ISO/FDIS 20579-1
(Main)Surface chemical analysis — Sample handling, preparation and mounting — Part 1: Documenting and reporting the handling of specimens prior to analysis
Surface chemical analysis — Sample handling, preparation and mounting — Part 1: Documenting and reporting the handling of specimens prior to analysis
This document identifies information to be collected and reported to an analyst by a user of surface analysis services regarding the selection and preparation of samples presented for surface analysis. Such information is required to ensure that the sample has been selected, processed, handled and stored in a manner consistent with the analysis objective, to insure the reliability and reproducibility of the analyses. This information should also appear, as appropriate to the analyses and planned data use, in a data record books, datasheets, certificates of analysis, reports or other publications. This information should be in addition to other details associated with to specimens to be analyzed, including synthesis information, processing history and other characterization that should become part of the data record (sometimes identified as provenance information) regarding the source of the material and changes that have taken place since it was originated. This document also includes informative annexes as an aid in understanding the special sample handling requirements of surface chemical analysis techniques, particularly: Auger electron spectroscopy (AES), Secondary ion mass spectrometry (SIMS), and X-ray photoelectron spectroscopy (XPS or ESCA). The information presented may also be applicable for other analytical techniques, such as TXRF, that are sensitive to surface composition. This document does not define the nature of instrumentation or operating procedures needed to ensure that the analytical measurements described have been appropriately conducted.
Analyse chimique des surfaces — Manipulation, préparation et montage des échantillons — Partie 1: Documentation et notification des données de manipulation des échantillons avant analyse
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FINAL DRAFT
International
Standard
ISO/TC 201/SC 2
Surface chemical analysis —
Secretariat: ANSI
Sample handling, preparation and
Voting begins on:
mounting —
2024-06-20
Part 1:
Voting terminates on:
2024-08-15
Documenting and reporting the
handling of specimens prior to
analysis
RECIPIENTS OF THIS DRAFT ARE INVITED TO SUBMIT,
WITH THEIR COMMENTS, NOTIFICATION OF ANY
RELEVANT PATENT RIGHTS OF WHICH THEY ARE AWARE
AND TO PROVIDE SUPPOR TING DOCUMENTATION.
IN ADDITION TO THEIR EVALUATION AS
BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO-
LOGICAL, COMMERCIAL AND USER PURPOSES, DRAFT
INTERNATIONAL STANDARDS MAY ON OCCASION HAVE
TO BE CONSIDERED IN THE LIGHT OF THEIR POTENTIAL
TO BECOME STAN DARDS TO WHICH REFERENCE MAY BE
MADE IN NATIONAL REGULATIONS.
Reference number
FINAL DRAFT
International
Standard
ISO/TC 201/SC 2
Surface chemical analysis —
Secretariat: ANSI
Sample handling, preparation and
Voting begins on:
mounting —
Part 1:
Voting terminates on:
Documenting and reporting the
handling of specimens prior to
analysis
RECIPIENTS OF THIS DRAFT ARE INVITED TO SUBMIT,
WITH THEIR COMMENTS, NOTIFICATION OF ANY
RELEVANT PATENT RIGHTS OF WHICH THEY ARE AWARE
AND TO PROVIDE SUPPOR TING DOCUMENTATION.
© ISO 2024
IN ADDITION TO THEIR EVALUATION AS
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO-
LOGICAL, COMMERCIAL AND USER PURPOSES, DRAFT
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on
INTERNATIONAL STANDARDS MAY ON OCCASION HAVE
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
TO BE CONSIDERED IN THE LIGHT OF THEIR POTENTIAL
or ISO’s member body in the country of the requester.
TO BECOME STAN DARDS TO WHICH REFERENCE MAY BE
MADE IN NATIONAL REGULATIONS.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland Reference number
ii
Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Symbols and abbreviated terms. 2
5 Information to be documented and accompany a sample for analysis . 2
5.1 General sample handling requirements .2
5.2 Nature of sample, analysis objectives and any special requirements .3
5.3 Sample identification and provenance information .3
Annex A (normative) Overview of issues and methods related to sample handling . 4
Annex B (normative) Critical information about sample handling and order of analyses to
minimize contamination . 7
Annex C (normative) Sample Storage and Transport . 10
Bibliography .13
iii
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out through
ISO technical committees. Each member body interested in a subject for which a technical committee
has been established has the right to be represented on that committee. International organizations,
governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely
with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are described
in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the different types
of ISO document should be noted. This document was drafted in accordance with the editorial rules of the
ISO/IEC Directives, Part 2 (see www.iso.org/directives).
ISO draws attention to the possibility that the implementation of this document may involve the use of (a)
patent(s). ISO takes no position concerning the evidence, validity or applicability of any claimed patent
rights in respect thereof. As of the date of publication of this document, ISO had not received notice of (a)
patent(s) which may be required to implement this document. However, implementers are cautioned that
this may not represent the latest information, which may be obtained from the patent database available at
www.iso.org/patents. ISO shall not be held responsible for identifying any or all such patent rights.
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and expressions
related to conformity assessment, as well as information about ISO's adherence to the World Trade
Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www.iso.org/iso/foreword.html.
This document was prepared by Technical Committee ISO/TC 201, Surface Chemical Analysis, Subcommittee
SC 2, Sample handling.
This first edition of ISO 20579-1 cancels and replaces ISO 18117:2009.
A list of all parts in the ISO 20579 series can be found on the ISO website.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www.iso.org/members.html.
iv
Introduction
0.1 Introduction to the ISO 20579 series
The handling and preparation of samples for surface analysis can physically or chemically alter the surface.
Therefore, reliable surface analysis depends upon knowing the analysis objectives and knowledge of the
sample history including aspects of how the sample has been prepared, stored, processed, and handled
prior to and during analysis. The ISO 20579 series describes the information that needs to be collected and
included as part of the sample history (sample provenance information). Both ISO 20579-1 and ISO 20579-2
describe information to be recorded regarding sample handling, and storage. This document describes
information needed regarding sample selection, handling, and preparation when requesting surface
analysis. ISO 20579-2 provides information about sample handling, preparation, mounting and processing
to be reported by an analyst. ISO 20579-3 and ISO 20579-4 focus on specific handling and reporting needs
associated with nanomaterials (ISO 20579-4) and biomaterials (ISO 20579-3). Each part of this series
can be used independently of the other parts, although the general reporting requirements described in
this document (ISO 20579-1) and in ISO 20579-2 are applicable to a wide range of materials and are not
reproduced in ISO 20579-3 and ISO 20579-4.
Although primarily prepared for the surface-analysis techniques of Auger-electron spectroscopy (AES),
X-ray photoelectron spectroscopy (XPS), and secondary-ion mass spectrometry (SIMS), the methods
described in this document are also applicable to many other surface-sensitive analytical techniques such
as ion-scattering spectrometry, scanning probe microscopy, low-energy electron diffraction and electron
energy-loss spectroscopy, where specimen handling can influence surface-sensitive measurements. AES,
XPS, and SIMS are sensitive to surface layers that are typically a few nanometers thick. Such thin layers
can be subject to severe perturbations caused by specimen handling or surface treatments that can be
necessary prior to introduction into the analytical chamber. Proper handling and preparation of specimens
is particularly critical for dependable analysis. Improper handling of specimens can result in alteration of
[1][2]
the surface composition and unreliable data .
0.2 Introduction to this document (ISO 20579-1)
This document is intended for the specimen owner or someone requesting surface analytical services.
It describes the minimum information regarding the analysis objectives and sample preparation that an
analyst needs to know to determine if and how the desired information can be obtained. This information
becomes part of sample provenance record to help validate the reliability and usefulness of data obtained
[3]
from surface-analysis methods .
Surface analysis methods measure the outer atomic layers of a specimen surface which can be inadvertently
altered by inappropriate handling or preparation. Therefore, the degree of care and cleanliness required
by surface-sensitive analytical techniques is usually much greater than for many other analysis methods.
Appropriate careful sample selection, preparation and storage are essential for reliable surface analysis and
the documentation and reporting of this information is critical to the ability to assess the validity of surface
analysis information.
Although the categories of needed reporting are similar for all specimens, the details of the required sample
handling can vary depending on the nature of the sample and analysis objectives. Annexes to this document
and references therein provide background information useful to assist in identification of the necessary
sample preparation, handling, storage, and transport requirements that maximize the ability for obtaining
the desired information.
Annex A identifies three categories of analysis objectives and provides an overview of the challenges
associated with sample preparation for surface analysis in the context of each desired objective. Included
is a table summarizing relevant sample handling methods and types of specimen containers needed for the
three types of analysis objectives and is intended to help those requiring surface analysis. Annex B discusses
common sources of contamination and issues along with methods to minimize contamination related to
sample handling. Annex C discusses topics related to sample storage and transportation.
v
FINAL DRAFT International Standard ISO/FDIS 20579-1:2024(en)
Surface chemical analysis — Sample handling, preparation
and mounting —
Part 1:
Documenting and reporting the handling of specimens prior
to analysis
1 Scope
This document identifies the information needed to ensure that a sample has been selected, processed,
handled, and stored in a manner consistent with the analysis objectives, and to ensure the reliability and
reproducibility of the surface analyses. Such information is also an important component of sample data record
books, datasheets, certificates of analysis, reports, and other publications. This information is in addition to
other details associated with the specimens to be analysed, such as source/synthesis information, processing
history, and other characterizations that naturally become part of the data record (sometimes referred to as
provenance information) regarding the origin of the sample and any changes to its original form.
This document also includes normative annexes as an aid to understanding the special sample handling
techniques and storage requirements of surface chemical analysis techniques, particularly: Auger electron
spectroscopy (AES), secondary ion mass spectrometry (SIMS), and X-ray photoelectron spectroscopy (XPS
or ESCA). The information presented can also be applicable for other analytical techniques, such as total
reflection X-ray fluorescence spectroscopy (TXRF), that is sensitive to surface composition, and scanning
probe microscopy (SPM), that is sensitive to surface morphology.
This document does not define the nature of instrumentation or operating procedures needed to ensure
that the analytical measurements described have been appropriately conducted.
2 Normative references
The following documents are referred to in the text in such a way that some of their content constitutes
requirements of this document. For dated references, only the edition cited applies. For undated references,
the latest edition of the referenced document (including any amendments) applies.
ISO 18115-1, Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy
ISO 18115-2, Surface chemical anal
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ISO/TC 201/SC 2
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Secretariat: ANSI
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Date: 2024-05-01
Surface Chemical Analysis chemical analysis — Sample handling,
preparation and mounting – —
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Part 1:
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Documenting and reporting the handling of specimens prior to
Formatted: Regular
analysis
FDIS stage
ISO/DIS 20579-1:2023(E)
Formatted: Default Paragraph Font
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this
publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical,
including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can
be requested from either ISO at the address below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: + 41 22 749 01 11
Formatted: French (Switzerland)
EmailE-mail: copyright@iso.org
Formatted: French (Switzerland)
Website: www.iso.orgwww.iso.org
Formatted: French (Switzerland)
Published in Switzerland
ii © ISO 2023 – All rights reserved
ISO/DIS 20579-1:2023(E)
Contents
Foreword . v
Introduction . vi
1 Normative references . 1
2 Terms and definitions . 1
3 Symbols and abbreviated terms . 1
4 Information to be documented and provided to an analyst prior to undertaking
surface analysis . 2
4.1 General sample handling requirements . 2
4.2 Nature of sample, analysis objective and any special requirements . 2
4.3 Sample I.D. and provenance information regarding the selection, history, handling,
storage, and processing of specimens prior to submission for surface analysis . 2
Annex A (normative) Overview of issues and methods related to sample handling and table
identifying typical handling requirements. . 4
A.1 Analysis objectives . 4
A.1.1 Multiple types of analysis objectives and related sample handling requirements . 4
A.1.1.1 Objective Type 1 . 4
A.1.1.2 Objective Type 2 . 5
A.1.1.3 Objective Type 3 . 5
A.2 Overview of relationships between objectives and sample handling and storage
requirements . 6
Annex B (normative ) Critical information about sample handling and order of analyses to
minimize contamination . 8
B.1 Potential Sources of contamination during handling . 8
B.2 Suggested handling procedures to minimize contamination . 8
B.2.1 Important generic sample handling recommendations: . 8
B.3 Considerations when multiple analysis techniques are required . 9
Annex C (normative) Sample Storage and Transport . 11
C.1 Storage requirements and needs . 11
C.2 Storage time, temperature and humidity . 11
C.3 Containers . 11
C.3.1 Avoid contamination by the container . 11
C.3.2 Types of containers and minimizing contact/contamination during storage . 12
C.4 Specimen transfer . 12
C.4.1 Specially designed chambers: wafer carriers, inert transfer boxes, etc. . 12
C.4.2 Protective Coatings . 13
Bibliography . 16
ISO/DIS 20579-1:2023(E)
5 Bibliography
.......................................................................................................................................................... 16Fore
word . v
Introduction . vii
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Symbols and abbreviated terms . 2
5 Information to be documented and accompany a sample for analysis . 2
5.1 General sample handling requirements . 2
5.2 Nature of sample, analysis objectives and any special requirements . 3
5.3 Sample identification and provenance information . 3
Annex A (normative) Overview of issues and methods related to sample handling . 5
A.1 Analysis objectives . 5
A.1.1 Types of analysis objectives and related sample handling requirements . 5
A.1.2 Objective type 1 . 5
A.1.3 Objective type 2 . 6
A.1.4 Objective type 3 . 6
A.2 Overview of relationships between objectives and sample handling and storage
requirements . 1
Annex B (normative) Critical information about sample handling and order of analyses to
minimize contamination . 3
B.1 Potential Sources of contamination during handling . 3
B.2 Suggested handling procedures to minimize contamination . 3
B.2.1 Generic and special sample handling: . 3
B.2.2 Important generic sample handling recommendations: . 3
B.2.3 Specific sample handling requirements . 4
B.3 Considerations when multiple analysis techniques are required . 4
Annex C (normative) Sample Storage and Transport . 6
C.1 Storage requirements and needs . 6
C.2 Storage time, temperature and humidity . 6
C.3 Containers . 6
C.3.1 Avoid contamination by the container . 6
C.3.2 Container types and minimizing contact/contamination during storage . 6
C.4 Specimen transfer . 7
C.4.1 Complexities of sample transport . 7
C.4.2 Specially designed chambers: wafer carriers, inert transfer boxes, etc. . 7
C.4.3 Protective Coatings . 8
Bibliography . 9
Formatted: Normal, Adjust space between Latin and
Asian text, Adjust space between Asian text and
numbers
iv © ISO 2023 – All rights reserved
ISO/DIS 20579-1:2023(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO
collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO document should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).
Formatted: English (United Kingdom)
ISO draws attention to the possibility that the implementation of this document may involve the use of
(a) patent(s). ISO takes no position concerning the evidence, validity or applicability of any claimed
patent rights in respect thereof. As of the date of publication of this document, ISO had not received notice
of (a) patent(s) which may be required to implement this document. However, implementers are
cautioned that this may not represent the latest information, which may be obtained from the patent
database available at www.iso.org/patents.www.iso.org/patents. ISO shall not be held responsible for
identifying any or all such patent rights.
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO's adherence to the World
Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see
www.iso.org/iso/foreword.htmlwww.iso.org/iso/foreword.html.
Formatted: English (United Kingdom)
This document was prepared by Technical Committee ISO/TC 201, Surface Chemical Analysis. This
Formatted: Adjust space between Latin and Asian text,
document is Part 1 of the ISO 20579 series which replaces ISO 18117:2009 Surface Chemical Analysis — Adjust space between Asian text and numbers
Handling of Specimens Prior to Analysis., Subcommittee SC 2, Sample handling.
The main changes are as follows:
ISO 18117 provided guidance on the handling of and the containers for specimens submitted for surface
chemical analysis. It was intended as information for the user of surface analysis services as an aid in
understanding the special sample handling requirements for surface analytical techniques. This
information is now incorporated into part 1 of a series of four documents related to sample handling for
surface analysis. Because of the importance of recording and reporting aspects of sample handling, ISO
20579-1, which replaces ISO 18117, now focuses on reporting requirements for handling of s
...
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