ISO/IEC 10373-6:2011/FDAmd 5

Identification cards — Test methods — Part 6: Proximity cards — Amendment 5: Bit rates of 3fc/4, fc, 3fc/2 and 2fc from PCD to PICC

Cartes d'identification — Méthodes d'essai — Partie 6: Cartes de proximité — Amendement 5: Débits binaires de 3fc/4, fc, 3fc/2 et 2fc de PCD à PICC

General Information

• Status: Withdrawn
• ICS: 35.240.15 - Identification cards. Chip cards. Biometrics
• Technical Committee: ISO/IEC JTC 1/SC 17 - Cards and security devices for personal identification
• Drafting Committee: ISO/IEC JTC 1/SC 17/WG 8 - Integrated circuit cards without contacts
• Current Stage: 5098 - Project deleted
• Completion Date: 10-Mar-2014

Relations

• Replaced By: ISO/IEC 10373-6:2016 - Identification cards — Test methods — Part 6: Proximity cards
• Effective Date: 21-Nov-2015
• Amends: ISO/IEC 10373-6:2011 - Identification cards — Test methods — Part 6: Proximity cards
• Effective Date: 09-May-2020

Standards Content (Sample)

FINAL ISO/IEC
AMENDMENT
DRAFT 10373-6:2011
FDAM 5
ISO/IEC JTC 1
Identification cards — Test methods —
Secretariat: ANSI
Part 6:
Voting begins on:
2013-10-02
Proximity cards
Voting terminates on:
AMENDMENT 5: Bit rates of 3fc/4, fc, 3fc/2
2013-12-02
and 2fc from PCD to PICC
Cartes d'identification — Méthodes d'essai —
Partie 6: Cartes de proximité
AMENDEMENT 5: Débits binaires de 3fc/4, fc, 3fc/2 et 2fc de PCD à
PICC




RECIPIENTS OF THIS DRAFT ARE INVITED TO
SUBMIT, WITH THEIR COMMENTS, NOTIFICATION
OF ANY RELEVANT PATENT RIGHTS OF WHICH
THEY ARE AWARE AND TO PROVIDE SUPPORT-
ING DOCUMENTATION.
IN ADDITION TO THEIR EVALUATION AS
Reference number
BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO-
ISO/IEC 10373-6:2011/FDAM 5:2013(E)
LOGICAL, COMMERCIAL AND USER PURPOSES,
DRAFT INTERNATIONAL STANDARDS MAY ON
OCCASION HAVE TO BE CONSIDERED IN THE
LIGHT OF THEIR POTENTIAL TO BECOME STAN-
DARDS TO WHICH REFERENCE MAY BE MADE IN
©
ISO/IEC 2013
NATIONAL REGULATIONS.

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ISO/IEC 10373-6:2011/FDAM 5:2013(E)

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ii © ISO/IEC 2013 – All rights reserved

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ISO/IEC 10373-6:2011/FDAM 5:2013(E)
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are members of
ISO or IEC participate in the development of International Standards through technical committees
established by the respective organization to deal with particular fields of technical activity. ISO and IEC
technical committees collaborate in fields of mutual interest. Other international organizations, governmental
and non-governmental, in liaison with ISO and IEC, also take part in the work. In the field of information
technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of the joint technical committee is to prepare International Standards. Draft International
Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication as
an International Standard requires approval by at least 75 % of the national bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights.
Amendment 5 to ISO/IEC 10373-6:2011 was prepared by Joint Technical Committee ISO/IEC JTC 1,
Information technology, Subcommittee SC 17, Cards and personal identification.






© ISO/IEC 2013 – All rights reserved iii

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FINAL DRAFT AMENDMENT ISO/IEC 10373-6:2011/FDAM 5:2013(E)

Identification cards — Test methods — Part 6: Proximity cards
Amendment 5: Bit rates of 3fc/4, fc, 3fc/2 and 2fc from PCD to
PICC

Page 22
Add new subclause
"
7.3 Test methods for bit rates of 3fc/4, fc, 3fc/2 and 2fc from PCD to PICC
See Annex J.
"

After Annex I
Add following new annex:

© ISO/IEC 2013 – All rights reserved 1

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ISO/IEC 10373-6:2011/FDAM 5:2013(E)
Annex J
(normative)

Test methods for bit rates of 3fc/4, fc, 3fc/2 and 2fc from PCD to PICC
J.1 Overview
This annex specifies the test methods for bit rates of 3fc/4, fc, 3fc/2 and 2fc from PCD to PICC.
NOTE Future revisions of ISO/IEC 14443 and ISO/IEC 10373-6 may specify new NPV tolerance and phase noise
values with corresponding test methods.
J.2 Test of ISO/IEC 14443-2 parameters
J.2.1 PCD Tests
All the tests described below will be done in the operating volume as defined by the PCD manufacturer.
J.2.1.1 PCD phase range and waveform characteristics
J.2.1.1.1 Purpose
This test is used to determine the PR as well as the normalized differential phase noise and inter-symbol
interference parameters, ISI and ISI , as defined in ISO/IEC 14443-2:2010/Amd 5.
m d
J.2.1.1.2 Test procedure
Apply the procedure defined in 7.1.4.2 with the following adaptations:
 After the activation of a bit rate of 3fc/4, fc, 3fc/2 or 2fc, the PCD shall transmit an
I(0) (TEST
...