ASTM E2695-09

Standard Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy (Withdrawn 2018)

SIGNIFICANCE AND USE
Interpretation of static SIMS mass spectral data can be complicated due to the complexity and density of data obtained and therefore, variability often occurs when users are not consistent in their methods of data interpretation This guide is intended to help avoid these inconsistencies, by discussing the most commonly observed scenarios in static SIMS analysis and how to approach these scenarios.
This guide can be used as a training guide for employees or students, or both.
SCOPE
1.1 This guide provides time-of-flight secondary ion mass spectrometry (ToF-SIMS) users with a method for forms of interpretation of mass spectral data. This guide is applicable to most ToF-SIMS instruments and may or may not be applicable to other forms of secondary icon mass spectrometry (SIMS).
1.2 This guide does not purport to address methods of sample preparation. It is the responsibility of the user to adhere to strict sample preparation procedures in order to minimize contamination and optimize signals. See Guide E1078 and ISO 18116 for sample preparation guidelines.
1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
WITHDRAWN RATIONALE
This guide provides time-of-flight secondary ion mass spectrometry (ToF-SIMS) users with a method for forms of interpretation of mass spectral data. This guide is applicable to most ToF-SIMS instruments and may or may not be applicable to other forms of secondary icon mass spectrometry (SIMS).
Formerly under the jurisdiction of Committee E42 on Surface Analysis, this guide was withdrawn in January 2018 in accordance with Section 10.6.3 of the Regulations Governing ASTM Technical Committees, which requires that standards shall be updated by the end of the eighth year since the last approval date.

General Information

• Status: Withdrawn
• Publication Date: 30-Apr-2009
• Withdrawal Date: 16-Jan-2018
• ICS: 71.040.50 - Physicochemical methods of analysis
• Technical Committee: E42 - Surface Analysis
• Drafting Committee: E42.06 - SIMS

Standards Content (Sample)

NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation: E2695 − 09
Standard Guide for
Interpretation of Mass Spectral Data Acquired with Time-of-
1
Flight Secondary Ion Mass Spectroscopy
This standard is issued under the fixed designation E2695; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
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1. Scope 2.2 ISO Standards:
ISO 23830 Repeatability and Constancy of the Relative
1.1 This guide provides time-of-flight secondary ion mass
Intensity Scale
spectrometry (ToF-SIMS) users with a method for forms of
ISO 18115:2007 Terminology Related to Surface Chemical
interpretation of mass spectral data. This guide is applicable to
Analysis
mostToF-SIMS instruments and may or may not be applicable
ISO 18116 Guidelines for Preparation and Mounting of
to other forms of secondary icon mass spectrometry (SIMS).
Specimens for Analysis
1.2 This guide does not purport to address methods of
3. Terminology
sample preparation. It is the responsibility of the user to adhere
to strict sample preparation procedures in order to minimize
3.1 Definitions—See Terminology E673 and
contamination and optimize signals. See Guide E1078 and
ISO 18115:2007 for definitions of terms used in SIMS.
ISO 18116 for sample preparation guidelines.
3.2 Definitions of Terms Specific to This Standard:
1.3 The values stated in SI units are to be regarded as 3.2.1 cationization—the process by which a positively
standard. No other units of measurement are included in this
chargedionisformed,wherebyaneutralmoleculeiscombined
standard. with a cation, usually a metal ion; the resulting peaks are often
referred to as cationized peaks.
1.4 This standard does not purport to address all of the
3.2.2 deprotonated molecular ion—a molecule that has lost
safety concerns, if any, associated with its use. It is the
a proton to form a negative ion.
responsibility of the user of this standard to establish appro-
priate safety and health practices and determine the applica-
3.2.3 exact mass—measurement of the mass of an ion with
bility of regulatory limitations prior to use.
sufficient accuracy to provide an unequivocal identification of
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its elemental and isotopic composition (1); for example, a
2. Referenced Documents
peak located at m/z 43.0184 in a positive ion mass spectrum is
+ +
2 most likely C H O and cannot be C H (m/z 43.0547).
2 3 3 7
2.1 ASTM Standards:
3.2.4 fragment ion—the molecular ion, when struck by a
E673 Terminology Relating to SurfaceAnalysis (Withdrawn
3
primary ion beam, will typically break up into smaller pieces;
2012)
this process is called fragmentation; a charged dissociation
E1078 Guide for Specimen Preparation and Mounting in
product arising from the fragmentation process is called a
Surface Analysis
fragment ion.
E1504 PracticeforReportingMassSpectralDatainSecond-
ary Ion Mass Spectrometry (SIMS)
3.2.5 fragmentation pattern—the fragmentation of molecu-
E1635 Practice for Reporting Imaging Data in Secondary
lar species results in a series of peaks that are characteristic of
Ion Mass Spectrometry (SIMS)
the molecule’s underlying structure; this series of peaks is
referred to as the fragmentation pattern of the molecule.
3.2.6 m/z—the X-axis of a mass spectrum is labeled as m/z,
1
This practice is under the jurisdiction of ASTM Committee E42 on Surface definedasthemassoftheion,indaltons,dividedbythecharge
Analysis and is the direct responsibility of Subcommittee E42.06 on SIMS.
of the ion, where most ions are singly charged.
Current edition approved May 1, 2009. Published January 2010. DOI: 10.1520/
E2695-09.
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
4
contact ASTM Customer Service at [e-mail]. For Annual Book of ASTM Available from International Organization for Standardization (ISO), 1, ch. de
Standards volume information, refer to the standard’s Document Summary page on la Voie-Creuse, Case postale 56, CH-1211, Geneva 20, Switzerland, http://
the ASTM website. www.iso.ch.
3 5
The last approved version of this historical standard is referenced on The boldface numbers in parentheses refer to a list of references at the end of
www.astm.org. this standard.
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E2695 − 09
3.2.7 mass defect—when a peak’s exact mass is located 6.2.1.1 Above m/z 250 (the “high” mass range), organic
slightly below nominal mass. peakscanrepresenteitherfragmentsormolecularions.Also,in
this range, there will be no more atomic ions and any inorganic
3.2.8 mass excess—when a peak’s exact mass is locate
...