General Information

Abstract

Status: Published
Publication Date: 14-Nov-2000

ICS: 31.220.01 - Electromechanical components in general

Technical Committee: SC 48B - Electrical connectors

Current Stage: PPUB - Publication issued
Start Date: 15-Nov-2000
Completion Date: 31-Oct-2000

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IEC 60512-1-4:1997/COR1:2000 - Corrigendum 1 - Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 1: General - Section 4: Test 1d: Contact protection effectiveness (scoop-proof)
Released:11/15/2000 - Page 1 preview

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IEC 60512-1-4:1997/COR1:2000 - Corrigendum 1 - Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 1: General - Section 4: Test 1d: Contact protection effectiveness (scoop-proof) Released:11/15/2000

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Corrects: IEC 60512-1-4:1997 - Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 1: General - Section 4: Test 1d: Contact protection effectiveness (scoop-proof)
Effective Date: 05-Sep-2023

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IEC 60512-1-4:1997/COR1:2000 - Corrigendum 1 - Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 1: General - Section 4: Test 1d: Contact protection effectiveness (scoop-proof) Released:11/15/2000

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Frequently Asked Questions

What is IEC 60512-1-4:1997/COR1:2000?

IEC 60512-1-4:1997/COR1:2000 is a standard published by the International Electrotechnical Commission (IEC). Its full title is "Corrigendum 1 - Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 1: General - Section 4: Test 1d: Contact protection effectiveness (scoop-proof)". This standard covers: Corrigendum 1 - Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 1: General - Section 4: Test 1d: Contact protection effectiveness (scoop-proof)

What is the scope of IEC 60512-1-4:1997/COR1:2000?

Corrigendum 1 - Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 1: General - Section 4: Test 1d: Contact protection effectiveness (scoop-proof)

What ICS categories does IEC 60512-1-4:1997/COR1:2000 belong to?

IEC 60512-1-4:1997/COR1:2000 is classified under the following ICS (International Classification for Standards) categories: 31.220.01 - Electromechanical components in general. The ICS classification helps identify the subject area and facilitates finding related standards.

What standards are related to IEC 60512-1-4:1997/COR1:2000?

IEC 60512-1-4:1997/COR1:2000 has the following relationships with other standards: It is inter standard links to IEC 60512-1-4:1997. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.

How can I access IEC 60512-1-4:1997/COR1:2000?

IEC 60512-1-4:1997/COR1:2000 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.

Standards Content (Sample)

IEC 60512-1-4:1997/COR1:2000 -...

Publication 60512-1-4 de la CEI
IEC Publication 60512-1-4
(Première édition – 1997) (First edition – 1997)
Composants électromécaniques Electromechanical components
pour équipements électroniques − for electronic equipment −
Procédures d’essai de base Basic testing procedures
et méthodes de mesure − and measuring methods −
Partie 1: Généralités – Part 1: General –
Section 4: Essai 1d: Efficacité de la Section 4: Test 1d: Contact protection
protection des contacts (scoop-proof) effectiveness (sco
...

IEC

IEC 60603-7:2020(Main)

Connectors for electronic equipment - Part 7: Detail specification for 8-way, unshielded, free and fixed connectors

IEC 60603-7:2020 covers 8-way, unshielded, free and fixed connectors and is intended to specify the common dimensions (interface dimensions), mechanical, electrical and environmental characteristics and tests for the family of IEC 60603-7-x connectors. These connectors are intermateable (according to IEC 61076-1 level 2) and interoperable with other IEC 60603-7 series connectors. This fourth edition cancels and replaces the third edition, published in 2008, its Amendment 1:2011 and its Amendment 2:2019. It constitutes a technical revision. This edition includes the following significant technical change with respect to the previous edition:
- Revised the definitions for intermateability and interoperability; added new definitions.
- Corrected dimension line for dimension AZ2 in Figure 5.
- Corrected dimension line for dimension F1 in Figure A.1.
- Revised the reference to ISO;IEC 11801 to ISO;IEC 11801-1.
- Added lower limiting temperature and upper limiting temperature definitions.
- Revised Table 1 to Table 8 so the column order is Minimum-Nominal-Maximum dimensions (ascending order).
- Corrected Table 7: Climatic category and Upper temperature values to 90 °C (to be consistent with the graph in Figure 10 and Note 1 in Figure 10).
- Revised the wording in 8.2, contact resistance, for clarification.
- Revised Figure 11 and Figure 12 and the wording in the Key below for clarification.
- Removed the sentences under the figure in the Introduction.
- Added Annex E.

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SC 48B

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IEC 60512-9-5:2020(Main)

Connectors for electrical and electronic equipment - Tests and measurements - Part 9-5: Endurance tests - Test 9e: Current loading, cyclic

IEC 60512-9-5:2020 when required by the detail product specification, is used for testing connectors or solderless connections within the scope of technical committee 48. It may also be used for similar devices when specified in a detail product specification. The object of this document is to detail a standard method for subjecting solderless connections to thermal stress conditioning by cyclic current loading. This second edition cancels and replaces the first edition published in 2010. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
- added method B and renamed the former test method as method A, to provide an alternative with more adjustable time "ON" and "OFF" for products with larger thermal mass.
- added introduction to provide background of this revision.

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IEC 60512-11-1:2019(Main)

Connectors for electrical and electronic equipment - Tests and measurements - Part 11-1: Climatic tests - Test 11a - Climatic sequence

IEC 60512-11-1:2019 est utilisée, lorsque la spécification particulière (de produit) l'exige, pour soumettre à l'essai des connecteurs qui entrent dans le domaine d'application du comité d'études 48 de l'IEC. Cet essai peut aussi être utilisé sur des dispositifs similaires (c'est-à-dire lorsque les mécanismes de dégradation sont les mêmes) lorsqu'une spécification particulière (de produit) l'indique. L'objet de cet essai est de définir une méthode d'essai normalisée pour évaluer l'aptitude des connecteurs à fonctionner de manière spécifiée dans un environnement spécifié qui pourrait être rencontré dans des conditions normales d'utilisation, y compris le stockage. Le présent document fournit une méthode d'essai composite normalisée pour déterminer l'aptitude des connecteurs soumis à des conditions d'environnement consistant en une séquence de contraintes climatiques comportant température, humidité, et si cela est exigé, basse pression. Mots clés: connecteurs, Essais climatiques

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IEC 60603-7:2008/AMD2:2019(Amendment)

Amendment 2 - Connectors for electronic equipment - Part 7: Detail specification for 8-way, unshielded, free and fixed connectors

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17 pages
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IEC

IEC 60512-23-3:2018(Main)

Connectors for electrical and electronic equipment - Tests and measurements - Part 23-3: Screening and filtering tests - Test 23c: Shielding effectiveness of connectors and accessories - Line injection method

IEC 60512-23-3:2018. defines a standard test method for measuring the shielding effectiveness SE of a shielded connector, or of a connector not provided with integral shield once fitted with a shielding accessory and terminated with a screened cable. The complete assembly has a continuous 360° shielding capability throughout its length. This test method can be applied to shielded connectors and to connector accessories with shielding capability. The following different connector designs can be tested:
- circular connectors;
- rectangular connectors;
- connectors for printed boards;
- connector shielding accessories.
This test method utilizes the principle that the intrinsic shielding property of the connector/ accessory/cable assembly is its surface transfer impedance ZT which can be expressed as the longitudinal voltage inside the shield, relative to the current flow on the outside shell. This test is also suitable for measuring the shielding effectiveness of a connector fitted with triaxial contacts terminated with shielded, twisted pair cables, as used in data bus systems. This second edition cancels and replaces the first edition, published in 2000. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) an introduction has been added to provide some guidance to this document in view of concurrent test method 23g in the same family;
b) the frequency range for which this test method is considered reliable moved from 1 GHz to 3 GHz, to be consistent with Figure 7 (unchanged) and current industry practice and need;
c) update to IEC 62153-4-6:2017 of former normative reference IEC 60096-4-1:1990, withdrawn and incorrect (should have been IEC 61196-1:1995, also withdrawn);
d) update to current subclause numbers of IEC 62153-4-6:2017 what were the previous subclause numbers referenced in IEC 61196-1:1995 (wrongly attributed to IEC 60096-4-1:1990). For immediate understanding the title of these subclauses has been added;
e) alignment of title to the current scope of SC 48B (connectors) and inclusion of electrical equipment as target application of said connectors (per current scope of TC 48) and explicit reference to the method – line injection – for the measurement of transfer impedance;
f) symbols SE for shielding effectiveness and ZT for surface transfer impedance added throughout the document;
g) list of connectors to which the test method is applicable – previously in 3.1 – moved in scope;
h) former name of AECMA organization changed to the current ASD-STAN;
i) “specimen” used instead of “sample” throughout the document;
j) clarification in the title of what transfer impedance is described in Table 3 and editorial improvement of the same;
k) “dielectric constant” changed into the updated term “relative permittivity”;
l) added a note to warn about the fact that this test method requires in 6.6 a TDR with more stringent rise time of less than 100 ps than the value of less than 350 ps specified both in IEC 62153-4-6 and in EN 50289-1-6 for the similar line injection method applied to screened cables, whereas test 23g of IEC 60512-23-7 specifies for the same purpose a TDR with a rise time of less than 200 ps;
m) adoption of term “connector housing” [IEV 581-27-10] instead of “shell” to address the connector accessory providing the shielding;
n) title “Transfer impedance ZT [Ω]” added to the ordinate axis on the left side of double log diagram of Figure 7;
o) explanatory note to clarify the conversion formula for SE from ZT added.
Key words: Connectors, Screening and Filtering Tests, Shielding Effectiveness

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46 pages
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30 pages
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13-Dec-2018
31.220.01
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IEC

IEC 60512-8-3:2018(Main)

Connectors for electrical and electronic equipment - Tests and measurements - Part 8-3: Static load tests (fixed connectors) - Test 8c: Robustness of actuating lever

IEC 60512-8-3:2018 Lorsque la spécification particulière (de produit) l’exige, la présente partie de l'IEC 60512 est utilisée pour les essais des connecteurs qui entrent dans le domaine d’application du comité d’études 48 de l'IEC. Elle peut aussi être utilisée pour des dispositifs similaires, lorsqu’une spécification particulière (de produit) le spécifie. L’objet de ce document est de détailler une méthode d’essai normalisée pour évaluer la robustesse de l’ergot d’activation d’un mécanisme d’accouplement ou de relâchement de la connexion. Cette deuxième édition annule et remplace la première édition parue en 2011. La présente édition constitue une révision technique. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente: La présente édition reflète l'IEC 60512-1-101, Spécification particulière cadre et le paragraphe 4.2 (Préparation du spécimen) est amélioré. Mots clés: connecteurs, Essais de charge statique (embases)

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IEC 60603-7:2008+AMD1:2011 CSV(Main)

Connectors for electronic equipment - Part 7: Detail specification for 8-way, unshielded, free and fixed connectors

IEC 60603-7:2008+A1:2011 covers 8-way unshielded free and fixed connectors and is intended to specify the common dimensions, mechanical, electrical and environmental characteristics and tests for the family of IEC 60603-7-x connectors. These connectors are intermateable and interoperable with other IEC 60603-7 series connectors. This new edition includes the following significant technical changes with respect to the previous edition:
- updated drawings and test schedules on the basis of IEC 60603-7-4;
- corrected figure illustrating a connector de-rating curve.
This consolidated version consists of the third edition (2008) and its amendment 1 (2011). Therefore, no need to order amendment in addition to this publication.

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IEC 60512-9-2:2011(Main)

Connectors for electronic equipment - Tests and measurements - Part 9-2: Endurance tests - Test 9b: Electrical load and temperature

IEC 60512-9-2:2011 when required by the detail specification, this part of IEC 60512, is used for testing connectors within the scope of technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of this standard is to detail a standard test method to assess the ability of a connector to withstand elevated temperatures with electrical loading. This standard cancels and replaces Test 9b of IEC 60512-5, issued in 1992.

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13 pages
English and French language
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13 pages
English and French language
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27-Nov-2011
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IEC

IEC 60512-7-2:2011(Main)

Connectors for electronic equipment - Tests and measurements - Part 7-2: Impact tests (free components) - Test 7b: Mechanical strength impact

IEC 60512-7-2:2011 when required by the detail specification, is used for testing connectors within the scope of technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of this standard is to detail a standard test method to assess the ability of a free connector on the end of a cable or wire bundle to withstand impacts it could receive when dropped onto a hard surface.

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IEC 60603-7:2008/AMD1:2011(Amendment)

Amendment 1 - Connectors for electronic equipment - Part 7: Detail specification for 8-way, unshielded, free and fixed connectors

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General Information

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IEC 60512-1-4:1997/COR1:2000 - Corrigendum 1 - Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 1: General - Section 4: Test 1d: Contact protection effectiveness (scoop-proof) Released:11/15/2000

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IEC 60512-1-4:1997/COR1:2000 - Corrigendum 1 - Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 1: General - Section 4: Test 1d: Contact protection effectiveness (scoop-proof) Released:11/15/2000

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