IEC 62047-40:2021

Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold

IEC 62047-40:2021(E) specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open micro-electromechanical inertial shock switch.

General Information

• Status: Published
• Publication Date: 02-Sep-2021
• ICS: 31.080.99 - Other semiconductor devices
• Technical Committee: SC 47F - Micro-electromechanical systems
• Drafting Committee: WG 3 - TC 47/SC 47F/WG 3
• Current Stage: PPUB - Publication issued
• Start Date: 01-Oct-2021
• Completion Date: 03-Sep-2021

Standards Content (Sample)

IEC 62047-40 ®
Edition 1.0 2021-09
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices – Micro-electromechanical devices –
Part 40: Test methods of micro-electromechanical inertial shock switch
threshold
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IEC 62047-40 ®
Edition 1.0 2021-09
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices – Micro-electromechanical devices –

Part 40: Test methods of micro-electromechanical inertial shock switch

threshold
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.99 ISBN 978-2-8322-1018-7

– 2 – IEC 62047-40:2021 © IEC 2021
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 Essential ratings and characteristics . 7
4.1 Recommended operating condition . 7
4.2 Characteristics . 7
5 Test items and methods. 7
5.1 Switch type . 7
5.2 Static threshold . 7
5.2.1 Test method 1 . 7
5.2.2 Test method 2 . 8
5.3 Dynamic threshold . 10
5.3.1 Test system . 10
5.3.2 Test procedure . 11

Figure 1 – The schematic drawing of micro-electromechanical inertia shock switch . 6
Figure 2 – Test system 1 of static threshold . 7
Figure 3 – Test system 2 of static threshold . 9
Figure 4 – Circuit diagram of switch . 10
Figure 5 – Static threshold of switch . 10
Figure 6 – Test system of dynamic threshold . 10

Table 1 – Characteristics of the switch threshold . 7
Table 2 – Test parameters of static threshold . 8
Table 3 – Test parameters of dynamic threshold . 11

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
MICRO-ELECTROMECHANICAL DEVICES –

Part 40: Test methods of micro-electromechanical
inertial shock switch threshold

FOREWORD
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IEC 62037-40 has been prepared by subcommittee 47F: Micro-electromechanical systems, of
IEC technical committee 47: Semiconductor devices. It is an International Standard.
The text of this International Standard is based on the following documents:
DRAFT Report on voting
47F/384/FDIS 47F/388/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.

– 4 – IEC 62047-40:2021 © IEC 2021
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