IEC 62333-2:2006/AMD1:2015

Amendment 1 - Noise suppression sheet for digital devices and equipment - Part 2: Measuring methods

Amendement 1 - Plaque réduisant le bruit des dispositifs et appareils numériques - Partie 2: Méthodes de mesure

General Information

• Status: Published
• Publication Date: 04-Aug-2015
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 29.100.10 - Magnetic components
• Technical Committee: TC 51 - Magnetic components, ferrite and magnetic powder materials
• Drafting Committee: WG 10 - TC 51/WG 10
• Current Stage: PPUB - Publication issued
• Start Date: 15-Sep-2015
• Completion Date: 05-Aug-2015

Relations

• Amends: IEC 62333-2:2006 - Noise suppression sheet for digital devices and equipment - Part 2: Measuring methods
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 62333-2 ®
Edition 1.0 2015-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
A MENDMENT 1
AM ENDEMENT 1
Noise suppression sheet for digital devices and equipment –
Part 2: Measuring methods
Plaque réduisant le bruit des dispositifs et appareils numériques –
Partie 2: Méthodes de mesure
IEC 62333-2:2006-05/AMD1:2015-08(en-fr)

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.

Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de l'IEC ou du Comité national de l'IEC du pays du demandeur. Si vous avez des
questions sur le copyright de l'IEC ou si vous désirez obtenir des droits supplémentaires sur cette publication, utilisez
les coordonnées ci-après ou contactez le Comité national de l'IEC de votre pays de résidence.

IEC Central Office Tel.: [phone]
3, rue de Varembé Fax: [phone]
CH-1211 Geneva 20 [e-mail]
Switzerland www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.

IEC Catalogue - webstore.iec.ch/catalogue Electropedia - www.electropedia.org
The stand-alone application for consulting the entire The world's leading online dictionary of electronic and
bibliographical information on IEC International Standards, electrical terms containing more than 30 000 terms and
Technical Specifications, Technical Reports and other definitions in English and French, with equivalent terms in 15
documents. Available for PC, Mac OS, Android Tablets and additional languages. Also known as the International
iPad. Electrotechnical Vocabulary (IEV) online.

IEC publications search - www.iec.ch/searchpub IEC Glossary - std.iec.ch/glossary
The advanced search enables to find IEC publications by a More than 60 000 electrotechnical terminology entries in
variety of criteria (reference number, text, technical English and French extracted from the Terms and Definitions
committee,…). It also gives information on projects, replaced clause of IEC publications issued since 2002. Some entries
and withdrawn publications. have been collected from earlier publications of IEC TC 37,

77, 86 and CISPR.
IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Customer Service Centre - webstore.iec.ch/csc
details all new publications released. Available online and If you wish to give us your feedback on this publication or
also once a month by email. need further assistance, please contact the Customer Service
Centre: [e-mail].
A propos de l'IEC
La Commission Electrotechnique Internationale (IEC) est la première organisation mondiale qui élabore et publie des
Normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.

A propos des publications IEC
Le contenu technique des publications IEC est constamment revu. Veuillez vous assurer que vous possédez l’édition la
plus récente, un corrigendum ou amendement peut avoir été publié.

Catalogue IEC - webstore.iec.ch/catalogue Electropedia - www.electropedia.org
Application autonome pour consulter tous les renseignements
Le premier dictionnaire en ligne de termes électroniques et
bibliographiques sur les Normes internationales,
électriques. Il contient plus de 30 000 termes et définitions en
Spécifications techniques, Rapports techniques et autres
anglais et en français, ainsi que les termes équivalents dans
documents de l'IEC. Disponible pour PC, Mac OS, tablettes
15 langues additionnelles. Egalement appelé Vocabulaire
Android et iPad.
Electrotechnique International (IEV) en ligne.

Recherche de publications IEC - www.iec.ch/searchpub
Glossaire IEC - std.iec.ch/glossary
Plus de 60 000 entrées terminologiques électrotechniques, en
La recherche avancée permet de trouver des publications IEC
en utilisant différents critères (numéro de référence, texte, anglais et en français, extraites des articles Termes et
comité d’études,…). Elle donne aussi des informations sur les Définitions des publications IEC parues depuis 2002. Plus
projets et les publications remplacées ou retirées. certaines entrées antérieures extraites des publications des

CE 37, 77, 86 et CISPR de l'IEC.
IEC Just Published - webstore.iec.ch/justpublished

Service Clients - webstore.iec.ch/csc
Restez informé sur les nouvelles publications IEC. Just
Published détaille les nouvelles publications parues. Si vous désirez nous donner des commentaires sur cette
Disponible en ligne et aussi une fois par mois par email. publication ou si vous avez des questions contactez-nous:
[e-mail].
IEC 62333-2 ®
Edition 1.0 2015-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
A MENDMENT 1
AM ENDEMENT 1
Noise suppression sheet for digital devices and equipment –

Part 2: Measuring methods
Plaque réduisant le bruit des dispositifs et appareils numériques –

Partie 2: Méthodes de mesure
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 29.100.10 ISBN 978-2-8322-2802-9

– 2 – IEC 62333-2:2006/AMD1:2015
© IEC 2015
FOREWORD
This amendment has been prepared by IEC technical committee 51: Magnetic components
and ferrite materials.
The text of this amendment is based on the following documents:
CDV Report on voting
51/1068/CDV 51/1088/RVC
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC website under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
_____________
4 Measuring methods
Add, after 4.4, the following new subclause, new tables and new figures:
4.5 Line-decoupling ratio: R
dl
4.5.1 General
This standard has provided for the measuring method of
① the intra-decoupling ratio (R ),
da
② the inter-decoupling ratio (R ),
de
③ the transmission attenuation power ratio (R ) and
tp
④ the radiation suppression ratio (R ) in 4.1 to 4.4.
rs
Subclause 4.5 provides
⑤ the line-decoupling ratio (R ).
dl
The diagrammatic illustration of each noise suppression effect is shown in the following
Table 9 and Figure 17.
© IEC 2015
Table 9 – Noise suppression effect classified as noise path and NSS position
Victim Near field coupling Conduction Radiation
Part (component) Line
Line Far
plane field
Same Opposite Line in
Agressor side side vicinity
① ② ⑤
Part
Intra- Inter- Line
(component)
③ ④
decoupling decoupling decoupling
Transmission Radiation
⑤
attenuation suppression
Line
⑥ Line ⑦
decoupling
Chassis
Cable, FPC ④
⑤
③
③
PCB
Victim
Aggressor
(part)
⑥
②
⑤ Line
⑦
①
Aggressor
Victim
decoupling
Victim Aggressor
PCB
(line) (line)
IEC
Figure 17 – Noise path
4.5.2 Principle
The following method is applied to evaluate the reduction of coupling between a line and (a)
part(s) on both sides of the NSS, from 100 MHz to 6 GHz.
A test fixture for this evaluation is constructed with a micro-strip line (MSL) and a magnetic
loop antenna as shown in Figure 18. The test fixture is aimed to simulate an electromagnetic
interference observed frequently in electronic equipments. The MSL and the antenna
correspond to a noise source, the aggressor, and a receiver, the victim, respectively.
The antenna and the NSS are set up at the centre of the MSL as shown in Figure 19. Two
coupling factors of the loop antenna to the MSL with the NSS and without the NSS are
measured in dB. The line-decoupling ratio R is given in terms of dB as the difference of the
dl
two factors.
Permeability of the NSS modifies the magnetic field in its vicinity which can be applied to
reduce noise coupling between the MSL and the antenna. At the high frequency range where
the imaginary part of the permeability is dominant, the noise can be effectively absorbed due
to the magnetic loss of the NSS.

– 4 – IEC 62333-2:2006/AMD1:2015
© IEC 2015
Network
analyzer
Receiver
(victim)
Loop
Magnetic
antenna
flux
•
Micro-strip
Noise source RF ⊗
line
(aggressor) current
IEC
Figure 18 – A test fixture for line decoupling measurement
4.5.3 Apparatus
Figure 19 shows the schematic diagram of the measurement set-up for the line-decoupling
ratio.
Bottom centre
of loop
Lift off h = 2
Elevation θ
Offset S = 3
Azimuth θ
IEC
Key
h is the lift off between the lower edge of the loop antenna and the surface of the MSL substrate,
θ is the elevation angle of the loop antenna surface from the horizontal plane,
θ is the azimuth angle of the loop antenna and transverse direction of the MSL,
S is the centre offset of the loop antenna and the MSL.
Figure 19 – Schematic diagram of MSL and loop antenna set-up
4.5.3.1 Loop antenna
A small loop antenna defined in 4.1.2.1 shall be used.
4.5.3.2 Micro-strip line
The dimensions of the micro-strip line are shown in Table 10. One end of the MSL shall be
connected to the network analyzer via an SMA type connector, and the other end of the MSL

© IEC 2015
shall be connected to termination load of 50 Ω via an SMA type connector. The VSWR of the
MSL terminated with the other end shall be smaller than 1,2.
Table 10 – Dimensions of the MSL
Length Width Thickness Material
mm mm mm
b
Substrate 100 ± 0,8 50 ± 0,8 1,6 PTFE/Glass
a
Strip conductor Cu
100 ± 0,15 4,4 ± 0,05 0,018
a
Typically, but in any case < 21 µm.
b
ε = 2,2 to 2,6.
r
The antenna MSL and NSS configuration are shown in Figure 20. The dimensions of the loop
antenna are specified as shown in Table 11.
Offset S
Magnetic
Antenna φ
flux
a
NSS
RF
current
IEC
Key
φ is the average diameter of the loop antenna.
a
Figure 20 – NSS, loop antenna and magnetic flux configuration
Table 11 – Dimensions of loop antenna
Lift off h Angle θ Angle θ Offset S
Diameter φ
1 2
a
mm mm radian radian mm
a b
2,0 ± 0,2 3,0 ± 0,2 ≤ π/18 ≤ π/2 3,0±0,2
a
≤ 10°
b
≤ 90°
The frequency response required between the loop antenna and the MSL shall be in
accordance with 4.1.2.1, however, the antenna and the MSL are within a fixed position as
shown in Figure 18.
4.5.3.3 Network analyzer
A vector network analyzer shall be operated in accordance with 4.1.2.2.
4.5.4 Test sample
4.5.4.1 Dimension
The dimensions of the test sample for measuring R are shown in Table 12.
dl
h
– 6 – IEC 62333-2:2006/AMD1:2015
© IEC 2015
Table 12 – Dimensions of the test sample
Length L Width W
mm mm
20±0,5 ≥ 20
NOTE Any thickness of the test sample can be used in this measurement (provided the condition h = (2,0±0,2)
mm is maintained) as the thickness of the test sample depends on the sample formation.
The measurement is not sensitive to the maximum width of the test sample.

4.5.4.2 Attachment method on the test fixture
The test sample should be put and fixed as shown in 4.3.4.2.
4.5.5 Procedure
The arrangements of the antenna, MSL and test sample are shown in Tables 10 to 12, and
also Figures 19 and 20.
4.5.5.1 Measurement system set-up
The measurement apparatus and the test sample(s) should be prepared in accordance with
4.5.3 and 4.5.4 in advance. A calibration of the network analyzer should be done at the end of
the connectors of coaxial cables connected to the test fixture. Connect one connector to the
MSL, and the other connector to the antenna.
4.5.5.2 Reference measurement
Measure the S data as a reference, S .
21 21R
4.5.5.3 Test sample measurement
The test sample should be placed on the test fixture in accordance with 4.5.4. Measure the
S data as a sample characteristic. The measured value is then called S .
21 21M
4.5.5.4 Calculation of R
dl
R shall be calculated by using the following formula:
dl
R = S – S [dB]
dl 21R 21M
where
S is the transmission characteristics (S ) without the test sample.
21R 21
S is the transmission characteristics (S ) with the test sample.
21M 21
4.5.6 Expression of results
The following items shall be expressed.
a) R ;
dl
b) attachment condition of the test sample;
c) thickness of the test sample.

_____________
– 8 – IEC 62333-2:2006/AMD1:2015
© IEC 2015
AVANT-PROPOS
Le présent amendement a été établi par le comité d'études 51 de l'IEC: Composants
magnétiques et ferrites.
Le texte de cet amendement est issu des documents suivants:
CDV Ra
...