IEC 60512-28-100:2019

Connectors for electrical and electronic equipment - Tests and measurements - Part 28-100: Signal integrity tests up to 2 000 MHz - Tests 28a to 28g

IEC 60512-28-100:2019 specifies the test methods for signal integrity and transmission performance for connectors specified in respective parts of IEC 60603-7, IEC 61076-1, IEC 61076-2, and IEC 61076-3 standards for connecting hardware applications up to 2 000 MHz. It is also suitable for testing lower frequency connectors, however, the test methodology specified in the detail specification for any given connector remains the reference conformance test for that connector. The above list of connector series of standards does not preclude referencing this document in other connector manufacturer’s specifications or published standards. Test procedures provided herein are:
- insertion loss, test 28a;
- return loss, test 28b;
- near-end crosstalk (NEXT) test 28c;
- far-end crosstalk (FEXT), test 28d;
- transverse conversion loss (TCL), test 28f;
- transverse conversion transfer loss (TCTL), test 28g.
Other test procedures referenced herein are:
- transfer impedance (ZT), see IEC 60512-26-100, test 26e.
- for coupling attenuation (aC), see IEC 62153 4 12.
This second edition cancels and replaces the first edition, issued in 2013, and constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
- The title is revised from 1 000 MHz to 2 000 MHz to reflect the range of frequencies which may be tested.
- All tables and requirements have been revised up to 2 000 MHz.
Key words: Connectors, Signal Integrity Tests

Connecteurs pour équipements électriques et électroniques - Essais et mesures - Partie 28-100: Essais d’intégrité des signaux jusqu’à 2 000 MHz - Essais 28a à 28g

L'IEC 60512-28-100:2019 spécifie les méthodes d’essai d’intégrité des signaux et de qualité de transmission pour des connecteurs spécifiés dans les parties respectives des normes IEC 60603-7, IEC 61076-1, IEC 61076-2 et IEC 61076-3 pour des applications de matériel de connexion jusqu’à 2 000 MHz. Elle s’applique également aux essais de connecteurs de fréquences inférieures, mais la méthodologie d’essai stipulée dans la spécification particulière pour tout connecteur donné reste l’essai de conformité de référence pour le connecteur en question. La liste ci-dessus de séries de normes concernant les connecteurs n’exclut pas le fait de faire référence au présent document dans d’autres normes publiées ou spécifications des fabricants de connecteurs. Les procédures spécifiées ici sont:
- perte d’insertion, essai 28a;
- affaiblissement de réflexion, essai 28b;
- paradiaphonie (NEXT), essai 28c;
- télédiaphonie (FEXT), essai 28d;
- perte de conversion transverse (TCL), essai 28f;
- perte de transfert de conversion transverse (TCTL), essai 28g.
Les autres procédures citées ici en référence sont:
- impédance de transfert (ZT), voir l’IEC 60512-26-100, essai 26e;
- pour l’affaiblissement de couplage (aC), voir l’IEC 62153 4 12.
Cette deuxième édition annule et remplace la première édition parue en 2013 et constitue une révision technique. Cette édition inclut les modifications techniques majeures suivantes par rapport à l’édition précédente:
- Le titre a été modifié, 1 000 MHz a été remplacé par 2 000 MHz afin de refléter la plage des fréquences qui peuvent être soumises à des essais.
- Tous les tableaux et toutes les exigences ont été révisés jusqu’à 2 000 MHz.
Mots-clés: connecteurs, essai d’intégrité des signaux

General Information

• Status: Published
• Publication Date: 14-Nov-2019
• ICS: 31.220.10 - Plug-and-socket devices. Connectors
• Technical Committee: SC 48B - Electrical connectors
• Current Stage: DELPUB - Deleted Publication
• Start Date: 02-Aug-2024
• Completion Date: 18-Nov-2021

Relations

• Revises: IEC 60512-28-100:2013 - Connectors for electronic equipment - Tests and measurements - Part 28-100: Signal integrity tests up to 1 000 MHz on IEC 60603-7 and IEC 61076-3 series connectors - Tests 28a to 28g
• Effective Date: 05-Sep-2023
• Revised: IEC 60512-28-100:2024 - Connectors for electrical and electronic equipment - Tests and measurements - Part 28-100: Signal integrity tests up to 2 000 MHz - Tests 28a to 28g
• Effective Date: 05-Sep-2023

Overview

IEC 60512-28-100:2019 defines standardized signal integrity tests for connectors used in electrical and electronic equipment, extending the test frequency range up to 2 000 MHz. It specifies test methods and measurement arrangements to evaluate transmission performance of connector series referenced in IEC 60603-7 and IEC 61076-1/2/3 and can be applied to lower-frequency connector types (while the connector’s own detail specification remains the primary conformance reference).

This second edition updates the previous 1 000 MHz scope to 2 000 MHz and revises tables and requirements throughout.

Key topics and technical requirements

• Signal integrity measurements (Tests 28a–28g):
  • Test 28a - Insertion loss
  • Test 28b - Return loss
  • Test 28c - Near-end crosstalk (NEXT)
  • Test 28d - Far-end crosstalk (FEXT)
  • Test 28f - Transverse conversion loss (TCL)
  • Test 28g - Transverse conversion transfer loss (TCTL)
• Referenced procedures
  • Shield transfer impedance (ZT) - see IEC 60512-26-100 (test 26e)
  • Coupling attenuation (aC) - see IEC 62153‑4‑12
• Measurement infrastructure and best practice
  • Use of vector network analysers (VNA), RF switching units, controlled coaxial interconnects and calibrated reference loads
  • Mixed-mode S‑parameter nomenclature and modal decomposition techniques for balanced pair measurements
  • Detailed requirements for test fixtures (indirect-reference, direct-probe, specialized) and termination loads
  • Calibration at the defined reference plane and verification of termination symmetry and impedance matching
• Test reporting and accuracy guidance for each measurement type

Practical applications

• Qualification and performance verification of high-speed connectors used in:
  • Data communications (Ethernet, datacenter interconnects)
  • Telecommunications and networking equipment
  • Industrial and electronic assemblies requiring controlled transmission up to 2 GHz
• Use cases include connector design validation, production test, compliance verification, and supplier qualification.
• Test labs, OEMs, connector manufacturers and compliance engineers use this standard to ensure consistent, repeatable signal integrity results across suppliers and test facilities.

Who should use this standard

• Connector manufacturers and R&D teams validating mating hardware
• Independent test and certification laboratories
• System integrators and OEMs specifying connector performance for high-speed links
• Quality and compliance engineers establishing test programs for interconnects

Related standards

• IEC 60603-7, IEC 61076-1/2/3 (connector family specifications)
• IEC 60512-26-100 (transfer impedance test 26e)
• IEC 62153-4-12 (coupling attenuation)

Keywords: IEC 60512-28-100:2019, Connectors, Signal Integrity Tests, insertion loss, return loss, NEXT, FEXT, TCL, TCTL, transfer impedance, mixed‑mode S‑parameters.

Standards Content (Sample)

IEC 60512-28-100 ®
Edition 2.0 2019-11
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
Connectors for electrical and electronic equipment – Tests and measurements –
Part 28-100: Signal integrity tests up to 1 000 MHz on IEC 60603-7 and
IEC 61076-3 series connectors 2 000 MHz – Tests 28a to 28g

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.

IEC Central Office Tel.: [phone]
3, rue de Varembé [e-mail]
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.

IEC publications search - webstore.iec.ch/advsearchform Electropedia - www.electropedia.org
The advanced search enables to find IEC publications by a The world's leading online dictionary on electrotechnology,
variety of criteria (reference number, text, technical containing more than 22 000 terminological entries in English
committee,…). It also gives information on projects, replaced and French, with equivalent terms in 16 additional languages.
and withdrawn publications. Also known as the International Electrotechnical Vocabulary

(IEV) online.
IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Glossary - std.iec.ch/glossary
details all new publications released. Available online and 67 000 electrotechnical terminology entries in English and
once a month by email. French extracted from the Terms and Definitions clause of
IEC publications issued since 2002. Some entries have been
IEC Customer Service Centre - webstore.iec.ch/csc collected from earlier publications of IEC TC 37, 77, 86 and
If you wish to give us your feedback on this publication or CISPR.

need further assistance, please contact the Customer Service

Centre: [e-mail].
IEC 60512-28-100 ®
Edition 2.0 2019-11
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
Connectors for electrical and electronic equipment – Tests and measurements –

Part 28-100: Signal integrity tests up to 1 000 MHz on IEC 60603-7 and

IEC 61076-3 series connectors 2 000 MHz – Tests 28a to 28g

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.220.10 ISBN 978-2-8322-7632-7

– 2 – IEC 60512-28-100:2019 RLV © IEC 2019
CONTENTS
FOREWORD . 6
1 Scope . 8
2 Normative references . 8
3 Terms, definitions and acronyms abbreviated terms . 10
3.1 Terms and definitions . 11
3.2 Acronyms Abbreviated terms . 11
4 Overall test arrangement . 11
4.1 General . 11
4.2 Test instrumentation . 11
4.2.1 General . 11
4.2.2 Vector network analyser . 12
4.2.3 RF switching unit . 12
4.2.4 Reference loads and termination loads . 12
4.3 Measurement precautions . 12
4.4 Mixed mode S-parameter nomenclature . 13
4.5 Coaxial cables and interconnect for network analyzers . 14
4.6 Requirements Characteristic for switching switching matrices . 14
4.7 Test fixture requirements . 15
4.7.1 Test fixture types . 17
4.8 Requirements for termination performance at calibration plane . 17
4.9 Reference loads for calibration . 18
4.10 Calibration . 18
4.10.1 General . 18
4.10.2 Calibration test interface . 19
4.10.3 Calibration at end of coaxial test cables . 19
4.11 Termination loads for termination of conductor pairs . 19
4.11.1 General . 19
4.11.2 Verification of termination loads Impedance matching resistor
termination networks . 19
4.12 Termination of screens . 20
4.13 Test specimen and reference planes . 20
4.13.1 General . 20
4.13.2 Interconnections between device under test (DUT) and the calibration
plane . 20
4.14 Overall test setup requirements . 23
5 Connector measurements up to 1 000 2 000 MHz . 23
5.1 General . 24
5.2 Insertion loss, test 28a . 24
5.2.1 Object . 24
5.2.2 Connecting hardware insertion loss . 24
5.2.3 Test method . 24
5.2.4 Test set-up . 25
5.2.5 Procedure . 25
5.2.6 Test report . 25
5.2.7 Accuracy . 26
5.3 Return loss, test 28b . 26

5.3.1 Object . 26
5.3.2 Connecting hardware return loss . 26
5.3.3 Test method . 26
5.3.4 Test set-up . 26
5.3.5 Procedure . 26
5.3.6 Test report . 26
5.3.7 Accuracy . 27
5.4 Near-end crosstalk (NEXT), test 28c . 27
5.4.1 Object . 27
5.4.2 Connecting hardware NEXT . 27
5.4.3 Test method . 27
5.4.4 Test set-up . 27
5.4.5 Procedure . 28
5.4.6 Test report . 29
5.4.7 Accuracy . 29
5.5 Far-end crosstalk (FEXT), test 28d . 29
5.5.1 Object . 29
5.5.2 Connecting hardware FEXT . 29
5.5.3 Test method . 29
5.5.4 Test set-up . 29
5.5.5 Procedure . 30
5.5.6 Test report . 30
5.5.7 Accuracy . 30
Transfer impedance (Z ), Test 28e .
T
5.6 Transverse conversion loss (TCL), test 28f . 31
5.6.1 Object . 31
5.6.2 Connecting hardware TCL . 31
5.6.3 Test method . 31
5.6.4 Test set-up . 31
5.6.5 Procedure . 32
5.6.6 Test report . 32
5.6.7 Accuracy . 32
5.7 Transverse conversion transfer loss (TCTL), test 28g . 32
5.7.1 Object . 32
5.7.2 Connecting hardware TCTL . 33
5.7.3 Test method . 33
5.7.4 Test set-up . 33
5.7.5 Procedure . 33
5.7.6 Test report . 33
5.7.7 Accuracy . 34
5.8 Shield transfer impedance (Z ), test 26e . 34
T
5.8.1 Object . 34
5.8.2 Connecting hardware Ttansfer impedance (Z ). 34
T
5.8.3 Test method . 34
5.8.4 Test set-up . 34
5.8.5 Procedure . 34
5.8.6 Test report . 35
5.8.7 Accuracy . 35
5.9 Coupling attenuation (a ) . 35
C
– 4 – IEC 60512-28-100:2019 RLV © IEC 2019
5.9.1 Object . 35
5.9.2 Connecting hardware coupling attenuation (a ) . 35
C
5.9.3 Test method . 35
5.9.4 Test set-up . 35
5.9.5 Procedure . 35
5.9.6 Test report . 36
5.9.7 Accuracy . 36
Annex (informative) Test pins – Dimensions and references .
Annex A (informative) Example Derivation of mixed mode parameters using the modal
decomposition technique . 37
A.1 General . 37
A.2 Example of a calculation . 37
Annex B (normative) Indirect-reference test fixtures . 41
B.1 General . 41
B.2 Requirements . 41
B.2.1 General requirements . 41
B.2.2 Specific requirements . 41
Annex C (normative) Direct-probe test fixtures . 43
C.1 General . 43
C.2 Requirements . 43
C.2.1 General requirements . 43
C.2.2 Specific requirements . 43
Annex D (normative) Specialized test fixtures . 45
D.1 General . 45
D.2 Requirements . 45
D.2.1 General requirements . 45
D.2.2 Specific requirements . 45
Annex E (informative) Symmetry verification of resistors used for calibration . 46
Bibliography . 49

Figure – Test interface pattern .
Figure – Example of pin and fixed connector dimensions .
Figure 1 – Diagram of a single ended 4-port device . 13
Figure 2 – Diagram of a balanced 2-port device . 13
Figure 3 – Calibration of reference loads . 18
Figure 4 – Resistor termination networks . 19
Figure 5 – Definition of reference planes . 20
Figure 6 – Insertion loss and TCTL measurement . 25
Figure 7 – NEXT measurement . 28
Figure 8 – FEXT measurement . 30
Figure 9 – Return loss and TCL measurement . 31
Figure A.1 – Voltage and current on balanced DUT. 37
Figure A.2 – Voltage and current on unbalanced DUT . 38
Figure E.1 – Example of 50 Ω SMA termination comparison (1 MHz – 100 MHz) . 47
Figure E.2 – Comparison of phase selected and only magnitude selected terminations . 47

Table – Test fixture requirements .
Table 1 – Mixed mode S-parameter nomenclature . 14
Table 2 – Switch performance recommendations requirements . 15
Table 3 – Requirements for terminations at calibration plane . 17
Table 4 – Interconnection DM return loss requirements. 22
Table 5 – Overall test setup requirements . 23
Table B.1 – IEC 60603-7 series, 8-pole connector types detail specifications
and respective detail connector test procedures standards . 41
Table B.2 – Reference connector crosstalk (NEXT) vector . 42
Table C.1 – Direct-probe test fixture requirements . 44

– 6 – IEC 60512-28-100:2019 RLV © IEC 2019
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
CONNECTORS FOR ELECTRICAL AND ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –
Part 28-100: Signal integrity tests up to 1 000 MHz
on IEC 60603-7 and IEC 61076-3 series connectors 2 000 MHz –
Tests 28a to 28g
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
This redline version of the official IEC Standard allows the user to identify the changes
made to the previous edition. A vertical bar appears in the margin wherever a change
has been made. Additions are in green text, deletions are in strikethrough red text.

International Standard IEC 60512-28-100 has been prepared by subcommittee 48B: Electrical
connectors, of IEC technical committee 48: Electrical connectors and mechanical structures
for electrical and electronic equipment.
This second edition cancels and replaces the first edition, issued in 2013, and constitutes a
technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
• The title is revised from 1 000 MHz to 2 000 MHz to reflect the range of frequencies which
may be tested.
• All tables and requirements have been revised up to 2 000 MHz.
The text of this International Standard is based on the following documents:
FDIS Report on voting
48B/2756/FDIS 48B/2766/RVD
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
Future standards in this series will carry the new general title as cited above. Titles of existing
standards in this series will be updated at the time of the next edition.
A list of all parts of IEC 60512 series, under the general title Connectors for electrical and
electronic equipment – Tests and measurements can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
– 8 – IEC 60512-28-100:2019 RLV © IEC 2019
CONNECTORS FOR ELECTRICAL AND ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –
Part 28-100: Signal integrity tests up to 1 000 MHz
on IEC 60603-7 and IEC 61076-3 series connectors 2 000 MHz –
Tests 28a to 28g
1 Scope
This part of IEC 60512 specifies the test methods for signal integrity and transmission
performance for connectors specified in respective parts of IEC 60603-7, IEC 61076-1,
IEC 61076-2, and IEC 61076-3 series connectors up to 1 000 MHz standards for connecting
hardware applications up to 2 000 MHz. It is also suitable for testing lower frequency
connectors, however, the test methodology specified in the detailed specification for any
given connector remains the reference conformance test for that connector. The above list of
connector series of standards does not preclude referencing this document in other connector
manufacturer’s specifications or published standards.
The test methods Test procedures provided herein are:
– insertion loss, test 28a;
– return loss, test 28b;
– near-end crosstalk (NEXT) test 28c;
– far-end crosstalk (FEXT), test 28d;
– transverse conversion loss (TCL), test 28f;
– transverse conversion transfer loss (TCTL), test 28g.
Other test procedures referenced herein are:
– transfer impedance (Z ), see IEC 60512-26-100, test 26e.
T
– for coupling attenuation (a ), see IEC 62153-4-12.
C
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC 60050-581, International Electrotechnical Vocabulary (IEV) – Part 581: Electromechanical
components for electronic equipment
IEC 60169-15, Radio-frequency connectors – Part 15: R.F. coaxial connectors with inner
diameter of outer conductor 4,13 mm (0.163 in) with screw coupling – Characteristic
impedance 50 ohms (Type SMA)
IEC 60512-1, Connectors for electronic equipment – Tests and measurements – Part 1:
General Generic specification
IEC 60512-26-100:2008, Connectors for electronic equipment – Tests and measurements –
Part 26-100: Measurement setup, test and reference arrangement and measurements for
connectors according to IEC 60603-7 – Tests 26a to 26g

IEC 60512-27-100, Connectors for electronic equipment – Tests and measurements –
Part 27-100: Signal integrity tests up to 500 MHz on 60603-7 series connectors – Tests 27a to
27g
IEC PAS 60512-27-200, Connecteurs for electrical and electronic equipment – Tests and
measurements – Part 27-200: Additional specifications for signal integrity tests up to 2 000
MHz on IEC 60603-7 series connectors – Tests 27a to 27g
IEC 60512-29-100, Connectors for electronic equipment – Tests and measurements –
Part 29-100: Signal integrity tests up to 500 MHz on M12 style connectors – Tests 29a to 29g
IEC 60603-7, Connectors for electronic equipment – Part 7: Detail specification for 8-way,
unshielded, free and fixed connectors
IEC 60603-7-1, Connectors for electronic equipment – Part 7-1: Detail specification for 8-way,
shielded, free and fixed connectors
IEC 60603-7-2, Connectors for electronic equipment – Part 7-2: Detail specification for 8-way,
unshielded, free and fixed connectors, for data transmissions with frequencies up to 100 MHz
IEC 60603-7-3, Connectors for electronic equipment – Part 7-3: Detail specification for 8-way,
shielded, free and fixed connectors, for data transmission with frequencies up to 100 MHz
IEC 60603-7-4, Connectors for electronic equipment – Part 7-4: Detail specification for 8-way,
unshielded, free and fixed connectors, for data transmissions with frequencies up to 250 MHz
IEC 60603-7-5, Connectors for electronic equipment – Part 7-5: Detail specification for 8-way,
shielded, free and fixed connectors, for data transmissions with frequencies up to 250 MHz
IEC 60603-7-7, Connectors for electronic equipment – Part 7-7: Detail specification for 8-way,
shielded, free and fixed connectors for data transmission with frequencies up to 600 MHz
IEC 60603-7-41, Connectors for electronic equipment – Part 7-41: Detail specification for
8-way, unshielded, free and fixed connectors, for data transmissions with frequencies up to
500 MHz
IEC 60603-7-51, Connectors for electronic equipment – Part 7-51: Detail specification for
8-way, shielded, free and fixed connectors, for data transmissions with frequencies up to
500 MHz
IEC 60603-7-71, Connectors for electronic equipment – Part 7-71: Detail specification for
8-way, shielded, free and fixed connectors, for data transmission with frequencies up to
1 000 MHz
IEC 60603-7-81, Connectors for electronic equipment – Part 7-81: Detail specification for
8-way, shielded, free and fixed connectors, for data transmissions with frequencies up to
2 000 MHz
IEC 60603-7-82, Connectors for electronic equipment – Part 7-82: Detail specification for
8-way, 12 contacts, shielded, free and fixed connectors, for data transmission with
frequencies up to 2 000 MHz
IEC 61076-1, Connectors for electronic equipment – Product requirements – Part 1: Generic
specification
IEC 61076-2, Connectors for electronic equipment – Product requirements – Part 2: Sectional
specification for circular connectors

– 10 – IEC 60512-28-100:2019 RLV © IEC 2019
IEC 61076-2-109, Connectors for electronic equipment – Product requirements – Part 2-109:
Circular connectors – Detail specification for connectors with M 12 x 1 screw-locking, for data
transmission frequencies up to 500 MHz
IEC 61076-3, Connectors for electronic equipment – Product requirements – Part 3:
Rectangular connectors – Sectional specification
IEC 61076-3-104, Connectors for electronic equipment – Product requirements –
Part 3-104: Detail specification for 8-way, shielded free and fixed connectors for data
transmissions with frequencies up to 1 000 2 000 MHz
IEC 61076-3-110, Connectors for electronic equipment – Product requirements – Part 3-110:
Detail specification for shielded, free and fixed connectors for data transmission with
frequencies up to 1 000 3 000 MHz
IEC 61156 (all parts), Multicore and symmetrical pair/quad cables for digital communications
IEC 61156-1, Multicore and symmetrical pair/quad cables for digital communications – Part 1:
Generic specification
IEC 61156-6, Multicore and symmetrical pair/quad cables for digital communications – Part 6:
Symmetrical pair/quad cables with transmission characteristics up to 1 000 MHz – Work area
wiring – Sectional specification
IEC 61156-9, Multicore and symmetrical pair/quad cables for digital communications – Part 9:
Cables for channels with transmission characteristics up to 2 GHz – Sectional specification
IEC 61156-10:2016, Multicore and symmetrical pair/quad cables for digital communications –
Part 10: Cables for cords with transmission characteristics up to 2 GHz – Sectional
specification
IEC 61169-16, Radio-frequency connectors – Part 16: RF coaxial connectors with inner
diameter of outer conductor 7 mm (0,276 in) with screw coupling – Characteristic impedance
50 ohms (75 ohms) (Type N)
IEC 62153-4-12, Metallic communication cable test methods – Part 4-12: Electromagnetic
compatibility (EMC) – Coupling attenuation or screening attenuation of connecting hardware –
Absorbing clamp method
ISO/IEC 11801-1:2017, Information technology – Generic cabling for customer premises –
Part 1: General requirements
3 Terms, definitions and acronyms abbreviated terms
For the purposes of this document, the terms and definitions given in IEC 60050-581,
IEC 61076-1, IEC 60512-1, IEC 60603-7, IEC 61076-3-104 and IEC 61076-3-110, and the
following apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp

3.1 Terms and definitions
3.1.1
intermodal
parameter or measurement that either sources on the common mode and measures on the
differential mode, or sources on the differential mode and measures on the common mode
3.1.2
mixed mode
parameters or measurements containing differential mode, common mode, and intermodal
S-matrices
3.2 Acronyms Abbreviated terms
a coupling attenuation
C
CM common mode
DM differential mode
DUT device under test
FEXT far-end crosstalk loss
IEC International Electrotechnical Commission
LCL longitudinal conversion loss
LCTL longitudinal conversion transfer loss
NA network analyzer
NEXT near-end crosstalk loss
TCL transverse conversion loss
TCTL transverse conversion transfer loss
SE single ended
Z transfer impedance
T
4 Overall test arrangement
4.1 General
This document specifies test methods and procedures for connectors.
The test methods and procedures for signal integrity and transmission performance specified
herein are referenced by connector standards, specified in IEC 60603-7, IEC 60603-7-1,
IEC 61076-2, 61076-3 and other standards for connecting hardware and their sectional
specifications, with signal integrity specifications up to 2 000 MHz; such connector standards
include IEC 60603-7-81, IEC 60603-7-82, IEC 61076-3-110, IEC 61076-3-104, and
IEC 61076-2-109, which are used with twisted-pair cables having 100 Ω nominal differential
characteristic impedance.
The test methods and procedures specified herein are referenced by connector standards for
connecting hardware typically used with twisted-pair cables having 100 Ω nominal differential
characteristic impedance, which are specified in accordance with IEC 61156-1 cable
standards and its sectional specifications up to 2 000 MHz, e.g. IEC 61156-9 and
IEC 61156-10.
4.2 Test instrumentation
4.2.1 General
All test instrumentation shall be capable of performing measurements over the frequency
range of 1 MHz to 1 000 2 000 MHz.

– 12 – IEC 60512-28-100:2019 RLV © IEC 2019
4.2.2 Vector network analyser
The test procedures hereby described require the use of a vector network analyzer. The
analyzer should shall have the capability of full 2-port calibrations. The analyzer shall cover
the frequency range of 1 MHz to 1 000 2 000 MHz at least.
Measurements are to be taken using a mixed mode test set-up, which is often referred to as
an unbalanced, modal decomposition or balun-less setup. This allows measurements of
balanced devices without use of an RF balun in the signal path.
Such a configuration also allows testing with either a common or differential mode stimulus
and or responses, ensuring that intermodal parameters can be measured without
reconnection.
A 16-port network analyzer is required shall be used to measure all combinations of a 4-pair
device without external switching, however the network analyzer shall have a minimum of
2-ports (including one bi-directional port) to enable the data to be collated and calculated.
It should be noted that the use of a 2-port analyzer will involve successive repositioning of the
measurement port in order to measure any given parameter.
A 4-port network analyzer is recommended as a practical minimum number of ports, as this
will allow the measurement of the full 16 term mixed mode S-parameter matrix on a given pair
combination without switching or reconnection in one direction.
4.2.3 RF switching unit
In order to minimise the reconnection of the DUT for each pair combination the use of a RF
switching unit is also recommended.
Each conductor of the pair or pair combination under test shall be connected to a separate
port of the network analyzer, and results are processed either by internal analysis within the
network analyzer or by an external application.
4.2.4 Reference loads and termination loads
Reference loads and through connections are needed shall be utilised for the calibration of
the set-up. Requirements for the reference loads are shall be as given in 4.9. Termination
loads are needed shall be utilised for termination of pairs, used and unused, which are not
terminated by the network analyzer. Requirements for the termination loads are shall be as
given in 4.7 and 4.10 4.11.
Loads used for calibration shall be paired as explained in Annex E to ensure good symmetry
at the calibration plane.
4.3 Measurement precautions
To ensure a high degree of reliability for transmission measurements, the following
precautions are required.
• Consistent and stable resistor loads shall be used throughout the test sequence.
• Cable and adapter discontinuities, as introduced by physical flexing, sharp bends and
restraints shall be avoided before, during and after the tests.
• Consistent test methodology and termination resistors shall be used at all stages of
transmission performance qualifications.
• The relative spacing of conductors in the pairs shall be preserved throughout the tests to
the greatest extent possible.
• The balance of the cables shall be maintained to the greatest extent possible by
consistent conductor lengths and pair twisting to the point of load.
• The sensitivity to set-up variations for these measurements at high frequencies demands
attention to details for both the measurement equipment and the procedures.
• The test setup has to be grounded appropriately.
4.4 Mixed mode S-parameter nomenclature
The test methods specified in this document are based on a balunless test setup in which all
terminals of a device under test are measured and characterised as single ended (SE) ports,
i.e. signals (RF voltages and currents) are shall be defined relative to a common earth
(ground). For a device with 4 terminals, a diagram is given in Figure 1.
Port 1 Port 3
Port 2 DUT Port 4
IEC
Figure 1 – Diagram of a single ended 4-port device
The 4-port device in Figure 1 is shall be characterised by the 16-term SE S-matrix given in
Formula 1, in which the S-parameter S expresses the relation between a single ended
ba
response on port “b” resulting from a single ended stimulus on port “a”.
S S S S
 
11 12 13 14
 
S S S S
21 22 23 24
 
S = (1)
S S S S 
31 32 33 34
 
S S S S
41 42 43 44
 
For a balanced device, each port is shall be considered to consist of a pair of terminals
(= a balanced port) as opposed to the SE ports defined above, see Figure 2.
Port 1 Port 2
DUT
(balanced)
IEC
.
Figure 2 – Diagram of a balanced 2-port device
In order to characterize the balanced device, both the differential mode and the common
mode signals on each balanced port shall be considered. The device can be is characterised
by a mixed mode S-matrix that includes all combinations of modes and ports, e.g. the mixed
mode S-parameter S that expresses the relation between a differential mode response on
DC21
port 2 resulting from a common mode stimulus on port 1. Using this nomenclature, the full set
of mixed mode S-parameters for a 2-port can be presented as are given in Table 1.

– 14 – IEC 60512-28-100:2019 RLV © IEC 2019
Table 1 – Mixed mode S-parameter nomenclature
Differential mode Common mode
stimulus stimulus
Port 1 Port 2 Port 1 Port 2
Differential Port 1 S S S S
DD11 DD12 DC11 DC12
mode
Port 2 S S S S
response
DD21 DD22 DC21 DC22
Port 1 S S S S
Common mode CD11 CD12 CC11 CC12
response
Port 2 S S S S
CD21 CD22 CC21 CC22
A 4-terminal device can be represented both as a 4-port SE device as in Figure 1
characterised by a single ended S-matrix (Formula 1) and as a 2-port balanced device as in
Figure 2 characterised by a mixed mode S-matrix (Table 1). As applying a SE signal to a port
is mathematically equivalent to applying superposed superimposed differential and common
mode signals, the SE and the mixed mode characterisations of the device are interrelated.
The conversion from SE to mixed mode S-parameters is given in Annex A. Making use of this
conversion, the mixed mode S-parameters may be derived from the measured SE S-matrix.
4.5 Coaxial cables and interconnect for network analyzers
Assuming that the characteristic impedance of the network analyzer is 50 Ω, coaxial cables
used to interconnect the network analyzer, switching matrix and the test fixture shall be of
50 Ω characteristic impedance and of low transfer impedance (double screen or more).
These coaxial cables should be as short as possible. (It is recommended that they do not
exceed 1 000 mm each.) Max 1 000 mm (on each port).
The screens of each cable shall be electrically bonded to a common earth (ground) plane.
To optimize dynamic range, the total interconnecti
...

IEC 60512-28-100 ®
Edition 2.0 2019-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Connectors for electrical and electronic equipment –
Tests and measurements –
Part 28-100: Signal integrity tests up to 2 000 MHz – Tests 28a to 28g

Connecteurs pour équipements électriques et électroniques –
Essais et mesures –
Partie 28-100: Essais d’intégrité des signaux jusqu’à 2 000 MHz – Essais
28a à 28g
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.

Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de l'IEC ou du Comité national de l'IEC du pays du demandeur. Si vous avez des
questions sur le copyright de l'IEC ou si vous désirez obtenir des droits supplémentaires sur cette publication, utilisez
les coordonnées ci-après ou contactez le Comité national de l'IEC de votre pays de résidence.

IEC Central Office Tel.: [phone]
3, rue de Varembé [e-mail]
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.

IEC publications search - webstore.iec.ch/advsearchform Electropedia - www.electropedia.org
The advanced search enables to find IEC publications by a The world's leading online dictionary on electrotechnology,
variety of criteria (reference number, text, technical containing more than 22 000 terminological entries in English
committee,…). It also gives information on projects, replaced and French, with equivalent terms in 16 additional languages.
and withdrawn publications. Also known as the International Electrotechnical Vocabulary

(IEV) online.
IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Glossary - std.iec.ch/glossary
details all new publications released. Available online and 67 000 electrotechnical terminology entries in English and
once a month by email. French extracted from the Terms and Definitions clause of
IEC publications issued since 2002. Some entries have been
IEC Customer Service Centre - webstore.iec.ch/csc collected from earlier publications of IEC TC 37, 77, 86 and
If you wish to give us your feedback on this publication or CISPR.

need further assistance, please contact the Customer Service

Centre: [e-mail].
A propos de l'IEC
La Commission Electrotechnique Internationale (IEC) est la première organisation mondiale qui élabore et publie des
Normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.

A propos des publications IEC
Le contenu technique des publications IEC est constamment revu. Veuillez vous assurer que vous possédez l’édition la
plus récente, un corrigendum ou amendement peut avoir été publié.

Recherche de publications IEC - Electropedia - www.electropedia.org
webstore.iec.ch/advsearchform Le premier dictionnaire d'électrotechnologie en ligne au
La recherche avancée permet de trouver des publications IEC monde, avec plus de 22 000 articles terminologiques en
en utilisant différents critères (numéro de référence, texte, anglais et en français, ainsi que les termes équivalents dans
comité d’études,…). Elle donne aussi des informations sur les 16 langues additionnelles. Egalement appelé Vocabulaire
projets et les publications remplacées ou retirées. Electrotechnique International (IEV) en ligne.

IEC Just Published - webstore.iec.ch/justpublished Glossaire IEC - std.iec.ch/glossary
Restez informé sur les nouvelles publications IEC. Just 67 000 entrées terminologiques électrotechniques, en anglais
Published détaille les nouvelles publications parues. et en français, extraites des articles Termes et Définitions des
Disponible en ligne et une fois par mois par email. publications IEC parues depuis 2002. Plus certaines entrées
antérieures extraites des publications des CE 37, 77, 86 et
Service Clients - webstore.iec.ch/csc CISPR de l'IEC.

Si vous désirez nous donner des commentaires sur cette
publication ou si vous avez des questions contactez-nous:
[e-mail].
IEC 60512-28-100 ®
Edition 2.0 2019-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Connectors for electrical and electronic equipment –

Tests and measurements –
Part 28-100: Signal integrity tests up to 2 000 MHz – Tests 28a to 28g

Connecteurs pour équipements électriques et électroniques –

Essais et mesures –
Partie 28-100: Essais d’intégrité des signaux jusqu’à 2 000 MHz – Essais

28a à 28g
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.220.10 ISBN 978-2-8322-7590-0

– 2 – IEC 60512-28-100:2019 © IEC 2019
CONTENTS
FOREWORD . 6
1 Scope . 8
2 Normative references . 8
3 Terms, definitions and abbreviated terms . 10
3.1 Terms and definitions . 10
3.2 Abbreviated terms . 11
4 Overall test arrangement . 11
4.1 General . 11
4.2 Test instrumentation . 11
4.2.1 General . 11
4.2.2 Vector network analyser . 11
4.2.3 RF switching unit . 12
4.2.4 Reference loads and termination loads . 12
4.3 Measurement precautions . 12
4.4 Mixed mode S-parameter nomenclature . 13
4.5 Coaxial cables and interconnect for network analyzers . 14
4.6 Characteristic for switching matrices . 14
4.7 Test fixture requirements . 15
4.7.1 Test fixture types . 15
4.8 Requirements for termination performance at calibration plane . 15
4.9 Reference loads for calibration . 15
4.10 Calibration . 16
4.10.1 General . 16
4.10.2 Calibration test interface . 16
4.10.3 Calibration at end of coaxial test cables . 16
4.11 Termination loads for termination of conductor pairs . 17
4.11.1 General . 17
4.11.2 Impedance matching resistor termination networks . 17
4.12 Termination of screens . 17
4.13 Test specimen and reference planes . 18
4.13.1 General . 18
4.13.2 Interconnections between device under test (DUT) and the calibration
plane . 18
4.14 Overall test setup requirements . 20
5 Connector measurements up to 2 000 MHz . 21
5.1 General . 21
5.2 Insertion loss, test 28a . 21
5.2.1 Object . 21
5.2.2 Connecting hardware insertion loss . 21
5.2.3 Test method . 21
5.2.4 Test set-up . 21
5.2.5 Procedure . 21
5.2.6 Test report . 22
5.2.7 Accuracy . 22
5.3 Return loss, test 28b . 22
5.3.1 Object . 22

5.3.2 Connecting hardware return loss . 22
5.3.3 Test method . 22
5.3.4 Test set-up . 23
5.3.5 Procedure . 23
5.3.6 Test report . 23
5.3.7 Accuracy . 23
5.4 Near-end crosstalk (NEXT), test 28c . 23
5.4.1 Object . 23
5.4.2 Connecting hardware NEXT . 23
5.4.3 Test method . 24
5.4.4 Test set-up . 24
5.4.5 Procedure . 24
5.4.6 Test report . 25
5.4.7 Accuracy . 25
5.5 Far-end crosstalk (FEXT), test 28d . 25
5.5.1 Object . 25
5.5.2 Connecting hardware FEXT . 25
5.5.3 Test method . 25
5.5.4 Test set-up . 25
5.5.5 Procedure . 26
5.5.6 Test report . 26
5.5.7 Accuracy . 26
5.6 Transverse conversion loss (TCL), test 28f . 27
5.6.1 Object . 27
5.6.2 Connecting hardware TCL . 27
5.6.3 Test method . 27
5.6.4 Test set-up . 27
5.6.5 Procedure . 28
5.6.6 Test report . 28
5.6.7 Accuracy . 28
5.7 Transverse conversion transfer loss (TCTL), test 28g . 28
5.7.1 Object . 28
5.7.2 Connecting hardware TCTL . 29
5.7.3 Test method . 29
5.7.4 Test set-up . 29
5.7.5 Procedure . 29
5.7.6 Test report . 29
5.7.7 Accuracy . 30
5.8 Shield transfer impedance (Z ), test 26e . 30
T
5.8.1 Object . 30
5.8.2 Connecting hardware Ttansfer impedance (Z ). 30
T
5.8.3 Test method . 30
5.8.4 Test set-up . 30
5.8.5 Procedure . 30
5.8.6 Test report . 31
5.8.7 Accuracy . 31
5.9 Coupling attenuation (a ) . 31
C
5.9.1 Object . 31
5.9.2 Connecting hardware coupling attenuation (a ) . 31
C
– 4 – IEC 60512-28-100:2019 © IEC 2019
5.9.3 Test method . 31
5.9.4 Test set-up . 31
5.9.5 Procedure . 31
5.9.6 Test report . 32
5.9.7 Accuracy . 32
Annex A (informative) Derivation of mixed mode parameters using the modal
decomposition technique . 33
A.1 General . 33
A.2 Example of a calculation . 33
Annex B (normative) Indirect-reference test fixtures . 36
B.1 General . 36
B.2 Requirements . 36
B.2.1 General requirements . 36
B.2.2 Specific requirements . 36
Annex C (normative) Direct-probe test fixtures . 38
C.1 General . 38
C.2 Requirements . 38
C.2.1 General requirements . 38
C.2.2 Specific requirements . 38
Annex D (normative) Specialized test fixtures . 40
D.1 General . 40
D.2 Requirements . 40
D.2.1 General requirements . 40
D.2.2 Specific requirements . 40
Annex E (informative) Symmetry verification of resistors used for calibration . 41
Bibliography . 44

Figure 1 – Diagram of a single ended 4-port device . 13
Figure 2 – Diagram of a balanced 2-port device . 13
Figure 3 – Calibration of reference loads . 16
Figure 4 – Resistor termination networks . 17
Figure 5 – Definition of reference planes . 18
Figure 6 – Insertion loss and TCTL measurement . 22
Figure 7 – NEXT measurement . 24
Figure 8 – FEXT measurement . 26
Figure 9 – Return loss and TCL measurement . 27
Figure A.1 – Voltage and current on balanced DUT. 33
Figure A.2 – Voltage and current on unbalanced DUT . 34
Figure E.1 – Example of 50 Ω SMA termination comparison (1 MHz – 100 MHz) . 42
Figure E.2 – Comparison of phase selected and only magnitude selected terminations . 42

Table 1 – Mixed mode S-parameter nomenclature . 14
Table 2 – Switch performance requirements . 14
Table 3 – Requirements for terminations at calibration plane . 15
Table 4 – Interconnection DM return loss requirements. 20
Table 5 – Overall test setup requirements . 20

Table B.1 – IEC 60603-7 series, 8-pole connector types detail specifications and
respective detail connector test procedures standards . 36
Table B.2 – Reference connector crosstalk (NEXT) vector . 37
Table C.1 – Direct-probe test fixture requirements . 38

– 6 – IEC 60512-28-100:2019 © IEC 2019
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
CONNECTORS FOR ELECTRICAL AND ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –
Part 28-100: Signal integrity tests up to 2 000 MHz –
Tests 28a to 28g
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60512-28-100 has been prepared by subcommittee 48B: Electrical
connectors, of IEC technical committee 48: Electrical connectors and mechanical structures
for electrical and electronic equipment.
This second edition cancels and replaces the first edition, issued in 2013, and constitutes a
technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
• The title is revised from 1 000 MHz to 2 000 MHz to reflect the range of frequencies which
may be tested.
• All tables and requirements have been revised up to 2 000 MHz.

The text of this International Standard is based on the following documents:
FDIS Report on voting
48B/2756/FDIS 48B/2766/RVD
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
Future standards in this series will carry the new general title as cited above. Titles of existing
standards in this series will be updated at the time of the next edition.
A list of all parts of IEC 60512 series, under the general title Connectors for electrical and
electronic equipment – Tests and measurements can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
– 8 – IEC 60512-28-100:2019 © IEC 2019
CONNECTORS FOR ELECTRICAL AND ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –
Part 28-100: Signal integrity tests up to 2 000 MHz –
Tests 28a to 28g
1 Scope
This part of IEC 60512 specifies the test methods for signal integrity and transmission
performance for connectors specified in respective parts of IEC 60603-7, IEC 61076-1,
IEC 61076-2, and IEC 61076-3 standards for connecting hardware applications up to
2 000 MHz. It is also suitable for testing lower frequency connectors, however, the test
methodology specified in the detail specification for any given connector remains the
reference conformance test for that connector. The above list of connector series of standards
does not preclude referencing this document in other connector manufacturer’s specifications
or published standards.
Test procedures provided herein are:
– insertion loss, test 28a;
– return loss, test 28b;
– near-end crosstalk (NEXT) test 28c;
– far-end crosstalk (FEXT), test 28d;
– transverse conversion loss (TCL), test 28f;
– transverse conversion transfer loss (TCTL), test 28g.
Other test procedures referenced herein are:
– transfer impedance (Z ), see IEC 60512-26-100, test 26e.
T
– for coupling attenuation (a ), see IEC 62153-4-12.
C
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC 60050-581, International Electrotechnical Vocabulary (IEV) – Part 581: Electromechanical
components for electronic equipment
IEC 60169-15, Radio-frequency connectors – Part 15: R.F. coaxial connectors with inner
diameter of outer conductor 4,13 mm (0.163 in) with screw coupling – Characteristic
impedance 50 ohms (Type SMA)
IEC 60512-1, Connectors for electronic equipment – Tests and measurements – Part 1:
Generic specification
IEC 60512-26-100, Connectors for electronic equipment – Tests and measurements –
Part 26-100: Measurement setup, test and reference arrangement and measurements for
connectors according to IEC 60603-7 – Tests 26a to 26g

IEC 60512-27-100, Connectors for electronic equipment – Tests and measurements –
Part 27-100: Signal integrity tests up to 500 MHz on 60603-7 series connectors – Tests 27a to
27g
IEC PAS 60512-27-200, Connecteurs for electrical and electronic equipment – Tests and
measurements – Part 27-200: Additional specifications for signal integrity tests up to 2 000
MHz on IEC 60603-7 series connectors – Tests 27a to 27g
IEC 60512-29-100, Connectors for electronic equipment – Tests and measurements –
Part 29-100: Signal integrity tests up to 500 MHz on M12 style connectors – Tests 29a to 29g
IEC 60603-7, Connectors for electronic equipment – Part 7: Detail specification for 8-way,
unshielded, free and fixed connectors
IEC 60603-7-1, Connectors for electronic equipment – Part 7-1: Detail specification for 8-way,
shielded, free and fixed connectors
IEC 60603-7-2, Connectors for electronic equipment – Part 7-2: Detail specification for 8-way,
unshielded, free and fixed connectors, for data transmissions with frequencies up to 100 MHz
IEC 60603-7-3, Connectors for electronic equipment – Part 7-3: Detail specification for 8-way,
shielded, free and fixed connectors, for data transmission with frequencies up to 100 MHz
IEC 60603-7-4, Connectors for electronic equipment – Part 7-4: Detail specification for 8-way,
unshielded, free and fixed connectors, for data transmissions with frequencies up to 250 MHz
IEC 60603-7-5, Connectors for electronic equipment – Part 7-5: Detail specification for 8-way,
shielded, free and fixed connectors, for data transmissions with frequencies up to 250 MHz
IEC 60603-7-7, Connectors for electronic equipment – Part 7-7: Detail specification for 8-way,
shielded, free and fixed connectors for data transmission with frequencies up to 600 MHz
IEC 60603-7-41, Connectors for electronic equipment – Part 7-41: Detail specification for
8-way, unshielded, free and fixed connectors, for data transmissions with frequencies up to
500 MHz
IEC 60603-7-51, Connectors for electronic equipment – Part 7-51: Detail specification for
8-way, shielded, free and fixed connectors, for data transmissions with frequencies up to
500 MHz
IEC 60603-7-71, Connectors for electronic equipment – Part 7-71: Detail specification for
8-way, shielded, free and fixed connectors, for data transmission with frequencies up to
1 000 MHz
IEC 60603-7-81, Connectors for electronic equipment – Part 7-81: Detail specification for
8-way, shielded, free and fixed connectors, for data transmissions with frequencies up to
2 000 MHz
IEC 60603-7-82, Connectors for electronic equipment – Part 7-82: Detail specification for
8-way, 12 contacts, shielded, free and fixed connectors, for data transmission with
frequencies up to 2 000 MHz
IEC 61076-1, Connectors for electronic equipment – Product requirements – Part 1: Generic
specification
IEC 61076-2, Connectors for electronic equipment – Product requirements – Part 2: Sectional
specification for circular connectors

– 10 – IEC 60512-28-100:2019 © IEC 2019
IEC 61076-2-109, Connectors for electronic equipment – Product requirements – Part 2-109:
Circular connectors – Detail specification for connectors with M 12 x 1 screw-locking, for data
transmission frequencies up to 500 MHz
IEC 61076-3, Connectors for electronic equipment – Product requirements – Part 3:
Rectangular connectors – Sectional specification
IEC 61076-3-104, Connectors for electronic equipment – Product requirements –
Part 3-104: Detail specification for 8-way, shielded free and fixed connectors for data
transmissions with frequencies up to 2 000 MHz
IEC 61076-3-110, Connectors for electronic equipment – Product requirements – Part 3-110:
Detail specification for free and fixed connectors for data transmission with frequencies up to
3 000 MHz
IEC 61156-1, Multicore and symmetrical pair/quad cables for digital communications – Part 1:
Generic specification
IEC 61156-9, Multicore and symmetrical pair/quad cables for digital communications – Part 9:
Cables for channels with transmission characteristics up to 2 GHz – Sectional specification
IEC 61156-10:2016, Multicore and symmetrical pair/quad cables for digital communications –
Part 10: Cables for cords with transmission characteristics up to 2 GHz – Sectional
specification
IEC 61169-16, Radio-frequency connectors – Part 16: RF coaxial connectors with inner
diameter of outer conductor 7 mm (0,276 in) with screw coupling – Characteristic impedance
50 ohms (75 ohms) (Type N)
IEC 62153-4-12, Metallic communication cable test methods – Part 4-12: Electromagnetic
compatibility (EMC) – Coupling attenuation or screening attenuation of connecting hardware –
Absorbing clamp method
ISO/IEC 11801-1:2017, Information technology – Generic cabling for customer premises –
Part 1: General requirements
3 Terms, definitions and abbreviated terms
For the purposes of this document, the terms and definitions given in IEC 60050-581,
IEC 61076-1, IEC 60512-1, IEC 60603-7, IEC 61076-3-104 and IEC 61076-3-110, and the
following apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1 Terms and definitions
3.1.1
intermodal
parameter or measurement that either sources on the common mode and measures on the
differential mode, or sources on the differential mode and measures on the common mode

3.1.2
mixed mode
parameters or measurements containing differential mode, common mode, and intermodal
S-matrices
3.2 Abbreviated terms
a coupling attenuation
C
CM common mode
DM differential mode
DUT device under test
FEXT far-end crosstalk loss
LCL longitudinal conversion loss
LCTL longitudinal conversion transfer loss
NA network analyzer
NEXT near-end crosstalk loss
TCL transverse conversion loss
TCTL transverse conversion transfer loss
SE single ended
Z transfer impedance
T
4 Overall test arrangement
4.1 General
This document specifies test methods and procedures for connectors.
The test methods and procedures for signal integrity and transmission performance specified
herein are referenced by connector standards, specified in IEC 60603-7, IEC 60603-7-1,
IEC 61076-2, 61076-3 and other standards for connecting hardware and their sectional
specifications, with signal integrity specifications up to 2 000 MHz; such connector standards
include IEC 60603-7-81, IEC 60603-7-82, IEC 61076-3-110, IEC 61076-3-104, and
IEC 61076-2-109, which are used with twisted-pair cables having 100 Ω nominal differential
characteristic impedance.
The test methods and procedures specified herein are referenced by connector standards for
connecting hardware typically used with twisted-pair cables having 100 Ω nominal differential
characteristic impedance, which are specified in accordance with IEC 61156-1 cable
standards and its sectional specifications up to 2 000 MHz, e.g. IEC 61156-9 and
IEC 61156-10.
4.2 Test instrumentation
4.2.1 General
All test instrumentation shall be capable of performing measurements over the frequency
range of 1 MHz to 2 000 MHz.
4.2.2 Vector network analyser
The test procedures hereby described require the use of a vector network analyzer. The
analyzer shall have the capability of full 2-port calibrations. The analyzer shall cover the
frequency range of 1 MHz to 2 000 MHz at least.

– 12 – IEC 60512-28-100:2019 © IEC 2019
Measurements are to be taken using a mixed mode test set-up, which is often referred to as
an unbalanced, modal decomposition or balun-less setup. This allows measurements of
balanced devices without use of an RF balun in the signal path.
Such a configuration also allows testing with either a common or differential mode stimulus or
responses, ensuring that intermodal parameters can be measured without reconnection.
A 16-port network analyzer shall be used to measure all combinations of a 4-pair device
without external switching, however the network analyzer shall have a minimum of 2-ports
(including one bi-directional port) to enable the data to be collated and calculated.
It should be noted that the use of a 2-port analyzer will involve successive repositioning of the
measurement port in order to measure any given parameter.
A 4-port network analyzer is recommended as a practical minimum number of ports, as this
will allow the measurement of the full 16 term mixed mode S-parameter matrix on a given pair
combination without switching or reconnection in one direction.
4.2.3 RF switching unit
In order to minimise the reconnection of the DUT for each pair combination the use of a RF
switching unit is also recommended.
Each conductor of the pair or pair combination under test shall be connected to a separate
port of the network analyzer, and results are processed either by internal analysis within the
network analyzer or by an external application.
4.2.4 Reference loads and termination loads
Reference loads and through connections shall be utilised for the calibration of the set-up.
Requirements for the reference loads shall be as given in 4.9. Termination loads shall be
utilised for termination of pairs, used and unused, which are not terminated by the network
analyzer. Requirements for the termination loads shall be as given in 4.11.
Loads used for calibration shall be paired as explained in Annex E to ensure good symmetry
at the calibration plane.
4.3 Measurement precautions
To ensure a high degree of reliability for transmission measurements, the following
precautions are required.
• Consistent and stable resistor loads shall be used throughout the test sequence.
• Cable and adapter discontinuities, as introduced by physical flexing, sharp bends and
restraints shall be avoided before, during and after the tests.
• Consistent test methodology and termination resistors shall be used at all stages of
transmission performance qualifications.
• The relative spacing of conductors in the pairs shall be preserved throughout the tests to
the greatest extent possible.
• The balance of the cables shall be maintained to the greatest extent possible by
consistent conductor lengths and pair twisting to the point of load.
• The sensitivity to set-up variations for these measurements at high frequencies demands
attention to details for both the measurement equipment and the procedures.
• The test setup has to be grounded appropriately.

4.4 Mixed mode S-parameter nomenclature
The test methods specified in this document are based on a balunless test setup in which all
terminals of a device under test are measured and characterised as single ended (SE) ports,
i.e. signals (RF voltages and currents) shall be defined relative to a common earth (ground).
For a device with 4 terminals, a diagram is given in Figure 1.
Port 1 Port 3
Port 2 DUT Port 4
IEC
Figure 1 – Diagram of a single ended 4-port device
The 4-port device in Figure 1 shall be characterised by the 16-term SE S-matrix given in
expresses the relation between a single ended
Formula 1, in which the S-parameter S
ba
response on port “b” resulting from a single ended stimulus on port “a”.
S S S S
 
11 12 13 14
 
S S S S
21 22 23 24
 
S=
(1)
S S S S 
31 32 33 34
 
S S S S
 41 42 43 44
For a balanced device, each port shall be considered to consist of a pair of terminals
(= a balanced port) as opposed to the SE ports defined above, see Figure 2.
Port 1 Port 2
DUT
(balanced)
IEC
.
Figure 2 – Diagram of a balanced 2-port device
The device is characterised by a mixed mode S-matrix that includes all combinations of
modes and ports, e.g. the mixed mode S-parameter S that expresses the relation
DC21
between a differential mode response on port 2 resulting from a common mode stimulus on
port 1. Using this nomenclature, the full set of mixed mode S-parameters for a 2-port are
given in Table 1.
– 14 – IEC 60512-28-100:2019 © IEC 2019
Table 1 – Mixed mode S-parameter nomenclature
Differential mode Common mode
stimulus stimulus
Port 1 Port 2 Port 1 Port 2
Differential Port 1 S S S S
DD11 DD12 DC11 DC12
mode
Port 2 S S S S
response
DD21 DD22 DC21 DC22
Port 1 S S S S
Common mode CD11 CD12 CC11 CC12
response
Port 2 S S S S
CD21 CD22 CC21 CC22
A 4-terminal device can be represented both as a 4-port SE device as in Figure 1
characterised by a single ended S-matrix (Formula 1) and as a 2-port balanced device as in
Figure 2 characterised by a mixed mode S-matrix (Table 1). As applying a SE signal to a port
is mat
...