IEC 62333-2:2006/AMD1:2015

Amendment 1 - Noise suppression sheet for digital devices and equipment - Part 2: Measuring methods

Amendement 1 - Plaque réduisant le bruit des dispositifs et appareils numériques - Partie 2: Méthodes de mesure

General Information

• Status: Published
• Publication Date: 04-Aug-2015
• ICS: 29.100.10 - Magnetic components
• Technical Committee: TC 51 - Magnetic components, ferrite and magnetic powder materials
• Drafting Committee: WG 10 - TC 51/WG 10
• Current Stage: PPUB - Publication issued
• Start Date: 05-Aug-2015
• Completion Date: 15-Sep-2015

Relations

• Amends: IEC 62333-2:2006 - Noise suppression sheet for digital devices and equipment - Part 2: Measuring methods
• Effective Date: 05-Sep-2023

Overview

IEC 62333-2:2006/AMD1:2015 is an international standard amendment issued by the International Electrotechnical Commission (IEC) focusing on noise suppression sheets for digital devices and equipment. This amendment specifically updates Part 2, which addresses the measuring methods for evaluating the effectiveness of noise suppression sheets. It provides detailed procedures and apparatus specifications to measure how noise suppression materials reduce electromagnetic interference (EMI) in electronic components and systems.

Key Topics

• Line-Decoupling Ratio (R_dl): A new measuring method introduced in this amendment to evaluate the reduction of electromagnetic coupling between a conductive line and nearby components or devices when using noise suppression sheets.
• Measurement Setup: The standard specifies the use of a micro-strip line (MSL) and a magnetic loop antenna to simulate noise source (aggressor) and receiver (victim). This setup helps accurately evaluate coupling and noise suppression effects.
• Apparatus Specifications:
  • Micro-strip Line (MSL): Defined dimensions and materials, including PTFE/glass substrate and copper strip, with specific electrical characteristics like VSWR below 1.2.
  • Loop Antenna: Small loop antenna with controlled dimension and orientation parameters to ensure consistent measurement accuracy.
  • Network Analyzer: Vector network analyzer usage for measuring S-parameters with and without the noise suppression sheet applied.
• Measurement Procedure:
  • Calibration of the network analyzer.
  • Reference measurement without noise suppression.
  • Measurement with the noise suppression sheet in place.
  • Calculation of the decoupling ratio as the difference in transmission characteristics.
• Performance Metrics: Documentation of the line-decoupling ratio along with sample attachment conditions and thickness of the noise suppression sheet.

Applications

IEC 62333-2:2006/AMD1:2015 is crucial for industries and professionals involved in:

• Digital Device Manufacturing: Ensuring EMI is minimized by selecting effective noise suppression sheets evaluated per this standard.
• Electronic Equipment Design: Incorporating noise suppression materials to reduce interference on signal lines and enhance device reliability.
• Quality Control and Testing: Verifying the performance of noise suppression components using defined measurement methods to comply with international standards.
• Electromagnetic Compatibility (EMC) Assessment: Assisting engineers in precisely quantifying noise attenuation to meet EMC regulatory requirements.

Related Standards

• IEC 62333-1: The base document focusing on general requirements and specifications of noise suppression sheets for digital equipment.
• IEC 61000 Series: Electromagnetic compatibility standards providing additional context for emission and immunity testing.
• CISPR Standards: Relevant for radiated and conducted emission measurement methods critical to complementary EMC evaluation.

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Keywords: IEC 62333-2, noise suppression sheet, digital devices, electromagnetic interference, EMI measurement, line-decoupling ratio, micro-strip line, loop antenna, network analyzer, electromagnetic compatibility, EMC standards, noise attenuation, digital equipment, EMI testing methods, IEC amendment 2015.

Standards Content (Sample)

IEC 62333-2 ®
Edition 1.0 2015-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
A MENDMENT 1
AM ENDEMENT 1
Noise suppression sheet for digital devices and equipment –
Part 2: Measuring methods
Plaque réduisant le bruit des dispositifs et appareils numériques –
Partie 2: Méthodes de mesure
IEC 62333-2:2006-05/AMD1:2015-08(en-fr)

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IEC 62333-2 ®
Edition 1.0 2015-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
A MENDMENT 1
AM ENDEMENT 1
Noise suppression sheet for digital devices and equipment –

Part 2: Measuring methods
Plaque réduisant le bruit des dispositifs et appareils numériques –

Partie 2: Méthodes de mesure
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 29.100.10 ISBN 978-2-8322-2802-9

– 2 – IEC 62333-2:2006/AMD1:2015
© IEC 2015
FOREWORD
This amendment has been prepared by IEC technical committee 51: Magnetic components
and ferrite materials.
The text of this amendment is based on the following documents:
CDV Report on voting
51/1068/CDV 51/1088/RVC
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC website under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
_____________
4 Measuring methods
Add, after 4.4, the following new subclause, new tables and new figures:
4.5 Line-decoupling ratio: R
dl
4.5.1 General
This standard has provided for the measuring method of
① the intra-decoupling ratio (R ),
da
② the inter-decoupling ratio (R ),
de
③ the transmission attenuation power ratio (R ) and
tp
④ the radiation suppression ratio (R ) in 4.1 to 4.4.
rs
Subclause 4.5 provides
⑤ the line-decoupling ratio (R ).
dl
The diagrammatic illustration of each noise suppression effect is shown in the following
Table 9 and Figure 17.
© IEC 2015
Table 9 – Noise suppression effect classified as noise path and NSS position
Victim Near field coupling Conduction Radiation
Part (component) Line
Line Far
plane field
Same Opposite Line in
Agressor side side vicinity
① ② ⑤
Part
Intra- Inter- Line
(component)
③ ④
decoupling decoupling decoupling
Transmission Radiation
⑤
attenuation suppression
Line
⑥ Line ⑦
decoupling
Chassis
Cable, FPC ④
⑤
③
③
PCB
Victim
Aggressor
(part)
⑥
②
⑤ Line
⑦
①
Aggressor
Victim
decoupling
Victim Aggressor
PCB
(line) (line)
IEC
Figure 17 – Noise path
4.5.2 Principle
The following method is applied to evaluate the reduction of coupling between a line and (a)
part(s) on both sides of the NSS, from 100 MHz to 6 GHz.
A test fixture for this evaluation is constructed with a micro-strip line (MSL) and a magnetic
loop antenna as shown in Figure 18. The test fixture is aimed to simulate an electromagnetic
interference observed frequently in electronic equipments. The MSL and the antenna
correspond to a noise source, the aggressor, and a receiver, the victim, respectively.
The antenna and the NSS are set up at the centre of the MSL as shown in Figure 19. Two
coupling factors of the loop antenna to the MSL with the NSS and without the NSS are
measured in dB. The line-decoupling ratio R is given in terms of dB as the difference of the
dl
two factors.
Permeability of the NSS modifies the magnetic field in its vicinity which can be applied to
reduce noise coupling between the MSL and the antenna. At the high frequency range where
the imaginary part of the permeability is dominant, the noise can be effectively absorbed due
to the magnetic loss of the NSS.

– 4 – IEC 62333-2:2006/AMD1:2015
© IEC 2015
Network
analyzer
Receiver
(victim)
Loop
Magnetic
antenna
flux
•
Micro-strip
Noise source RF ⊗
line
(aggressor) current
IEC
Figure 18 – A test fixture for line decoupling measurement
4.5.3 Apparatus
Figure 19 shows the schematic diagram of the measurement set-up for the line-decoupling
ratio.
Bottom centre
of loop
Lift off h = 2
Elevation θ
Offset S = 3
Azimuth θ
IEC
Key
h is the lift off between the lower edge of the loop antenna and the surface of the MSL substrate,
θ is the elevation angle of the loop antenna surface from the horizontal plane,
θ is the azimuth angle of the loop antenna and transverse direction of the MSL,
S is the centre offset of the loop antenna and the MSL.
Figure 19 – Schematic diagram of MSL and loop antenna set-up
4.5.3.1 Loop antenna
A small loop antenna defined in 4.1.2.1 shall be used.
4.5.3.2 Micro-strip line
The dimensions of the micro-strip line are shown in Table 10. One end of the MSL shall be
connected to the network analyzer via an SMA type connector, and the other end of the MSL

© IEC 2015
shall be connected to termination load of 50 Ω via an SMA type connector. The VSWR of the
MSL terminated with the other end shall be smaller than 1,2.
Table 10 – Dimensions of the MSL
Length Width Thickness Material
mm mm mm
b
Substrate 100 ± 0,8 50 ± 0,8 1,6 PTFE/Glass
a
Strip conductor Cu
100 ± 0,15 4,4 ± 0,05 0,018
a
Typically, but in any case < 21 µm.
b
ε = 2,2 to 2,6.
r
The antenna MSL and NSS configuration are shown in Figure 20. The dimensions of the loop
antenna are specified as shown in Table 11.
Offset S
Magnetic
Antenna φ
flux
a
NSS
RF
current
IEC
Key
φ is the average diameter of the loop antenna
...