ASTM B854-98(2016)

Standard Guide for Measuring Electrical Contact Intermittences

SIGNIFICANCE AND USE
4.1 This guide suggests techniques to evaluate intermittences in a contact pair while it is subjected to simulated or actual environmental stress. Such measurements are a valuable tool in predicting circuit performance under these stress conditions and in diagnosing observed problems in circuit function under such conditions.  
4.2 This document is intended to provide some general guidance on the best available practices for detecting, quantifying, characterizing and reporting short duration intermittences in circuits containing electrical contacts. Certain environmental stresses such as mechanical shock, vibration or temperature change may cause intermittences. These measurement procedures include methods applicable to contacts operating under various conditions in testing or in service.  
4.3 Practice B615 defines methods for measuring electrical contact noise in sliding electrical contacts. In contrast Guide B854 provides guidance to the various methods for measuring similar phenomena in static contacts.
SCOPE
1.1 The techniques described in this guide apply to electrical circuits that include one or more electrical contacts in devices such as slip rings, separable connectors, electromechanical relays or closed switch contacts. The user should determine applicability for other devices.  
1.2 The range of techniques described apply to circuit discontinuities (intermittences) of durations ranging from approximately 10 nanoseconds to several seconds and of sufficient magnitude to cause alteration of the circuit function. Extension of the guide to shorter duration events may be possible with suitable instrumentation. Events of longer duration may be monitored by techniques for dc measurements such as those described in Test Methods B539 or by adaptation of methods described in this guide.  
1.3 The techniques described in this guide apply to electrical circuits carrying currents typical of signal circuits. Such currents are generally less than 100 ma. Extension of these techniques to circuits carrying larger currents may be possible, but the user should evaluate applicability first.  
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to become familiar with all hazards including those identified in the appropriate Safety Data Sheet (SDS) for this product/material as provided by the manufacturer, to establish appropriate safety and health practices, and determine the applicability of regulatory limitations prior to use.

General Information

• Status: Historical
• Publication Date: 30-Apr-2016
• ICS: 29.120.20 - Connecting devices
• Technical Committee: B02 - Nonferrous Metals and Alloys
• Drafting Committee: B02.11 - Electrical Contact Test Methods

Standards Content (Sample)

NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation: B854 − 98 (Reapproved 2016)
Standard Guide for
1
Measuring Electrical Contact Intermittences
This standard is issued under the fixed designation B854; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
This standard has been approved for use by agencies of the U.S. Department of Defense.
1. Scope B539 Test Methods for Measuring Resistance of Electrical
Connections (Static Contacts)
1.1 The techniques described in this guide apply to electri-
B542 Terminology Relating to Electrical Contacts and Their
cal circuits that include one or more electrical contacts in
Use
devices such as slip rings, separable connectors, electrome-
B615 Practice for Measuring Electrical Contact Noise in
chanical relays or closed switch contacts. The user should
Sliding Electrical Contacts
determine applicability for other devices.
B878 Test Method for Nanosecond Event Detection for
1.2 The range of techniques described apply to circuit
Electrical Contacts and Connectors
discontinuities (intermittences) of durations ranging from ap-
2.2 Other Documents:
3
proximately 10 nanoseconds to several seconds and of suffi-
IEC Publication 512 Test 2e Contact Disturbance
cient magnitude to cause alteration of the circuit function.
EIA-364-46 Continuity Test Procedure for Electrical Con-
4
Extension of the guide to shorter duration events may be
nectors
possible with suitable instrumentation. Events of longer dura-
tion may be monitored by techniques for dc measurements 3. Terminology
such as those described inTest Methods B539 or by adaptation
3.1 Terms relevant to this guide are defined in Terminology
of methods described in this guide.
B542 except as noted in the following section.
1.3 The techniques described in this guide apply to electri-
3.2 Definitions of Terms Specific to This Standard:
cal circuits carrying currents typical of signal circuits. Such
3.2.1 intermittence, n—a transient increase in the voltage
currents are generally less than 100 ma. Extension of these
drop across a pair of electrical contacts.
techniques to circuits carrying larger currents may be possible,
but the user should evaluate applicability first.
4. Significance and Use
1.4 This standard does not purport to address all of the
4.1 This guide suggests techniques to evaluate intermit-
safety concerns, if any, associated with its use. It is the
tences in a contact pair while it is subjected to simulated or
responsibility of the user of this standard to become familiar
actual environmental stress. Such measurements are a valuable
with all hazards including those identified in the appropriate
tool in predicting circuit performance under these stress
Safety Data Sheet (SDS) for this product/material as provided
conditions and in diagnosing observed problems in circuit
by the manufacturer, to establish appropriate safety and health
function under such conditions.
practices, and determine the applicability of regulatory limi-
4.2 This document is intended to provide some general
tations prior to use.
guidance on the best available practices for detecting,
quantifying, characterizing and reporting short duration inter-
2. Referenced Documents
mittences in circuits containing electrical contacts. Certain
2
2.1 ASTM Standards:
environmental stresses such as mechanical shock, vibration or
temperature change may cause intermittences. These measure-
ment procedures include methods applicable to contacts oper-
1
ating under various conditions in testing or in service.
This guide is under the jurisdiction of ASTM Committee B02 on Nonferrous
Metals and Alloys and is the direct responsibility of Subcommittee B02.11 on
4.3 Practice B615 defines methods for measuring electrical
Electrical Contact Test Methods.
contact noise in sliding electrical contacts. In contrast Guide
Current edition approved May 1, 2016. Published May 2016. Originally
ɛ1
approved in 1998. Last previous edition approved in 2010 as B854 – 98 (2010) .
DOI: 10.1520/B0854-98R16.
2 3
For referenced ASTM standards, visit the ASTM website, www.astm.org, or Available from American National Standards Institute (ANSI), 25 W. 43rd St.,
contact ASTM Customer Service at [e-mail]. For Annual Book of ASTM 4th Floor, New York, NY 10036, http://www.ansi.org.
4
Standards volume information, refer to the standard’s Document Summary page on Available from Electronic IndustriesAssociation, 2001 PennsylvaniaAve NW,
the ASTM website. Washington D.C. 20006.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

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This document is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
´1
Designation: B854 − 98 (Reapproved 2010) B854 − 98 (Reapproved 2016)
Standard Guide for
1
Measuring Electrical Contact Intermittences
This standard is issued under the fixed designation B854; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1
ε NOTE—Footnotes 7 and 8 were removed editorially in October 2010.
This standard has been approved for use by agencies of the U.S. Department of Defense.
1. Scope
1.1 The techniques described in this guide apply to electrical circuits that include one or more electrical contacts in devices such
as slip rings, separable connectors, electromechanical relays or closed switch contacts. The user should determine applicability for
other devices.
1.2 The range of techniques described apply to circuit discontinuities (intermittences) of durations ranging from approximately
10 nanoseconds to several seconds and of sufficient magnitude to cause alteration of the circuit function. Extension of the guide
to shorter duration events may be possible with suitable instrumentation. Events of longer duration may be monitored by
techniques for dc measurements such as those described in Test Methods B539 or by adaptation of methods described in this guide.
1.3 The techniques described in this guide apply to electrical circuits carrying currents typical of signal circuits. Such currents
are generally less than 100 ma. Extension of these techniques to circuits carrying larger currents may be possible, but the user
should evaluate applicability first.
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to become familiar with all hazards including those identified in the appropriate Material Safety Data
Sheet (MSDS)(SDS) for this product/material as provided by the manufacturer, to establish appropriate safety and health practices,
and determine the applicability of regulatory limitations prior to use.
2. Referenced Documents
2
2.1 ASTM Standards:
B539 Test Methods for Measuring Resistance of Electrical Connections (Static Contacts)
B542 Terminology Relating to Electrical Contacts and Their Use
B615 Practice for Measuring Electrical Contact Noise in Sliding Electrical Contacts
B878 Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
2.2 Other Documents:
3
IEC Publication 512 Test 2e Contact Disturbance
4
EIA-364-46 Continuity Test Procedure for Electrical Connectors
3. Terminology
3.1 Terms relevant to this guide are defined in Terminology B542 except as noted in the following section.
3.2 Definitions of Terms Specific to This Standard:
3.2.1 intermittence, n—a transient increase in the voltage drop across a pair of electrical contacts.
1
This guide is under the jurisdiction of ASTM Committee B02 on Nonferrous Metals and Alloys and is the direct responsibility of Subcommittee B02.11 on Electrical
Contact Test Methods.
Current edition approved Oct. 1, 2010May 1, 2016. Published October 2010May 2016. Originally approved in 1998. Last previous edition approved in 20042010 as
ɛ1
B854 – 98 (2004).(2010) . DOI: 10.1520/B0854-98R10E01.10.1520/B0854-98R16.
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or contact ASTM Customer Service at [e-mail]. For Annual Book of ASTM Standards
volume information, refer to the standard’s Document Summary page on the ASTM website.
3
Available from American National Standards Institute (ANSI), 25 W. 43rd St., 4th Floor, New York, NY 10036, http://www.ansi.org.
4
Available from Electronic Industries Association, 2001 Pennsylvania Ave NW, Washington D.C. 20006.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

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B854 − 98 (2016)
4. Significance and Use
4.1 This guide suggests techniques to evaluate intermittences in a contact pair while it is subjected to simulated or actual
environmental stress. Such measurements are a valuable tool in predicting circuit performance under these stress conditions and
in diagnosing observed problems in circuit function under such conditions.
4.2 This document is intended to provide some general guidance on the best available practices for detecting, quantifying,
char
...