Basic Specification: X-ray inspection of electronic components

Supersedes CECC 00 012:1985

Grundspezifikation: Röntgenprüfung von Bauelementen der Elektronik

Spécification de base: Contrôle aux rayons X des composants électroniques

Basic specification: X-ray inspection of electronic components

General Information

Status
Published
Publication Date
31-Aug-2002
Current Stage
6060 - National Implementation/Publication (Adopted Project)
Start Date
01-Sep-2002
Due Date
01-Sep-2002
Completion Date
01-Sep-2002

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Standard
EN 100012:2002
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Standards Content (Sample)

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Basic specification: X-ray inspection of electronic componentsGrundspezifikation: Röntgenprüfung von Bauelementen der ElektronikSpécification de base: Contrôle aux rayons X des composants électroniquesBasic Specification: X-ray inspection of electronic components31.020Elektronske
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