IEC 62271-101:2021

High-voltage switchgear and controlgear - Part 101: Synthetic testing

IEC 62271-101:2021 mainly applies to AC circuit-breakers within the scope of IEC 62271-100. It provides the general rules for testing AC circuit-breakers, for making and breaking capacities over the range of test duties described in 7.102 to 7.111 of IEC 62271-100:2021, by synthetic methods.
It has been proven that synthetic testing is an economical and technically correct way to test high-voltage AC circuit-breakers according to the requirements of IEC 62271-100 and that it is equivalent to direct testing.
The methods and techniques described are those in general use. The purpose of this document is to establish criteria for synthetic testing and for the proper evaluation of results. Such criteria will establish the validity of the test method without imposing restraints on innovation of test circuitry.
This third edition cancels and replaces the second edition published in 2012 and Amendment 1:2017. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the second edition:
a) alignment with the third edition of IEC 62271-100:2021;
b) update this document with the last methods and techniques used for synthetic tests.
The contents of the corrigendum of October 2021 have been included in this copy.

Appareillage à haute tension - Partie 101: Essais synthétiques

L’IEC 62271-101:2021 s’applique principalement aux disjoncteurs à courant alternatif définis dans le domaine d’application de l’IEC 62271-100. Elle donne les règles générales d’essais de ces disjoncteurs, pour les pouvoirs de fermeture et de coupure dans la plage des séquences d’essais décrites de 7.102 à 7.111 de l’IEC 62271-100:2021, à l'aide de méthodes d'essais synthétiques.
Il a été démontré que l'essai synthétique est un moyen économique et techniquement valable pour soumettre à l’essai les disjoncteurs à courant alternatif à haute tension selon les exigences de l’IEC 62271-100, et qu’il est équivalent à un essai direct.
Les méthodes et techniques décrites sont celles d’usage courant. L’objet du présent document est d'établir des critères pour les essais synthétiques et pour l'évaluation correcte des résultats. Ces critères établissent la validité de la méthode d'essai sans limiter l'invention de nouveaux circuits d'essais.
Cette troisième édition annule et remplace la deuxième édition parue en 2012 et l’Amendement 1:2017. Cette édition constitue une révision technique.
Cette édition inclut les modifications techniques majeures suivantes par rapport à la deuxième édition:
a) alignement sur la troisième édition de l’IEC 62271-100:2021;
b) mise à jour du présent document avec les méthodes et techniques récentes utilisées pour les essais synthétiques.
Le contenu du corrigendum d’octobre 2021 a été pris en considération dans cet exemplaire.

General Information

• Status: Published
• Publication Date: 26-Jul-2021
• ICS: 29.130.10 - High voltage switchgear and controlgear
• Technical Committee: SC 17A - Switching devices
• Current Stage: PPUB - Publication issued
• Completion Date: 27-Jul-2021

Standards Content (sample)

IEC 62271-101
Edition 3.0 2021-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
High-voltage switchgear and controlgear –
Part 101: Synthetic testing
Appareillage à haute tension –
Partie 101: Essais synthétiques
IEC 62271-101:2021-07(en-fr)
---------------------- Page: 1 ----------------------
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---------------------- Page: 2 ----------------------
IEC 62271-101
Edition 3.0 2021-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
High-voltage switchgear and controlgear –
Part 101: Synthetic testing
Appareillage à haute tension –
Partie 101: Essais synthétiques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 29.130.10 ISBN 978-2-8322-1004-6

Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
---------------------- Page: 3 ----------------------
– 2 – IEC 62271-101:2021 © IEC 2021
CONTENTS

FOREWORD ......................................................................................................................... 9

1 Scope .......................................................................................................................... 11

2 Normative references................................................................................................... 11

3 Terms and definitions .................................................................................................. 11

4 Synthetic testing techniques and methods for short-circuit breaking tests ...................... 13

4.1 Basic principles and general requirements for synthetic breaking test

methods .............................................................................................................. 13

4.1.1 General ....................................................................................................... 13

4.1.2 High-current interval ..................................................................................... 14

4.1.3 Interaction interval ....................................................................................... 15

4.1.4 High-voltage interval .................................................................................... 15

4.2 Synthetic test circuits and related specific requirements for breaking tests ........... 18

4.2.1 Current injection methods ............................................................................. 18

4.2.2 Voltage injection method .............................................................................. 19

4.2.3 Duplicate circuit method (transformer or Skeats circuit) ................................. 20

4.2.4 Other synthetic test methods ........................................................................ 20

4.3 Three-phase synthetic test methods .................................................................... 20

5 Synthetic testing techniques and methods for short-circuit making tests ........................ 24

5.1 Basic principles and general requirements for synthetic making test methods ....... 24

5.1.1 General ....................................................................................................... 24

5.1.2 High-voltage interval .................................................................................... 27

5.1.3 Pre-arcing interval ........................................................................................ 27

5.1.4 Latching interval and fully closed position ..................................................... 27

5.2 Synthetic test circuit and related specific requirements for making tests ............... 27

5.2.1 General ....................................................................................................... 27

5.2.2 Test circuit and test requirements ................................................................. 27

5.2.3 Alternative test method with reduced voltage ................................................ 32

7 Type tests ................................................................................................................... 33

7.102 General ............................................................................................................... 33

7.104 Demonstration of arcing times ............................................................................. 34

7.107 Terminal fault tests .............................................................................................. 45

7.109 Short-line fault tests ............................................................................................ 49

7.110 Out-of-phase making and breaking tests .............................................................. 50

7.111 Capacitive current tests ....................................................................................... 50

Annex A (normative) Correction of di/dt and TRV for test duty T100a .................................. 53

A.1 General ............................................................................................................... 53

A.2 Reduction in di/dt ................................................................................................ 53

A.3 Corrected TRV for the first-pole-to-clear with required asymmetry ........................ 53

A.4 Correction of the di/dt and TRV of the first-pole-to-clear for tests with

intermediate asymmetry ...................................................................................... 60

A.5 Correction of the di/dt and TRV of the second- or last-pole-to-clear with

major extended loop with required asymmetry during three-phase tests ................ 61

A.6 Correction of the di/dt and TRV during tests with a subsequent minor loop ........... 61

A.7 Calculation of the di/dt and TRV of the first-pole-to-clear ..................................... 61

A.7.1 General ....................................................................................................... 61

A.7.2 Calculation of di/dt ....................................................................................... 61

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IEC 62271-101:2021 © IEC 2021 – 3 –

A.7.3 Calculation of TRV ....................................................................................... 62

A.7.4 Examples of calculation of di/dt and TRV ...................................................... 64

Annex B (normative) Tolerances on test quantities for type tests ......................................... 66

Annex C (normative) Information to be given and results to be recorded for synthetic

tests ................................................................................................................................... 69

C.1 General ............................................................................................................... 69

C.2 Auxiliary circuit-breaker ....................................................................................... 69

C.3 Test conditions .................................................................................................... 69

C.4 Quantities to be recorded .................................................................................... 69

C.4.1 General ....................................................................................................... 69

C.4.2 Voltages ...................................................................................................... 69

C.4.3 Currents ...................................................................................................... 69

Annex D (normative) Test procedure using a three-phase current circuit and one

voltage circuit ..................................................................................................................... 70

D.1 Test circuit .......................................................................................................... 70

D.2 Test method ........................................................................................................ 71

D.2.1 General ....................................................................................................... 71

D.2.2 Test duty T100s(b) ....................................................................................... 71

D.2.3 Test duty T100a ........................................................................................... 80

D.2.4 Combination of first-pole-to-clear factors 1,3 and 1,5 .................................... 89

Annex E (normative) Splitting of test duties in test series taking into account the

associated TRV for each pole-to-clear ................................................................................. 92

E.1 General ............................................................................................................... 92

E.2 Test-duties T10, T30, T60, T100s(b), OP1 and OP2(b)......................................... 92

E.2.1 Test procedure for first-pole-to-clear factors 1,5 and 2,5 ............................... 92

E.2.2 Test procedure for first-pole-to-clear factors 1,3 and 2,0 ............................... 93

E.2.3 Test procedure for first-pole-to-clear factor 1,2 ............................................. 94

E.3 Test duty T100a .................................................................................................. 95

E.3.1 General ....................................................................................................... 95

E.3.2 Test procedure for first-pole-to-clear factor 1,5 ............................................. 96

E.3.3 Test procedure for first-pole-to-clear factor 1,3 ............................................. 97

E.3.4 Test procedure for first-pole-to-clear factor 1,2 ............................................. 99

E.4 Combination of first-pole-to-clear factors ........................................................... 100

E.4.1 General ..................................................................................................... 100

E.4.2 Combination of first-pole-to-clear factors 1,3 and 1,5 for test duties T10,

T30, T60 and T100s(b) ............................................................................... 100

E.4.3 Combination of first-pole-to-clear factors 2,0 and 2,5 for test duties OP1

and OP2(b) ................................................................................................ 101

E.4.4 Combination of first-pole-to-clear factors 1,3 and 1,5 for test duty T100a ..... 102

Annex F (informative) Three-phase synthetic test circuits ................................................. 114

F.1 General ............................................................................................................. 114

F.2 Three-phase synthetic combined circuit ............................................................. 114

F.3 Three-phase synthetic circuit with injection in all phases .................................... 117

F.4 Three-phase synthetic circuit with injection in two phases .................................. 118

Annex G (informative) Examples of test circuits for metal-enclosed and dead tank

circuit-breakers ................................................................................................................. 122

Annex H (informative) Step-by-step method to prolong arcing ........................................... 133

Annex I (informative) Synthetic methods for capacitive current tests ................................. 135

I.1 General ............................................................................................................. 135

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– 4 – IEC 62271-101:2021 © IEC 2021

I.2 Recovery voltage .............................................................................................. 135

I.3 Combined current and voltage circuits ............................................................... 135

I.4 Making tests ..................................................................................................... 136

I.5 Current chopping .............................................................................................. 136

I.6 Examples test circuits ....................................................................................... 136

Annex J (normative) Synthetic test methods for circuit-breakers with opening resistors ..... 145

J.1 General ............................................................................................................. 145

J.2 Conditions......................................................................................................... 145

J.2.1 General ..................................................................................................... 145

J.2.2 Transient recovery voltage interval ............................................................. 145

J.2.3 Power-frequency recovery voltage interval .................................................. 145

J.3 Multiple step test procedure .............................................................................. 145

J.3.1 General ..................................................................................................... 145

J.3.2 Test to verify the re-ignition behaviour of the making and breaking unit ....... 146

J.3.3 Test to verify the re-ignition behaviour of the making and breaking unit

during short circuit test duties with any test method .................................... 147

J.3.4 Tests on resistor switch(s) .......................................................................... 148

J.4 Test requirements ............................................................................................. 149

J.4.1 General ..................................................................................................... 149

J.4.2 Testing of the making and breaking unit ...................................................... 150

J.4.3 Testing of the resistor switch ...................................................................... 151

J.4.4 Test of the resistor stack ............................................................................ 151

Annex K (informative) Combination of current injection and voltage injection methods ....... 152

K.1 Current injection methods .................................................................................. 152

K.2 Voltage injection methods ................................................................................. 152

K.3 Combined current and voltage injection circuits.................................................. 152

K.3.1 General ..................................................................................................... 152

K.3.2 Combined current and voltage injection circuit with application of full

test voltage to earth ................................................................................... 152

K.3.3 Combined current and voltage injection circuit with separated

application of test voltage ........................................................................... 152

Bibliography ..................................................................................................................... 155

Figure 1 – Interrupting process – Basic time intervals .......................................................... 14

Figure 2 – Examples of evaluation of initial recovery voltage ................................................ 17

Figure 3 – Equivalent surge impedance of the voltage circuit for the current injection

method ............................................................................................................................... 19

Figure 4 – Reference lines of TRV with four-parameter for k = 1,5 .................................... 22

Figure 5 – Reference lines of TRV with four-parameter for k = 1,3 .................................... 23

Figure 6 – Reference lines of TRV with four-parameter for k = 1,2 .................................... 24

Figure 7 – Making process – Basic time intervals ................................................................. 26

Figure 8 – Example of synthetic making circuit for single-phase tests ................................... 29

Figure 9 – Example of synthetic making circuit for out-of-phase tests ................................... 30

Figure 10 – Example of synthetic making circuit for three-phase tests (k = 1,5) ................. 31

Figure 11 – Comparison of arcing time settings during three-phase direct tests (left)

and three-phase synthetic (right) for T100s with k = 1,5 ................................................... 37

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IEC 62271-101:2021 © IEC 2021 – 5 –

Figure 12 – Comparison of arcing time settings during three-phase direct tests (left)

and three-phase synthetic (right) for T100s with k = 1,3 ................................................... 38

Figure 13 – Comparison of arcing time settings during three-phase direct tests (left)

and three-phase synthetic tests (right) for T100a with k = 1,5 ........................................... 41

Figure 14 – Comparison of arcing time settings during three-phase direct tests (left)

and three-phase synthetic tests (right) for T100a with k = 1,3 ........................................... 42

Figure 15 – Evaluation of recovery voltage during synthetic capacitive current

switching testing ................................................................................................................. 52

Figure D.1 – Example of a three-phase current circuit with single-phase synthetic

injection .............................................................................................................................. 71

Figure D.2 – Representation of the testing conditions of Table D.1....................................... 73

Figure D.3 – Representation of the testing conditions of Table D.2....................................... 75

Figure D.4 – Representation of the testing conditions of Table D.3....................................... 77

Figure D.5 – Representation of the testing conditions of Table D.4....................................... 79

Figure D.6 – Representation of the testing conditions of Table D.5....................................... 82

Figure D.7 – Representation of the testing conditions of Table D.6....................................... 84

Figure D.8 – Representation of the testing conditions of Table D.7....................................... 86

Figure D.9 – Representation of the testing conditions of Table D.8....................................... 88

Figure E.1 – Example of graphical representation of the tests shown in Table E.6 ................ 97

Figure E.2 – Example of graphical representation of the tests shown in Table E.7 and

Table E.8 ............................................................................................................................ 99

Figure F.1 – Three-phase synthetic combined circuit ......................................................... 115

Figure F.2 – Waveshapes of currents, phase-to-ground and phase-to phase voltages
during a three-phase synthetic test (T100s; k = 1,5) performed according to the

three-phase synthetic combined circuit .............................................................................. 116

Figure F.3 – Three-phase synthetic circuit with injection in all phases for k = 1,5 ............ 117

Figure F.4 – Waveshapes of currents and phase-to-ground voltages during a three-
phase synthetic test (T100s; k = 1,5) performed according to the three-phase

synthetic circuit with injection in all phases ........................................................................ 118

Figure F.5 – Three-phase synthetic circuit for terminal fault tests with k = 1,3

(current injection method) ................................................................................................. 119

Figure F.6 – Waveshapes of currents and phase-to-ground voltages during a

three-phase synthetic test (T100s; k = 1,3 ) performed according to the three-phase

synthetic circuit shown in Figure F.5 .................................................................................. 120

Figure F.7 – TRV voltages waveshapes of the test circuit described in Figure F.5 .............. 121

Figure G.1 – Example of a test circuit for unit testing (circuit-breaker with interaction

due to gas circulation) ....................................................................................................... 123

Figure G.2 – Oscillogram corresponding to Figure G.1 – Example of the required TRVs

to be applied between the terminals of the unit(s) under test and between the live parts

and the insulated enclosure .............................................................................................. 124

Figure G.3 – Example of test circuit using two voltage circuits for breaking tests ................ 125

Figure G.4 – Example of test circuit using two voltage circuits for breaking tests ................ 126

Figure G.5 – Example of a synthetic test circuit for unit testing (if unit testing is allowed

as per 7.102.4.2 of IEC 62271-100:2021) .......................................................................... 127

Figure G.6 – Oscillogram corresponding to Figure G.3 – Example of the required TRVs

to be applied between the terminals of the unit(s) under test and between the live parts

and the insulated enclosure .............................................................................................. 128

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– 6 – IEC 62271-101:2021 © IEC 2021

Figure G.7 – Example of a capacitive current injection circuit with enclosure of the

circuit-breaker energized .................................................................................................. 129

Figure G.8 – Example of a capacitive synthetic circuit using two power-frequency

circuits and with the enclosure of the circuit-breaker energized .......................................... 130

Figure G.9 – Example of a capacitive synthetic current injection circuit – Unit testing on

half a pole of a circuit-breaker with two units per pole – Enclosure energized with DC

voltage ............................................................................................................................. 131

Figure G.10 – Example of a synthetic making circuit for out-of-phase tests ........................ 132

Figure H.1 – Example of a re-ignition circuit diagram for prolonging arc-duration ................ 133

Figure H.2 – Example of waveforms obtained during a symmetrical test using the

circuit in Figure H.1........................................................................................................... 134

Figure I.1 – Power-frequency circuits in parallel................................................................. 138

Figure I.2 – Current injection circuit ................................................................................... 139

Figure I.3 – Power-frequency current injection circuit ......................................................... 140

Figure I.4 – Current injection circuit, recovery voltage applied to both terminals of the

circuit-breaker .................................................................................................................. 141

Figure I.5 – Current injection circuit with decay compensation............................................ 142

Figure I.6 – LC oscillating circuit ....................................................................................... 143

Figure I.7 – Inrush making current test circuit .................................................................... 144

Figure J.1 – Test circuit to verify re-ignition behaviour of the making and breaking unit

using current injection method........................................................................................... 147

Figure J.2 – Test circuit to verify re-ignition behaviour of the making and breaking unit ...... 148

Figure J.3 – Test circuit on the resistor switch ................................................................... 149

Figure J.4 – Example of test circuit for capacitive current switching tests on the making

and breaking unit .............................................................................................................. 150

Figure J.5 – Example of test circuit for capacitive current switching tests on the resistor

switch ............................................................................................................................... 151

Figure K.1 – Example of combined current
...