CEN/TS 18094:2024
(Main)Non-destructive testing - Test method for determining residual stresses by synchrotron x-ray diffraction
Non-destructive testing - Test method for determining residual stresses by synchrotron x-ray diffraction
This document describes the test method for determining residual stresses in polycrystalline materials by the synchrotron X-ray diffraction method. The method can be applied to both homogeneous and inhomogeneous materials including those containing distinct phases.
Information on how to carry out residual stress measurements by the synchrotron X-ray diffraction technique is provided as:
- the selection of appropriate diffracting lattice planes on which measurements should be made for different categories of materials,
- the specimen directions in which the measurements should be performed,
- the volume of material examined in relation to the material grain size and the envisaged stress state,
- the selection of the stress-free reference (sample) facilitating the residual strain calculation, and
- the methods available for deriving residual stresses from the measured strain data.
Procedures are presented for calibrating synchrotron X-ray diffraction instruments, enabling:
- accurately positioning and aligning test pieces;
- precisely defining the volume of material sampled for the individual measurements;
and also for:
- making measurements;
- carrying out procedures for analysing the results;
- determining their uncertainties.
The principles of the synchrotron X-ray diffraction technique are described and put into perspective with EN 15305:2008 and EN ISO 21432:2020, which are used to measure stresses in the bulk of a specimen.
Zerstörungsfreie Prüfung - Prüfverfahren zur Bestimmung von Eigenspannungen mittels Synchrotron-Röntgendiffraktometrie
Essais non destructifs - Méthode d’essai pour l’analyse des contraintes résiduelles par diffraction des rayons X synchrotron
Le présent document décrit la méthode d’essai permettant de déterminer les contraintes résiduelles dans les matériaux polycristallins par la méthode de diffraction des rayons X au synchrotron. La méthode peut être appliquée aux matériaux homogènes et non homogènes, y compris ceux contenant des phases distinctes.
Des informations sont fournies sur la manière de réaliser les évaluations des contraintes résiduelles par la technique de diffraction des rayons X au synchrotron en ce qui concerne :
— la sélection appropriée de plans réticulaires de diffraction sur lesquels il convient d’effectuer des mesurages pour différentes catégories de matériaux ;
— les directions de l’éprouvette dans lesquelles il convient d’effectuer les mesurages ;
— le volume de matériau examiné en fonction de la taille du grain et de l’état de contrainte visé ;
— le choix de la référence (échantillon) sans contrainte facilitant le calcul de déformation résiduelle ;
— les méthodes disponibles pour calculer les contraintes résiduelles à partir des mesures de déformation.
Des modes opératoires sont présentés pour l’étalonnage des appareils de diffraction des rayons X au synchrotron, permettant :
— le positionnement et l’alignement corrects des pièces d’essai ;
— la définition précise du volume de matériau échantillonné aux fins des mesurages individuels ;
mais aussi pour :
— la réalisation des mesurages ;
— la réalisation des modes opératoires pour l’analyse des résultats ;
— la détermination de leurs incertitudes.
Les principes de la technique de diffraction des rayons X au synchrotron sont décrits et mis en perspective avec l’EN 15305:2008 et l’EN ISO 21432:2020 qui sont utilisées pour évaluer les contraintes dans la masse d’une éprouvette.
Neporušitvene preiskave - Preskusne metode za ugotavljanje preostalih napetosti s sinhrotronskim uklonom rentgenskih žarkov
General Information
Standards Content (Sample)
SLOVENSKI STANDARD
01-april-2025
Neporušitvene preiskave - Preskusne metode za ugotavljanje preostalih napetosti
s sinhrotronskim uklonom rentgenskih žarkov
Non-destructive testing - Test method for determining residual stresses by synchrotron x-
ray diffraction
Zerstörungsfreie Prüfung - Prüfverfahren zur Bestimmung von Eigenspannungen mittels
Synchrotron-Röntgendiffraktometrie
Essais non-destructifs - Méthode d'essai pour l'analyse des contraintes résiduelles par
diffraction des rayons X au synchrotron
Ta slovenski standard je istoveten z: CEN/TS 18094:2024
ICS:
19.100 Neporušitveno preskušanje Non-destructive testing
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
CEN/TS 18094
TECHNICAL SPECIFICATION
SPÉCIFICATION TECHNIQUE
December 2024
TECHNISCHE SPEZIFIKATION
ICS 19.100
English Version
Non-destructive testing - Test method for determining
residual stresses by synchrotron x-ray diffraction
Essais non-destructifs - Méthode d'essai pour l'analyse Zerstörungsfreie Prüfung - Prüfverfahren zur
des contraintes résiduelles par diffraction des rayons X Bestimmung von Eigenspannungen mittels
au synchrotron Synchrotron-Röntgendiffraktometrie
This Technical Specification (CEN/TS) was approved by CEN on 20 October 2024 for provisional application.
The period of validity of this CEN/TS is limited initially to three years. After two years the members of CEN will be requested to
submit their comments, particularly on the question whether the CEN/TS can be converted into a European Standard.
CEN members are required to announce the existence of this CEN/TS in the same way as for an EN and to make the CEN/TS
available promptly at national level in an appropriate form. It is permissible to keep conflicting national standards in force (in
parallel to the CEN/TS) until the final decision about the possible conversion of the CEN/TS into an EN is reached.
CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia,
Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway,
Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Türkiye and
United Kingdom.
EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION
EUROPÄISCHES KOMITEE FÜR NORMUNG
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2024 CEN All rights of exploitation in any form and by any means reserved Ref. No. CEN/TS 18094:2024 E
worldwide for CEN national Members.
Contents Page
European foreword . 4
Introduction . 5
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Symbols and abbreviated terms . 11
4.1 Symbols and units . 11
4.2 Subscripts . 12
4.3 Abbreviations . 12
5 Summary of the synchrotron XRD measurement method . 12
5.1 General. 12
5.2 Diffraction techniques. 14
5.2.1 General information . 14
5.2.2 Effects due to the material structure . 15
5.3 Synchrotron high energy X-ray diffraction . 16
5.3.1 General. 16
5.3.2 Monochromatic beam for angle-dispersive X-ray diffraction (ADXRD) . 16
5.3.3 Polychromatic beam for energy-dispersive X-ray diffraction (EDXRD) . 17
5.4 Residual stress calculation . 17
5.4.1 Strain . 17
5.4.2 Stress . 19
5.5 Sources of error and uncertainty . 21
5.5.1 Errors and misapplications . 21
5.5.2 Uncertainties . 22
6 Preparation of measurement and calibration . 23
6.1 Sample preparation . 23
6.1.1 General. 23
6.1.2 Geometry . 23
6.1.3 Composition . 23
6.1.4 Thermal/mechanical history. 24
6.1.5 Phases and crystals . 24
6.1.6 Homogeneity, microstructure and texture . 24
6.1.7 Grain size . 24
6.2 Instrumentation preparation . 24
6.2.1 Instrumentation calibration . 24
6.2.2 Verification of the instrumentation . 24
6.3 Experimental setup . 25
6.3.1 Choosing the measurement method and beam type . 25
6.3.2 Reflection geometry . 25
6.3.3 Transmission geometry . 25
6.3.4 Energy-dispersive (EDXRD) mode . 25
6.3.5 Angle dispersive (ADXRD) mode . 25
6.3.6 Determination of the gauge volume (GV). 26
6.3.7 Peak selection . 26
6.3.8 Temperature . 27
6.4 Measurement procedure: EDXRD – transmission. 27
6.4.1 General considerations . 27
6.4.2 Calibration of the detector . 27
6.4.3 Instrument alignment . 27
6.4.4 Calibration of scattering angle . 27
6.5 Measurement procedure: EDXRD – reflection . 28
6.5.1 General considerations . 28
6.5.2 Calibration of detector . 28
6.5.3 Instrument alignment . 28
6.5.4 Calibration of scattering angle . 28
6.5.5 Determination of gauge volume (GV) . 28
6.5.6 Sample positioning . 29
6.5.7 Slit positioning . 29
6.6 Measurement procedure: ADXRD – transmission and reflection . 29
6.6.1 General considerations . 29
6.6.2 Calibration of detector . 29
6.6.3 Instrument alignment . 30
6.6.4 Calibration of scattering angle . 30
6.6.5 Detector distance . 30
6.6.6 Defining beam parameters. 30
6.6.7 Performing the measurement . 31
6.7 Measurement procedure: ADXRD – CSC . 31
6.7.1 General considerations . 31
6.7.2 Calibration of detector . 31
6.7.3 Instrument alignment . 31
7 Measurement and recording requirements . 31
7.1 General . 31
7.2 Measurements . 31
7.3 Recording requirements . 32
7.4 Reduction of measurement data and data fitting . 32
8 Data analysis and stress calculation . 33
8.1 Specific equations for synchrotron radiation-based diffraction techniques . 33
8.1.1 General . 33
8.1.2 Data input .
...
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