ISO/IEC 10373-6:2011/FDAmd 6
(Amendment)Identification cards — Test methods — Part 6: Proximity cards — Amendment 6: Alternating between PICC and PCD functionalities, and PICC supporting both types
Identification cards — Test methods — Part 6: Proximity cards — Amendment 6: Alternating between PICC and PCD functionalities, and PICC supporting both types
Cartes d'identification — Méthodes d'essai — Partie 6: Cartes de proximité — Amendement 6: Alternance entre fonctionnalités PICC et PCD, et PICC supportant les deux types
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Standards Content (Sample)
FINAL
ISO/IEC
AMENDMENT
DRAFT
10373-6:2011
FDAM 6
ISO/IEC JTC 1/SC 17
Identification cards — Test methods —
Secretariat: BSI
Voting begins on:
Part 6:
2013-11-08
Proximity cards
Voting terminates on:
2014-01-08
AMENDMENT 6: Alternating between
PICC and PCD functionalities, and PICC
supporting both types
Cartes d’identification — Méthodes d’essai —
Partie 6: Cartes de proximité
AMENDEMENT 6: Alternance entre fonctionnalités PICC et PCD, et
PICC supportant les deux types
RECIPIENTS OF THIS DRAFT ARE INVITED TO
SUBMIT, WITH THEIR COMMENTS, NOTIFICATION
OF ANY RELEVANT PATENT RIGHTS OF WHICH
THEY ARE AWARE AND TO PROVIDE SUPPOR TING
DOCUMENTATION.
IN ADDITION TO THEIR EVALUATION AS
Reference number
BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO-
ISO/IEC 10373-6:2011/FDAM 6:2013(E)
LOGICAL, COMMERCIAL AND USER PURPOSES,
DRAFT INTERNATIONAL STANDARDS MAY ON
OCCASION HAVE TO BE CONSIDERED IN THE
LIGHT OF THEIR POTENTIAL TO BECOME STAN-
DARDS TO WHICH REFERENCE MAY BE MADE IN
©
NATIONAL REGULATIONS. ISO/IEC 2013
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ISO/IEC 10373-6:2011/FDAM 6:2013(E)
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ISO/IEC 10373-6:2011/FDAM 6:2013(E)
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are
members of ISO or IEC participate in the development of International Standards through technical
committees established by the respective organization to deal with particular fields of technical
activity. ISO and IEC technical committees collaborate in fields of mutual interest. Other international
organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in the
work. In the field of information technology, ISO and IEC have established a joint technical committee,
ISO/IEC JTC 1.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of the joint technical committee is to prepare International Standards. Draft International
Standards adopted by the joint technical committee are circulated to national bodies for voting.
Publication as an International Standard requires approval by at least 75 % of the national bodies
casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights.
Amendment 6 to ISO/IEC 10373-6:2011 was prepared by Joint Technical Committee ISO/IEC JTC 1,
Information technology, Subcommittee SC 17, Cards and personal identification.
© ISO/IEC 2013 – All rights reserved iii
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ISO/IEC 10373-6:2011/FDAM 6:2013(E)
Identification cards — Test methods —
Part 6:
Proximity cards
AMENDMENT 6: Alternating between PICC and PCD
functionalities, and PICC supporting both types
Page 1, Clause 1
Replace first sentence of last paragraph with:
This part of ISO/IEC 10373 defines test methods which are specific to proximity cards and objects,
proximity coupling devices and proximity extended devices, defined in ISO/IEC 14443-1:2008,
ISO/IEC 14443-2:2010, ISO/IEC 14443-3:2011 and ISO/IEC 14443-4:2008.
Page 14, Clause 6
Add new subclause 6.3 at the end of Clause 6:
6.3 PXD tests
PCD and PICC tests shall be applied as follows:
— when the PXD is in PCD Mode, tests defined in 6.1 shall be applied;
— when the PXD is in PICC Mode, tests defined in 6.2 shall be applied.
NOTE In automatic mode alternation the PXD may be forced into the required mode.
Page 22, Clause 7
Add new subclause 7.3 at the end of Clause 7:
7.3 PXD tests
PCD and PICC tests shall be applied as follows:
— when the PXD is in PCD Mode, tests defined in 7.1 shall be applied;
— when the PXD is in PICC Mode, tests defined in 7.2 shall be applied.
NOTE In automatic mode alternation the PXD may be forced into the required mode.
Page 22, Clause 8
Add new subclause 8.3 at the end of Clause 8:
8.3 PXD tests
8.3.1 PCD and PICC Modes
PCD and PICC tests shall be applied as follows:
— when the PXD is in PCD Mode, tests defined in 8.1 shall be applied;
© ISO/IEC 2013 – All rights reserved 1
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