IEC 62024-1:2008

High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor

IEC 62024-1:2008 specifies electrical characteristics and measuring methods for the nanohenry range chip inductor that is normally used in high frequency (over 100 kHz) range. This edition includes the following significant technical changes with respect to the previous edition:
a) sizes 0402 added in Table 1 and Table 2;
b) contents of 4.4 reviewed for easier understanding;
c) correct errors in 3.1.4.2.

Composants inductifs à haute fréquence - Caractéristiques électriques et méthodes de mesure - Partie 1: Inductance pastille de l'ordre du nanohenry

La CEI 62024-1:2008 spécifie les caractéristiques électriques et les méthodes de mesure pour l'inductance pastille de l'ordre du nanohenry qui est normalement utilisée dans la gamme des hautes fréquences (supérieures à 100 kHz). Par rapport à l'édition précédente, les principales modifications techniques sont les suivantes:
a) tailles 0402 ajoutées dans le Tableau 1 et le Tableau 2;
b) contenu de 4.4 révisé pour en faciliter la compréhension;
c) erreurs de 3.1.4.2 corrigées.

General Information

• Status: Published
• Publication Date: 21-Feb-2008
• ICS: 29.100.10 - Magnetic components
• Technical Committee: TC 51 - Magnetic components, ferrite and magnetic powder materials
• Drafting Committee: MT 9 - TC 51/MT 9
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 13-Dec-2017

Relations

• Corrected By: IEC 62024-1:2008/COR1:2008 - Corrigendum 1 - High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
• Effective Date: 05-Sep-2023
• Revises: IEC 62024-1:2002 - High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
• Effective Date: 05-Sep-2023
• Revised: IEC 62024-1:2017 - High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 62024-1
Edition 2.0 2008-02
INTERNATIONAL
STANDARD
High frequency inductive components – Electrical characteristics and measuring
methods –
Part 1: Nanohenry range chip inductor

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form

or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester.
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please contact the address below or your local IEC member National Committee for further information.

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IEC 62024-1
Edition 2.0 2008-02
INTERNATIONAL
STANDARD
High frequency inductive components – Electrical characteristics and measuring
methods –
Part 1: Nanohenry range chip inductor

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
R
ICS 29.100.10 ISBN 2-8318-9631-2

– 2 – 62024-1 © IEC:2008(E)
CONTENTS
FOREWORD.4

1 Scope.6

2 Normative references .6

3 Inductance, Q-factor and impedance .6

3.1 Inductance .6

3.1.1 Measuring circuit .7

3.1.2 Mounting of the inductor to the test fixture .7
3.1.3 Measurement method and calculation.9
3.1.4 Notes on measurement.9
3.2 Quality factor.10
3.2.1 Measurement method .10
3.2.2 Measurement circuit .11
3.2.3 Mounting of the inductor .11
3.2.4 Methods of measurement and calculation .11
3.2.5 Notes on measurement.11
3.3 Impedance .11
3.3.1 Measurement method .11
3.3.2 Measurement circuit .11
3.3.3 Measurement method and calculation.11
3.3.4 Notes on measurement.12
4 Resonance frequency.12
4.1 Self-resonance frequency.12
4.2 Minimum output method .12
4.2.1 Measurement circuit .12
4.2.2 Mounting the inductor for test .13
4.2.3 Measuring method .13
4.2.4 Note on measurement .14
4.3 Reflection method .14
4.3.1 Measurement circuit .14
4.3.2 Mounting the inductor for test .14
4.3.3 Measurement method .15
4.3.4 Notes on measurement.15

4.4 Measurement by analyser.16
4.4.1 Measurement by impedance analyser.16
4.4.2 Measurement by network analyser.16
5 DC resistance.16
5.1 Measuring circuit (Bridge method) .16
5.2 Measuring method and calculation formula.17
5.3 Precaution for measurement.17
5.4 Measuring temperature.18

Annex A (normative) Mounting method for a surface mounting coil .19

Figure 1 – Example of circuit for vector voltage/current method .7
Figure 2 – Fixture A .8

62024-1 © IEC:2008(E) – 3 –
Figure 3 – Fixture B .8

Figure 4 – Short device shape .10

Figure 5 – Example of test circuit for the minimum output method.12

Figure 6 – Self-resonance frequency test board (minimum output method) .13

Figure 7 – Example of test circuit for the reflection method .14

Figure 8 – Self-resonance frequency test board (reflection method).15

Figure 9 – Suitable test fixture for measuring self-resonance frequency.16

Figure 10 – Example of measuring circuit of d.c. resistance.17

Table 1 – Dimensions of l and d.8
Table 2 – Short device dimensions and inductances .10

– 4 – 62024-1 © IEC:2008(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION

____________
HIGH FREQUENCY INDUCTIVE COMPONENTS –

ELECTRICAL CHARACTERISTICS AND MEASURING METHODS –

Part 1: Nanohenry range chip inductor

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)“). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62024-1 has been prepared by IEC technical committee 51:
Magnetic components and ferrite materials.
This second edition cancels and replaces the first edition published in 2002. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) sizes 0402 added in Table 1 and Table 2;
b) contents of 4.4 reviewed for easier understanding;
c) correct errors in 3.1.4.2.
62024-1 © IEC:2008(E) – 5 –
The text of this standard is based on the following documents:

FDIS Report on voting
51/908/FDIS 51/915/RVD
Full information on the voting for the approval of this standard can be found in the report on

voting indicated in the above table.

This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

A list of all parts of IEC 62024 series, published under the general title High frequency

inductive components – Electrical characteristics and measuring methods, can be found on
the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.
The contents of the corrigendum of July 2008 have been included in this copy.

– 6 – 62024-1 © IEC:2008(E)
HIGH FREQUENCY INDUCTIVE COMPONENTS –

ELECTRICAL CHARACTERISTICS AND MEASURING METHODS –

Part 1: Nanohenry range chip inductor

1 Scope
This part of IEC 62024 specifies electrical characteristics and measuring methods for the
nanohenry range chip inductor that is normally used in high frequency (over 100 kHz) range.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendm
...

IEC 62024-1 ®
Edition 2.0 2008-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
High frequency inductive components – Electrical characteristics and measuring
methods –
Part 1: Nanohenry range chip inductor

Composants inductifs à haute fréquence – Caractéristiques électriques et
méthodes de mesure –
Partie 1: Inductance pastille de l'ordre du nanohenry

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form

or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,

please contact the address below or your local IEC member National Committee for further information.

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utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie et les

microfilms, sans l'accord écrit de la CEI ou du Comité national de la CEI du pays du demandeur.

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publication, utilisez les coordonnées ci-après ou contactez le Comité national de la CEI de votre pays de résidence.

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The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.

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IEC 62024-1 ®
Edition 2.0 2008-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
High frequency inductive components – Electrical characteristics and measuring

methods –
Part 1: Nanohenry range chip inductor

Composants inductifs à haute fréquence – Caractéristiques électriques et

méthodes de mesure –
Partie 1: Inductance pastille de l'ordre du nanohenry

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX R
ICS 29.100.10 ISBN 978-2-83220-350-7

– 2 – 62024-1  IEC:2008
CONTENTS
FOREWORD . 4

1 Scope . 6

2 Normative references . 6

3 Inductance, Q-factor and impedance . 6

3.1 Inductance . 6

3.1.1 Measuring circuit . 7

3.1.2 Mounting of the inductor to the test fixture . 7
3.1.3 Measurement method and calculation . 9
3.1.4 Notes on measurement . 9
3.2 Quality factor . 10
3.2.1 Measurement method . 10
3.2.2 Measurement circuit . 11
3.2.3 Mounting of the inductor . 11
3.2.4 Methods of measurement and calculation . 11
3.2.5 Notes on measurement . 11
3.3 Impedance . 11
3.3.1 Measurement method . 11
3.3.2 Measurement circuit . 11
3.3.3 Measurement method and calculation . 11
3.3.4 Notes on measurement . 12
4 Resonance frequency . 12
4.1 Self-resonance frequency . 12
4.2 Minimum output method . 12
4.2.1 Measurement circuit . 12
4.2.2 Mounting the inductor for test . 13
4.2.3 Measuring method . 13
4.2.4 Note on measurement . 14
4.3 Reflection method . 14
4.3.1 Measurement circuit . 14
4.3.2 Mounting the inductor for test . 14
4.3.3 Measurement method . 15
4.3.4 Notes on measurement . 15

4.4 Measurement by analyser. 16
4.4.1 Measurement by impedance analyser . 16
4.4.2 Measurement by network analyser . 16
5 DC resistance . 16
5.1 Measuring circuit (Bridge method) . 16
5.2 Measuring method and calculation formula . 17
5.3 Precaution for measurement . 17
5.4 Measuring temperature. 18

Annex A (normative) Mounting method for a surface mounting coil . 19

Figure 1 – Example of circuit for vector voltage/current method . 7
Figure 2 – Fixture A . 8

62024-1  IEC:2008 – 3 –
Figure 3 – Fixture B . 8

Figure 4 – Short device shape . 10

Figure 5 – Example of test circuit for the minimum output method . 12

Figure 6 – Self-resonance frequency test board (minimum output method) . 13

Figure 7 – Example of test circuit for the reflection method . 14

Figure 8 – Self-resonance frequency test board (reflection method) . 15

Figure 9 – Suitable test fixture for measuring self-resonance frequency . 16

Figure 10 – Example of measuring circuit of d.c. resistance . 17

Table 1 – Dimensions of l and d . 8
Table 2 – Short device dimensions and inductances . 10

– 4 – 62024-1  IEC:2008
INTERNATIONAL ELECTROTECHNICAL COMMISSION

____________
HIGH FREQUENCY INDUCTIVE COMPONENTS –

ELECTRICAL CHARACTERISTICS AND MEASURING METHODS –

Part 1: Nanohenry range chip inductor

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)“). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC Natio
...