ISO/IEC 10373-6:2011/Amd 2:2012
(Amendment)Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Test methods for electromagnetic disturbance
Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Test methods for electromagnetic disturbance
Cartes d'identification — Méthodes d'essai — Partie 6: Cartes de proximité — Amendement 2: Méthodes d'essai des perturbations électromagnétiques
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Standards Content (Sample)
INTERNATIONAL ISO/IEC
STANDARD 10373-6
Second edition
2011-01-15
AMENDMENT 2
2012-10-15
Identification cards — Test methods —
Part 6:
Proximity cards
AMENDMENT 2: Test methods for
electromagnetic disturbance
Cartes d'identification — Méthodes d'essai —
Partie 6: Cartes de proximité
AMENDEMENT 2: Méthodes d'essai des perturbations
électromagnétiques
Reference number
ISO/IEC 10373-6:2011/Amd.2:2012(E)
©
ISO/IEC 2012
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ISO/IEC 10373-6:2011/Amd.2:2012(E)
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ii © ISO/IEC 2012 – All rights reserved
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ISO/IEC 10373-6:2011/Amd.2:2012(E)
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are members of
ISO or IEC participate in the development of International Standards through technical committees
established by the respective organization to deal with particular fields of technical activity. ISO and IEC
technical committees collaborate in fields of mutual interest. Other international organizations, governmental
and non-governmental, in liaison with ISO and IEC, also take part in the work. In the field of information
technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of the joint technical committee is to prepare International Standards. Draft International
Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication as
an International Standard requires approval by at least 75 % of the national bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights.
Amendment 2 to ISO/IEC 10373-6:2011 was prepared by Joint Technical Committee ISO/IEC JTC 1,
Information technology, Subcommittee SC 17, Cards and personal identification.
© ISO/IEC 2012 – All rights reserved iii
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ISO/IEC 10373-6:2011/Amd.2:2012(E)
Identification cards — Test methods —
Part 6:
Proximity cards
AMENDMENT 2: Test methods for electromagnetic disturbance
Page 5, 3.2
Add the following symbol between TM-PDU and UIDTX :
I
t Start of PICC transmission
START
Page 12
Insert the following new subclause 5.5 before Clause 6:
5.5 EMD test setup
5.5.1 General description
The EMD test setup contains:
a signal generator with low phase noise, which is used to synthesize both an EMD test pattern and
PCD test commands sent to the PICC under test;
the Test PCD assembly;
a signal amplitude analyzing device:
either a signal acquiring device (e.g. oscilloscope) and appropriate computation software,
or a spectrum analyzer (see additional constraints in 5.5.2).
The signal amplitude analyzing device shall be able to carry out power versus time measurements with fixed
frequency, fixed bandwidth, high dynamic range, low measurement uncertainty and high time resolution.
NOTE The PICC EMD tests may be performed using the RF output signal of a commercial PCD. The PCD EMD test
may use a PICC emulator to generate the EMD test pattern.
5.5.2 Computation of power versus time
The beginning of the captured signal shall be windowed by a Bartlett window of exactly two subcarrier cycles.
Fourier transformation of these windowed samples produces one power value. By shifting the Bartlett window
by steps of 1/fc from the beginning to the end of the captured signal, the desired power versus time result is
finally computed.
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ISO/IEC 10373-6:2011/Amd.2:2012(E)
NOTE The resulting 3 dB-bandwidth of the above described window is 531 kHz and its noise equivalent bandwidth
amounts to 843 kHz.
The computation of the power versus time shall be performed at fc + fs and fc − fs, using a scaling such that a
pure sinusoidal signal results in its peak magnitude. An example of computation is provided in Annex J.
In case of using a spectrum analyzer, the analyzer shall have at least an equivalent analysis bandwidth. It
shall pass the noise floor precondition test, as defined in 5.5.3, and there shall be some additional margin of
10/fc on t requirement and no spikes above the EMD limit.
E,PICC
5.5.3 Noise floor precondition test
In order to ensure a high dynamic range and sufficient sensitivity, a noise floor measurement shall be
performed and passed successfully by the EMD test setup. The aim of this precondition test is to verify that
the test apparatus used for EMD level measurement satisfies a minimum noise requirement.
The noise floor test is passed if the noise standard deviation is at least three times smaller than the EMD limit
V , when measured as described in 5.5.3.1.
E,PICC
The noise standard deviation is determined by calculating the root-mean-square value of the results of the
Fourier transformation, as described in 5.5.2.
NOTE This noise floor can be obtained either with a 14-bit digitizer at a sampling rate of 100 million samples per
second or with an 8-bit digital oscilloscope at sampling rate of 1000 million samples per second.
5.5.3.1 Test procedure
Perform the following steps to assess the noise floor at least at H and H .
min max
a) Tune the Reference PICC to 13,56 MHz.
b) Adjust the RF power delivered by the signal generator to the Test PCD antenna to the required field
strength as measured by the calibration coil.
c) Place the Reference PICC into the DUT position on the Test PCD assembly, set jumper J1 to position 'b'
and adjust R2 to obtain a voltage of 6 V (DC) at CON3. Alternatively, jumper J1 may be set to position 'c'
and the applied voltage on CON2 is adjusted to obtain a voltage of 6 V (DC) at CON3. In both cases the
operating field condition shall be verified by monitoring the voltage in the calibration coil and adjusted if
necessary.
d) Record the signal of the sense coils for a time period of at least 250 μs.
e) Compute the noise standard deviations at fc + fs and fc − fs using suitable computer software, as e.g. the
one given in Annex J. Check if these noise standard deviations are three times smaller than VE,PICC.
5.5.3.2 Test report
The test report shall state the noise standard deviations at fc + fs and fc – fs and shall state whether the
requirements have been fulfilled.
Page 18
Insert the following new subclauses 7.1.6 and 7.1.7 before 7.2:
2 © ISO/IEC 2012 – All rights reserved
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ISO/IEC 10373-6:2011/Amd.2:2012(E)
7.1.6 PCD EMD immunity test
7.1.6.1 Purpose
The purpose of this test is to determine whether the PCD is insensitive to any load modulation amplitude
below V .
E,PCD
7.1.6.2 Test procedure
a) Tune the Reference PICC to 13,56 MHz as described in 5.4.3 and switch the jumper J1 to position 'c'.
b) Place the Reference PICC at a designated position in the PCD operating volume.
c) Apply and adjust a DC voltage at CON2 to obtain a DC voltage at connector CON3 of 3 V or optionally
6 V when supporting "Class 1" at that position.
d) Send the test pattern as shown in Figure Amd.2.1. The test pattern is a valid standard frame including
one single byte (01011101)b. The initial load modulation amplitude VEMD of the test pattern shall be
sufficiently low so that the PCD detects the PICC answer sent in step e).
e) Immediately after this test pattern, applying no gap, send the appropriate PICC answer to the PCD
command with a load modulation amplitude VLMA, measured as defined in 7.2.1, of a level higher, e.g.
twice, than the minimum value for the applied field strength H.
f) Increase VEMD by adjusting the voltage at CON1 until the PCD does no longer detect the answer
correctly. This may be determined by monitoring the next PCD command following the PICC answer, see
Figure Amd.2.1.
g) Place the Reference PICC into the DUT position on the Test PCD assembly.
h) Adjust the Test PCD assembly to produce a field strength H which gives the same voltage at CON3 and
note the corresponding field strength by reading the calibration coil voltage.
i) Derive the current value of VEMD on the Reference PICC by applying the power versus time
measurement as described in 5.5.2.
j) Compare this measured VEMD value with VE,PCD.
Repeat steps b) to j) for other designated positions within the operating volume.
next PCD
PCD
command
PCD
command
Reference
PICC
V
PICC EMD
test pattern
answer
t
Figure Amd.2.1 — PCD immunity test (common for Type A and Type B)
7.1.6.3 Test report
The test report shall state whether the PCD was insensitive to any load modulation amplitude below V .
E,PCD
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ISO/IEC 10373-6:2011/Amd.2:2012(E)
7.1.7 PCD EMD recovery test
7.1.7.1 Purpose
The purpose of this test is to determine whether the PCD is disturbed by a test pattern sent t before the
E,PCD
PICC answer.
7.1.7.2 Test procedure
a) Tune the Reference PICC to 13,56 MHz as described in 5.4.3.
b) Calibrate the Test PCD assembly to produce the H operating condition on the calibration coil.
min
c) Place the Reference PICC into the DUT position on the Test PCD assembly. Switch the jumper J1 to
position 'c' and adjust the DC voltage at CON2 to obtain a voltage of 6 V (DC) at CON3. The operating
field condition shall be verified by monitoring the voltage on the calibration coil and the voltage adjusted if
necessary.
d) Find the appropriate driving voltage at CON1 to produce a load modulation amplitude V , measured as
LMA
defined in 7.2.1, higher than the limit for H , defined in ISO/IEC 14443-2.
min
e) Place the Reference PICC at a position within the operating volume of the PCD where 6 V (DC) is
obtained at CON3.
f) Send in sequence, as illustrated in Figure Amd.2.2 using the t associated with minimum FDT/TR0,
E,PCD
NOTE 1 The low EMD time t is a function of FDT/TR0 as defined in ISO/IEC 14443-3:2011/Amd.1:2011.
E,PCD
a test pattern, which starts sending the two data bits b1 = (0)b followed by b2 = (1)b in a valid way to
the PCD, but interrupts immediately after the second bit sent, as illustrated in Figure Amd.2.3 for
Type A and Figure Amd.2.4 for Type B,
NOTE 2 Depending on the FDT/TR0, the test pattern may start before the end of the PCD command.
a period with no load modulation for a duration of t ,
E,PCD
the appropriate answer to the PCD command.
g) Check if the PCD behaves in the same way as if there was no test pattern. This may be determined by
monitoring the next PCD command following the PICC answer, see Figure Amd.2.2.
h) Repeat steps f) and g) 10 times.
i) Repeat steps f) to h) replacing minimum FDT/TR0 with maximum FDT/TR0.
next PCD
PCD
command
command
PCD
t
E,PCD
test pattern PICC
Reference
answer
PICC
t
Figure Amd.2.2 — EMD recovery test sequence (common for Type A and Type B)
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ISO/IEC 10373-6:2011/Amd.2:2012(E)
no subcarrier
S b1 b2
0 1
t
E,PCD
Figure Amd.2.3 — Test pattern for the EMD recovery test (Type A)
no subcarrier TR1 = 80/fs SOF
Start b1 no subcarrier
b2
subcarrier 0 1
t
E, PCD
Figure Amd.2.4 — Test pattern for the EMD recovery test (Type B)
7.1.7.3 Test report
The test report shall report whether the PCD was not disturbed by the test pattern sent t before the PICC
E,PCD
answer (or was able to recover from the test pattern).
Page 19, 7.2.1
Insert the following new subclause 7.2.2 before the existing 7.2.2 and renumber all subsequent subclauses:
7.2.2 PICC EMD level and low EMD time test
7.2.2.1 Purpose
The purpose of this test is to determine that the PICC does not generate an electromagnetic disturbance
amplitude V higher than V during t with exceptions defined in ISO/IEC 14443-2:2010/Amd.1:2011.
EMD E,PICC E,PICC
NOTE 1 The low EMD time t is a function of FDT/TR0 as defined in ISO/IEC 14443-3:2011/Amd.1:2011.
E,PICC
NOTE 2 The EMD limit V is a function of the field strength.
E,PICC
7.2.2.2 Noise requirements
In order to ensure a high dynamic range and sufficient sensitivity to EMD, the noise floor precondition test
defined in 5.5.3 shall be performed before this test.
7.2.2.3 Test commands
The PICC EMD test shall be performed for ISO/IEC 14443-3 commands. Depending on the PICC application,
additional higher layer commands shall be included in the test plan.
7.2.2.4 Test procedure
This test shall be done at least applying H and H Using the Test PCD assembly, perform the following
min max.
steps:
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ISO/IEC 10373-6:2011/Amd.2:2012(E)
a) Adjust the RF power delivered by the signal generator to the Test PCD antenna to the required field
strength as measured by the calibration coil.
b) Place the PICC under test into the DUT position. The RF drive into the Test PCD antenna shall be
readjusted to the required field strength if necessary.
c) Reset the PICC by switching the RF field off and on; then if necessary send a transition of sequence
commands to put the PICC in the Test Initial State, (see Annex G.3.3.2.1 for PICC Type A and Annex
G.4.4.1.1 for PICC Type B).
d) Send the command to be tested.
e) Record the sense coil’s signal for a time period of at least 200 μs before the start of PICC subcarrier
generation. Additionally, record at least 50 μs after the first detected subcarrier in order to determine
precisely the position of the PICC answer.
f) Determine the value of t from the acquired signal: if the PCD modulation is present on the trace then
E,PICC
measure the time between the last rising edge of PCD modulation and the start of PICC subcarrier
generation and calculate t with the formula given in ISO/IEC 14443-3:2011/ Amd.1:2011; if the
E,PICC
PCD modulation is not present on the trace then t equals its maximum value defined in
E,PICC
ISO/IEC 14443-3:2011/Amd.1:2011.
g) Compute the signal power at the frequencies fc + fs and fc − fs as a function of time as defined in 5.5.2.
h) Using data obtained in step g), determine the time t corresponding to half the upper side
START
band amplitude during the rising edge of PICC transmission. Check if the signal amplitude during the
time period [t − t ; t − 10/fc] complies with the requirements defined in
START E,PICC START
ISO/IEC 14443-2:2010/Amd.1:2011.
i) Repeat step h) for the lower side band frequency.
j) Repeat steps d) to i) for the next test command.
7.2.2.5 Test report
The test report shall state whether the PICC EMD level during t complies with the requirements defined in
E,PICC
ISO/IEC 14443-2:2010/Amd.1:2011.
Furthermore the test report shall give the measured maximum electromagnetic disturbance levels of the upper
and lower sidebands at fc + fs and fc − fs during t . A graph showing EMD levels during t should be
E,PICC E,PICC
incorporated in the report in case the test fails.
Page 188
Replace the (normative) Annex I with the following (informative) Annex I:
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ISO/IEC 10373-6:2011/Amd.2:2012(E)
Annex I
(informative)
Program for EMD level measurements
The following code in C language may be used to perform the EMD level measurements.
NOTE The output of (time, USB, LSB) may depend on compiler options and the used operating system architecture.
/**************************************************************************************************/
/*** This program calculates the upper side band (USB) and ***/
/*** lower side band (LSB) load modulation amplitudes ***/
/*** versus time of a PICC for the evaluation of EMD levels ***/
/*** according to ISO/IEC 10373-6/Amd.2 ***/
/**************************************************************************************************/
/*** Input: ***/
/*** File in CSV format containing a table of two ***/
/*** columns (time and sense coils' voltage) ***/
/*** data format of input-file: ***/
/*** - one data-point per line: ***/
/*** (time[seconds], sense-coil-voltage[volts]) ***/
/*** - contents in ASCII, no headers ***/
/*** - data-points shall be equidistant time ***/
/*** - minimum sampling rate: 100 MSamples/second ***/
/*** - At least 200 microsecond before start of PICC ***/
/*** sub-carrier generation ***/
/*** - At least 50 microsecond after start of PICC ***/
/*** sub-carrier generation ***/
/*** ***/
/*** example for spreadsheet file (start in next line): ***/
/*** (time) (voltage) ***/
/*** 3.00000e-06,1.00 ***/
/*** 3.00200e-06,1.01 ***/
/*** . ***/
/*** ***/
/*** Ouput: ***/
/*** File in CSV format containing the results ***/
/*** in a table of three columns (time, USB, LSB) ***/
/*** ***/
/*** ***/
/**************************************************************************************************/
/*** RUN: ***/
/*** "exefilename" filename[.csv] ***/
/**************************************************************************************************/
/*** ISO/IEC 10373-6 EMD levels Calculation
...
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