Basic Specification: X-ray inspection of electronic components

Supersedes CECC 00 012:1985

Grundspezifikation: Röntgenprüfung von Bauelementen der Elektronik

Spécification de base: Contrôle aux rayons X des composants électroniques

Basic specification: X-ray inspection of electronic components

General Information

Status
Published
Publication Date
05-Sep-1994
Withdrawal Date
05-Mar-1996
Technical Committee
Drafting Committee
Parallel Committee
Current Stage
9960 - Withdrawal effective - Withdrawal
Completion Date
16-Sep-2014

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Standard
EN 100012:2002
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Standards Content (Sample)

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Basic specification: X-ray inspection of electronic componentsGrundspezifikation: Röntgenprüfung von Bauelementen der ElektronikSpécification de base: Contrôle aux rayons X des composants électroniquesBasic Specification: X-ray inspection of electronic components31.020Elektronske
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