IEC 60747-5-14:2022
(Main)Semiconductor devices - Part 5-14: Optoelectronic devices - Light emitting diodes - Test method of the surface temperature based on the thermoreflectance method
Semiconductor devices - Part 5-14: Optoelectronic devices - Light emitting diodes - Test method of the surface temperature based on the thermoreflectance method
IEC 60747-5-14:2022(E) specifies the measuring method of the surface temperature of single LED die or package, based on the thermoreflectance (TR) method. TR is the effect that the reflectance of light changes with the temperature of a substance. This part measures relative change in the reflectance of light from a metal film deposited nearby on the metallurgical pn junction as the relative change in the LED junction temperature. The surface temperature can be approximated as the junction temperature when the thermal resistance effect between the metal surface and the pn junction is negligibly small.
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Standards Content (Sample)
IEC 60747-5-14
®
Edition 1.0 2022-03
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the
surface temperature based on the thermoreflectance method
IEC 60747-5-14:2022-03(en)
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IEC 60747-5-14
®
Edition 1.0 2022-03
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the
surface temperature based on the thermoreflectance method
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.99 ISBN 978-2-8322-1085-1
Warning! Make sure that you obtained this publication from an authorized distributor.
® Registered trademark of the International Electrotechnical Commission
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– 2 – IEC 60747-5-14:2022 © IEC 2022
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms, definitions and abbreviated terms . 5
3.1 Terms and definitions . 5
3.2 Abbreviated terms . 7
4 Measuring methods . 7
4.1 Basic requirements . 7
4.1.1 Measuring conditions . 7
4.1.2 Measuring instruments and equipment . 7
4.2 Purpose . 7
4.3 Measurement .
...
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