SIST EN 60512-5-2:2003

Connectors for electronic equipment - Tests and measurements -- Part 5-2: Current-carrying capacity tests - Test 5b: Current-temperature derating

Details a standard test method to assess the current-carrying capacity of electromechanical components (essentially connectors) at elevated ambient temperature.

Steckverbinder für elektronische Einrichtungen - Mess- und Prüfverfahren -- Teil 5-2: Prüfungen der Strombelastbarkeit - Prüfung 5b: Strombelastbarkeit (Derating-Kurve)

Connecteurs pour équipements électroniques - Essais et mesures -- Partie 5-2: Essais de courant limite - Essai 5b: Taux de réduction de l'intensité en fonction de la température

Définit une méthode d'essai normalisée pour évaluer le courant limite des composants électromécaniques (essentiellement des connecteurs) à température ambiante élevée.

Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests - Test 5b: Current-temperature derating (IEC 60512-5-2:2002)

General Information

• Status: Published
• Publication Date: 30-Sep-2003
• ICS: 31.220.10 - Plug-and-socket devices. Connectors
• Technical Committee: SS EIT - Technical Board for the electrotechnical, information technology and telecommunications fields
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 01-Oct-2003
• Due Date: 01-Oct-2003
• Completion Date: 01-Oct-2003
• Ref Project: EN 60512-5-2:2002 - Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests - Test 5b: Current-temperature derating

Overview

EN 60512-5-2:2002 (equivalent to IEC 60512-5-2:2002) defines a standard test method - Test 5b: Current-temperature derating - to assess the current-carrying capacity of electromechanical components (primarily connectors) at elevated ambient temperatures. The standard specifies how to measure temperature rise caused by current, construct a basic current–temperature curve and derive a conservative derating curve for safe operation.

Key topics and requirements

• Purpose: determine how self-heating and ambient temperature limit permissible current for connectors and similar devices.
• Measurement concept: temperature rise Δt = tb − tu, where tb is the hottest-spot temperature and tu is ambient temperature near the specimen.
• Specimen sampling: use three specimens; the mean of their measurements forms the basic curve. At least three points of the basic curve are required.
• Derating: apply a reduction factor (default 0.8 × In) to the basic curve to produce the official derating curve unless a detail specification states otherwise.
• Test stability: at each current level maintain current for about 1 hour after thermal stability is reached - defined as three consecutive Δt values, taken at 5 min intervals, within 2 K.
• Test environment and mounting:
  • Enclosure to minimize air disturbance; non–heat-reflective material; sides ≥200 mm from specimen edges; specimen mounted horizontally 50 mm above enclosure bottom and ≥150 mm below top.
  • If support required, use insulating material with thermal conductivity ≤ 2 W/mK and contact ≤ 20% of specimen surface.
• Wiring: connecting wire lengths inside enclosure per Table 1 (minimum lengths):
  • < 0.5 mm² → 2000 mm
  • 0.5 to 5 mm² → 500 mm

  • 5 mm² → 400 mm

• Temperature measurement: probes near hottest point; ambient probe located 50 mm from midpoint of longest specimen side; thin thermocouples (e.g., ≤0.3 mm) are permitted and may be connected in opposition to measure Δt directly.
• Reporting: specify mounting, wire size/type, upper temperature limit, and any deviations from the standard method.

Applications and users

• Connector manufacturers: validate rated currents and produce current–temperature derating curves used in datasheets.
• Test laboratories and certification bodies: perform standardized thermal/current qualification and compliance testing.
• OEMs and system designers: size wiring and select connectors for expected ambient temperatures and reliability targets.
• Procurement/specification engineers: incorporate derating data into product detail specifications and safety assessments.

Related standards

• IEC/EN 60512 series (connectors - tests and measurements).
• EN 60512-5-2 supersedes earlier Test 5b in IEC 60512-3 (1976); follow national implementation guidance from CENELEC where applicable.

This standard is essential where connector thermal performance, current-carrying capacity, and current-temperature derating affect safety, reliability and system design.

Standards Content (Sample)

STANDARDConnectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests - Test 5b: Current-temperature derating (IEC 60512-5-2:2002)©
Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljenoReferenčna številkaSIST EN 60512-5-2:2003(en)ICS31.220.10

EUROPEAN STANDARDEN 60512-5-2NORME EUROPÉENNEEUROPÄISCHE NORMApril 2002CENELECEuropean Committee for Electrotechnical StandardizationComité Européen de Normalisation ElectrotechniqueEuropäisches Komitee für Elektrotechnische NormungCentral Secretariat: rue de Stassart 35, B - 1050 Brussels© 2002 CENELEC -All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.Ref. No. EN 60512-5-2:2002 EICS 31.220.10English versionConnectors for electronic equipment -Tests and measurementsPart 5-2: Current-carrying capacity tests -Test 5b: Current-temperature derating(IEC 60512-5-2:2002)Connecteurs pour équipementsélectroniques -Essais et mesuresPartie 5-2: Essais de courant limite -Essai 5b: Taux de réduction de l'intensitéen fonction de la température(CEI 60512-5-2:2002)Steckverbinder für elektronischeEinrichtungen -Mess- und PrüfverfahrenTeil 5-2: Prüfungen derStrombelastbarkeit -Prüfung 5b: Strombelastbarkeit(Derating-Kurve)(IEC 60512-5-2:2002)This European Standard was approved by CENELEC on 2002-04-01. CENELEC members are bound tocomply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this EuropeanStandard the status of a national standard without any alteration.Up-to-date lists and bibliographical references concerning such national standards may be obtained onapplication to the Central Secretariat or to any CENELEC member.This European Standard exists in three official versions (English, French, German). A version in any otherlanguage made by translation under the responsibility of a CENELEC member into its own language andnotified to the Central Secretariat has the same status as the official versions.CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands,Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom.

NORMEINTERNATIONALECEIIECINTERNATIONALSTANDARD60512-5-2Première éditionFirst edition2002-02Connecteurs pour équipements électroniques –Essais et mesures –Partie 5-2:Essais de courant limite –Essai 5b: Taux de réduction de l'intensitéen fonction de la températureConnectors for electronic equipment –Tests and measurements –Part 5-2:Current-carrying capacity tests –Test 5b: Current-temperature deratingPour prix, voir catalogue en vigueurFor price, see current catalogue IEC 2002
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Copyright - all rights reservedAucune partie de cette publication ne peut être reproduite niutilisée sous quelque forme que ce soit et par aucun procédé,électronique ou mécanique, y compris la photocopie et lesmicrofilms, sans l'accord écrit de l'éditeur.No part of this publication may be reproduced or utilized in anyform or by any means, electronic or mechanical, includingphotocopying and microfilm, without permission in writing fromthe publisher.International Electrotechnical Commission,
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Web: www.iec.chCODE PRIXPRICE CODEGCommission Electrotechnique InternationaleInternational Electrotechnical Commission

60512-5-2  IEC:2002– 3 –INTERNATIONAL ELECTROTECHNICAL COMMISSION____________CONNECTORS FOR ELECTRONIC EQUIPMENT –TESTS AND MEASUREMENTS –Part 5-2: Current-carrying capacity tests –Test 5b: Current-temperature deratingFOREWORD1)The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprisingall national electrotechnical committees (IEC National Committees). The object of the IEC is to promoteinternational co-operation on all questions concerning standardization in the electrical and electronic fields. Tothis end and in addition to other activities, the IEC publishes International Standards. Their preparation isentrusted to technical committees; any IEC National Committee interested in the subject dealt with mayparticipate in this preparatory work. International, governmental and non-governmental organizations liaisingwith the IEC also participate in this preparation. The IEC collaborates closely with the InternationalOrganization for Standardization (ISO) in accordance with conditions determined by agreement between thetwo organizations.2)The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, aninternational consensus of opinion on the relevant subjects since each technical committee has representationfrom all interested National Committees.3)The documents produced have the form of recommendations for international use and are published in the formof standards, technical specifications, technical reports or guides and they are accepted by the NationalCommittees in that sense.4)In order to promote international unification, IEC National Committees undertake to apply IEC InternationalStandards transparently to the maximum extent possible in their national and regional standards. Anydivergence between the IEC Standard and the corresponding national or regional standard shall be clearlyindicated in the latter.5)The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for anyequipment declared to be in conformity with one of its standards.6)Attention is drawn to the possibility that some of the elements of this International Standard may be the subjectof patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.International Standard IEC 60512-5-2 has been prepared by subcommittee 48B: Connectors,of IEC technical committee 48: Electromechanical components and mechanical structures forelectronic equipment.This standard cancels and replaces test 5b of IEC 60512-3, issued in 1976, and constitutes atechnical revision.The text of this standard is based on the following documents:FDISReport on voting48B/1137/FDIS48B/1188/RVDFull information on the voting for the approval of this standard can be found in the report onvoting indicated in the above table.This publication has been drafted in accordance with the ISO/IEC Directives, Part 3.The committee has decided that the contents of this publication will remain unchanged until2007. At this date, the publication will be•reconfirmed;•withdrawn;•replaced by a revised edition, or•amended.

60512-5-2  IEC:2002– 5 –CONNECTORS FOR ELECTRONIC EQUIPMENT –TESTS AND MEASUREMENTS –Part 5-2: Current-carrying capacity tests –Test 5b: Current-temperature derating1 Scope and objectThis part of IEC 60512, when required by the detail specification, is used for testing electro-mechanical components within the scope of IEC technical committee 48. This test may alsobe used for similar devices when specified in a detail specification.The object of this test is to detail a standard test method to assess the current-carryingcapacity of electromechanical components at elevated ambient temperature.
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