ISO/IEC 14443-2:2010/Amd 1:2011

Identification cards — Contactless integrated circuit cards — Proximity cards — Part 2: Radio frequency power and signal interface — Amendment 1: Limits of electromagnetic disturbance levels parasitically generated by the PICC

Cartes d'identification — Cartes à circuit(s) intégré(s) sans contact — Cartes de proximité — Partie 2: Interface radiofréquence et des signaux de communication — Amendement 1: Limites des niveaux de perturbations électromagnétiques générées de façon parasite par la PICC

General Information

• Status: Withdrawn
• Publication Date: 13-Oct-2011
• Withdrawal Date: 13-Oct-2011
• ICS: 35.240.15 - Identification cards. Chip cards. Biometrics
• Technical Committee: ISO/IEC JTC 1/SC 17 - Cards and security devices for personal identification
• Drafting Committee: ISO/IEC JTC 1/SC 17/WG 8 - Integrated circuit cards without contacts
• Current Stage: 9599 - Withdrawal of International Standard
• Completion Date: 21-Jul-2016

Relations

• Amends: ISO/IEC 14443-2:2010 - Identification cards — Contactless integrated circuit cards — Proximity cards — Part 2: Radio frequency power and signal interface
• Effective Date: 21-Aug-2021
• Revised: ISO/IEC 14443-2:2016 - Identification cards — Contactless integrated circuit cards — Proximity cards — Part 2: Radio frequency power and signal interface
• Effective Date: 06-Jun-2022

Standards Content (Sample)

INTERNATIONAL ISO/IEC
STANDARD 14443-2
Second edition
2010-09-01
AMENDMENT 1
2011-10-15

Identification cards — Contactless
integrated circuit cards — Proximity
cards —
Part 2:
Radio frequency power and signal
interface
AMENDMENT 1: Limits of electromagnetic
disturbance levels parasitically generated by
the PICC
Cartes d'identification — Cartes à circuit(s) intégré(s) sans contact —
Cartes de proximité —
Partie 2: Interface radiofréquence et des signaux de communication
AMENDEMENT 1: Limites des niveaux de perturbations
électromagnétiques générées de façon parasite par la PICC




Reference number
ISO/IEC 14443-2:2010/Amd.1:2011(E)
©
ISO/IEC 2011

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ISO/IEC 14443-2:2010/Amd.1:2011(E)

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ii © ISO/IEC 2011 – All rights reserved

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ISO/IEC 14443-2:2010/Amd.1:2011(E)
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are members of
ISO or IEC participate in the development of International Standards through technical committees
established by the respective organization to deal with particular fields of technical activity. ISO and IEC
technical committees collaborate in fields of mutual interest. Other international organizations, governmental
and non-governmental, in liaison with ISO and IEC, also take part in the work. In the field of information
technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of the joint technical committee is to prepare International Standards. Draft International
Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication as
an International Standard requires approval by at least 75 % of the national bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights.
Amendment 1 to ISO/IEC 14443-2:2010 was prepared by Joint Technical Committee ISO/IE
...