prEN IEC 61788-15:2025
(Main)Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies
Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies
Supraleitfähigkeit - Teil 15: Messungen der elektronischen Charakteristik - Oberflächenimpedanz von Supraleiterschichten bei Mikrowellenfrequenzen
Supraconductivité - Partie 15: Mesures de caractéristiques électroniques - Impédance de surface intrinsèque de films supraconducteurs aux fréquences micro-ondes
Superprevodnost - 15. del: Meritve elektronskih karakteristik - Lastna površinska impedanca superprevodnih plasti pri mikrovalovnih frekvencah
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SLOVENSKI STANDARD
01-april-2025
Superprevodnost - 15. del: Meritve elektronskih karakteristik - Lastna površinska
impedanca superprevodnih plasti pri mikrovalovnih frekvencah
Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface
impedance of superconductor films at microwave frequencies
Supraleitfähigkeit - Teil 15: Messungen der elektronischen Charakteristik -
Oberflächenimpedanz von Supraleiterschichten bei Mikrowellenfrequenzen
Supraconductivité - Partie 15: Mesures de caractéristiques électroniques - Impédance de
surface intrinsèque de films supraconducteurs aux fréquences micro-ondes
Ta slovenski standard je istoveten z: prEN IEC 61788-15:2025
ICS:
17.220.20 Merjenje električnih in Measurement of electrical
magnetnih veličin and magnetic quantities
29.050 Superprevodnost in prevodni Superconductivity and
materiali conducting materials
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
90/539/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 61788-15 ED2
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2025-01-31 2025-04-25
SUPERSEDES DOCUMENTS:
90/523/CD, 90/534/CC
IEC TC 90 : SUPERCONDUCTIVITY
SECRETARIAT: SECRETARY:
Japan Mr Jun Fujikami
OF INTEREST TO THE FOLLOWING COMMITTEES: HORIZONTAL FUNCTION(S):
ASPECTS CONCERNED:
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TITLE:
Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface
impedance of superconductor films at microwave frequencies
PROPOSED STABILITY DATE: 2032
NOTE FROM TC/SC OFFICERS:
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
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IEC 61788-15 ED2 © IEC 2024 3 90/539/CDV
1 CONTENTS
3 FOREWORD . 5
4 INTRODUCTION . 7
5 1 Scope . 8
6 2 Normative references . 8
7 3 Terms and definitions . 8
8 4 Requirements . 9
9 5 Apparatus . 9
10 5.1 Measurement equipment . 9
11 5.2 Measurement apparatus . 10
12 5.3 Dielectric rods . 14
13 5.4 Superconductor films and copper cavity . 15
14 6 Measurement procedure . 15
15 6.1 Set-up . 15
16 6.2 Measurement of the reference level. 15
17 6.3 Measurement of the R of oxygen-free high conductivity copper . 16
S
18 6.4 Determination of the R of superconductor films and tan δ of standard
Se
19 dielectric rods . 19
20 6.5 Determination of the penetration depth . 20
21 6.6 Determination of the intrinsic surface impedance . 21
22 7 Uncertainty of the test method . 21
23 7.1 Measurement of unloaded quality factor . 21
24 7.2 Measurement of loss tangent. 22
25 7.3 Temperature . 22
26 7.4 Specimen and holder support structure . 23
27 7.5 Uncertainty in the intrinsic surface impedance . 23
28 Test Report . 23
29 8.1 Identification of test specimen . 23
30 8.2 Report of the Z values . 23
S
31 8.3 Report of the test conditions . 23
Annex A (informative) Additional information relating to clauses 1 to 8 . 24
33 A.1 Concerning the Scope . 24
34 A.2 Requirements . 25
35 A.3 Theory and the measurement procedure for the intrinsic surface impedance . 26
36 Theoretical relation between the Z and the Z [14] . 26
A.3.1 S Se
37 A.3.2 Calculation of the geometrical factors [22] . 30
38 A.4 Dimensions of the standard sapphire rod . 32
39 A.5 Dimensions of the closed type resonators . 33
40 A.6 Test results for type A and type B sapphire resonators . 33
41 Bibliography . 52
43 Figure 1 – Schematic diagram for the measurement equipment for the intrinsic ZS of
HTS films at cryogenic temperatures . 11
45 Figure 2 – Schematic diagram of a dielectric resonator with a switch for thermal
46 connection . 11
47 Figure 3 – Typical dielectric resonator with a movable top plate . 12
48 Figure 4 – Switch block for thermal connection . 13
49 Figure 5 – Dielectric resonator assembled with a switch block for thermal connection . 14
90/539/CDV 4 IEC 61788-15 ED2 © IEC 2024
50 Figure 6 – A typical resonance peak. Insertion attenuation IA, resonant frequency f0
51 and half power bandwidth ∆f are defined . 17
3dB
52 Figure 7 – Reflection scattering parameters S11 and S22 . 18
53 Figure 8 – Definitions for terms in Table 5 . 22
54 Figure A.1 - Schematic diagram for the measurement system . 24
55 Figure A.2 – A motion stage using step motors . 25
56 Figure A.3 – Cross-sectional view of a dielectric resonator . 26
57 Figure A.4 – A diagram for simplified cross-sectional view of a dielectric resonator . 30
58 Figure A.5 – Mode chart for type A sapphire resonator with a cavity diameter of 12 mm . 33
59 Figure A.6 – Frequency response of type A sapphire resonator . 34
60 Figure A.7 – QU versus temperature for the TE021 and the TE012 modes of type A
61 sapphire resonator with 360 nm-thick YBCO films . 34
62 Figure A.8 – The resonant frequency f versus temperature for the TE021 and TE012
63 modes of type A sapphire resonator with 360 nm-thick YBCO films . 35
64 Figure A.9 – The temperature dependence of the RSe of YBCO films with the
65 thicknesses of 70 nm to 360 nm measured at ~40 GHz . 35
66 Figure A.10 – The temperature dependence of ∆λ for the YBCO films with the
e
67 thicknesses of 70 nm and 360 nm measured at ~40 GHz . 36
68 Figure A.11 – The penetration depths λ of the 360 nm-thick YBCO film measured at
69 10 kHz using the mutual inductance method and at ~40 GHz using type A sapphire
70 resonator . 36
71 Figure A.12 – The temperature dependence of the RS of YBCO films with the
72 thicknesses of 70 nm to 360 nm measured at ~40 GHz . 37
73 Figure A.14 – Frequency response of type B sapphire resonator . 39
74 Figure A.15 – The temperature dependence of the R for the 300 nm-thick YBCO films
Se
75 measured at ~38 GHz Inset-The tan δ of the sapphire rod used for the measurements . 39
76 Figure A.16 – The temperature dependence of ∆λ for the 300 nm-thick YBCO film
e
77 measured at ~38 GHz Inset-The penetration depths λ of the 300 nm-thick YBCO film
78 measured at ~38 GHz using type B sapphire resonator . 40
79 Figure A.17 – The σ vs. temperature data for the 300 nm-thick YBCO films measured
80 at ~38 GHz Inset-The σ vs. temperature data for the same YBCO films at ~38 GHz . 40
81 Figure A.18 – The R vs. temperature data for the 300 nm-thick YBCO films measured
S
82 at ~38 GHz Inset- The XS for the same YBCO films at ~38 GHz . 40
84 Table 1 – Typical dimensions of a sapphire rod . 15
85 Table 2 – Typical dimensions of OFHC cavities and HTS films . 15
86 Table 3 – Geometrical factors and filling factors calculated for the standard sapphire
87 resonators . 18
88 Table 4 – Specifications of Vector Network Analyzer . 22
89 Table 5 – Type B uncertainty for the specifications on the sapphire rod . 22
IEC 61788-15 ED2 © IEC 2024 5 90/539/CDV
92 INTERNATIONAL ELECTROTECHNICAL COMMISSION
93 __________
95 SUPERCONDUCTIVITY –
97 Part 15: Electronic characteristic measurements –
98 Intrinsic surface impedance of superconductor films at microwave
99 frequencies
102 FOREWORD
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