Determination of certain substances in electrotechnical products - Part 2: Disassembly, disjointment and mechanical sample preparation

IEC 62321-2:2013 provides strategies of sampling along with the mechanical preparation of samples from electrotechnical products, electronic assemblies and electronic components. These samples can be used for analytical testing to determine the levels of certain substances as described in the test methods in other parts of IEC 62321. Restrictions for substances will vary between geographic regions and from time to time. This Standard describes a generic process for obtaining and preparing samples prior to the determination of any substance which are under concern.

Verfahren zur Bestimmung von bestimmten Substanzen in Produkten der Elektrotechnik - Teil 2: Demontage, Zerlegung und mechanische Probenvorbereitung

Détermination de certaines substances dans les produits électrotechniques - Partie 2: Démontage, désassemblage et préparation mécanique de l'échantillon

La CEI 62321-2:2013 fournit des stratégies d'échantillonnage ainsi que la préparation mécanique d'échantillons de produits électrotechniques, ensembles électroniques et composants électroniques. Ces échantillons peuvent être utilisés pour un essai analytique visant à déterminer les niveaux de certaines substances, comme décrit dans les méthodes d'essai des autres parties de la CEI 62321. Les restrictions concernant les substances varient selon les régions géographiques et de temps à autres. La présente norme décrit un processus général permettant d'obtenir et de préparer des échantillons avant de déterminer toute substance posant problème.

Določevanje posameznih snovi v elektrotehničnih izdelkih - 2. del: Razstavljanje, odklop in mehanska priprava vzorca (IEC 62321-2:2013)

Standard 62321-2 določa strategije vzorčenja skupaj z mehansko pripravo vzorcev iz elektrotehničnih izdelkov, elektronskih sklopov in elektronskih komponent. Ti vzorci se lahko uporabijo za analitično testiranje za določitev vsebnosti nekaterih snovi, kot je opisano v testnih metodah v drugih delih IEC 62321. Omejitve za snovi se razlikujejo med geografskimi regijami in od časa do časa. Ta standard opisuje splošen postopek za pridobitev in pripravo vzorcev pred določitvijo katere koli zadevne snovi. Ta standard ne ponuja: - popolnih smernic za vsak izdelek, ki ga je mogoče razvrstiti kot elektrotehnično opremo. Ker hkrati z nenehnimi industrijskimi inovacijami obstaja veliko različnih elektrotehničnih komponent z različnimi zgradbami in postopki, je nerealno, da bi poskušali zagotoviti postopke za razstavljanje vsakega tipa sestavnega dela pri stikališčih; – smernice glede drugih poti za zbiranje dodatnih informacij o nekaterih snoveh v proizvodu, čeprav so zbrane informacije pomembne za strategije vzorčenja v tem standardu; – varno razstavljanje in navodila za mehansko razstavljanje pri stikališčih, povezana z elektrotehničnimi izdelki (npr. stikala, ki vsebujejo živo srebro) in reciklažno industrijo (npr. kako ravnati z zasloni CRT ali varno odstraniti baterije). Glejte standard IEC 62554 [2] za razstavljanje pri stikališčih in pripravo mehanskih vzorcev fluorescenčnih sijalk, ki vsebujejo živo srebro; – opredelitev »enote« kot vzorca; – postopke vzorčenja za embalažo in embalažne materiale; – analitične postopke za merjenje ravni določenih snovi. To je zajeto v drugih standardih (na primer drugih delih IEC 62321), ki so navedeni kot »preskusni standard« v tem standardu; – smernice za oceno skladnosti.

General Information

Status
Published
Publication Date
24-Apr-2014
Current Stage
6060 - Document made available
Due Date
25-Apr-2014
Completion Date
25-Apr-2014

RELATIONS

Buy Standard

Standard
EN 62321-2:2014 - BARVE v standardu!
English language
53 pages
sale 10% off
Preview
sale 10% off
Preview

e-Library read for
1 day

Standards Content (sample)

SLOVENSKI STANDARD
SIST EN 62321-2:2014
01-junij-2014
1DGRPHãþD
SIST EN 62321:2009

'RORþHYDQMHSRVDPH]QLKVQRYLYHOHNWURWHKQLþQLKL]GHONLKGHO5D]VWDYOMDQMH

RGNORSLQPHKDQVNDSULSUDYDY]RUFD ,(&

Determination of certain substances in electrotechnical products - Part 2: Disassembly,

disjunction and mechanical sample preparation

Verfahren zur Bestimmung von bestimmten Substanzen in Produkten der Elektrotechnik

- Teil 2: Demontage, Zerlegung und mechanische Probenvorbereitung

Détermination de certaines substances dans les produits électrotechniques - Partie 2:

Démontage, désassemblage et préparation mécanique de l'échantillon
Ta slovenski standard je istoveten z: EN 62321-2:2014
ICS:
29.020 Elektrotehnika na splošno Electrical engineering in
general
31.020 Elektronske komponente na Electronic components in
splošno general
SIST EN 62321-2:2014 en

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------
SIST EN 62321-2:2014
---------------------- Page: 2 ----------------------
SIST EN 62321-2:2014
EUROPEAN STANDARD
EN 62321-2
NORME EUROPÉENNE
April 2014
EUROPÄISCHE NORM
ICS 13.020; 43.040.10 Supersedes EN 62321:2009 (partially)
English version
Determination of certain substances in electrotechnical products -
Part 2: Disassembly, disjointment and mechanical sample preparation
(IEC 62321-2:2013)
Détermination de certaines substances Verfahren zur Bestimmung von
dans les produits électrotechniques - bestimmten Substanzen in Produkten der
Partie 2: Démontage, désassemblage et Elektrotechnik -
préparation mécanique de l'échantillon Teil 2: Demontage, Zerlegung und
(CEI 62321-2:2013) mechanische Probenvorbereitung
(IEC 62321-2:2013)

This European Standard was approved by CENELEC on 2013-11-15. CENELEC members are bound to comply

with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard

the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on

application to the CEN-CENELEC Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other

language made by translation under the responsibility of a CENELEC member into its own language and notified

to the CEN-CENELEC Management Centre has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,

the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany,

Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland,

Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B - 1000 Brussels

© 2014 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 62321-2:2014 E
---------------------- Page: 3 ----------------------
SIST EN 62321-2:2014
EN 62321-2:2014 - 2 -
Foreword

The text of document 111/301/FDIS, future edition 1 of IEC 62321-2, prepared by IEC/TC 111

"Environmental standardization for electrical and electronic products and systems" was submitted to the

IEC-CENELEC parallel vote and approved by CENELEC as EN 62321-2:2014.
The following dates are fixed:
(dop) 2014-10-25
• latest date by which the document has
to be implemented at national level by
publication of an identical national
standard or by endorsement
(dow) 2016-11-15
• latest date by which the national
standards conflicting with the
document have to be withdrawn

EN 62321-2:2014 is a partial replacement of EN 62321:2009, forming a structural revision and generally

replacing Clause 5 and incorporating IEC/PAS 62596:2009 [1] which will be withdrawn upon publication

of IEC 62321-2.

Future parts in the EN 62321 series will gradually replace the corresponding clauses in EN 62321:2009.

Until such time as all parts are published, however, EN 62321:2009 remains valid for those clauses not

yet re-published as a separate part.

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent

rights.
Endorsement notice

The text of the International Standard IEC 62321-2:2013 was approved by CENELEC as a European

Standard without any modification.

In the official version, for Bibliography, the following notes have to be added for the standards indicated:

IEC 62554 NOTE Harmonised as EN 62554 (not modified).
IEC 62542 NOTE Harmonised as EN 62542 (not modified).
IEC 62321-6 NOTE Harmonised as EN 62321-6 (not modified).
IEC 62321-7-1 NOTE Harmonised as EN 62321-7-1 (not modified).
IEC 62137-1-2 NOTE Harmonised as EN 62137-1-2 (not modified).
Numbers in square brackets refer to the Bibliography.
---------------------- Page: 4 ----------------------
SIST EN 62321-2:2014
- 3 - EN 62321-2:2014
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following documents, in whole or in part, are normatively referenced in this document and are

indispensable for its application. For dated references, only the edition cited applies. For undated

references, the latest edition of the referenced document (including any amendments) applies.

NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD

applies.
Publication Year Title EN/HD Year
IEC 62321-1 - Determination of certain substances in EN 62321-1 -
electrotechnical products - Part 1: Introduction
and overview
IEC 62321-3-1 - Determination of certain substances in EN 62321-3-1 -
electrotechnical products - Part 3-1: Screening
electrotechnical products for lead, mercury,
cadmium, total chromium and total bromine
using X-ray Fluorescence Spectrometry
IEC 62321-3-2 - Determination of certain substances in EN 62321-3-2 -
electrotechnical products - Part 3-2: Screening
of total bromine in electric and electronic
products by combustion-ion chromatography
(C-IC)
IEC 62321-4 - Determination of certain substances in EN 62321-4 -
electrotechnical products - Part 4:
Determination of mercury in polymers, metals
and electronics by CV-AAS, CV-AFS, ICP-
OES and ICP-MS
IEC 62321-5 - Determination of certain substances in EN 62321-5 -
electrotechnical products - Part 5:
Determination of cadmium, lead and
chromium in polymers and electronics, and
cadmium and lead in metals by AAS, AFS,
ICP-OES and ICP-MS
---------------------- Page: 5 ----------------------
SIST EN 62321-2:2014
---------------------- Page: 6 ----------------------
SIST EN 62321-2:2014
IEC 62321-2
Edition 1.0 2013-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Determination of certain substances in electrotechnical products –
Part 2: Disassembly, disjointment and mechanical sample preparation
Détermination de certaines substances dans les produits électrotechniques –
Partie 2: Démontage, désassemblage et préparation mécanique de l'échantillon
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX XB
ICS 13.020; 43.040.10 ISBN 978-2-83220-837-3

Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
---------------------- Page: 7 ----------------------
SIST EN 62321-2:2014
– 2 – 62321-2 © IEC:2013
CONTENTS

FOREWORD ........................................................................................................................... 4

INTRODUCTION ..................................................................................................................... 6

1 Scope ............................................................................................................................... 7

2 Normative references ....................................................................................................... 7

3 Terms, definitions and abbreviations ................................................................................ 8

3.1 Terms and definitions .............................................................................................. 8

3.2 Abbreviations .......................................................................................................... 8

4 Introduction to sampling ................................................................................................... 9

4.1 Introductory remark ................................................................................................. 9

4.2 Requirements and concerns for substances of concern ........................................... 9

4.3 Complexity of electrotechnical products and related challenges............................... 9

4.4 Strategies for sampling .......................................................................................... 10

5 Sampling ........................................................................................................................ 13

5.1 Introductory remark ............................................................................................... 13

5.2 Complete product .................................................................................................. 14

5.3 Partial disassembly ............................................................................................... 14

5.4 Complete disassembly ........................................................................................... 14

5.5 Partial disjointment ................................................................................................ 14

5.6 Complete disjointment ........................................................................................... 15

5.7 Considerations of sampling and disjointment ......................................................... 15

5.7.1 Introductory remark ................................................................................... 15

5.7.2 Sample size required ................................................................................. 15

5.7.3 Sample size versus detection limit ............................................................. 17

5.7.4 Composite testing of disjointable samples ................................................. 17

5.7.5 Non-uniform “homogeneous materials” ...................................................... 18

5.7.6 Determination of sampling position of homogeneous materials .................. 19

6 Conclusions and recommendations for sampling ............................................................ 19

7 Mechanical sample preparation ...................................................................................... 20

7.1 Overview ............................................................................................................... 20

7.1.1 Field of application .................................................................................... 20

7.1.2 Quality assurance ...................................................................................... 20

7.2 Apparatus, equipment and materials...................................................................... 21

7.3 Procedure ............................................................................................................. 21

7.3.1 Manual cutting ........................................................................................... 21

7.3.2 Coarse grinding/milling .............................................................................. 22

7.3.3 Homogenizing............................................................................................ 22

7.3.4 Fine grinding/milling .................................................................................. 22

7.3.5 Very fine grinding of polymers and organic materials ................................. 22

Annex A (informative) Examples of procedures for sampling and disjointment ..................... 23

Annex B (informative) Probability of the presence of certain substances .............................. 32

Annex C (informative) Composite testing and sampling ........................................................ 35

Annex D (informative) Tools used in sampling...................................................................... 38

Annex E (informative) Examples of mobile phone disassembly and component

disjointment .......................................................................................................................... 39

Bibliography .......................................................................................................................... 50

---------------------- Page: 8 ----------------------
SIST EN 62321-2:2014
62321-2 © IEC:2013 – 3 –

Figure 1 – Generic iterative procedure for sampling .............................................................. 11

Figure 2 – Cross-section of a 900 µm wide lead oxide-based resistor (SMD) ........................ 19

Figure A.1 – Methodology for sampling and disjointment ....................................................... 24

Figure A.2 – Sampling of DVD player .................................................................................... 25

Figure A.3 – Sampling of CRT .............................................................................................. 26

Figure A.4 – Sampling of LCD TV ......................................................................................... 27

Figure A.5 – Sampling of PDA/phone .................................................................................... 28

Figure A.6 – Sampling of desk fan ........................................................................................ 29

Figure A.7 – Sampling of components – Thick film resistor ................................................... 30

Figure A.8 – Sampling of components – SMD potentiometer ................................................. 31

Figure D.1 – Hot gas gun for removing the electronic components ........................................ 38

Figure D.2 – Vacuum pin to remove the target electronic devices ......................................... 38

Figure E.1 – Mobile phone type A with battery charger and camera lens cap ........................ 39

Figure E.2 – Mobile phone type A with battery and back cover removed ............................... 40

Figure E.3 – Partial disassembly of a mobile phone (type B) into its major components ........ 41

Figure E.4 – Complete disassembly of the key pad ............................................................... 42

Figure E.5 – Complete disassembly of the bottom housing ................................................... 42

Figure E.6 – Complete disassembly of the other housing/frame ............................................ 43

Figure E.7 – Components of the TFT display of the mobile phoneafter partial

disjointment .......................................................................................................................... 43

Figure E.8 – Components of the main PWB of the mobile phone after partial

disjointment .......................................................................................................................... 44

Figure E.9 – Disjointment of lead frame component .............................................................. 46

Figure E.10 – BGA package prior to disjointment .................................................................. 47

Figure E.11 – BGA package disjointed by the hand removal procedure ................................. 47

Figure E.12 – Solder ball material collected from BGA using a hand removal procedure ....... 48

Figure E.13 – BGA solder ball removal using the ball shear procedure ................................. 48

Table 1 – Minimum number of lead frame samples required for analytical testing ................. 16

Table 2 – Levels of a certain substance in a composite sample ............................................ 18

Table B.1 – Probability of the presence of certain substances in materials and

components used in electrotechnical products (1 of 3) .......................................................... 32

Table C.1 – Calculated maximum concentration for a composite sample based on

detection limit ....................................................................................................................... 36

Table C.2 – Required detection limit for a composite sample based on the maximum

allowable concentration ........................................................................................................ 37

Table E.1 – Possible certain substances or screening substances from a mobile phone ....... 40

Table E.2 – Possible certain substances in major components of the mobile phone .............. 41

Table E.3 – Examples of disjointment for typical small electronic components ...................... 45

---------------------- Page: 9 ----------------------
SIST EN 62321-2:2014
– 4 – 62321-2 © IEC:2013
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
DETERMINATION OF CERTAIN SUBSTANCES
IN ELECTROTECHNICAL PRODUCTS –
Part 2: Disassembly, disjointment and mechanical sample preparation
FOREWORD

1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

all national electrotechnical committees (IEC National Committees). The object of IEC is to promote

international co-operation on all questions concerning standardization in the electrical and electronic fields. To

this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,

Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC

Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested

in the subject dealt with may participate in this preparatory work. International, governmental and non-

governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely

with the International Organization for Standardization (ISO) in accordance with conditions determined by

agreement between the two organizations.

2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international

consensus of opinion on the relevant subjects since each technical committee has representation from all

interested IEC National Committees.

3) IEC Publications have the form of recommendations for international use and are accepted by IEC National

Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC

Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any

misinterpretation by any end user.

4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications

transparently to the maximum extent possible in their national and regional publications. Any divergence

between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in

the latter.

5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity

assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any

services carried out by independent certification bodies.

6) All users should ensure that they have the latest edition of this publication.

7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and

members of its technical committees and IEC National Committees for any personal injury, property damage or

other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and

expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC

Publications.

8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is

indispensable for the correct application of this publication.

9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of

patent rights. IEC shall not be held responsible for identifying any or all such patent rights.

International Standard IEC 62321-2 has been prepared by IEC technical committee 111:

Environmental standardization for electrical and electronic products and systems.

The first edition of IEC 62321:2008 was a 'stand-alone' standard that included an introduction,

an overview of test methods, a mechanical sample preparation as well as various test method

clauses.

This first edition of IEC 62321-2 is a partial replacement of IEC 62321:2008, forming a

structural revision and generally replacing Clause 5 and incorporating IEC/PAS 62596:2009

[1] which will be withdrawn upon publication of IEC 62321-2.
___________
Numbers in square brackets refer to the Bibliography.
---------------------- Page: 10 ----------------------
SIST EN 62321-2:2014
62321-2 © IEC:2013 – 5 –

Future parts in the IEC 62321 series will gradually replace the corresponding clauses in

IEC 62321:2008. Until such time as all parts are published, however, IEC 62321:2008 remains

valid for those clauses not yet re-published as a separate part.
The text of this standard is based on the following documents:
FDIS Report on voting
111/301/FDIS 111/311/RVD

Full information on the voting for the approval of this standard can be found in the report on

voting indicated in the above table.

This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

A list of all parts in the IEC 62321 series can be found on the IEC website under the general

title: Determination of certain substances in electrotechnical products

The committee has decided that the contents of this publication will remain unchanged until

the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data

related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates

that it contains colours which are considered to be useful for the correct

understanding of its contents. Users should therefore print this document using a

colour printer.
---------------------- Page: 11 ----------------------
SIST EN 62321-2:2014
– 6 – 62321-2 © IEC:2013
INTRODUCTION

The widespread use of electrotechnical products has drawn increased attention to their impact

on the environment. In many countries this has resulted in the adaptation of regulations

affecting wastes, substances and energy use of electrotechnical products.

The use of certain substances (e.g. lead (Pb), cadmium (Cd) and polybrominated diphenyl

ethers (PBDEs)) in electrotechnical products, is a source of concern in current and proposed

regional legislation.

The purpose of the IEC 62321 series is therefore to provide test methods that will allow the

electrotechnical industry to determine the levels of certain substances of concern in

electrotechnical products on a consistent global basis.

WARNING – Persons using this International Standard should be familiar with normal

laboratory practice. This standard does not purport to address all of the safety

problems, if any, associated with its use. It is the responsibility of the user to establish

appropriate safety and health practices and to ensure compliance with any national

regulatory conditions.
---------------------- Page: 12 ----------------------
SIST EN 62321-2:2014
62321-2 © IEC:2013 – 7 –
DETERMINATION OF CERTAIN SUBSTANCES
IN ELECTROTECHNICAL PRODUCTS –
Part 2: Disassembly, disjointment and mechanical sample preparation
1 Scope

This part of IEC 62321 provides strategies of sampling along with the mechanical preparation

of samples from electrotechnical products, electronic assemblies and electronic components.

These samples can be used for analytical testing to determine the levels of certain

substances as described in the test methods in other parts of IEC 62321. Restrictions for

substances will vary between geographic regions and from time to time. This Standard

describes a generic process for obtaining and preparing samples prior to the determination of

any substance which are under concern.
This standard does not provide:

– full guidance on each and every product that could be classified as electrotechnical

equipment. Since there is a huge variety of electrotechnical components, with various

structures and processes, along with the continuous innovations in the industry, it is

unrealistic to attempt to provide procedures for the disjointment of every type of

component;

– guidance regarding other routes to gather additional information on certain substances in

a product, although the information collected has relevance to the sampling strategies in

this standard;

– safe disassembly and mechanical disjointment instructions related to electrotechnical

products (e.g. mercury-containing switches) and the recycling industry (e.g. how to handle

CRTs or the safe removal of batteries). See IEC 62554 [2] for the disjointment and

mechanial sample preparation of mercury-containing fluorescent lamps;
– the definition of a “unit” as the sample;
– sampling procedures for packaging and packaging materials;

– analytical procedures to measure the levels of certain substances. This is covered by

other standards (for example other parts of IEC 62321), which are referred to as the "test

standard" in this standard;
– guidelines for assessment of compliance.
NOTE Further guidance on assessment procedures is provided by IEC/TR 62476 [3].
2 Normative references

The following documents, in whole or in part, are normatively referenced in this document and

are indispensable for its application. For dated references, only the edition cited applies. For

undated references, the latest edition of the referenced document (including any
amendments) applies.

IEC 62321-1, Determination of certain substances in electrotechnical products – Part 1

Introduction and overview

IEC 62321-3-1, Determination of certain substances in electrotechnical products – Part 3-1:

Screening – Lead, mercury, cadmium, total chromium and total bromine using X-ray
fluorescence spectrometry
---------------------- Page: 13 ----------------------
SIST EN 62321-2:2014
– 8 – 62321-2 © IEC:2013

IEC 62321-3-2, Determination of certain substances in electrotechnical products – Part 3-2:

Screening – Total bromine in polymers and electronics by combustion – Ion chromatography

(C-IC)

IEC 62321-4, Determination of certain substances in electrotechnical products – Part 4:

Determination of mercury in polymers, metals and electronics by CV-AAS, CV-AFS, ICP-OES

and ICP-MS

IEC 62321-5, Determination of certain substances in electrotechnical products – Part 5:

Determination of cadmium, lead and chromium in polymers and electronics and cadmium and

lead in metals by AAS, AFS, ICP-OES, ICP-AES and ICP-MS
3 Terms, definitions and abbreviations
3.1 Terms and definitions

For the purposes of this document, the definitions given in IEC 62321-1, as well as the

following, apply.
3.1.1
composite testing

testing two or more materials as a single sample that could be mechanically disjointed if

necessary
3.1.2
certain substance

cadmium, lead, mercury, hexavalent chromium, polybrominated biphenyl, polybrominated

diphenyl ether

NOTE IEC 62321-1 includes test methods for the evaluation of each of the substances identified in the definition

above.
3.2 Abbreviations
AC Alternating current
BGA Ball grid array (electronic component)
CRT Cathode ray tube (television)
DVD Digital versatile disc
IC Integrated circuit
JEDEC Joint Electronic Devices Engineering Council
LCD Liquid crystal display
MDL Method detection limit
OEM Original equipment manufacturer
PAS Publicly Available Specification
PCB Printed circuit board
PDA Personal digital assistant
PWB Printed wiring board
SIM Subscriber identity module
SMD Surface mounted device
TFT Thin film transistor
TV Television
___________
---------------------- Page: 14 ----------------------
SIST EN 62321-2:2014
62321-2 © IEC:2013 – 9 –
USB Universal serial bus
4 Introduction to sampling
4.1 Introductory remark

Obtaining a sample (i.e. sampling) is the first step in analysing electrotechnical products f

...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.