IEC 60747-5-10:2019
(Main)Semiconductor devices - Part 5-10: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the room-temperature reference point
Semiconductor devices - Part 5-10: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the room-temperature reference point
IEC 60747-5-10:2019(E) specifies the measuring method of the internal quantum efficiency (IQE) of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes only the relative external quantum efficiency (EQE) measured at an operating room temperature. In order to identify the reference IQE, an operating current corresponding to the injection efficiency of 100 % is found and the radiative efficiency is determined by the infinitesimal change of the relative EQE at that point. The IQE as a function of current is then calculated from the relative ratio of the EQEs to the value at the reference point, which is called room-temperature reference-point method (RTRM).
General Information
- Status
- Published
- Publication Date
- 10-Dec-2019
- Technical Committee
- SC 47E - Discrete semiconductor devices
- Drafting Committee
- WG 9 - TC 47/SC 47E/WG 9
- Current Stage
- PPUB - Publication issued
- Start Date
- 11-Dec-2019
- Completion Date
- 02-Jan-2020
Overview
IEC 60747-5-10:2019 defines a standardized test method for determining the internal quantum efficiency (IQE) of single light-emitting diode (LED) chips or packages without phosphor, using measurements taken at room temperature. Known as the room‑temperature reference‑point method (RTRM), the standard uses only relative external quantum efficiency (EQE) measured at an operating ambient (25 ± 3) °C to find a reference operating point and then derives IQE as a function of forward current. White LEDs for lighting applications are excluded from this document.
Key topics and requirements
- Scope and targets
- IQE measurement for single LED chips/packages without phosphor.
- Excludes white LEDs for lighting.
- Measurement conditions
- Ambient temperature default: (25 ± 3) °C; relative humidity typically 45–85% RH.
- Thermal equilibrium or controlled measurement timing to avoid self‑heating artifacts.
- Measurement inputs
- Radiant power vs. forward current (Φe vs I) curve measured at room temperature.
- Forward voltage, emission spectrum (peak wavelength λp, bandwidth), and pulse current methods as needed.
- Method principle (RTRM)
- Identify a room‑temperature reference point corresponding to an operating current at which injection efficiency reaches its maximum (≈100%).
- Determine radiative efficiency from the infinitesimal change of the relative EQE at that point.
- Compute IQE(I) by normalizing relative EQE values to the reference‑point value.
- Instruments and setup
- Measurement equipment and basic setup follow IEC 60747-5-6:2016 references (radiometer/photometer, spectrometer, current source, thermal control).
- Reporting
- Test report components and an informative test example are provided (see Annex A in the standard).
Applications and who uses it
- LED manufacturers and device engineers for device characterization, performance benchmarking, and process optimization.
- R&D labs and materials scientists studying recombination dynamics, radiative efficiency, and injection efficiency in LEDs.
- Independent test laboratories and quality assurance teams validating LED chip or package performance (non‑phosphor types).
- Useful in failure analysis and comparative studies across device designs and epitaxial structures.
Related standards
- IEC 60747-5-6:2016 - referenced for measurement instruments and basic optoelectronic LED test procedures.
- Other parts of the IEC 60747 series covering semiconductor and optoelectronic device test methods.
Keywords: IEC 60747-5-10, IQE, internal quantum efficiency, LED test method, RTRM, room-temperature reference-point method, EQE, radiative efficiency, injection efficiency, LED characterization.
Frequently Asked Questions
IEC 60747-5-10:2019 is a standard published by the International Electrotechnical Commission (IEC). Its full title is "Semiconductor devices - Part 5-10: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the room-temperature reference point". This standard covers: IEC 60747-5-10:2019(E) specifies the measuring method of the internal quantum efficiency (IQE) of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes only the relative external quantum efficiency (EQE) measured at an operating room temperature. In order to identify the reference IQE, an operating current corresponding to the injection efficiency of 100 % is found and the radiative efficiency is determined by the infinitesimal change of the relative EQE at that point. The IQE as a function of current is then calculated from the relative ratio of the EQEs to the value at the reference point, which is called room-temperature reference-point method (RTRM).
IEC 60747-5-10:2019(E) specifies the measuring method of the internal quantum efficiency (IQE) of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes only the relative external quantum efficiency (EQE) measured at an operating room temperature. In order to identify the reference IQE, an operating current corresponding to the injection efficiency of 100 % is found and the radiative efficiency is determined by the infinitesimal change of the relative EQE at that point. The IQE as a function of current is then calculated from the relative ratio of the EQEs to the value at the reference point, which is called room-temperature reference-point method (RTRM).
IEC 60747-5-10:2019 is classified under the following ICS (International Classification for Standards) categories: 31.080.99 - Other semiconductor devices. The ICS classification helps identify the subject area and facilitates finding related standards.
You can purchase IEC 60747-5-10:2019 directly from iTeh Standards. The document is available in PDF format and is delivered instantly after payment. Add the standard to your cart and complete the secure checkout process. iTeh Standards is an authorized distributor of IEC standards.
Standards Content (Sample)
IEC 60747-5-10 ®
Edition 1.0 2019-12
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 5-10: Optoelectronic devices – Light emitting diodes – Test method of the
internal quantum efficiency based on the room-temperature reference point
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IEC 60747-5-10 ®
Edition 1.0 2019-12
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 5-10: Optoelectronic devices – Light emitting diodes – Test method of the
internal quantum efficiency based on the room-temperature reference point
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.99 ISBN 978-2-8322-7655-6
– 2 – IEC 60747-5-10:2019 © IEC:2019
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms, definitions and abbreviated terms . 5
3.1 Terms and definitions . 5
3.2 Abbreviated terms . 7
4 Measuring methods . 7
4.1 Basic requirements . 7
4.1.1 Measuring conditions . 7
4.1.2 Measuring instruments and equipment . 8
4.2 Purpose . 8
4.3 Measurement . 8
4.3.1 Measurement setup . 8
4.3.2 Measurement principle. 8
4.3.3 Measurement sequence . 8
5 Test report . 10
Annex A (informative) Test example. 11
Bibliography . 16
Figure 1 – Test flow . 10
Figure A.1 – Radiant power as a function of forward current . 11
Figure A.2 – Relative EQE as a function of forward current . 12
Figure A.3 – Determination of peak EQE point in the relative EQE curve . 12
Figure A.4 – Conversion to the normalized variables of X and Y . 13
Figure A.5 – Coefficients a and a as a function of X . 13
1 2
Figure A.6 – Verification of a reference point in the a curve . 14
Figure A.7 – IQE as a function of forward current . 14
Table A.1 – Summary of test report . 15
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
Part 5-10: Optoelectronic devices – Light emitting diodes –
Test method of the internal quantum efficiency based on
the room-temperature reference point
FOREWORD
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International Standard IEC 60747-5-10 has been prepared by subcommittee 47E: Discrete
semiconductor devices, of IEC technical committee 47: Semiconductor devices.
The text of this International Standard is based on the following documents:
CDV Report on voting
47E/652/CDV 47E/677/RVC
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
– 4 – IEC 60747-5-10:2019 © IEC:2019
A list of all parts in the IEC 60747 series, published under the general title Semiconductor
devices, can be found on the IEC website.
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SEMICONDUCTOR DEVICES –
Part 5-10: Optoelectronic devices – Light emitting diodes –
Test method of the internal quantum efficiency based on
the room-temperature reference point
1 Scope
This part of IEC 60747 specifies the measuring method of the internal quantum efficiency
(IQE) of single light emitting diode (LED) chips or packages without phosphor. White LEDs for
lighting applications are out of the scope of this document. This document utilizes only the
relative external quantum efficiency (EQE) measured at an operating room temperature. In
order to identify the reference IQE, an operating current corresponding to the injection
efficiency of 100 % is found and the radiative efficiency is determined by the infinitesimal
change of the relative EQE at that point. The IQE as a function of current is then calculated
from the relative ratio of the EQEs to the value at the reference point, which is called room-
temperature reference-point method (RTRM).
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC 60747-5-6:2016, Semiconductor devices – Part 5-6: Optoelectronic devices – Light
emitting diodes
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1.1
internal quantum efficiency
η
IQE
ratio of the number of photons emitted from the active region
...
記事タイトル:IEC 60747-5-10:2019 - 半導体デバイス - 第5-10部:光電子デバイス - 発光ダイオード - 室温基準点に基づく内部量子効率の試験方法 記事内容:IEC 60747-5-10:2019(E)は、リンズなしの単一の発光ダイオード(LED)チップまたはパッケージの内部量子効率(IQE)を測定する方法を規定しています。照明用の白色LEDは、この文書の対象外です。この文書では、運転時の室温で測定された相対的な外部量子効率(EQE)のみを利用します。参照IQEを特定するためには、注入効率が100%となる運転電流を見つけ、その点でのEQEの微小変化から放射効率を決定します。次に、EQEの相対比率を参照点の値で割ったものから、電流の関数としてのIQEを計算します。この方法は、室温基準点法(RTRM)とも呼ばれています。
The article discusses the test method for measuring the internal quantum efficiency (IQE) of light emitting diode (LED) chips or packages without phosphor. The scope of the document does not include white LEDs for lighting applications. The method involves determining the reference IQE by finding the operating current where the injection efficiency is 100% and calculating the radiative efficiency from the relative change in external quantum efficiency (EQE) at that point. The IQE as a function of current is then calculated using the room-temperature reference-point method (RTRM).
제목: IEC 60747-5-10:2019 - 반도체 소자 - 파트 5-10: 광전자 소자 - 발광 다이오드 - 실내 온도 기준을 기반으로 한 내부 양자 효율성의 시험 방법 내용: IEC 60747-5-10:2019(E)은 형광체가 없는 개별 발광 다이오드 (LED) 칩 또는 패키지의 내부 양자 효율성 (IQE)을 측정하는 방법을 규정합니다. 조명용으로 사용되는 흰색 LED는 이 문서의 범위에서 제외됩니다. 이 문서는 작동 온도에서 측정된 상대적인 외부 양자 효율성(EQE)만을 사용합니다. 참조 IQE를 식별하기 위해서는 주입 효율이 100%인 작동 전류를 찾고, 해당 지점에서 상대적인 EQE의 미세한 변화를 통해 방사 효율성을 결정합니다. 그런 다음 EQE의 상대적인 비율을 참조점의 값으로 나눈 것으로부터 전류에 따른 IQE를 계산합니다. 이 방법은 실내 온도 기준점 방법 (RTRM)이라고도 합니다.










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