ISO/IEC 10373-7:2019
(Main)Cards and security devices for personal identification — Test methods — Part 7: Contactless vicinity objects
Cards and security devices for personal identification — Test methods — Part 7: Contactless vicinity objects
The ISO/IEC 10373 series defines test methods for characteristics of identification cards according to the definition given in ISO/IEC 7810. Each test method is cross‑referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of the supplementary standards that define the information storage technologies employed in identification card applications. NOTE 1 Criteria for acceptability do not form part of the ISO/IEC 10373 series, but can be found in the International Standards mentioned above. NOTE 2 Test methods defined in the ISO/IEC 10373 series are intended to be performed separately. A given card is not required to pass through all the tests sequentially. This document deals with test methods, which are specific to contactless integrated circuit card (vicinity card) technology. ISO/IEC 10373-1 deals with test methods which are common to one or more ICC technologies and other parts in the ISO/IEC 10373 series deal with other technology‑specific tests. Unless otherwise specified, the tests in this document apply exclusively to vicinity cards defined in ISO/IEC 15693‑1, ISO/IEC 15693-2 and ISO/IEC 15693-3.
Cartes et dispositifs de sécurité pour l'identification personnelle — Méthodes d'essai — Partie 7: Objets sans contact de voisinage
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Standards Content (Sample)
INTERNATIONAL ISO/IEC
STANDARD 10373-7
Third edition
2019-10
Cards and security devices for
personal identification — Test
methods —
Part 7:
Contactless vicinity objects
Cartes et dispositifs de sécurité pour l'identification personnelle —
Méthodes d'essai —
Partie 7: Objets sans contact de voisinage
Reference number
©
ISO/IEC 2019
© ISO/IEC 2019
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
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Published in Switzerland
ii © ISO/IEC 2019 – All rights reserved
Contents Page
Foreword .v
1 Scope . 1
2 Normative reference(s) . 1
3 Terms, definitions, symbols and abbreviated terms . 1
3.1 Terms and definitions . 1
3.2 Symbols and abbreviated terms. 2
4 Default items applicable to the test methods . 2
4.1 Test environment . 2
4.2 Pre-conditioning . 2
4.3 Default tolerance . 2
4.4 Spurious inductance . 2
4.5 Total measurement uncertainty . 2
5 Static electricity test . 3
6 Test apparatus and test circuits . 3
6.1 General . 3
6.2 Calibration coil card. 3
6.2.1 General. 3
6.2.2 Size of the calibration coil card . 3
6.2.3 Thickness and material of the calibration coil card. 3
6.2.4 Coil characteristics . 3
6.3 Test VCD assembly . 4
6.3.1 General. 4
6.3.2 Test VCD antenna . 5
6.3.3 Sense coils . 6
6.3.4 Assembly of test VCD . 6
6.4 Reference VICCs . 6
6.4.1 General. 6
6.4.2 Reference VICC for VCD power . 7
6.4.3 Reference VICC for load modulation test . 7
6.4.4 Dimensions of the reference VICCs . 7
6.4.5 Thickness of the reference VICC board . 7
6.4.6 Coil characteristics . 7
6.5 Digital sampling oscilloscope . 8
7 Functional test — VICC . 8
7.1 Purpose . 8
7.2 Test procedure . 8
7.3 Test report . 8
8 Functional test — VCD . 9
8.1 VCD field strength and power transfer. 9
8.1.1 Purpose . 9
8.1.2 Test procedure . 9
8.1.3 Test report . 9
8.2 Modulation index and waveform .10
8.2.1 Purpose .10
8.2.2 Test procedure .10
8.2.3 Test report .10
8.3 Load modulation reception .10
9 Additional test methods .10
9.1 Additional VICC test methods .10
9.2 Additional VCD test methods .10
Annex A (normative) Test VCD antenna .11
© ISO/IEC 2019 – All rights reserved iii
Annex B (informative) Test VCD antenna tuning.14
Annex C (normative) Sense coil .17
Annex D (normative) Reference VICC for VCD power test .19
Annex E (informative) Reference VICC for load modulation test .21
Annex F (informative) Program for evaluation of the spectrum .23
Annex G (normative) Additional VICC test methods .27
Annex H (normative) Additional VCD test methods .49
Bibliography .51
iv © ISO/IEC 2019 – All rights reserved
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are
members of ISO or IEC participate in the development of International Standards through technical
committees established by the respective organization to deal with particular fields of technical
activity. ISO and IEC technical committees collaborate in fields of mutual interest. Other international
organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in the
work. In the field of information technology, ISO and IEC have established a joint technical committee,
ISO/IEC JTC 1.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for
the different types of document should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject
of patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent
rights. Details of any patent rights identified during the development of the document will be in the
Introduction and/or on the ISO list of patent declarations received (see www .iso .org/patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO's adherence to the
World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT) see www .iso
.org/iso/foreword .html.
This document was prepared by Technical Committee ISO/IEC JTC 1, Information technology,
Subcommittee SC 17, Cards and security devices for personal identification.
This third edition cancels and replaces the second edition (ISO/IEC 10373-7:2008), which has been
technically revised.
The main changes compared to the previous edition are as follows:
— Annex G and Annex H have been added.
A list of all parts in the ISO/IEC 10373 series can be found on the ISO website.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at https: //www .iso .org/members .html.
© ISO/IEC 2019 – All rights reserved v
INTERNATIONAL STANDARD ISO/IEC 10373-7:2019(E)
Cards and security devices for personal identification —
Test methods —
Part 7:
Contactless vicinity objects
1 Scope
The ISO/IEC 10373 series defines test methods for characteristics of identification cards according
to the definition given in ISO/IEC 7810. Each test method is cross-referenced to one or more base
standards, which can be ISO/IEC 7810 or one or more of the supplementary standards that define the
information storage technologies employed in identification card applications.
NOTE 1 Criteria for acceptability do not form part of the ISO/IEC 10373 series, but can be found in the
International Standards mentioned above.
NOTE 2 Test methods defined in the ISO/IEC 10373 series are intended to be performed separately. A given
card is not required to pass through all the tests sequentially.
This document deals with test methods, which are specific to contactless integrated circuit card
(vicinity card) technology. ISO/IEC 10373-1 deals with test methods which are common to one or more
ICC technologies and other parts in the ISO/IEC 10373 series deal with other technology-specific tests.
Unless otherwise specified, the tests in this document apply exclusively to vicinity cards defined in
ISO/IEC 15693-1, ISO/IEC 15693-2 and ISO/IEC 15693-3.
2 Normative reference(s)
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments) applies.
ISO/IEC 7810, Identification cards — Physical characteristics
ISO/IEC 15693-1:2018, Cards and security devices for personal identification — Contactless vicinity
objects — Part 1: Physical characteristics
ISO/IEC 15693-2:2019, Cards and security devices for personal identification — Contactless vicinity
objects — Part 2: Air interface and initialization
ISO/IEC 15693-3:2019, Cards and security devices for personal identification — Contactless vicinity
objects — Part 3: Anticollision and transmission protocol
3 Terms, definitions, symbols and abbreviated terms
3.1 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminological databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https: //www .iso .org/obp
© ISO/IEC 2019 – All rights reserved 1
— IEC Electropedia: available at http: //www .electropedia .org/
3.1.1
base standard
standard which the test method (3.1.2) is used to verify conformance to
3.1.2
test method
method for testing characteristics of identification cards for the purpose of confirming their compliance
with International Standards
3.2 Symbols and abbreviated terms
DUT device under test
ESD electrostatic discharge
f frequency of the operating field
c
f , f frequencies of the subcarriers
s1 s2
H maximum field strength of the VCD antenna field
max
H minimum field strength of the VCD antenna field
min
VCD vicinity coupling device
VICC vicinity card
4 Default items applicable to the test methods
4.1 Test environment
Unless otherwise specified, testing shall take place in an environment of temperature 23 °C ± 3 °C
(73 °F ± 5 °F) and of relative humidity 40 % to 60 %.
4.2 Pre-conditioning
Where pre-conditioning is required by the test method, the identification cards to be tested shall be
conditioned to the test environment for a period of 24 h before testing.
4.3 Default tolerance
Unless otherwise specified, a default tolerance of ±5 % shall be applied to the quantity values given
to specify the characteristics of the test equipment (e.g. linear dimensions) and the test method
procedures (e.g. test equipment adjustments).
4.4 Spurious inductance
Resistors and capacitors should have negligible inductance.
4.5 Total measurement uncertainty
The total measurement uncertainty for each quantity determined by these test methods shall be stated
in the test report.
Basic information is given in ISO/IEC Guide 98-3.
2 © ISO/IEC 2019 – All rights reserved
5 Static electricity test
ISO/IEC 10373-1 defines test methods which are common to one or more integrated circuit card
technologies and other parts in the ISO/IEC 10373 series deal with other technology specific tests.
6 Test apparatus and test circuits
6.1 General
This clause defines the test apparatus and test circuits for verifying the operation of a VICC or a VCD
according to ISO/IEC 15693-2 and ISO/IEC 15693-3. The test apparatus includes:
— calibration coil (see 6.2),
— test VCD assembly (see 6.3),
— reference VICC (see 6.4),
— digital sampling oscilloscope (see 6.5).
6.2 Calibration coil card
6.2.1 General
This subclause defines the size, thickness and characteristics of the calibration coil.
6.2.2 Size of the calibration coil card
The calibration coil card consists of an area, which shall have the height and width defined in
ISO/IEC 7810 for ID-1 type containing a single turn coil concentric with the card outline (see Figure 1).
Key
1 coil 72 × 42 mm (1 turn)
2 connections
Figure 1 — Calibration coil for ISO/IEC 7810 ID-1 outline
6.2.3 Thickness and material of the calibration coil card
The thickness of the calibration coil card shall be 0,76 mm with a tolerance of ±10 %. It shall be
constructed of a suitable insulating material.
6.2.4 Coil characteristics
The coil on the calibration coil card shall have one turn. The relative dimensional tolerance shall be
±2 %. The outer size of the coil shall be 72 mm × 42 mm with corner radius 5 mm.
NOTE 1 The area over which the field is integrated is approximately 3 000 mm .
© ISO/IEC 2019 – All rights reserved 3
The coil is made as a printed coil on PCB plated with 35 µm copper. Track width shall be 500 µm with a
relative tolerance of ±20 %. The size of the connection pads shall be 1,5 mm × 1,5 mm.
NOTE 2 At 13,56 MHz the approximate inductance is 200 nH and the approximate resistance is 0,25 Ω.
A high impedance oscilloscope probe (e.g. >1 MΩ, <14 pF) shall be used to measure the (open circuit)
voltage in the coil. The resonance frequency of the whole set (calibration coil, connecting leads and
probe) shall be above 60 MHz.
NOTE 3 A parasitic capacitance of the probe assembly of less than 35 pF normally ensures a resonant
frequency for the whole set of greater than 60 MHz.
The open circuit calibration factor for this coil is 0,32 V (rms) per A/m (rms) [equivalent to 900 mV
(peak-to-peak) per A/m (rms)].
6.3 Test VCD assembly
6.3.1 General
The test VCD assembly for load modulation consists of a 150 mm diameter VCD antenna and two
parallel sense coils: sense coil a; and sense coil b. The test set-up is shown in Figure 2. The sense
coils are connected such that the signal from one coil is in an opposite phase to the other. The 10 Ω
potentiometer P1 serves to fine adjust the balance point when the sense coils are not loaded by a VICC
or any magnetically coupled circuit. The capacitive load of the probe including its parasitic capacitance
shall be less than 14 pF.
4 © ISO/IEC 2019 – All rights reserved
Key
1 VCD antenna
2 sense coil b
3 sense coil a
4 identical length of twisted pairs with less than 150 mm.
5 probe
6 to oscilloscope
P1 potentiometer
Figure 2 — Load modulation test circuit
The maximum length of 150 mm of the twisted pairs takes the wider spacing of the sense coils in
comparison to the set-up in ISO/IEC 10373-6 into account.
In order to avoid any unintended misalignment in case of an unsymmetrical set-up the tuning range of
the potentiometer P1 is only 10 Ω. If the set-up cannot be compensated by the 10 Ω potentiometer P1
the overall symmetry of the set-up should be checked.
The capacitance of the connections and oscilloscope probe should be kept to a minimum for
reproducibility.
The high impedance oscilloscope probe ground connection should be as short as possible, less than
20 mm or coaxial connection.
6.3.2 Test VCD antenna
The test VCD antenna shall have a diameter of 150 mm and its construction shall conform to the
drawings in Annex A. The tuning of the antenna may be accomplished with the procedure given in
Annex B.
© ISO/IEC 2019 – All rights reserved 5
6.3.3 Sense coils
The size of the sense coils is 100 mm × 70 mm. The sense coil construction shall conform to the drawings
in Annex C.
6.3.4 Assembly of test VCD
The sense coils and test VCD antenna are assembled in parallel, with the sense and antenna coils coaxial
and such that the distance between the active conductors is 100 mm as in Figure 3. The distance
between the coil in the DUT and the calibration coil shall be equal with respect to the coil of the test
VCD antenna.
Dimensions in millimetres
Key
1 sense coil a
2 sense coil b
3 VCD antenna
4 active conductors
5 calibration coil
6 DUT
a
3 mm air spacing.
NOTE 1 The distance of 100 mm reflects a larger read distance and the 3mm air spacing avoids parasitic
effects such as detuning by closer spacing or ambiguous results due to noise and other environmental effects.
NOTE 2 Drawings are not to scale.
Figure 3 — Test VCD assembly
6.4 Reference VICCs
6.4.1 General
Reference VICCs are defined
— to test H and H produced by a VCD (under conditions of loading by a VICC);
min max
— to test the ability of a VCD to power a VICC;
6 © ISO/IEC 2019 – All rights reserved
— to detect the minimum load modulation signal from the VICC.
6.4.2 Reference VICC for VCD power
Annex D shows the schematic the power test shall use. Power dissipation can be set by the resistor R1
or R2 respectively in order to measure H and H as defined in 8.1.2. The resonant frequency can be
max min
adjusted with C2.
6.4.3 Reference VICC for load modulation test
A suggested schematic for the load modulation test is shown in Annex E. The load modulation can be
chosen to be resistive or reactive.
This reference VICC is calibrated by using the test VCD assembly as follows:
The reference VICC is placed in the position of the DUT. The load modulation signal amplitude is
measured as described in 7.2. This amplitude should correspond to the minimum amplitude at all
values of field strength required by the base standard.
6.4.4 Dimensions of the reference VICCs
The reference VICCs consist of an area containing the coils which has the height and width defined
in ISO/IEC 7810 for ID-1 type. An area external to this, containing the circuitry which emulates the
required VICC functions, is appended in a way as to allow insertion into the test set-ups described below
and so as to cause no interference to the tests. The dimensions shall be as in Figure 4.
Dimensions in millimetres
Key
1 outline ISO/IEC 7810 ID-1 type
2 coil
3 circuitry
NOTE Drawings are not to scale.
Figure 4 — Reference VICC dimensions
6.4.5 Thickness of the reference VICC board
The thickness of the reference VICC active area shall be 0,76 mm, with a tolerance of ±10 %.
6.4.6 Coil characteristics
The coil in the active area of the reference VICC shall have 4 turns and shall be concentric with the area
outline.
The outer size of the coils shall be 72 mm × 42 mm with relative tolerance of ±2 %.
© ISO/IEC 2019 – All rights reserved 7
The coil is printed on PCB plated with 35 µm copper.
Track width and spacing shall be 500 µm with a relative tolerance of ±20 %.
6.5 Digital sampling oscilloscope
The digital sampling oscilloscope shall be capable of sampling at a rate of at least 100 million samples
per second with a resolution of at least 8 bits at optimum scaling. The oscilloscope should have the
capability to output the sampled data as a text file to facilitate mathematical and other operations such
as windowing on the sampled data using external software programmes (Annex F).
7 Functional test — VICC
7.1 Purpose
The purpose of this test is to determine the amplitude of the VICC load modulation signal within the
operating field range [H , H ] as specified in ISO/IEC 15693-2:2019, 6.3 and the functionality of
min max
the VICC with the modulation under emitted fields as defined in ISO/IEC 15693-2:2019, Figure 1 and
Figure 2.
7.2 Test procedure
Step 1: The load modulation test circuit of Figure 2 and the test VCD assembly of Figure 3 are used.
The RF power delivered by the signal generator to the test VCD antenna shall be adjusted to the required
field strength and modulation waveforms as measured by the calibration coil without any VICC. The
output of the load modulation test circuit of Figure 2 is connected to a digital sampling oscilloscope.
The 10 Ω potentiometer P1 shall be trimmed to minimise the residual carrier. This signal shall be at
least 40 dB lower than the signal obtained by shorting one sense coil.
Step 2: The VICC under test shall be placed in the DUT position, concentric and aligned with sense coil a.
The RF drive into the test VCD antenna shall be re-adjusted to the required field strength.
Care should be taken to apply a proper synchronization method for low amplitude load modulation.
Exactly two subcarrier cycles of the sampled modulation waveform shall be Fourier transformed. A
discrete Fourier transformation with a scaling such that a pure sinusoidal signal results in its peak
magnitude shall be used. To minimize transient effects, a subcarrier cycle immediately following a
non-modulating period shall be avoided. In case of two subcarrier frequencies this procedure shall be
repeated for the second subcarrier frequency.
The resulting amplitudes of the two upper sidebands at f +f and f +f and the two lower sidebands at
c s1 c s2
f -f and f -f , respectively, shall be above the value defined in 8.2 of the base standard.
c s1 c s2
An appropriate command sequence as defined in ISO/IEC 15693-3 shall be sent by the reference VCD to
obtain a signal or load modulation response from the VICC.
7.3 Test report
The test report shall give the measured amplitudes of the upper sidebands at f +f and f +f and the
c s1 c s2
lower sidebands at f -f and f -f and the applied fields and modulations.
c s1 c s2
8 © ISO/IEC 2019 – All rights reserved
8 Functional test — VCD
8.1 VCD field strength and power transfer
8.1.1 Purpose
This test measures the field strength produced by a VCD with its specified antenna in its operating
volume as defined in accordance with the base standard. The test procedure of 8.1.2 is also used to
determine that the VCD with its specified antenna shall generate a field not higher than the value
specified in ISO/IEC 15693-1:2018, 4.3.
This test uses a reference VICC as defined in Annex D to determine that a specific VCD to be tested is
able to supply a certain power to a VICC placed anywhere within the defined operating volume.
8.1.2 Test procedure
Procedure for H test:
max
1) Set Jumper J1 to position 'a' to activate R1.
2) Tune the reference VICC to 13,56 MHz.
NOTE The resonance frequency of the reference VICC is measured by using an impedance analyser or
a LCR-meter connected to a calibration coil. The coil of the reference VICC is placed on the calibration coil
with (3 ± 0.3) mm spacing, with the axes of the two coils being congruent. The resonance frequency is that
frequency at which the reactive part of the measured complex impedance is at maximum.
3) Set Jumper J1 to position “b” to activate R2.
4) Calibrate the reference VICC in the test VCD assembly set to produce H operating condition for
max
an output voltage of V = 3 V by adjusting R2.
DC
5) Position the reference VICC within the defined operating volume of VCD under test.
6) The DC voltage (V ) across resistor R3 (Annex D) is measured with a high impedance voltmeter
DC
and shall not exceed 3 V.
Procedure for H test:
min
1) Set Jumper J1 to position “a” to activate R1.
2) Tune the reference VICC to 13,56 MHz.
3) Calibrate the reference VICC in the test VCD assembly set to produce H operating condition for
min
an output voltage of V = 3 V by adjusting R1.
DC
4) Position the reference VICC within the defined operating volume of the VCD under test.
5) The DC voltage (V ) across resistor R3 is measured with a high impedance voltmeter and shall
DC
exceed 3 V.
8.1.3 Test report
The test report shall give the measured values for V at H and H under the defined conditions.
DC min max
© ISO/IEC 2019 – All rights reserved 9
8.2 Modulation index and waveform
8.2.1 Purpose
This test is used to determine the index of modulation of the VCD field as well as the rise and fall times
and the overshoot values as defined in ISO/IEC 15693-2:2019, Figure 1 and Figure 2 within the defined
operating volume.
8.2.2 Test procedure
The calibration coil is positioned anywhere within the defined operating volume, and the modulation
index and waveform characteristics are determined from the induced voltage on the coil displayed on a
suitable oscilloscope.
8.2.3 Test report
The test report shall give the measured modulation index of the VCD field, the rise and fall times and the
overshoot values as defined in ISO/IEC 15693-2:2019, Figure 1 and Figure 2 within the defined volume.
8.3 Load modulation reception
This test may be used to verify that a VCD correctly detects the load modulation of a VICC which
conforms to the base standard. It is supposed that the VCD has means to indicate correct reception of
the subcarrier(s) produced by a test VICC.
Annex E shows a circuit which can be used in conjunction with the test apparatus to determine the
sensitivity of a VCD to load modulation within the defined operating volume.
9 Additional test methods
9.1 Additional VICC test methods
The test methods shall be carried out as specified in Annex G.
9.2 Additional VCD test methods
The test methods shall be carried out as specified in Annex H.
10 © ISO/IEC 2019 – All rights reserved
Annex A
(normative)
Test VCD antenna
A.1 Test VCD antenna layout including impedance matching network
Figure A.1 and Figure A.2 show the VCD antenna layout.
NOTE The layout of the impedance matching network is informative.
Dimensions in millimetres
Key
1 ground compensation coil
2 antenna coil
3 impedance matching network
NOTE 1 The antenna coil track width is 1,8 mm (except for through-plated holes).
NOTE 2 Starting from the impedance matching network there are crossovers every 45°.
NOTE 3 PCB: FR4 material thickness 1,6 mm, double sided with 35 µm copper.
© ISO/IEC 2019 – All rights reserved 11
NOTE 4 The drawing is not to scale.
Figure A.1 — Test VCD antenna layout including impedance matching network
(view from front)
Figure A.2 — VCD antenna layout (view from back)
A.2 Impedance matching network
The antenna impedance (R , L ) is adapted to the function generator output impedance (Z = 50 Ω) by
ant ant
a matching circuit (see Figure A.3). The capacitors C1, C2 and C3 have fixed values. The input impedance
phase can be adjusted with the variable capacitor C4 (see Table A.1).
Care shall be taken to keep maximum voltages and maximum power dissipation within the specified
limits of the individual components.
The linear low distortion variable output 50 Ω power driver should be capable of emitting appropriate
signal sequences. The modulation index should be adjustable in the ranges of 10 % to 30 % and 95 % to
100 %. The output power should be adjustable to deliver H fields in the range of 150 mA/m to 12 A/m.
Care should be taken with the duration of fields above the upper operating range of 5 A/m.
12 © ISO/IEC 2019 – All rights reserved
Key
1 50 Ω power driver
2 impedance matching network
3 antenna coil
Z input impedance
R external resistance
ext
R antenna resistance
ant
L antenna inductance
ant
C1, C2, C3, C4 capacitors
Figure A.3 — Impedance matching network
Table A.1 — Component list
a
Component Value Unit
C1 47 pF
C2 180 pF
C3 33 pF
C4 2 to27 pF
R 5 × 4.7 (parallel) Ω
ext
a
The component table gives typical values which may have to be modified slightly to give more
precise adjustment.
C4 shall be adjusted for an input impedance of (50 ± 5) Ω with a phase angle of (0 ± 5) °.
© ISO/IEC 2019 – All rights reserved 13
Annex B
(informative)
Test VCD antenna tuning
B.1 General
Figure B.1 and Figure B.2 show the two steps of a simple phase tuning procedure to match the
impedance of the antenna to that of the driving generator. After the two steps of the tuning procedure
the signal generator shall be directly connected to the antenna output for the tests.
B.2 Step 1
A high precision resistor of 50 Ω, with a tolerance of ±1 % (e.g. 50 Ω BNC resistor) is inserted in the signal
line between the signal generator output and an antenna connector. The two probes of the oscilloscope
are connected to both sides of the serial reference resistor. The oscilloscope displays a Lissajous figure
when it is set in Y to X presentation. The signal generator is set to:
— Wave form: Sinusoidal
— Frequency: 13,56 MHz
— Amplitude: 2 V (rms) – 5 V (rms)
The output is terminated with a second high precision resistor of 50 Ω, with a tolerance of ±1 % (e.g. 50 Ω
BNC terminating resistor). The probe, which is in parallel to the output connector, has a small parasitic
capacitance C . A calibration capacitance C in parallel to the reference resistor compensates
probe cal
this probe capacitor if C = C . The probe capacitor is compensated when the Lissajous figure is
cal probe
completely closed.
14 © ISO/IEC 2019 – All rights reserved
Key
1 signal generator
2 closed figure: Phi = 0
3 angle corresponding to 50 Ω
4 oscilloscope
5 output
R output impedance of signal generator
i
C parasitic capacitance of probe
probe
C calibration capacitance
cal
a
Reference resistor.
b
Calibration resistor.
Figure B.1 — Calibration set-up (Step 1)
The ground cable shall be run close to the probe to avoid induced voltages caused by the magnetic field.
B.3 Step 2
Using the same values as set for step 1, in the second step the matching circuitry is connected to the
antenna output. The capacitor C4 on the antenna board is used to tune the phase to zero.
© ISO/IEC 2019 – All rights reserved 15
Key
1 signal generator
2 closed figure: Phi = 0
3 angle corresponding to 50 Ω
4 oscilloscope
5 output
6 impedance matching network
7 antenna coil
8 phase calibration by C4 in the impedance matching network
R output impedance of signal generator
i
C parasitic capacitance of probe
probe
C calibration capacitance
cal
a
Reference resistor.
Figure B.2 — Calibration set-up (Step 2)
16 © ISO/IEC 2019 – All rights reserved
Annex C
(normative)
Sense coil
C.1 Sense coil layout
Figure C.1 illustrates sense coils 1 layout.
Dimensions in millimetres
Key
1 connections
NOTE 1 The sense coils track width is 0,5 mm with a relative tolerance of ±20 % (except for through-
plated holes).
NOTE 2 Sizes of the coils refer to the outer dimensions.
NOTE 3 PCB: FR4 material thickness 1,6 mm, double sided with 35 µm copper.
Figure C.1 — Layout for sense coils a and b
C.2 Sense coil assembly
Figure C.2 illustrates the sense coil assembly.
© ISO/IEC 2019 – All rights reserved 17
Key
1 connections
2 test VCD antenna
3 sense coil a
4 sense coil b
Figure C.2 — Sense coil assembly
18 © ISO/IEC 2019 – All rights reserved
Annex D
(normative)
Reference VICC for VCD power test
The Reference VICC shall have a circuit diagram as defined in Figure D.1 and component values as
defined in Table D.1 and Table D.2.
Key
L antenna coil
C1, C2, C3, C4 capacitors
D1, D2, D3, D4 diodes
R1, R2, R3 resistors
J1 jumper settings
V output voltage
DC
Figure D.1 — Circuit diagram for Reference VICC
Table D.1 — Component list
Component Value
L See 6.4.6
C1 Stray capacitance < 5pF
C2 2 … 10 pF
C3 27 pF
C4 10 nF
D1, D2, D3, D4 See characteristics in Table D.2 (BAR 43 or equivalent)
a
R1 11 kΩ
a
R2 91 Ω
R3 100 kΩ
J1 Jumper settings:
a: minimum field strength
b: maximum field strength
a
The component table gives typical values for R1 and R2 which may have to be modified slightly to
give more precise adjustment (see 8.1.2).
© ISO/IEC 2019 – All rights reserved 19
Table D.2 — Specification of basic characteristics of D1, D2, D3, D4
Symbol Test Condition Typ. Max. Unit
at T = 25 °C
j
V I =2mA 0,33 V
F F
C V =1V, 7 pF
R
F=1 MHz
t I =10mA, 5 ns
rr F
I =10mA,
R
I =1mA
rr
Key
V : Forward voltage drop
F
V : Reverse voltage
R
I : Forward current
F
I : Reverse current
R
t : Reverse recovery time
rr
I : Reverse recovery current
rr
T : Junction temperature
j
F: Frequency
C: Junction capacitance
20 © ISO/IEC 2019 – All rights reserved
Annex E
(informative)
Reference VICC for load modulation test
The Reference VICC for load modulation test shall have a circuit diagram as defined in Figure E.1 and
component values as defined in Table E.1 and Table E.2.
Key
L antenna coil
C1, C2, C3, C4, C , C capacitors
mod1 mod2
D1, D2, D3, D4 diodes
R1, R2, R3, R , R resistors
mod1 mod2
J1, J2, J3 jumper setting
N1, N2 N-MOS transistor
V output voltage
DC
a
Load switching signal
Figure E.1 — Circuit diagram for Reference VICC for load modulation test
Table E.1 — Adjust following components for required emulation
Component Function Value
C2 adjust resonance between 2 pF and 10 pF
C , C capacitive modulation between 3,0 pF and 120 pF
mod1 mod2
R , R resistive modulation between 100 Ω and 2,7 kΩ
mod1 mod2
© ISO/IEC 2019 – All rights reserved 21
Table E.2 — Component list
Component Value
R1 11 kΩ
R2 91 Ω
R3 100 kΩ
D1, D2, D3, D4 As defined in Table D.1
L see 6.4.6
C1 Stray capacitance < 5 pF
C3 27 pF
C4 10 nF
J1 Jumper settings:
a: minimum field strength
b: maximum field strength
J2, J3 Jumper settings:
a: resistance load
b: capacitive load
N1, N2 N-MOS transistor with low parasitic capacitance
22 © ISO/IEC 2019 – All rights reserved
Annex F
(informative)
Program for evaluation of the spectrum
The following program written in C language gives an example for the calculation of the magnitude of
the spectrum from the VICC.
/***************************************************************/
/*** This program calculates the fourier coefficients ***/
/*** of load modulated voltage of a VICC according ***/
/*** the ISO/IEC 10373-7 Test methods. ***/
/*** The coefficient are calculated for the frequency ***/
/*** Carrier: 13.5600 MHz ***/
/*** Subcarrier: 423.75 kHz / 484.286 kHz ***/
/*** see #define N_FSUB: 32 28 ***/
/*** Upper sideband: 13.9838 MHz / 14.0443 MHz ***/
/*** Lower sideband: 13.1363 MHz / 13.0757 MHz ***/
/***************************************************************/
/*** Input: ***/
/*** File in CSV Format containing a table of two ***/
/*** columns (time and test VCD output voltage vd, clause 7)***/
/*** ***/
/*** data format of input-file: ***/
/*** ------------------------- ***/
/*** - one data-point per line: ***/
/*** {time[seconds], sense-coil-voltage[volts]) ***/
/*** - contents in ASCII, no headers ***/
/*** - data-points shall be equidistant time ***/
/*** - minimum sampling rate: 100 MSamples/second ***/
/*** - modulation waveform centred ***/
/*** (max. tolerance: half of subcarrier cycle) ***/
/*** ***/
/*** "screen-shot of centred modulation-waveform ***/
/*** with 8 subcarrier cycles": ***/
/***
...
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