ISO/IEC 15415:2024
(Main)Automatic identification and data capture techniques — Bar code symbol print quality test specification — Two-dimensional symbols
Automatic identification and data capture techniques — Bar code symbol print quality test specification — Two-dimensional symbols
This document — specifies two methodologies for the measurement of specific attributes of two-dimensional bar code symbols – one of which applies to multi-row bar code symbologies and the other to two-dimensional matrix symbologies; — specifies methods for evaluating and grading these measurements and deriving an overall assessment of symbol quality; — gives information on possible causes of deviation from optimum grades to assist users in taking appropriate corrective action. This document applies to two-dimensional symbologies for which a reference decode algorithm has been defined, however the methodologies in this document can be applied partially or wholly to other similar symbologies. NOTE While this document can be applied to direct part marks, better correlation between measurement results and scanning performance can be obtained with ISO/IEC 29158 in combination with this document.
Techniques automatiques d'identification et de capture des données — Spécification de test de qualité d'impression des symboles de code à barres — Symboles bidimensionnels
General Information
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Standards Content (Sample)
International
Standard
ISO/IEC 15415
Third edition
Automatic identification and data
2024-12
capture techniques — Bar code
symbol print quality test specification
— Two-dimensional symbols
Techniques automatiques d'identification et de capture des
données — Spécification de test de qualité d'impression des
symboles de code à barres — Symboles bidimensionnels
Reference number
© ISO/IEC 2024
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© ISO/IEC 2024 – All rights reserved
ii
Contents Page
Foreword .v
Introduction .vi
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Symbols and abbreviated terms. 3
4.1 Symbols .3
4.2 Abbreviated terms .3
5 Quality grading . 4
5.1 General .4
5.2 Expression of quality grades . .4
5.3 Symbol grade.4
5.4 Specifying the symbol grade requirement in an application specification .5
5.5 Reporting of symbol grade .5
5.6 Optical setup and obtaining the test images .6
5.6.1 General requirements .6
5.6.2 Convolving with the measuring aperture .7
5.6.3 Geometry of the optical setup .7
5.6.4 Inspection area .9
5.6.5 Measurement conditions .9
6 Measurement methodology for two-dimensional multi-row bar code symbols .10
6.1 General .10
6.2 Symbologies with cross-row scanning ability.10
6.2.1 Basis of grading .10
6.2.2 Grade based on analysis of scan reflectance profile .10
6.2.3 Grade based on codeword yield .11
6.2.4 Grade based on unused error correction . 12
6.2.5 Grade based on codeword print quality . 13
6.2.6 Overall symbol grade . 15
6.3 Symbologies requiring row-by-row scanning . 15
7 Measurement methodology for two-dimensional matrix symbols .16
7.1 Overview of methodology .16
7.2 Test images.16
7.2.1 Raw image .16
7.2.2 Reference grey-scale image .16
7.2.3 Binarised image .16
7.3 Reference reflectivity measurements .17
7.3.1 Application specification defines the aperture size .17
7.4 Grading procedure .17
7.5 Image assessment parameters and grading .18
7.5.1 Use of reference decode algorithm .18
7.5.2 Decode .18
7.5.3 Computing R and R .18
max min
7.5.4 Symbol contrast .19
7.5.5 Modulation and related measurements .19
7.5.6 Fixed pattern damage . 22
7.5.7 Axial nonuniformity . 22
7.5.8 Grid nonuniformity . 23
7.5.9 Unused error correction . 23
7.5.10 Print growth .24
7.5.11 Additional grading parameters . 25
7.6 Symbol grade. 25
© ISO/IEC 2024 – All rights reserved
iii
8 Measurement methodologies for composite symbologies .25
Annex A (normative) Thresholding algorithm based on histogram .27
Annex B (informative) Interpreting the scan and symbol grades .31
Annex C (informative) Guidance on selecting grading parameters in application specifications .33
Annex D (informative) Substrate characteristics .39
Annex E (informative) Parameter grade overlay applied to two-dimensional symbologies . 41
Annex F (informative) Explanation of the main changes in this edition of this document .42
Bibliography .45
© ISO/IEC 2024 – All rights reserved
iv
Foreword
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