EN 61290-10-1:2003
(Main)Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
Applies to optical fibre amplifiers (OFAs) using active fibres, containing rare-earth dopants, currently commercially available. The uniform requirements for accurate and reliable measurements of the signal-spontaneous noise figure as defined in 3.1.18 of EN 61291-1 are established. The test method independently detects amplified signal power and amplified spontaneous emission (ASE)power by launching optical pulses into the OFA under test and synchronously detecting on and off levels of the output pulses by using an optical sampling switch and an optical spectrum analyzer (OSA).
Prüfverfahren für Lichtwellenleiter-Verstärker - Teil 10-1: Mehrkanalparameter - Pulsmethode bei Verwendung eines optischen Schalters und optischen Spektralanalysators
Amplificateurs optiques - Méthodes d'essai - Partie 10-1: Paramètres à canaux multiples - Méthode d'impulsion utilisant un interrupteur optique et un analyseur de spectre optique
En anglais seulement
Optični ojačevalci – Preskusne metode – 10-1. del: Parametri z več kanali - Metoda s pulzom pri uporabi optičnega stikala in optičnega spektralnega analizatorja (IEC 61290-10-1:2003)*
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Standards Content (Sample)
SIST EN 61290-10-1:2004SLOVENSKIseptember 2004
STANDARDOptični ojačevalci – Preskusne metode – 10-1. del: Parametri z več kanali - Metoda s pulzom pri uporabi optičnega stikala in optičnega spektralnega analizatorja (IEC 61290-10-1:2003)*Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (IEC 61290-10-1:2003)©
Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljenoReferenčna številkaSIST EN 61290-10-1:2004(en)ICS33.180.30
EUROPEAN STANDARD
EN 61290-10-1 NORME EUROPÉENNE EUROPÄISCHE NORM
July 2003 CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2003 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61290-10-1:2003 E
ICS 33.180.30
English version
Optical amplifiers -
Test methods Part 10-1: Multichannel parameters -
Pulse method using an optical switch
and optical spectrum analyzer (IEC 61290-10-1:2003)
Amplificateurs optiques -
Méthodes d'essai Partie 10-1: Paramètres à canaux multiples -
Méthode d'impulsion utilisant
un interrupteur optique
et un analyseur de spectre optique (CEI 61290-10-1:2003)
Prüfverfahren für Lichtwellenleiter-Verstärker Teil 10-1: Mehrkanalparameter - Pulsmethode bei Verwendung
eines optischen Schalters
und optischen Spektralanalysators (IEC 61290-10-1:2003)
This European Standard was approved by CENELEC on 2003-05-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Lithuania, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom.
EN 61290-10-1:2003 - 2 - Foreword
The text of document 86C/498/FDIS, future edition 1 of IEC 61290-10-1, prepared by SC 86C, Fibre optic systems and active devices, of IEC TC 86, Fibre optics, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 61290-10-1 on 2003-05-01.
This standard shall be read in conjunction with EN 61291-1:1998 and EN 61290-3:2000
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement
(dop) 2004-02-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn
(dow) 2006-05-01
The International Electrotechnical Commission (IEC) and CENELEC draw attention to the fact that it is claimed that compliance with this International Standard/European Standard may involve the use of two patents.
One patent concerns a technique for determining the amplified spontaneous emission noise of an optical amplifier in the presence of an optical signal given in clause 3 and clause 5.
The IEC and CENELEC take no position concerning the evidence, validity and scope of this patent right.
The holder of this patent right has assured the IEC that he/she is willing to negotiate licences under reasonable and non-discriminatory terms and conditions with applicants throughout the world. In this respect, the statement of the holder of this patent right is registered with the IEC. Information may be obtained from:
Agilent Technologies Palo Alto (CA) USA
Another patent concerns a measurement system and noise measurement apparatus for an optical amplifier given in clause 3 and clause 5.
The IEC and CENELEC take no position concerning the evidence, validity and scope of this patent right.
The holder of this patent right has assured the IEC that he/she is willing to negotiate licences under reasonable and non-discriminatory terms and conditions with applicants throughout the world. In this respect, the statement of the holder of this patent right is registered with the IEC. Information may be obtained from:
Fujitsu Limited Tokyo Japan
Attention is drawn to the possibility that some of the elements of this International Standard/European Standard may be the subject of patent rights other than those identified above. IEC and CENELEC shall not be held responsibl
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