IEC TR 62153-4-0:2007
(Main)Metallic communication cable test methods - Part 4-0: Electromagnetic compatibility (EMC) - Relationship between surface transfer impedance and screening attenuation, recommended limits
Metallic communication cable test methods - Part 4-0: Electromagnetic compatibility (EMC) - Relationship between surface transfer impedance and screening attenuation, recommended limits
It describes important background material used during the revision of IEC 61196-1:1995, Clause 14, Guidance for surface transfer impedance and screening attenuation limits for flexible r.f. cables. It is also given the relationship between surface transfer impedance (ZT) and screening attenuation (as), also measurements of ZT and as are provided to show the correlation of mean screening attenuation between 200 MHz and 500 MHz and ZT at both 30 MHz and 300 MHz.
Méthodes d'essai des câbles métalliques de communication - Partie 4- 0: Compatibilité électromagnétique (CEM) - Relation entre l'impédance de transfert en surface et l'affaiblissement d'écran, limites recommandées
Il fournit les informations générales utiles utilisées au cours de la révision de la CEI 61196-1:1995, Article 14, Instructions pour l'impédance de transfert en surface et les limites d'affaiblissement d'écran pour les câbles r.f. souples. Il est egalément donnée la relation entre l'impédance en transfert en surface (ZT) et l'affaiblissement d'écran (as) ; de même, les mesures de ZT et as sont fournies pour montrer la corrélation de l'affaiblissement moyen de l'écrantage entre 200 MHz et 500 MHz et ZT à 30 MHz et 300 MHz.
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IEC/TR 62153-4-0
Edition 1.0 2007-11
TECHNICAL
REPORT
RAPPORT
TECHNIQUE
Metallic communication cable test methods –
Part 4-0: Electromagnetic compatibility (EMC) – Relationship between surface
transfer impedance and screening attenuation, recommended limits
Méthodes d’essai des câbles métalliques de communication –
Partie 4-0: Compatibilité électromagnétique (CEM) – Relation entre l’impédance
de transfert en surface et l’affaiblissement d’écran, limites recommandées
IEC/TR 62153-4-0:2007
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IEC/TR 62153-4-0
Edition 1.0 2007-11
TECHNICAL
REPORT
RAPPORT
TECHNIQUE
Metallic communication cable test methods –
Part 4-0: Electromagnetic compatibility (EMC) – Relationship between surface
transfer impedance and screening attenuation, recommended limits
Méthodes d’essai des câbles métalliques de communication –
Partie 4-0: Compatibilité électromagnétique (CEM) – Relation entre l’impédance
de transfert en surface et l’affaiblissement d’écran, limites recommandées
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
N
CODE PRIX
ICS 33.100; 33.120.10 ISBN 2-8318-9363-1
– 2 – TR 62153-4-0 © IEC:2007
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
METALLIC COMMUNICATION CABLE TEST METHODS –
Part 4-0: Electromagnetic compatibility (EMC) –
Relationship between surface transfer impedance and screening
attenuation, recommended limits
FOREWORD
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The main task of IEC technical committees is to prepare International Standards. However, a
technical committee may propose the publication of a technical report when it has collected
data of a different kind from that which is normally published as an International Standard, for
example "state of the art".
IEC 62153-4-0, which is a technical report, has been prepared by IEC technical committee 46:
Cables, wires, waveguides, R.F. connectors, R.F. and microwave passive components and
accessories.
This publication cancels and replaces IEC/TR 62064, published in 1999.
TR 62153-4-0 © IEC:2007 – 3 –
The text of this technical report is based on the following documents:
Enquiry draft Report on voting
46/197/DTR 46/252/RVC
Full information on the voting for the approval of this technical report can be found in the report
on voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of the IEC 62153 series, under the general title: Metallic communication cable
test methods, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until the
maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
– 4 – TR 62153-4-0 © IEC:2007
METALLIC COMMUNICATION CABLE TEST METHODS –
Part 4-0: Electromagnetic compatibility (EMC) –
Relationship between surface transfer impedance and screening
attenuation, recommended limits
1 Scope
This technical report describes important background material used during the revision of
IEC 61196-1:1995, Clause 14, Guidance for surface transfer impedance and screening
attenuation limits for flexible r.f. cables.
In this technical report, the relationship between surface transfer impedance (Z ) and
T
screening attenuation (a ) is given, also measurements of Z and a are provided to show the
s T s
at both
correlation of mean screening attenuation between 200 MHz and 500 MHz and Z
T
30 MHz and 300 MHz.
The sensitivity of a to the relative velocity difference between the inner and outer system is
s
shown. The cable data sheet should show the a values in a standardized form
s
– Δv/v = 10 % and the characteristic impedance of the outer system is 150 Ω. It is also shown
that a relative velocity difference change from 10 % to 40 % gives an improvement of 12 dB in
screening attenuation.
2 Normative references
The following referenced documents are indispensable for the application of this document. For
dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments) applies.
IEC/TR 61917, Cables, cable assemblies and connectors – Introduction to electromagnetic
(EMC) screening measurements
3 General
At high frequencies, when the surface transfer impedance Z and effective transfer
T
impedance Z = Z ±Z increase 6 dB per octave, the relationship to the screening
TE F T
n, f
attenuation a is frequency independent and can be written as (see also Figure 1):
s
a = −20 × log T (1)
n
s 10
n
f
f
Z Z c
T T o
= −20 × log = −20 × log (2)
10 10
l l
Z Z ω ε ± ε
1 2 r2 r1
Z Z ω ±
1 2
v v
2 1
and
TR 62153-4-0 © IEC:2007 – 5 –
U / Z
2n 2
f
T = (3)
n
f U / Z
1 1
where
l is the length of the cable under test;
D is the cylinder diameter;
E is the source voltage;
T are the coupling transfer functions;
n,f
‘n’ is for the near end and ‘f’ for the far end;
U is the inner circuit near end voltage;
1n
U is the outer circuit near end voltage;
2n
U is the inner circuit far end voltage;
1f
U is the outer circuit far end voltage;
2f
Z is the characteristic impedance of the cable;
Z is the impedance of the outer circuit;
ε is the cable dielectric permittivity;
r1
ε is the permittivity of the outer circuit;
r2
c is the velocity of light in vacuum;
o
ω is the radian frequency;
v is the propagation velocity of the inner circuit;
v is the propagation velocity of the outer circuit;
Z is the capacitive coupling impedance;
F
Z is the surface transfer impedance;
T
Z is the effective transfer impedance.
TE
n, f
l
+
E
Z U
2 U 2f
Z
2n
U
1n
Z Z
U
1f
D
Z
1 v
Z v
IEC 2143/07
Key
1 inner circuit, cable under test
2 outer circuit, formed by test line or cylinder or the outer environment as in the absorbing clamp method
Figure 1 – Concept of screening measurement set-ups
– 6 – TR 62153-4-0 © IEC:2007
When the capacitive coupling impedance Z is present (spaces in the outer conductor), Z
F T
shall be substituted by Z .
TE
"+" sign is for the near end and "–" sign for the far end. Z and Z are the impedances of the
1 2
inner and outer system and v and v the corresponding velocities.
1 2
Screening attenuation a is a reliable measure of screening efficiency when the frequency is
s
constant. This is true when Z or Z increases 6 dB/octave and the following criterion is
T TE
fulfilled:
λ
o
l ≥ (4)
n
f
π ε ± ε
r1 r2
where λ is the wave length in free space.
o
At lower frequencies when l is smaller than that found from (4), the coupling attenuation is:
(Z ±Z ) × l
F T
A = −20 × log T = −20 × log (5)
n
s 10 10
n
f 2 Z Z
f 1 2
More detailed information on the above equations is given in the IEC/TR 61917.
4 Correlation between measured screening attenuation a and measured
...
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