IEC 60384-21:2004/COR1:2004

Corrigendum 1 - Fixed capacitors for use in electronic equipment - Part 21: Sectional specification: Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1

General Information

• Status: Published
• Publication Date: 28-Sep-2004
• ICS: 31.060.10 - Fixed capacitors
• Technical Committee: TC 40 - Capacitors and resistors for electronic equipment
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 09-Dec-2011

Relations

• Corrects: IEC 60384-21:2004 - Fixed capacitors for use in electronic equipment - Part 21: Sectional specification: Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1
• Effective Date: 05-Sep-2023
• Revised: IEC 60384-21:2011 - Fixed capacitors for use in electronic equipment - Part 21: Sectional specification - Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 60384-21
(First edition – 2004-06)
Fixed capacitors for use in electronic equipment –
Part 21: Sectional specification: Fixed surface mount multilayer capacitors
of ceramic dielectric, Class 1
CORRIGENDUM 1
Page 8
1.5.6
rated voltage (DC)
Replace, in the note, ‘AC’ by ‘a.c.’.

Page 8
1.5.6
rated voltage (DC)
Replace, in the title and text, ‘DC’ by ‘d.c.’.

Page 9
1.6.1
Replace, in item b), ‘DC’ by ‘d.c.’.

Page 12
Table 3 – Combination of temperature coefficient and tolerance
Replace the sixth and seventh rows beneath the column headers:
-220 14,3 / 11,4 / 8,58 / 5,72 / –12,5 / –16,2 / –20,0 / –26,3 /
±30(G)
25,6 20,46 15,3 10,2 –9,50 –12,4 –15,2 –20,0
-330 20,3 / 16,2 / 12,2 / 8,12 / –19,5 / – –25,4 / –31,2 / –41,0 /
±60(H)
38,4 30,7 23,0 15,4 13,5 –17,6 –21,6 –28,4
by the following:
-220 14,3 / 11,4 / 8,55 / 5,70 / –12,5 / –16,2 / –20,0 / –26,3 /
±30(G)
25,6 20,46 15,3 10,2 –9,50 –12,4 –15,2 –20,0
-330 20,3 / 16,2 / 12,2 / 8,10 / –19,5 / –25,4 / –31,2 / –41,0 /
±60(H)
38,4 30,7 23,0 15,4 –13,5 –17,6 –21,6 –28,4

September 2004
Page 15
Table 4 – Fixed sample size test plan for qualification approval – Assessment level EZ
Replace the column headers by the following:
Group Test Subclause of this Number of Permissible
publication specimens number of
No.
non conforming
e
n
items
c
Page 16
Table 5 – Tests schedule for qualification approval
Replace GROUP 1A by the following:
GROUP 1A D See Table 4
4.15 Robustness of ter- Test Ua1, Force: 2.5 N No visible damage
minations
Test Ub, Method 1, Force: 2,5 N
(if applicable)
Number of bends: 1
Visual examination
4.9.1 Initial measurement Capacitance
4.9 Resistance to sol- See detail specification for the
dering heat method
Recovery: 6 h to 24 h
4.9.4 Final measurement Visual examination As in 4.9.4

Capacitance As in 4.9.4
4.16 Component solvent Solvent: … See detail specification
resistance
Solvent temperature: …
(if applicable)
Method 2
Recovery: …
September 2004
Page 17
Replace the existing text of page 17 by the following:
Subclause number and test D Conditions of test Number of Performance
specimens requirements
or
(see NOTE 1) (see NOTE 1)
(n)
(see NOTE 1)
and
ND
number of
non-
conforming
items (c)
GROUP 2 D  See Table 4
4.8 Substrate bending Deflection: … See detail specification
test
Number of bends: …
4.8.1 Initial measurement Capacitance
4.8.2 Final in
...