adjust space between Asian text and numbers, Tab
— Modified calculation of threshold to find edges within a scan reflectance profile;
stops: 0.7 cm, Left + 1.4 cm, Left + 2.1 cm, Left + 2.8 cm,
Left + 3.5 cm, Left + 4.2 cm, Left + 4.9 cm, Left + 5.6 cm,
— — Modified calculation of R and R ; Left + 6.3 cm, Left + 7 cm, Left
max min
Formatted: Font: Not Italic
— — Clarified calculation of continuous grades.
Formatted: Font: Not Italic
Formatted: Font: 9 pt
Formatted: Centered, Space After: 24 pt, Line spacing: At
least 12 pt
© ISO/IEC 2024 – All rights reserved
v
© ISO/IEC 2023 – All rights reserved v

ISO/IEC DIS 15416:2023(E)
Any feedback or questions on this document should be directed to the user’s national standards body. A Formatted: Don't adjust space between Latin and Asian text,
Don't adjust space between Asian text and numbers
complete listing of these bodies can be found at www.iso.org/members.html and www.iec.ch/national-
committees.
vi © ISO/IEC 2023 – All rights reserved

ISO/IEC DIS 15416:2023(E2024(en)
Formatted: Centered
Introduction
The technology of bar coding is based on the recognition
...