ASTM C657-93(2003)
(Test Method)Standard Test Method for D-C Volume Resistively of Glass
Standard Test Method for D-C Volume Resistively of Glass
SIGNIFICANCE AND USE
This experimental procedure yields meaningful data for the dc volume resistivity of glass. It is designed to minimize space charge, buildup polarization effects, and surface conductances. The temperature range is limited to room temperature to the annealing point of the specimen glass.
SCOPE
1.1 This test method covers the determination of the dc volume resistively of a smooth, preferably polished, glass by measuring the resistance to passage of a small amount of direct current through the glass at a voltage high enough to assure adequate sensitivity. This current must be measured under steady-state conditions that is neither a charging current nor a space-charge, buildup polarization current.
1.2 This test method is intended for the determination of sensitivities less than 1016 Ω ·cm in the temperature range from 25°C to the annealing point of the glass.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. For specific hazard statements, see Section 5.
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Designation:C657–93 (Reapproved 2003)
Standard Test Method for
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D-C Volume Resistivity of Glass
This standard is issued under the fixed designation C 657; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
1. Scope 4. Significance and Use
1.1 This test method covers the determination of the dc 4.1 This experimental procedure yields meaningful data for
volume resistivity of a smooth, preferably polished, glass by the dc volume resistivity of glass. It is designed to minimize
measuring the resistance to passage of a small amount of direct space charge, buildup polarization effects, and surface conduc-
current through the glass at a voltage high enough to assure tances. The temperature range is limited to room temperature
adequate sensitivity. This current must be measured under to the annealing point of the specimen glass.
steady-state conditions that is neither a charging current nor a
5. Cautions
space-charge, buildup polarization current.
5.1 Thermal emfs should be avoided. Connections involv-
1.2 This test method is intended for the determination of
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resistivities less than 10 V·cm in the temperature range from ing dissimilar metals can cause measurement difficulties. Even
copper-copper oxide junctions can produce high thermal emfs.
25°C to the annealing point of the glass.
1.3 This standard does not purport to address all of the Clean, similar metals should be used for electrical junctions.
Platinum is recommended. Welded or crimped connections
safety concerns, if any, associated with its use. It is the
responsibility of the user of this standard to establish appro- rather than soldered joints avoid difficulties. Specimen elec-
trodes shall have sufficient cross section for adequate electrical
priate safety and health practices and determine the applica-
bility of regulatory limitations prior to use. For specific hazard conductance.
statements, see Section 5.
6. Apparatus
2. Referenced Documents
6.1 Resistance-Measuring Devices, and the possible prob-
lems associated with them are discussed thoroughly in Section
2.1 ASTM Standards:
D 257 Test Methods for DC Resistance or Conductance of 9 and Appendixes A1 and A3 of Test Methods D 257. Further
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Insulating Materials discussion of electrometer circuitry is covered in Annex A1 to
this test method.
D 374 Test Methods for Thickness of Solid Electrical Insu-
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lation 6.2 Heating Chamber (Fig. 1)—For heating the specimen, a
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suitable electric furnace shall be used. The construction of the
D 1711 Terminology Relating to Electrical Insulation
D 1829 Test Method for Electrical Resistance of Ceramic furnace shall be such that the specimen is subjected to a
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uniform heat application with a minimum of temperature
Materials at Elevated Temperatures
fluctuation. An adequate muffle should be provided to shield
3. Summary of Test Method
the specimen from direct radiation by the heating elements.
3.1 The dc volume resistance is measured in accordance This may be made of a ceramic such as aluminum oxide or
with Test Methods D 257, with the specimen located in a equivalent. A grounded metallic shield shall also be provided
heating chamber with adequate temperature control, electrical within the furnace, preferably of silver, stainless steel, or
shielding and insulation of the sample leads as described in equivalent, to isolate electrically the specimen test circuit from
Test Method D 1829. the heating element. Furnaces for more than one specimen can
be constructed. The control thermocouple may be located in
the heating chamber outside the metallic shield, as shown in
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This test method is under the jurisdiction of ASTM Committee C14 on Glass
Fig. 1, or inside the metallic shield.
and Glass Products and is the direct responsibility of Subcommittee C14.04 on
6.3 Two Flat Contacting Electrodes, smaller in diameter
Physical and Mechanical Properties.
Current edition approved May 15, 1993. Published July 1993. Originally
than the specimen electrodes (see 7.6), shall be used to
approved in 1970. Last previous edition approved in 1988 as C 657 – 88.
sandwich the specimen. Sufficient thickness should be used to
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Annual Book of ASTM Standards, Vol 10.01.
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Annual Book of ASTM Standards, Vol 15.02.
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C657–93 (2003)
NOTE 1—Heating elements attached to fused alumina core—covered with baked-on refractory cement.
FIG. 1 Heating Chamber
maintain an adequate pressure and to provide heat equalization specimen
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