Semiconductor devices - Part 5-10: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the room-temperature reference point

IEC 60747-5-10:2019(E) specifies the measuring method of the internal quantum efficiency (IQE) of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes only the relative external quantum efficiency (EQE) measured at an operating room temperature. In order to identify the reference IQE, an operating current corresponding to the injection efficiency of 100 % is found and the radiative efficiency is determined by the infinitesimal change of the relative EQE at that point. The IQE as a function of current is then calculated from the relative ratio of the EQEs to the value at the reference point, which is called room-temperature reference-point method (RTRM).

General Information

Status
Published
Publication Date
10-Dec-2019
Current Stage
PPUB - Publication issued
Completion Date
11-Dec-2019
Ref Project

Buy Standard

Standard
IEC 60747-5-10:2019 - Semiconductor devices - Part 5-10: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the room-temperature reference point
English language
16 pages
sale 15% off
Preview
sale 15% off
Preview

Standards Content (sample)

IEC 60747-5-10
Edition 1.0 2019-12
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 5-10: Optoelectronic devices – Light emitting diodes – Test method of the
internal quantum efficiency based on the room-temperature reference point
IEC 60747-5-10:2019-12(en)
---------------------- Page: 1 ----------------------
THIS PUBLICATION IS COPYRIGHT PROTECTED
Copyright © 2019 IEC, Geneva, Switzerland

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form

or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from

either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC

copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or

your local IEC member National Committee for further information.
IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC

The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes

International Standards for all electrical, electronic and related technologies.
About IEC publications

The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the

latest edition, a corrigendum or an amendment might have been published.

IEC publications search - webstore.iec.ch/advsearchform Electropedia - www.electropedia.org

The advanced search enables to find IEC publications by a The world's leading online dictionary on electrotechnology,

variety of criteria (reference number, text, technical containing more than 22 000 terminological entries in English

committee,…). It also gives information on projects, replaced and French, with equivalent terms in 16 additional languages.

and withdrawn publications. Also known as the International Electrotechnical Vocabulary

(IEV) online.
IEC Just Published - webstore.iec.ch/justpublished

Stay up to date on all new IEC publications. Just Published IEC Glossary - std.iec.ch/glossary

details all new publications released. Available online and 67 000 electrotechnical terminology entries in English and

once a month by email. French extracted from the Terms and Definitions clause of

IEC publications issued since 2002. Some entries have been

IEC Customer Service Centre - webstore.iec.ch/csc collected from earlier publications of IEC TC 37, 77, 86 and

If you wish to give us your feedback on this publication or CISPR.
need further assistance, please contact the Customer Service
Centre: sales@iec.ch.
---------------------- Page: 2 ----------------------
IEC 60747-5-10
Edition 1.0 2019-12
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 5-10: Optoelectronic devices – Light emitting diodes – Test method of the
internal quantum efficiency based on the room-temperature reference point
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.99 ISBN 978-2-8322-7655-6

Warning! Make sure that you obtained this publication from an authorized distributor.

® Registered trademark of the International Electrotechnical Commission
---------------------- Page: 3 ----------------------
– 2 – IEC 60747-5-10:2019 © IEC:2019
CONTENTS

FOREWORD ........................................................................................................................... 3

1 Scope .............................................................................................................................. 5

2 Normative references ...................................................................................................... 5

3 Terms, definitions and abbreviated terms ........................................................................ 5

3.1 Terms and definitions .............................................................................................. 5

3.2 Abbreviated terms ................................................................................................... 7

4 Measuring methods ......................................................................................................... 7

4.1 Basic requirements ................................................................................................. 7

4.1.1 Measuring conditions ....................................................................................... 7

4.1.2 Measuring instruments and equipment ............................................................. 8

4.2 Purpose .................................................................................................................. 8

4.3 Measurement .......................................................................................................... 8

4.3.1 Measurement setup ......................................................................................... 8

4.3.2 Measurement principle..................................................................................... 8

4.3.3 Measurement sequence ................................................................................... 8

5 Test report ..................................................................................................................... 10

Annex A (informative) Test example..................................................................................... 11

Bibliography .......................................................................................................................... 16

Figure 1 – Test flow .............................................................................................................. 10

Figure A.1 – Radiant power as a function of forward current ................................................. 11

Figure A.2 – Relative EQE as a function of forward current ................................................... 12

Figure A.3 – Determination of peak EQE point in the relative EQE curve .............................. 12

Figure A.4 – Conversion to the normalized variables of X and Y ............................................ 13

Figure A.5 – Coefficients a and a as a function of X ........................................................... 13

1 2

Figure A.6 – Verification of a reference point in the a curve ................................................. 14

Figure A.7 – IQE as a function of forward current .................................................................. 14

Table A.1 – Summary of test report ....................................................................................... 15

---------------------- Page: 4 ----------------------
IEC 60747-5-10:2019 © IEC:2019 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
Part 5-10: Optoelectronic devices – Light emitting diodes –
Test method of the internal quantum efficiency based on
the room-temperature reference point
FOREWORD

1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

all national electrotechnical committees (IEC National Committees). The object of IEC is to promote

international co-operation on all questions concerning standardization in the electrical and electronic fields. To

this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,

Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC

Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested

in the subject dealt with may participate in this preparatory work. International, governmental and non-

governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely

with the International Organization for Standardization (ISO) in accordance with conditions determined by

agreement between the two organizations.

2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international

consensus of opinion on the relevant subjects since each technical committee has representation from all

interested IEC National Committees.

3) IEC Publications have the form of recommendations for international use and are accepted by IEC National

Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC

Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any

misinterpretation by any end user.

4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications

transparently to the maximum extent possible in their national and regional publications. Any divergence

between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in

the latter.

5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity

assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any

services carried out by independent certification bodies.

6) All users should ensure that they have the latest edition of this publication.

7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and

members of its technical committees and IEC National Committees for any personal injury, property damage or

other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and

expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC

Publications.

8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is

indispensable for the correct application of this publication.

9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of

patent rights. IEC shall not be held responsible for identifying any or all such patent rights.

International Standard IEC 60747-5-10 has been prepared by subcommittee 47E: Discrete

semiconductor devices, of IEC technical committee 47: Semiconductor devices.
The text of this International Standard is based on the following documents:
CDV Report on voting
47E/652/CDV 47E/677/RVC

Full information on the voting for the approval of this International Standard can be found in

the report on voting indicated in the above table.

This document has been drafted in accordance with the ISO/IEC Directives, Part 2.

---------------------- Page: 5 ----------------------
– 4 – IEC 60747-5-10:2019 © IEC:2019

A list of all parts in the IEC 60747 series, published under the general title Semiconductor

devices, can be found on the IEC website.

Future standards in this series will carry the new general title as cited above. Titles of existing

standards in this series will be updated at the time of the next edition.

The committee has decided that the contents of this document will remain unchanged until the

stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to

the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.

IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates

that it contains colours which are considered to be useful for the correct

understanding of its contents. Users should therefore print this document using a

colour printer.
---------------------- Page: 6 ----------------------
IEC 60747-5-10:2019 © IEC:2019 – 5 –
SEMICONDUCTOR DEVICES –
Part 5-10: Optoelectronic devices – Light emitting diodes –
Test method of the internal quantum efficiency based on
the room-temperature reference point
1 Scope

This part of IEC 60747 specifies the measuring method of the internal quantum efficiency

(IQE) of single light emitting diode (LED) chips or packages without phosphor. White LEDs for

lighting applications are out of the scope of this document. This document utilizes only the

relative external quantum efficiency (EQE) measured at an operating room temperature. In

order to identify the reference IQE, an operating current corresponding to the injection

efficiency of 100 % is found and the radiative efficiency is determined by the infinitesimal

change of the relative EQE at that point. The IQE as a function of current is then calculated

from the relative ratio of the EQEs to the value at the reference point, which is called room-

temperature reference-point method (RTRM).
2 Normative references

The following documents are referred to in the text in such a way that some or all of their

content constitutes requirements of this document. For dated references, only the edition

cited applies. For undated references, the latest edition of the referenced document (including

any amendments) applies.

IEC 60747-5-6:2016, Semiconductor devices – Part 5-6: Optoelectronic devices – Light

emitting diodes
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
For the purposes of this document, the following terms and definitions apply.

ISO and IEC maintain terminological databases for use in standardization at the following

addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1.1
internal quantum efficiency
IQE
ratio of the number of photons emitted from the active region
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.