SIST EN ISO/IEC 10373:1998
(Main)Identification cards - Test methods (ISO/IEC 10373:1993)
Identification cards - Test methods (ISO/IEC 10373:1993)
Migrated from Progress Sheet (TC Comment) (2000-07-10): Published IS available and sent down to procsedures for UAP. Delays in the ++ procedures department.
Identifikationskarten - Prüfverfahren (ISO/IEC 10373:1993)
Cartes d'identification - Méthodes d'essai (ISO/IEC 10373:1993)
Identification cards - Test methods (ISO/IEC 10373:1993)
General Information
Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN ISO/IEC 10373:1998
01-junij-1998
Identification cards - Test methods (ISO/IEC 10373:1993)
Identification cards - Test methods (ISO/IEC 10373:1993)
Identifikationskarten - Prüfverfahren (ISO/IEC 10373:1993)
Cartes d'identification - Méthodes d'essai (ISO/IEC 10373:1993)
Ta slovenski standard je istoveten z: EN ISO/IEC 10373:1995
ICS:
35.240.15 Identifikacijske kartice in Identification cards and
sorodne naprave related devices
SIST EN ISO/IEC 10373:1998 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN ISO/IEC 10373:1998
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SIST EN ISO/IEC 10373:1998
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SIST EN ISO/IEC 10373:1998
INTERNATIONAL
ISO/IEC
STANDARD
10373
First edition
1993-l 2-l 5
Identification cards - Test methods
Cartes d ‘identification - M6 thodes d ‘essai
Reference number
lSO/IEC 10373:1993(E)
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SIST EN ISO/IEC 10373:1998
ISO/IEC 10373:1993(E)
Contents
1
.......................................................
Scope
.............................................. 1
Yorrnative references
2
Definitions .
.................................. 2
Default test environment and conditioning
.................................................. 2
Test methods
2
................................................
51 . Card warpage
............................................ 4
52 . Dimensions of cards
5
...................................
5.3
Embossing relief height of character
5
...........................
54 . Height and surface profile of the magnetic stripe
9
................................
55 . Surface rowhness of the masletic strke
9
Wear test foFmagnetic stripe” . .*. .
56 .
10
...............................................
57 . Delamination
12
.........................................
5.8 Resistance to chemicals
12
59 . Amplitude mcasurcments .
............ 15
5.10 Card dimensional stability and warpage with temperature and humidity
15
.........................................
5.11Adhesionorblocking
16
............................................
5.12 Bending stiffness
.............................................. 17
5.13 Flammability
17
..........................................
5.14 Light transmittance
18
...................................
5.15 Flux transition spacing variation
19
.................................
Test methods of the integrated circuit card
19
.............................
6.1 Dynamic bending stress (bending properties)
.................................. 20
6.2 Dynamic torsionA stress (torsion)
21
...........................................
6.3 Location of contacts
22
..............................................
6.4 Static electricity
24
.............................................
6.5 Ultraviolet light
24
....................................................
6.6 X-rays
........................... 25
6.7 Electrical resistance and impedance of contacts
........................................ 25
6.8 Surface profile of contacts
27
........................................
6.9 Vibrations . :
29
.........................................
6.10 Electromagnetic fields
0 ISO/IEC 1993
All rights reserved. Unless otherwise specified, no part of this publication may be
reproduced or utilized in any form or by any means, electronic or mechanical, including
photocopying and microfilm, without permission in writing from the publisher.
ISO/IEC Copyright Office l Case postale 56 l CH-1211 Genkve 20 l Switzerkmd
Printed in Switzerland
ii
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SIST EN ISO/IEC 10373:1998
0 ISOIIEC
ISO/IEC 10373:1993(E)
Foreword
IS0 (the International Organization for Standardization) and IEC (the Interna-
tional Electrotechnical Commission) form the specialized system for worldwide
standardization. National bodies that are members of IS0 or IEC participate in
the development of International Standards through technical committees estab-
lished by the respective organization to deal with particular fields of technical
activity. IS0 and IEC technical committees collaborate in fields of mutual inter-
est. Other international organizations, governmental and non-governmental, in
liaison with IS0 and IEC, also take part in the work.
In the field of information technology, IS0 and IEC have established a joint
technical committee, ISO/IEC JTC 1. Draft International Standards adopted by
the joint technical committee are circulated to national bodies for voting. Publi-
cation as an International Standard requires approval by at least 75 % of the na-
tional bodies casting a vote.
International Standard ISO/IEC 10373 was prepared by Joint Technical Com-
mittee ISO/IEC JTC 1, Information technology, Subcommittee SC 17, Identifi-
cation cards and related devices.
. . .
111
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SIST EN ISO/IEC 10373:1998
~~
ISO/IEC 10373:1993 (E)
INTERNATIONAL STANDARD ?s”irEc
Identification cards - Test methods
I Scope
This International Standard describes test methods for the characteristics of identification cards in accordance
with IS0 7810, IS0 7811, IS0 7813, and IS0 7816.
NOTE 1 Criteria for acceptability do not form part of this International Standard but will be found in the International Standards
mentioned above.
NOTE 2 Test methods described in this International Standard are intended to be performed separately. A given card is not required
to pass through all the tests sequentially.
2 Normative references
The following standards contain provisions which, through reference in this text, constitute provisions of this
International Standard. At’ the time of publication, the editions indicated were valid. All standards are subject
to revision, and parties to agreements based on this Intemational Standard are encouraged ta investigate the
possibility of applying the most-recent editions of the standards listed below. Members of IEC and IS0
maintain registers of currently valid International StGdards.
IS0 5- 1: 1984, Density measurements - Part 1: Terms, symbols and notations.
Photography -
IS0 5-2:1991, Photography - Density measurements - Part 2: Geometric conditions for transmission
density.
IS0 5-3: 1984, Photography - Density measurements - Part 3: Spectral conditions.
IS0 10%E04: 1989, Textiles - Terts for coiow fastness - Part E04: Co/our fastness to perspiration.
Method of indicating surface texture.
IS0 1302: 1992, Technical drawings -
IS0 1817:1985, Rubber, vulcanized - Determination of the effect of liquids.
IS0 1880: 1979, Instruments for the measurement of surface roughness by the profile method - Contact
(stylus) instrunlerits of progressive proJ;ie transformation - Profile recoj -ding ins f rwnen ts.
IS0 9227: 1990, Cowosion tests in artificial atmospheres - Salt spray.
Physical characteristics.
IS0 7810: 1993, Identification cards -
IS0 78 1 l- 1: 1993, Identification cards - Recording technique - Part I: Embossing.
IS0 78 1 l-2: 1993, identification cards - Recording technique - Part 2: Magnetic stripe.
IS0 78 1 l-3: 1993, Identification cards - Recording technique - Part 3: Location of embossed characters on
ID- I cards.
1
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0 ISO/IEC
IS0 78 1 l-4: 1993, Identification cards - Recording technique - Part 4: Location of read-only magnetic tracks
- Track / and 2.
Recording technique - Part 5: Location of read-write magnetic track
IS0 78 1 l-5: 1993, Identification cards -
- Track 3.
IS0 7813:1993, Identification cards - Financial transaction cards.
IS0 78 16- 1: 1987, Identification cards - Integrated circuit(s) cards with contacts - Part I: Physical character-
istics.
IS0 78 16-2: 1988, Identification cards - integrated circuit(s) cards with contacts - Part 2: Dimensions and
location of the contacts.
IEC 5 12-2: 1976, Electromechanical components for electronic equipment; basic testing procedures and meas-
uring methods - Part 2: General examination, electrical continuity and contact resistance
tests, insulation tests and voltage stress tests.
3 Definitions
For the purpose of this International Standard, the following definition applies.
3.1 Test method: Method for testing characteristics of identification cards for the purpose of confirming
their compliance with International Standards.
4 Default test environment and conditioning
Unless otherwise specified, testing shall take place in an environment of temperature 23 “C + 3 “C (73 “F
+ 5 “F) and of relative humidity 40 % to 60 %. Identification cards shall be conditioned in this same envi-
-
ronment for a period of 24 h before testing.
5 Test methods
5.1 Card warpa-ge
The purpose of this test is to measure the extent of warpage in the test sample (see IS0 7810).
Card warpage is any deformation of card flatness.
51.1 Overall card warpage of unembossed and embossed cards
minimum accuracy of 0,Ol mm.
5.1.1.1 Apparatus: A profile projector or measuring device with a
5.1.1.2 Procedure: Place the card to be tested on the level rigid plate of the measuring apparatus. The card
edges shall rest on the plate (war-page of the card in convex fom to the plate).
Read the extent of warpage on the scale magnifier at the greatest point of displacement, measured from the
front surface of the card.
5.1.1.3 Result: The extent of war-page at the greatest point of displacement (see figure 1).
2
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0 ISO/IEC
ement grid
Measur
Figure 1 - Projector apparatus view of warpage measurement
51.2 Magnetic stripe area warpage for embossed and unembossed cards
5.1.2.1 Apparatus:
a) A level rigid plate whose surface roughness is not greater than 3,2 pm in accordance with IS0 1302. The
plate shall contain an aperture to allow access for a micrometer probe, see figure 2;
b) a micrometer accurate to within 2,5 pm with a probe whose contact area is a hemisphere with a diameter
in the range of 3 mm to 8 mm. The force exerted by the probe shall be f = 0,6 N t 0,3 N;
c) a means of applying a force F = 2,2 N (0.5 lbf) evenly distributed on the front face of the card opposite
the mapetic stripe area (see figure 2).
F+f
Reference ba
(Precision 23)
Figure 2 - Measuring arrangement
NOTE 3 The load of 2,2 N should be increased by an amount f to compensate for the micrometer force which is acting in the
opposite direction to that force.
5.1.2.2 Procedure: Position the magnetic
Place the sample card, front side up, on the level rigid plate.
stripe area to be measured over the aperture. Apply the force F (+f) directly over the magnetic stripe area
on the front side of the card. Wait 1 minute before making any measurements. Measure the card stripe area
for warpage at the nine positions along the stripe as shown in figure 3.
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ISO/IEC 10373:1993(E)
Not to scale
Dimensions in millimetres
Figure 3 - Measuring points on the card
5.1.2.3 Result: The maximum valtie of the measurements.
5.2 Dimensions of cards
The purpose of this test is to measure the height, width and thickness of an unembossed card test sample
(see IS0 7810).
5.2.1 Thickness of card measurements
5.2.3 .I Apparatus: A micrometer with a flat anvil and spindle whose diameter is within the range of 3 mm
to8mm.
5.2.1.2 Procedure: Use the micrometer to measure the thickness of the card at four points, one in each of
the four quadrants of the card (see figure 4 for the location of the quadrants). The measurements shall be
made at locations on the card that do not include signature panels, magnetic stripes or contacts (integrated
circuit/s cards), or any other raised area. Micrometer force shall be 3,5 N to 5,9 N.
Quadrant Quadrant
1 2
!
-.--pm.- .---I-.-.
.-
+
Quadrant Quadrant
3 4
I
Figure 4 - Assignment of quadrants
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5.2.1.3 Result: The maximum and the minimum value of the four measurements shall be compared with
the standardized value.
5.2.2 Height and width of card measurement
5.2.2.1 Apparatus: A level horizontal rigid surface of a roughness not greater than 3,2 pm according to
IS0 1302. A profile projector with a precision of 25 pm or adequate measuring device with the same accu-
racy. A load of 2,2 N + 0,2 N.
-
5.2.2.2 Procedure: The card to be tested shall be placed on the level horizontal rigid surface and flattened
under the 2,2 N + 0,2 N load. Use the profile projector to measure the height and width of the card.
-
5.2.2.3 Result: The measurement/s obtained shall be compared with those given in IS0 7810.
5.3 Embossing relief height of character
The purpose of this test is to obtain the overall and the relief height of imprinting character surfaces in the
test sample. (see IS0 781 l-l)
The embossing relief height of a character is the extent to which the card surface is raised by embossing
action.
5.3.1 Apparatus: See “52.1 Thickness of card measurements.”
53.2 Procedure: Use the micrometer with a force of 3,5 N to 5,9 N to measure the embossed height of any
one character.
5.3.3 Result: Overall height is the direct measurement obtained from the test. Relief height is calculated by
deducting the thickness of the card, as measured in the relevant quadrant (see figure 4) from the direct meas-
urement obtained of the overall height.
5.4 Height and surface profile of the magnetic stripe
The purpose of this test is to determine the degree of height and flatness of the magnetic stripe (see IS0
781 l-2). The location of the stripe is described in IS0 7811-4 and IS0 781 l-5.
The height of the magnetic stripe is defined in relation to the card and the stripe surface profile.
5.4.1 Apparatus: Profilometer (example figure 5).
5.4.2 Procedure: The height and the surface profile of the magnetic stripe as well as the surrounding card
surface shall be measured with a measuring recording instrument.
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r
Transducer
Measuring
- direction
I
I I
plate
Figure 5 - Measuring device for the height and the profde of the magnetic stripe
The card to be tested is held under a notched rigid metal plate as described in figure 6. The plate applies a
force of 2,2 N + 0,l N.
-
Not to state
Dimensions in millime tr es
3500
f’d
ljl I
I I ! I
I L , 1
6
8
1 I
.
8
E
k
E
I + ,
+ .
I
t
i
10.00 to IS,00
-
42.00
rC
-I
84.00
1-
Figure 6 - Card holder plate (contact area)
NOTE 4 Any rigid metal can be used. Plate thickness depends on material to achieve 2,2 N + 0,l N. Tolerance on all dimensions of
the plate : -+ 0,5 mm.
The profde is measured at a maximum speed of 1 mm/s (0.04 in/s) with a probe having a radius of 0,38 mm
to 2,54 mm (0.015 in to 0. I in) applied with a force of 0,5 mN to 6 mN.
Three measurements are to be taken on each specimen across the width of the stripe. The three locations V,
X and Y are defined as the distance of 15 mm + 2 mm (0.59 in +‘ - 0.08 in) from each end of the card and
location X the centreline of the card (see figure 7)-
6
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0 ISO/IEC
Not to scale
Dimensions in miilime tr es
0
;
X V
z Y
&
I
I
I
!
,
!
! .
1 4
I I
I I
4
Figure 7 - Magnetic stripe profile measurement location
The starting point for measurement along each line V,X,Y begins 1 mm min (0.039 in min) above the top
edge of the magnetic media and ends 1 mm min (0.039 in min) below the bottom edge of the magnetic
media.
When a measurement .hne crosses the integrated circuit contacts zone, an alternative line along the nearest
parallel line, Z will be used which does not cross the integrated circuit contacts zone (for the measurement of
“5.4.4 Height of the magnetic stripe”).
the height of the magnetic stripe see
Example profiles are shown in figures 8 and 9. The maximum vertical deviation (a) is defined as the distance
between the basic measurement line and the point on the magnetic media furthest away from, and at a right
angle to the basic measurement line.
Magnetic stripe area
b
b
a = maximum vertical deviation
Basic measurement line
Figure 8 - Concave stripe profile
Magnetic stripe area
b
=
maximum vertical deviation
a
= 1 mm (min)
b
w = minimum stripe width as
specified in ISO/IEC 7811-2
Basic measurement line
Figure 9 - Convex stripe profile
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5.4.3 Surface profile of the magnetic stripe
5.4.3.1 Procedure: For the measurements along V, X and Y line (see figure 7 , a frost basic measurement
line (see figures 8 and 9) is formed by connecting the top and bottom points that define the magnetic media
cdgcs (n-hichcl-cr shows the grcatcst vxtical dimension bctwccn the measuring line and the grcatcst peak or
valley on the magnetic media). The maximum vertical deviation (a) is defmed as the distance between the
basic measuring line and the point on the magnetic media furthest away from, and at a right angle, to the
basic measurement line.
5.4.3.2 Result: All three measurements shall comply with the profde criteria for card acceptance.
5.4.4 Height of the magnetic stripe
5.4.4.1 Procedure: For the three measurements along V, X and Y (or Z line if Y line crosses integrated
circuit contacts zone) as shown in figures 10 and 11, a basic measurement line is formed by connecting the
starting and ending points (see figures 10 and 11). The maximal vertical deviation (h) is defmed as the
distance between the basic measurement line and the point on the magnetic media furthest away from, and
at a right angle to, the basic measurement line.
Magnetic stripe area
b
b = lmm(min)
maximum vertical deviation as
h=
specified in ISO/IEC 781 l-2
Basic measurement line
Figure 10 - Concave stripe profle
Magnetic stripe area b
b = lmm(min)
b
d
L +-
h = maximum vertical deviation as
spccikd in ISO/IEC 781 l-2
Basic measurement tine
Figure 11 - Convex stripe profile
wnq$ with the critcri~ i&- card acceptance.
5.4.4.2 Result: All tllc tlmx I~;~suI‘cI~~~~ slul
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5.5 Surface roughness of the magnetic stripe
The purpose of this test is to determine the degree of roughness of the magnetic stripe (see IS0 78 1 l-2).
The surface roughness of the magnetic stripe is defmed as the surface topology or relative smoothness of the
magnetic stripe contact area.
5.5.1 Procedure: The surface roughness of the magnetic stripe shall be measured with a measuring recording
instrument as shown in figure 5. All test c;onditions spccificd in 5.3 apply csccpt:
-
probe stylus has a radius of 2,0 pm + 0,5 pm maximum;
-
-
a cutoff wavelength of 0,25 mm or 0,8 mm;
- longitudinal and transverse measurements are taken on the stripe.
5.5.2 Result: Centreline averages of the roughness R, of the magnetic stripe are obtained by measuring in
both longitudinal and transverse directions.
5.6 Wear test for magnetic stripe
The purpose of this test is to determine the signal amplitude of the magnetic stripe after controlled abrasion
(see IS0 781 l-2).
The dcftition of wear is the extent to which wear of the magnetic stripe on the card affects its performance.
5.6.1 Apparatus:
a) A metal dummy head whose hardness is between I10 I-IV - 130 HV (Vickers scale) or its equivalent in
Rockwell scale. The required dimensions are as shown in figure 12;
b) a rigid flat plate capable of holding the card still.
5.6.2 Procedure: Encode the sample card at 20 ftpmm (500 ftpi), read and note the signal amplitude.
Fasten the c;~-d, mn~notic stripe uppcrrnost, to the fl:lt plate so thnt the durnnq- head cm travcrsc the Icngth
of the stripe (or alternatively, the c&d can move under the head (see figure 13). Apply a force of 1,s LFJ
+ 0,2 N to the heid and allow the head to move back and forth at a speed of between 20 cm/set and
50 cm/set for 1 000 cycles, (1 cycle is equivalent to one forward and one backward movement). Read the
signal amplitude on the same apparatus and compare the result with the amplitude obtained at the beginning
of the test. Continue for a second sequence of one 1 000 cycles and compare the signal amplitude.
The position of the read and write heads must be completely contained within the area of the zone of wear
from the dummy head.
5.6.3 Result: LMeasuring of the signal amplitude shall be in accordarce with IS0 781 l-2.
Not to scale
Dimensions in miltime tres
5,00
7---
chamfer
Figure 12 - Dimensions of the contact area of the dummy head
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Magnetic stripe area
Force applied - I,50 N *O,ZON
I I
r 1 \
I
I
I
I
I
Dummy head
I
/
c
A
11 Widthofcard ]1
1 Distance of movement 1
Figure 13 - Dummy head and magnetic stripe
5.7 Delamination
The purpose of this test is to measure the amount of peel strength required to remove the protective over-
laminate from the printed card (see IS0 7810).
Delamination is defined as the separation of adjacent layers of material in the card.
57.1 Apparatus:
a) sharp cutting knife
b) strong adhesive tape or a suitable clamp
c) tensile tester
d) gripping device
5.7.2 Procedure:
a) Cut card into 25 mm (1 in) wide sections as shown in figure 14;
i\OTE 5 In the traditional PVC cards (constructed out of a white PVC core and clear PVC over-laminate) the overlay bond in areas
of the card that do not have ink coverage will have better bond strength than areas that have ink coverage. Choose a 25 mm (1 in)
wide section that has ink coverage. This is the “weak link” in the bond strength of overlay and core.
b) using a sharp knife, cut the overlay back from the core approximately 6 mm (0.25 in);
c) apply the clamp or adhesive tape to the peeled back edge of the overlay and core as shown in figure 15;
d) place prepared specimen in the tensile tester fixture as shown in figure 16. The card must be fixed on the
apparatus;
e) operate the tensile tester according to the manufacturers instructions (30 cmimin) to determine the peel
strength in newtons per centimetre (pounds per inch).
5.7.3 Result: Peel strength is recorded and compared with the standard values.
10
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Not to scale
Dimensions in mitlime tres
\
Section
Figure 14 - Card preparation
Not to scale
Dimensions in miltime tres
Apply clamp
Of
adhesive tap le
,te
bore
Figure 15 - Specimen preparation for peel tests
Gr ippef.
Figure 16 - Specimen mounted in tensile tester
11
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5.8 Resistance to chemicals
The purpose of this test is to determine any adverse effects of specified chemicals to the normal use of the
card in a test sample (see IS0 78 10, and IS0 78 1 l-2).
The resistance to chemicals is defined as the extent to which card magnetic performance and appearance is
affected by exposure to commonly encountered chemicals.
58.1 Procedure: A Jiffbrcnt cad is used for each tat. Immcdiatcly after rm~w-31 fi-c>ln tlx wlution, wLth
the card in distilled water and dry it with absorbent tissue.
Short term contamination:
for 1 min in one of the solutions listed below which are kept at a temper-
Sample cards shall be submerged
ature between 20” C and 25” C.
Kinds of solutions:
a) 5% salt water
b) 5% acetic acid water
c) 5% carbonated sodium water
d) aqueous solution containing 60% of ethyl alcohol
e) sugared water ( 10% solution)
f) Fuel B (according to IS0 1817)
g) ethylene glycol (50% solution)
Long term contamination:
a) salt mist
The sample card shall be tested vertically in a cabinet in accordance with IS0 9227.
Exposure to test conditions shall be for 24 h.
b) artificial perspiration
1) alkaline solution
2) acid solution
The sample card shall be subrrierged in each solution for 24 h.
Both test solutions shall be prepared in accordance with IS0 105E04.
5.8.2 Result: Mter visual examination the results are noted; the sample card shall be submitted to magnetic
and integrated circuit functional tests,
5.9 Amplitude measurements
The purpose of this test is to measure the signal amplitude, resolution and erasure from the magnetic stripe
of the sample card after writing to, check conformity with the referenced document (see IS0 781 l-2).
Amplitude measurements are defined as the measurements of signal amplitude, resolution, and erasure.
5.9.1 Apparatus:
a) All the sequcnccs of measurements must be performed on the same equipment and under the same con-
dit ions.
b) The resolution of the reading system must be bctwccn 90 9/u an d 100 % when testing on a rcfcrcncc c;rrd
at 8 ftprnm (200 ftpi) and 20 ftpmm (500 It pi), using test recording current of lmcw = 5 I tc .
c) The ovcrail width of that portion of the read/write head in contact with the strip; shall be less than
3,2 mm.
‘I’hc radius of the head curvature ;it the gap shall be 10 mm L ‘t mm.
‘I’hc card sh3ll lx held !l;lt duhg the nicasurcnicnt. It’ scvcral heads arc used, they shall be mcchanicAly
indcpcndcnt from each other.
For other information rcfcr to table 1.
12
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Table 1 - Test head specification
Two heads Single head with single gap
units min, max.
min. I max.
Kead gap mm (in) 0,o 10 (0.0004) 0,O 15 (0.0006)
Read width mm (in)
1,o (0.040) 1,6 (0.063) 1,6 (0.063)
Write gap mm (inj 0,046 (0.0018) 0,056 (0.0022)
Read/Write gap mm (in)
0,018 (0.0007; 0,025 (0.001)
Write width
mm (in) 2,79 (0.110) 2,79 (0.110)
Azimuth error minutes
10
I
I
The parameters of table 1 must be measured optically.
d) The force on the head shall be the minimum amount required to achieve the ma,ximum average signal
amplitude. Set the head force for the worst case card available at the time of calibration.
e) The waveform of the write current measured with a current probe, at nominal recording densities of 8
ftpmrn (200 ftpi) and 20 ftpmm (500 ftpi), must be as follows:
Risetime
Setting time I
Stabilization time
- -
Tl
I
Tl - T2 *5%
Period
Figure 17 - Write current waveform
- Write current waveform parameters
Table 2
1
max.
Parameter
5 % of the period
Rise Time
10 % of the write current (I)
Overshoot
15 % of the period
Settling time
2 ‘T/O of stabilized write current (I)
Settling
min.
Stabilization time
30 % of the period (minimum)
1
f) The reading system must include the following:
1) Linear amplifiers without automatic gain control with noise less than 0,5 o/6 of 100 o/‘o &knmce
signal amplitude and a frequency response which is flat within + 0,2 dB wide band from frequemies
corresponding to 2,5 cycles/mm (5.0 ftpmm) to 103 cycles/mm (21 ftpmm). This range corresponds
13
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to the characteristics of the bandpass of the filter described in 3) below. Outside this range the response
may not rise.
2) A means, such as a storage oscilloscope for determining the amplitudes of the signal peaks.
3) A filter with the following characteristics:
Upper and lower band edges shall consist of respectively a second order low pass filter
(slope 12 dB/octave). The respond shall be flat within 0,2 dB wide band from frequencies
corresponding to 25 cycles/mm (5,0 ftpmm) to 10,5 cycles/mm (21 ftpmm). Figure 18 defines
the band edges of the filter.
The filter response must continue downward for at least one decade after the band edges, the
response may not rise more than -40 dB outside this one decade range. Other filtering functions
outside of the one decade ranges may be used. This filter is used for all measurements except
the extra pulse ( U1,).
IO,5 cycIes/mm
2,s cycles/mm
Frequencies
(267 Cycles/in)
(63 cycles/in)
Corresponding to -
21,0 ftpmm
50 ftpmm
(533 ftpi) o.
(127 ftpi)
u I
0 dB
-3 dB
Frequencies
.
0,9 cycles/mm
30,O cycles/mm
Corresponding to --cr
(23 cycles/in) (762 cycles/in)
1,8 ftpmm 60,O ftpmm
(46 ftpi)
(1524 f tpi)
Figure 18 - ‘Filter characteristic
g) The drive must have the following qualities:
1) Transport system with an average speed variation of no more than 0,5 %,
2) Stable head pressure.
Accuracy of the measurements will be reduced if the drive does not have stable velocity and
pressure. If the drive stability is less than the required 0,5 %, the actual speed variation must
be recorded with the test results.
5.9.2 Procedure: All measurements are performed while reading in the same direction as writing. All meas-
ure
...
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