IEC 60747-18-4:2023

Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors

IEC 60747-18-4:2023(E) specifies the evaluation method for noise characteristics of lens-free CMOS photonic array sensors. This document includes the measurement setup, test procedure, test items, evaluation method, and test report for noise characteristics of lens-free CMOS photonic array sensors.

General Information

• Status: Published
• Publication Date: 15-Mar-2023
• ICS: 31.080.99 - Other semiconductor devices
• Technical Committee: SC 47E - Discrete semiconductor devices
• Drafting Committee: WG 1 - TC 47/SC 47E/WG 1
• Current Stage: PPUB - Publication issued
• Start Date: 14-Apr-2023
• Completion Date: 16-Mar-2023

Standards Content (Sample)

IEC 60747-18-4 ®
Edition 1.0 2023-03
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 18-4: Semiconductor bio sensors – Evaluation method of noise
characteristics of lens-free CMOS photonic array sensors

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IEC 60747-18-4 ®
Edition 1.0 2023-03
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 18-4: Semiconductor bio sensors – Evaluation method of noise

characteristics of lens-free CMOS photonic array sensors

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.99 ISBN 978-2-8322-6643-4

– 2 – IEC 60747-18-4:2023 © IEC 2023
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Measurement setup . 7
4.1 General . 7
4.2 Measurement system . 7
5 Measurement . 7
5.1 General . 7
5.2 Spatial noise . 8
5.2.1 DFPN: Dark fixed pattern noise (without illumination) . 8
5.2.2 PRNU: Photo response non uniformity (with illumination) . 9
5.3 Temporal noise . 10
5.3.1 RRN: Random read noise . 10
6 Test report . 12
Annex A (informative) Test report . 13
Bibliography . 14

Figure 1 – Measurement workflow . 7
Figure 2 – n trial data of frame capture . 8
Figure 3 – Dark frame subtracted data . 9
Figure 4 – Two frame subtracted data . 11

Table A.1 – Test environment specifications of CMOS photonic array sensor . 13

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
Part 18-4: Semiconductor bio sensors – Evaluation method of noise
characteristics of lens-free CMOS photonic array sensors

FOREWORD
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rights. IEC shall not be held responsible for identifying any or all such patent rights.
IEC 60747-18-4 has been prepared by subcommittee 47E: Discrete semiconductor devices, of
IEC technical committee 47: Semiconductor devices. It is an International Standard.
The text of this International Standard is based on the following documents:
Draft Report on voting
47E/778/CDV 47E/790/RVC
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.

– 4 – IEC 60747-18-4:2023 © IEC 2023
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 60747 series, published under the general title Semiconductor
devices, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
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INTRODUCTION
The IEC 60747-18 series on semiconductor bio sensors is composed of the following parts:
• IEC 60747-18-1 defines the test method and data analysis for calibration of lens-free CMOS
photonic array sensors;
• IEC 60747-18-2 [1] defines the evaluation process of lens-free CMOS photonic array
sensor package modules;
• IEC 60747-18-3 [2] defines the fluid flow characteristics of lens-free CMOS photonic array
sensor package modules with fluidic system;
• IEC 60747-18-4 defines the evaluation method of noise characteristics of lens-free CMOS
photonic array sensors;
• IEC 60747-18-5 [3] defines the evaluation method for light responsivity characteristics of
lens-free CMOS photonic array sensor package modules by incident angle of light.
The IEC 60747-18 series [4] includes subjects such as noise analysis, long-term reliability tests,
test methods for lens-free CMOS photonic array sensor package modules under patchable
environments, test methods under implantable environments, etc.

___________
Numbers in square brackets refer to the Bibliography.

– 6 – IEC 60747-18-4:2023 © IEC 2023
SEMICONDUCTOR DEVICES –
Part 18-4: Semiconductor bio sensors – Evaluation method of noise
characteristics of lens-free CMOS photonic array sensors

1 Scope
This part of IEC 60747 specifies the evaluation method for noise characteristics of lens-free
CMOS photonic array sensors. This document includes the measurement setup, test procedure,
test items, evaluation method, and test report for noise characteristics of lens-free CMOS
photonic array sensors.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60747-18-1:2019, Semiconductor devices – Part 18-1: Semiconductor bio sensors – Test
method and data analysis for calibration of lens-free CMOS photonic array sensors
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
• IEC Electropedia: available at https://www.electropedia.org/
• ISO Online browsing platform: available at https://www.iso.org/obp
3.1
noise
unwanted variations in the response of an imaging system
Note 1 to entry: Spatial noise is unwanted variations that are consistent for every exposure. Temporal noise is
unwanted time variance in the response of an imaging system. Noise of imaging systems also includes photon shot
noise and analogue processing and quantization noise, which varies from one image to the next.
[SOURCE: ISO 21550:2004 [5], 3.14 and ISO 15739:2017 [6], 3.9, modified – The note has
been added.]
3.2
spatial noise
spatial variation in pixel output of photonic array sensor
Note 1 to entry: The location and time of occurrence is not predictable. Dark Fixed Pattern Noise (FPN) is static
variation of the offset in the dark signal from pixel to pixel. Photo-response non-uniformity is non-uniformity in the
spatial variation of pixel values for
...