Optical amplifiers - Test methods -- Part 5-1: Reflectance parameters - Optical spectrum analyzer method

This part of IEC 61290 applies to all commercially available optical amplifiers (OAs) and optically amplified sub-systems. It applies to OAs using optically pumped fibres (OFAs based on either rare-earth doped fibres or on the Raman effect), semiconductor OAs (SOAs), and waveguides (POWAs).

Lichtwellenleiter-Verstärker - Prüfverfahren - Teil 5-1: Reflexionsparameter - Verfahren mit optischem Spektralanalysator

Amplificateurs optiques - Méthodes d'essais -- Partie 5-1: Paramètres de réflectance - Méthode d'analyseur de spectre optique

La présente partie de la CEI 61290 s'applique à tous les amplificateurs optiques (OA, Optical Amplifiers en anglais) et sous-systèmes à amplification optique, disponibles sur le marché. Elle s'applique aux OA utilisant des fibres pompées optiquement (AFO basés sur des fibres dopées aux terres rares ou sur l'effet Raman), des semi-conducteurs (SOA), et des guides d'ondes (POWA).

Metode preskušanja optičnega ojačevalnika – 5-1. del: Parametri odbojnosti – Metoda analize optičnega spektra (IEC 61290-5-1:2006)

General Information

Status
Published
Publication Date
30-Sep-2006
Withdrawal Date
30-Sep-2006
Technical Committee
iTEL - Communication cables
Current Stage
6060 - National Implementation/Publication (Adopted Project)
Start Date
01-Oct-2006
Due Date
01-Oct-2006
Completion Date
01-Oct-2006

Relations

Effective Date
01-Nov-2007
Effective Date
13-May-2010

Overview

EN 61290-5-1:2006 (IEC 61290-5-1:2006) defines a standardized optical spectrum analyzer (OSA) method for measuring reflectance parameters of optical amplifiers. The standard applies to all commercially available optical amplifiers (OAs) and optically amplified sub-systems - including optically pumped fibre amplifiers (OFAs), semiconductor optical amplifiers (SOAs) and planar waveguide OAs (POWAs). Its objective is to establish uniform requirements for accurate, repeatable measurement of maximum input reflectance, minimum input reflectance, and output reflectance using an OSA-based test setup.

Key topics and technical requirements

  • Scope and exclusions
    • Applies to OFAs (rare‑earth doped and Raman), SOAs and POWAs.
    • Does not apply to distributed fibre Raman amplifiers (evaluation under consideration).
  • Measured parameters
    • Maximum input reflectance, minimum input reflectance, and output reflectance as defined in IEC 61291‑1.
  • Required test apparatus and performance
    • Optical source: fixed or tunable; sufficient power to resolve reflectance down to around –50 to –60 dB; side‑mode suppression > 30 dB; integrated/connected isolator (> 40 dB).
    • Optical spectrum analyzer (OSA): spectral resolution ≤ 0.1 nm; linearity and spectral‑power accuracy within about ±1,5 dB and ±1 dB; polarization dependence ≤ ±0.1 dB; high dynamic range.
    • Optical coupler (3 dB, 2×2): insertion loss < 3.5 dB; directivity ≥ 60 dB; connector reflectance < –60 dB.
    • Optical power meter, isolator, variable optical attenuator: specified accuracy, isolation and reflectance limits to ensure measurement integrity.
    • Polarization‑dependent loss of passive components and tolerances are constrained (e.g., PDL variation better than 0.2 dB).
  • Procedure and calculations
    • Standard includes detailed setups (figures for input reflectance, insertion loss, OA input power), measurement procedures and calculation methods for reporting reflectance results.

Applications and users

  • Ensures consistent production test, type‑approval, R&D characterization, and quality assurance of optical amplifiers and amplified subsystems.
  • Primary users: manufacturers, component/test labs, systems integrators, telecommunications equipment vendors, and regulatory or standards compliance engineers.
  • Practical benefits: comparable reflectance data across vendors, better control of back‑reflections in amplified links, and improved system design for DWDM and long‑haul networks.

Related standards

  • Normative reference: IEC 61291‑1 (optical fibre amplifiers – generic specification).
  • Part of the IEC/EN 61290 family (other parts cover gain, noise figure, electrical spectrum analyzer methods, pump leakage and multi‑channel tests).

Keywords: EN 61290-5-1, IEC 61290-5-1, optical amplifiers, reflectance parameters, optical spectrum analyzer method, OFA, SOA, POWA, reflectance measurement.

Standard

SIST EN 61290-5-1:2006

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15 pages
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Frequently Asked Questions

SIST EN 61290-5-1:2007 is a standard published by the Slovenian Institute for Standardization (SIST). Its full title is "Optical amplifiers - Test methods -- Part 5-1: Reflectance parameters - Optical spectrum analyzer method". This standard covers: This part of IEC 61290 applies to all commercially available optical amplifiers (OAs) and optically amplified sub-systems. It applies to OAs using optically pumped fibres (OFAs based on either rare-earth doped fibres or on the Raman effect), semiconductor OAs (SOAs), and waveguides (POWAs).

This part of IEC 61290 applies to all commercially available optical amplifiers (OAs) and optically amplified sub-systems. It applies to OAs using optically pumped fibres (OFAs based on either rare-earth doped fibres or on the Raman effect), semiconductor OAs (SOAs), and waveguides (POWAs).

SIST EN 61290-5-1:2007 is classified under the following ICS (International Classification for Standards) categories: 33.180.30 - Optic amplifiers. The ICS classification helps identify the subject area and facilitates finding related standards.

SIST EN 61290-5-1:2007 has the following relationships with other standards: It is inter standard links to SIST EN 61290-5-1:2002, SIST EN 61290-5-1:2002. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.

You can purchase SIST EN 61290-5-1:2007 directly from iTeh Standards. The document is available in PDF format and is delivered instantly after payment. Add the standard to your cart and complete the secure checkout process. iTeh Standards is an authorized distributor of SIST standards.

Standards Content (Sample)


SLOVENSKI SIST EN 61290-5-1:2006

STANDARD
oct 2006
Optični ojačevalniki – Preskusne metode – 5-1. del: Parametri odbojnosti –
Metoda z analizatorjem optičnega spektra (IEC 61290-5-1:2006)
Optical amplifiers - Test methods – Part 5-1: Reflectance parameters – Optical
spectrum analyzer method (IEC 61290-5-1:2006)
ICS 33.180.30 Referenčna številka
SIST EN 61290-5-1:2006(en)
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

EUROPEAN STANDARD
EN 61290-5-1
NORME EUROPÉENNE
July 2006
EUROPÄISCHE NORM
ICS 33.180.30 Supersedes EN 61290-5-1:2000

English version
Optical amplifiers -
Test methods
Part 5-1: Reflectance parameters -
Optical spectrum analyzer method
(IEC 61290-5-1:2006)
Amplificateurs optiques -  Lichtwellenleiter-Verstärker -
Méthodes d'essais Prüfverfahren
Partie 5-1: Paramètres de réflectance - Teil 5-1: Reflexionsparameter -
Méthode d'analyseur de Verfahren mit optischem
spectre optique
Spektralanalysator
(CEI 61290-5-1:2006) (IEC 61290-5-1:2006)

This European Standard was approved by CENELEC on 2006-06-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, the Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels

© 2006 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61290-5-1:2006 E
Foreword
The text of document 86C/697/FDIS, future edition 2 of IEC 61290-5-1, prepared by SC 86C, Fibre optic
systems and active devices, of IEC TC 86, Fibre optics, was submitted to the IEC-CENELEC parallel vote
and was approved by CENELEC as EN 61290-5-1 on 2006-06-01.
This European Standard supersedes EN 61290-5-1:2000.
The applicability of the standard has been extended to all commercially available optical amplifiers - not
just optical fiber amplifiers.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2007-03-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2009-06-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61290-5-1:2006 was approved by CENELEC as a European
Standard without any modification.
__________
- 3 - EN 61290-5-1:2006
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year

1) 2)
IEC 61291-1 - Optical fibre amplifiers EN 61291-1 1998
Part 1: Generic specification
1)
Undated reference.
2)
Valid edition at date of issue.

NORME CEI
INTERNATIONALE
IEC
61290-5-1
INTERNATIONAL
Deuxième édition
STANDARD
Second edition
2006-05
Amplificateurs optiques –
Méthodes d'essais –
Partie 5-1:
Paramètres de réflectance –
Méthode d'analyseur de spectre optique

Optical amplifiers –
Test methods –
Part 5-1:
Reflectance parameters –
Optical spectrum analyzer method

 IEC 2006 Droits de reproduction réservés  Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in any
utilisée sous quelque forme que ce soit et par aucun procédé, form or by any means, electronic or mechanical, including
électronique ou mécanique, y compris la photocopie et les photocopying and microfilm, without permission in writing from
microfilms, sans l'accord écrit de l'éditeur. the publisher.
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Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch Web: www.iec.ch
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МеждународнаяЭлектротехническаяКомиссия
Pour prix, voir catalogue en vigueur
For price, see current catalogue

61290-5-1  IEC:2006 – 3 –
CONTENTS
FOREWORD.5
INTRODUCTION.11

1 Scope and object .13
2 Normative references.13
3 Acronyms and abbreviations .13
4 Apparatus.13
5 Test sample.17
6 Procedure.17
6.1 Maximum and minimum input reflectance.17
6.2 Output reflectance .21
7 Calculation .21
7.1 Maximum and minimum input reflectance.21
7.2 Output reflectance .21
8 Test results .21
8.1 Maximum and minimum input reflectance.21
8.2 Output reflectance .23

Figure 1 – Typical arrangement of the optical spectrum analyzer test apparatus for input

reflectance.15
Figure 2 – Set-up for insertion loss measurement of optical coupler and isolator .17
Figure 3 – Set-up for OA input power measurements .19

61290-5-1  IEC:2006 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
OPTICAL AMPLIFIERS –
TEST METHODS –
Part 5-1: Reflectance parameters –
Optical spectrum analyzer method

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61290-5-1 has been prepared by subcommittee 86C: Fibre optic
systems and active devices, of IEC technical committee 86: Fibre optics.
This second edition cancels and replaces the first edition published in 2000. It constitutes a
technical revision. In this edition the applicability has been extended to all commercially
available optical amplifiers—not just optical fiber amplifiers.

61290-5-1  IEC:2006 – 7 –
The text of this standard is based on the following documents:
FDIS Report on voting
86C/697/FDIS 86C/702/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
IEC 61290 consists of the following parts under the general title Optical amplifiers – Test
methods:
Part 1-1: Test methods for gain parameters – Optical spectrum analyzer
Part 1-2: Power and gain parameters – Electrical spectrum analyzer method
Part 1-3: Power and gain parameters – Optical power meter method
Part 2-1: Test methods for optical power parameters – Optical spectrum analyzer
Part 2-2: Test methods for optical power parameters – Electrical spectrum analyzer
Part 3: Test methods for noise figure parameters
Part 3-1: Noise figure parameters – Optical spectrum analyzer method
Part 3-2: Test methods for noise figure parameters – Electrical spectrum analyzer method
Part 5-1: Reflectance parameters – Optical spectrum analyser method
Part 5-2: Reflectance parameters – Electrical spectrum analyser method
Part 5-3: Test methods for reflectance parameters – Reflectance tolerance using an
electrical spectrum analyser
Part 6-1: Test methods for pump leakage parameters – Optical demultiplexer
Part 7-1: Test methods for out-of-band insertion losses – Filtered optical power meter
Part 10-1: Multi-channel parameters – Pulse method using an optical switch and optical
spectrum analyzer
Part 10-2: Multi-channel parameters – Pulse method using a gated optical spectrum
analyzer
Part 10-3: Multi-channel parameters – Probe methods
Part 11-
...

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기사 제목: SIST EN 61290-5-1:2007 - 광 증폭기 - 시험 방법 - 파트 5-1: 반사도 파라미터 - 광 스펙트럼 분석기 방법 기사 내용: 이 IEC 61290의 일부는 상용 광 증폭기(OA) 및 광 증폭 부분 시스템에 적용됩니다. 희귀 희토류 도핑된 광섬유나 라만 효과에 기반한 OA, 반도체 OA(SOA), 파장 도파(Waveguides)를 이용한 OA 등을 포함합니다. 이 표준의 목적은 IEC 61291-1에서 정의된 다음 OA 파라미터의 광 스펙트럼 분석기 시험 방법을 통한 정확하고 신뢰할 수 있는 측정을 위한 일관된 요구 사항을 설정하는 것입니다: a) 최대 입력 반사도; b) 최소 입력 반사도; c) 출력 반사도.

記事タイトル:SIST EN 61290-5-1:2007 - 光増幅器-試験方法-第5-1部:反射率パラメータ-光スペクトルアナライザ方法 記事内容:このIEC 61290の一部は、商業的に利用可能な光増幅器(OA)および光増幅サブシステムに適用されます。希土類ドープファイバーやラマン効果に基づくOA、半導体OA(SOA)、ウェーブガイド(POWA)を使用するOAなどが含まれます。この標準の目的は、IEC 61291-1で定義された以下のOAパラメーターの正確かつ信頼性のある測定に関する一貫した要件を確立することです:a)最大入力反射率、b)最小入力反射率、c)出力反射率。

The article discusses the SIST EN 61290-5-1:2007 standard, which provides test methods for optical amplifiers (OAs). It applies to various types of OAs, including those using optically pumped fibers, semiconductor OAs, and waveguides. The standard aims to establish consistent requirements for accurate and reliable measurement of parameters such as maximum and minimum input reflectance, as well as output reflectance.