Optics and photonics — Test methods for telescopic systems — Part 9: Test methods for field curvature

This document specifies the test method for the determination of the deviation from a flat image surface, i.e. the sagittal and tangential field curvature of telescopic systems and observational telescopic instruments.

Optique et instruments d'optique — Méthodes d'essai pour systèmes télescopiques — Partie 9: Méthodes d'essai pour la courbure de champ

General Information

Status
Published
Publication Date
17-Sep-2019
Current Stage
6060 - International Standard published
Start Date
18-Sep-2019
Due Date
11-Jan-2021
Completion Date
18-Sep-2019
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ISO 14490-9:2019 - Optics and photonics -- Test methods for telescopic systems
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INTERNATIONAL ISO
STANDARD 14490-9
First edition
2019-09
Optics and photonics — Test methods
for telescopic systems —
Part 9:
Test methods for field curvature
Reference number
ISO 14490-9:2019(E)
©
ISO 2019

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ISO 14490-9:2019(E)

COPYRIGHT PROTECTED DOCUMENT
© ISO 2019
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
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Published in Switzerland
ii © ISO 2019 – All rights reserved

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ISO 14490-9:2019(E)

Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Requirements . 1
4.1 General . 1
4.2 Test arrangement . 2
4.3 Preparation and carrying out of measurements . 3
4.4 Determination of results . 4
4.5 Test report . 4
Bibliography . 5
© ISO 2019 – All rights reserved iii

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ISO 14490-9:2019(E)

Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
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electrotechnical standardization.
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described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
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.org/iso/foreword .html.
This document was prepared by Technical Committee ISO/TC 172, Optics and photonics, Subcommittee
SC 4, Telescopic systems.
A list of all parts in the ISO 14490 series can be found on the ISO website.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www .iso .org/members .html.
iv © ISO 2019 – All rights reserved

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ISO 14490-9:2019(E)

Introduction
As mentioned in ISO 14490-7, there are several characteristics which determine image quality, besides
the limit of resolution. One unmentioned characteristic there is field curvature which can be noted
by the user as a field dependent defocus, which however could be refocused using the test specimen’s
focusing facility.
The intermediate image surface of a telescopic system (except Galilean systems) usually exhibits a
curvature instead of being a plane surface, depending on the optical characteristics of the objective
lens system. In addition, the surface can be split into two separate surfaces, the sagittal and tangential
image surfaces.
This surface, in turn, is being imaged by the eyepiece onto a virtual image surface (looked at by the user)
which also can be split into two separate surfaces. Due to the optical characteristics of the eyepiece,
the slope of the curvature of these surfaces might be different from those of the intermediate image
surfaces.
© ISO 2019 – All rights reserved v

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INTERNATIONAL STANDARD ISO 14490-9:2019(E)
Optics and photonics — Test methods for telescopic
systems —
Part 9:
Test methods for field curvature
1 Scope
This document specifies the test method for the determination of the deviation from a flat image
surface, i.e. the sagittal and tangential field curvature of telescopic systems and observational telescopic
instruments.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments) applies.
ISO 14132-1, Optics and photonics — Vocabulary for telescopic systems — Part 1: General terms and
alphabetical indexes of terms in ISO 14132
ISO 14490-1:2005, Optics and optical instruments — Test methods for telescopic systems — Part 1: Test
methods for basic characteristics
3 Terms and definitions
For the purposes of this document, the terms and definitions defined in ISO 14132-1 and the
following apply.
ISO and IEC maintain terminological databases for use in standardization at the following address:
— ISO Online browsing platform: available at https: //www .iso .org/obp
— IEC Electro
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