ASTM E1172-22
(Practice)Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
SIGNIFICANCE AND USE
4.1 This practice describes the essential components of a wavelength dispersive X-ray spectrometer. This description is presented so that the user may gain a general understanding of the structure of an X-ray spectrometer system. It also provides a means for comparing and evaluating different systems as well as understanding the capabilities and limitations of each instrument.
4.2 A laboratory may implement this practice or an X-ray fluorescence method in partnership with a manufacturer of the analytical instrumentation. If a laboratory chooses to consult with an instrument manufacturer, then the following should be considered. The laboratory should know the alloy matrices to be analyzed, elements and mass fraction ranges to be determined, and the expected performance requirements for each of these elements. The laboratory should inform the instrument manufacturer of these requirements so an analytical method may be developed which meets the laboratory’s expectations. Typically, instrument manufacturers customize the instrument configuration to satisfy the end-user’s requirements for elemental coverage, elemental precision, and detection limits. Instrument manufacturer developed analytical methods may include specific parameters for sample excitation, wavelengths, inter-element interference corrections, calibration and regression, equipment configuration/installation, and sample preparation requirements. Laboratories should have a basic understanding of the parameters derived by the manufacturer.
SCOPE
1.1 This practice covers the components of a wavelength dispersive X-ray spectrometer that are basic to its operation and to the quality of its performance. It is not the intent of this practice to specify component tolerances or performance criteria, as these are unique for each instrument. However, the practice does attempt to identify which tolerances are critical and thus which should be specified.
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. Specific safety hazard statements are given in Section 7.
1.3 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
General Information
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Standards Content (Sample)
This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the
Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
Designation: E1172 − 22
Standard Practice for
Describing and Specifying a Wavelength Dispersive X-Ray
1
Spectrometer
This standard is issued under the fixed designation E1172; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope presented so that the user may gain a general understanding of
the structure of an X-ray spectrometer system. It also provides
1.1 This practice covers the components of a wavelength
ameansforcomparingandevaluatingdifferentsystemsaswell
dispersive X-ray spectrometer that are basic to its operation
as understanding the capabilities and limitations of each
and to the quality of its performance. It is not the intent of this
instrument.
practice to specify component tolerances or performance
criteria, as these are unique for each instrument. However, the
4.2 A laboratory may implement this practice or an X-ray
practice does attempt to identify which tolerances are critical
fluorescence method in partnership with a manufacturer of the
and thus which should be specified.
analytical instrumentation. If a laboratory chooses to consult
1.2 This standard does not purport to address all of the
with an instrument manufacturer, then the following should be
safety concerns, if any, associated with its use. It is the
considered. The laboratory should know the alloy matrices to
responsibility of the user of this standard to establish appro-
be analyzed, elements and mass fraction ranges to be
priate safety, health, and environmental practices and deter-
determined, and the expected performance requirements for
mine the applicability of regulatory limitations prior to use.
each of these elements. The laboratory should inform the
Specific safety hazard statements are given in Section 7.
instrument manufacturer of these requirements so an analytical
1.3 This international standard was developed in accor-
method may be developed which meets the laboratory’s
dance with internationally recognized principles on standard-
expectations. Typically, instrument manufacturers customize
ization established in the Decision on Principles for the
the instrument configuration to satisfy the end-user’s require-
Development of International Standards, Guides and Recom-
ments for elemental coverage, elemental precision, and detec-
mendations issued by the World Trade Organization Technical
tion limits. Instrument manufacturer developed analytical
Barriers to Trade (TBT) Committee.
methods may include specific parameters for sample
excitation, wavelengths, inter-element interference corrections,
2. Referenced Documents
calibration and regression, equipment configuration/
2
2.1 ASTM Standards:
installation,andsamplepreparationrequirements.Laboratories
E135 Terminology Relating to Analytical Chemistry for
shouldhaveabasicunderstandingoftheparametersderivedby
Metals, Ores, and Related Materials
the manufacturer.
E2857 Guide for Validating Analytical Methods
3. Terminology
5. Description of Equipment
3.1 For definitions of terms used in this practice, refer to
5.1 Types of Spectrometers—X-ray spectrometers can be
Terminology E135.
classified as sequential, simultaneous, or hybrid (see 5.1.3).
4. Significance and Use
5.1.1 Sequential Spectrometers—The sequential spectrom-
eter disperses and detects secondary X-rays by means of an
4.1 This practice describes the essential components of a
adjustable monochromator called a goniometer. Secondary
wavelength dispersive X-ray spectrometer. This description is
X-rays emitted from the specimen pass through a mask that
1
defines the viewed region of the specimen. These X-rays enter
This practice is under the jurisdiction of ASTM Committee E01 on Analytical
Chemistry for Metals, Ores, and Related Materials and is the direct responsibility of
a collimator, typically a Soller slit, and nonparallel X-rays are
Subcommittee E01.20 on Fundamental Practices.
eliminated by being absorbed by the blades of the collimator.
Current edition approved Dec. 1, 2022. Published January 2023. Originally
The parallel beam of X-rays impinge an analyzing crystal that
approved in 1987. Last previous edition approved in 2016 as E1172 – 16. DOI:
10.1520/E1172-22.
disperses the X-rays according to their wavelengths. The
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
dispersed X-rays are measured by suitable detectors, which
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
may have an attached collimato
...
This document is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
Designation: E1172 − 16 E1172 − 22
Standard Practice for
Describing and Specifying a Wavelength Dispersive X-Ray
1
Spectrometer
This standard is issued under the fixed designation E1172; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope
1.1 This practice covers the components of a wavelength dispersive X-ray spectrometer that are basic to its operation and to the
quality of its performance. It is not the intent of this practice to specify component tolerances or performance criteria, as these are
unique for each instrument. However, the practice does attempt to identify which tolerances are critical and thus which should be
specified.
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety safety, health, and healthenvironmental practices and to determine the
applicability of regulatory limitations prior to use. Specific safety hazard statements are given in 5.3.1.2 and 5.3.2.4, and in Section
7.
1.3 This international standard was developed in accordance with internationally recognized principles on standardization
established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued
by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
2. Referenced Documents
2
2.1 ASTM Standards:
E135 Terminology Relating to Analytical Chemistry for Metals, Ores, and Related Materials
E2857 Guide for Validating Analytical Methods
3. Terminology
3.1 For terminology relating to X-ray spectrometry, definitions of terms used in this practice, refer to Terminology E135.
4. Significance and Use
4.1 This practice describes the essential components of a wavelength dispersive X-ray spectrometer. This description is presented
so that the user or potential user may gain a cursorygeneral understanding of the structure of an X-ray spectrometer system. It also
provides a means for comparing and evaluating different systems as well as understanding the capabilities and limitations of each
instrument.
1
This practice is under the jurisdiction of ASTM Committee E01 on Analytical Chemistry for Metals, Ores, and Related Materials and is the direct responsibility of
Subcommittee E01.20 on Fundamental Practices.
Current edition approved June 1, 2016Dec. 1, 2022. Published June 2016January 2023. Originally approved in 1987. Last previous edition approved in 20112016 as
E1172 – 87E1172 – 16.(2011). DOI: 10.1520/E1172-16.10.1520/E1172-22.
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM Standards
volume information, refer to the standard’s Document Summary page on the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
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E1172 − 22
4.2 It is understood that a A laboratory may implement this practice or an X-ray fluorescence method in partnership with a
manufacturer of the analytical instrumentation. If a laboratory chooses to consult with an instrument manufacturer, then the
following should be considered. The laboratory should have an idea of know the alloy matrices to be analyzed, elements and mass
fraction ranges to be determined, and the expected performance requirements for each of these elements. The laboratory should
inform the instrument manufacturer of these requirements so they may develop an analytical method may be developed which
meets the laboratory’s expectations. Typically, instrument manufacturers customize the instrument configuration to satisfy the
end-user’s requirements for elemental coverage, elemental precision, and detection limits. Instrument manufacturer developed
analytical methods may include specific parameters for sample excitation, wavelengths, inter-element interference corrections,
calibration and regression, equipment configuration/installation, and sample preparation requirements. Laboratories should have a
basic understanding of the parameters derived by the manufacturer.
5. Description of Equipment
5.1 Types of Spectrometers—X-ray spectrometers can be classified as sequential, simultane
...
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