prEN IEC 63541:2025

Lithium tantalate and lithium niobate crystals for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Kristali litijevega tantalata in litijevega niobata za površinske zvočnovalovne naprave (SAW) - Specifikacije in merilne metode

General Information

• Status: Not Published
• Publication Date: 09-Nov-2026
• ICS: 31.140 - Piezoelectric devices
• Technical Committee: CLC/SR 49 - Piezoelectric and dielectric devices for frequency control and selection
• Current Stage: 4020 - Enquiry circulated - Enquiry
• Start Date: 18-Apr-2025
• Due Date: 06-Dec-2024
• Completion Date: 18-Apr-2025
• Ref Project: oSIST prEN IEC 63541:2025 - Lithium tantalate and lithium niobate crystals for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Standards Content (Sample)

SLOVENSKI STANDARD
01-junij-2025
Kristali litijevega tantalata in litijevega niobata za površinske zvočnovalovne
naprave (SAW) - Specifikacije in merilne metode
Lithium tantalate and lithium niobate crystals for surface acoustic wave (SAW) device
applications - Specifications and measuring methods
Ta slovenski standard je istoveten z: prEN IEC 63541:2025
ICS:
31.140 Piezoelektrične naprave Piezoelectric devices
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

49/1496/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 63541 ED1
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2025-04-18 2025-07-11
SUPERSEDES DOCUMENTS:
49/1471/CD, 49/1488/CC
IEC TC 49 : PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC DEVICES AND ASSOCIATED MATERIALS FOR FREQUENCY
CONTROL, SELECTION AND DETECTION
SECRETARIAT: SECRETARY:
Japan Mr Masanobu Okazaki
OF INTEREST TO THE FOLLOWING COMMITTEES: HORIZONTAL FUNCTION(S):

ASPECTS CONCERNED:
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft
for Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.
This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of
which they are aware and to provide supporting documentation.
Recipients of this document are invited to submit, with their comments, notification of any relevant “In Some
Countries” clauses to be included should this proposal proceed. Recipients are reminded that the CDV stage is the
final stage for submitting ISC clauses. (SEE AC/22/2007 OR NEW GUIDANCE DOC).

TITLE:
Lithium tantalate and lithium niobate crystals for surface acoustic wave (SAW) device
applications - Specifications and measuring methods

PROPOSED STABILITY DATE: 2028
NOTE FROM TC/SC OFFICERS:
download this electronic file, to make a copy and to print out the content for the sole purpose of preparing National
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IEC CDV 63541 ED1 © IEC 2025         – 2 –                      49/1496/CDV
1 CONTENTS
2 FOREWORD . 4
3 1 Scope . 6
4 2 Normative references . 6
5 3 Terms and definitions . 6
6 4 Requirements . 8
7 4.1 Material specification . 8
8 4.1.1 LN . 8
9 4.1.2 LT . 8
10 4.2 Requirements for as-grown crystal . 8
11 4.2.1 Specifications . 8
12 4.2.2 Macroscopic quality . 8
13 4.2.3 Single domain . 8
14 4.2.4 Curie temperature and tolerance . 9
15 4.2.5 Lattice parameter . 9
16 4.3 Requirements for lumbered crystal . 9
17 4.3.1 As-grown crystal for lumbered crystal . 9
18 4.3.2 Specifications . 9
19 5 Sampling and inspection . 9
20 5.1 General . 9
21 5.2 Sampling and inspection plan . 10
22 5.3 Determination of inspection results . 10
23 6 Test methods . 10
24 6.1 Test methods for as-grown crystal . 10
25 6.1.1 Diameter and cylinder length . 10
26 6.1.2 Macroscopic quality . 10
27 6.1.3 Single domain . 10
28 6.1.4 Curie temperature . 10
29 6.1.5 Lattice parameter . 10
30 6.2 Test methods for lumbered crystal . 10
31 6.2.1 Surface orientation . 10
32 6.2.2 Diameter . 11
33 6.2.3 Orientation of orientation flat . 11
34 6.2.4 Width of orientation flat . 11
35 6.2.5 Effective length . 11
36 6.2.6 Cylindricity . 11
37 6.2.7 Verticality . 11
38 7 Identification, labelling, packaging, delivery condition . 11
39 7.1 Packaging . 11
40 7.2 Labelling and identification . 11
41 7.3 Terms of delivery . 11
42 Annex A (normative) Measurement of single domain for LT and LN crystals . 12
43 A.1 General . 12
44 A.2 Measurement principle . 12
45 A.3 Measurement . 12
46 A.3.1 Scattered light path method . 12

IEC CDV 63541 ED1 © IEC 2025         – 3 –                      49/1496/CDV
47 A.3.2 Etching method . 12
48 A.3.3 Electromotive voltage method . 14
49 Annex B (normative) Measurement of Curie temperature . 16
50 B.1 General . 16
51 B.2 DTA method . 16
52 B.3 DSC method . 16
53 B.4 Dielectric constant method . 17
54 Annex C (normative) Measurement of lattice parameter (Bond method) . 18
55 Annex D (normative) Measurement of cylindricity for LT and LN crystals . 20
56 D.1 General . 20
57 D.2 Measurement . 20
58 D.2.1 Device . 20
59 D.2.2 Measuring procedure . 20
60 D.2.3 Other instructions . 20
61 Annex E (normative) Measurement of verticality for LT and LN crystals . 21
62 E.1  General. 21
63 E.2  Measurement . 21
64 E.2.1  Equipment . 21
65 E.2.2  Measuring procedure . 21
67 Figure 1 – Schematic diagram of lumbered crystal . 7
68 Figure 2 – Schematic diagram of verticality for lumbered crystal . 8
69 Figure A.1 – Schematic diagram of sample position . 13
70 Figure A.2 – Schematic diagram of measurement points . 13
71 Figure A.3 – Examples of 42°Y-X LT after etching . 14
72 Figure A.4 – Examples of 128°Y-X LN after etching . 14
73 Figure A.5 – Schematic diagram of waveform for single-domain crystals . 14
74 Figure A.6 – Schematic diagram of waveform for non-single-domain crystals . 15
75 Figure B.1 – Schematic of a DTA system . 16
76 Figure B.2 – Schematic of a DSC system . 17
77 Figure B.3 – Schematic of a dielectric constant measurement system . 17
78 Figure C.1 – The Bond method . 19
79 Figure D.1 – Measurement schematic diagram of cylindricity . 20
80 Figure E.1 – Measurement schematic diagram of verticality . 21
82 Table 1 – Typical specifications of as-grown crystal . 8
83 Table 2 – The centre value and tolerance of Curie temperature specification . 9
84 Table 3 – Typical specifications of lumbered crystal . 9
85 Table 4 – Sampling and inspection plan . 10
IEC CDV 63541 ED1 © IEC 2025         – 4 –                      49/1496/CDV
INTERNATIONAL ELECTROTECHNICAL COMMISSION

____________
LITHIUM TANTALATE AND LITHIUM NIOBATE CRYSTALS
FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE
APPLICATIONS – SPECIFICATIONS AND MEASURING
METHODS
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization
comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to
promote international co-operation on all questions concerning standardization in the electrical and
electronic fields. To this end and in addition to other activities, IEC publishes International Standards,
Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides
(hereafter referred to
...